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Publication

"Teaching Digital RT-Level Self-Test using a Java Applet", 20th IEEE Conference NORCHIP'2002, pp. 322-328, 2002

Authors:
S. Devadse
Artur Jutman
A. Sudnitson
Raimund Ubar
Dr.-Ing. Heinz- Dietrich Wuttke
Typ:
Conferences
Status:
accepted
Date of publication
01/01/2002
Abstract:
A method called “living pictures” to combine learning, training and research phases in a laboratory course for educating today’s VLSI and system designers is presented and implemented as an Internet based tool. The system is designed mainly to illustrate RT-level
(RT-Register Transfer) problems in control intensive digital systems including: investigation of tradeoffs between system’s speed and HW cost, RT-level simulation, fault simulation, test generation, built-in self-test (BIST) and others. In this article we concentrate mainly on
testing related problems. The described system has a built-in multilingual support to ensure easy integration into teaching courses of universities over the world.
Bibtex