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Department Materials for Electronics

headerphoto Department Materials for Electronics
Contact Person

Univ.-Prof. Dr. Peter Schaaf

Head of Department

Phone +49 3677 69-3610

Send email



Structural Laboratory

  • transmission electron microscope (TEM, EELS, EDX, STEM)
  • scanning electron microscope (SEM, EDX, EBSD)
  • X-ray diffraction (XRD)
  • Focussed Ion Beam (FIB) mit REM, EBSD, EDX, TEM lamellar preparation
  • sample preparation (PECS, PIPS), materialography
  • scanning tunneling and atomic force microscope (STM/AFM)

Material testing Laboratory

  • ultrasound and eddy current testing, radiography
  • stiffness and hardness measuring
  • metallography, optical microscopy, image data processing

Preparation and Measuring Laboratory

  • sputtering and vapor techniques
  • annealing equipment
  • plasma etching
  • measurement of electrical conductivity
  • computer-assisted probing devices
  • thermal wave analysis of thermal properties