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Conference award "Student Support" at EIPBN 2013
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28.05.2013
Conference award "Student Support" at EIPBN 2013
The contribution "Mix & Match Eelctron Beam & Scanning Probe Lithography for high troughput sub-10nm Lithography" by M. Kaestner, M. Hofer and I.W. Rangelow won the "Student Support" award at the EIPBN conference in Nashville, USA.