Publikationsliste FG Nanotechnologie

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Abedin, Saadman; Kurtash, Vladislav; Mathew, Sobin; Thiele, Sebastian; Jacobs, Heiko O.; Pezoldt, Jörg
Defects contributing to hysteresis in few-layer and thin-film MoS2 memristive devices. - In: Materials, ISSN 1996-1944, Bd. 17 (2024), 6, 1350, S. 1-14

Molybdenum disulfide, a two-dimensional material extensively explored for potential applications in non-von Neumann computing technologies, has garnered significant attention owing to the observed hysteresis phenomena in MoS2 FETs. The dominant sources of hysteresis reported include charge trapping at the channel-dielectric interface and the adsorption/desorption of molecules. However, in MoS2 FETs with different channel thicknesses, the specific nature and density of defects contributing to hysteresis remain an intriguing aspect requiring further investigation. This study delves into memristive devices with back-gate modulated channel layers based on CVD-deposited flake-based and thin-film-based MoS2 FETs, with a few-layer (FL) and thin-film (TF) channel thickness. Analysis of current-voltage (I−V) and conductance-frequency (Gp/ω−f) measurements led to the conclusion that the elevated hysteresis observed in TF MoS2 devices, as opposed to FL devices, stems from a substantial contribution from intrinsic defects within the channel volume, surpassing that of interface defects. This study underscores the significance of considering both intrinsic defects within the bulk and the interface defects of the channel when analyzing hysteresis in MoS2 FETs, particularly in TF FETs. The selection between FL and TF MoS2 devices depends on the requirements for memristive applications, considering factors such as hysteresis tolerance and scaling capabilities.



https://doi.org/10.3390/ma17061350
Schlag, Leslie;
Fundamentals and applications of gas phase electrodeposition. - Ilmenau : Universitätsbibliothek, 2024. - 1 Online-Ressource (147 Seiten)
Technische Universität Ilmenau, Dissertation 2024

In dieser Arbeit werden Grundlagen und Anwendungen der Gasphasen Elektrodeposition erarbeitet. Der Begriff steht für ein Zusammenspiel von Aerosolphysik und konventioneller Abscheidungstechnologie. Das aus einer Funkenentladung erzeugte Material wird durch einen Plasmastrahl direkt zu Punkten auf einem Substrat transportiert, wo sich das Material lokal oder in Mikrofilmen abscheidet. In dieser Arbeit wurden drei entscheidende theoretische Aspekte (i-iii) und drei praktische Aspekte (iv-vi) herausgearbeitet. (i) Die beiden Schlüsselparameter Funkenentladungsleistung und Trägergasfluss beeinflussen den von den geladenen Spezies getragenen elektrischen Strom, die erzeugte Masse/Größe der Nanopartikel und die resultierende Mikro-/Nanostrukturmorphologie. Langmuir-Sonden-Messungen zeigen mindestens zwei Transportzonen – eine vom Gasfluss dominierte und eine vom elektrischen Feld dominierte Zone. Die Gasströmung ist der Hauptfaktor, nicht nur für die Partikelgeschwindigkeit in der Transportzone, sondern auch für die Verteilung des elektrischen Potenzials und des elektrischen Feldes im Reaktor. In der Nähe des Substrats bildet sich ein elektrischer Feldgradient aus. Der Transport wechselt von der Gasströmung zum E-Feld. Die Komponente des elektrischen Feldes zeigt zur Oberfläche hin. (ii) Der elektrische Strom und die gravimetrische Analyse zeigen, dass die Stickstoff Ionen im Vergleich zu den erzeugten Metallpartikeln deutlich in der Überzahl sind. In Anbetracht der Mikro-/Nanostrukturmorphologie erweist sich die Leistung der Entladung als der wichtigste Parameter. Eine niedrige Funkenleistung in Verbindung mit einem geringen Gasfluss führt zu dendritischen Partikeln. Im Gegensatz dazu führt eine höhere Funkenleistung in Verbindung mit einem höheren Gasfluss zu kompakten Schichten. Dieses zweidimensionale Parameterfeld ermöglicht eine maßgeschneiderte Schichtmorphologie und Abscheiderate. (iii) Bei konstantem Gasdurchsatz führt ein kleinerer Reaktordurchmesser zu einem turbulenteren Strömungsverhalten. Dieses Verhalten ist unabhängig vom Gaseinlass, der die Partikelkonzentration im Plasmastrahl beeinflusst. Ein statistisches Modell führt zu einem besseren Verständnis der Gasphasen Elektrodeposition. Zusätzlich zur üblichen Standarddiffusion treten in eine bestimmte Richtung auch lange super-diffusive Flüge der erzeugten Teilchen auf, wenn ein zusätzliches elektrisches Feld vorhanden ist. Die gewonnenen theoretischen Erkenntnisse halfen bei der Gasphasen Elektrodeposition von (iv) Mikrofilmen, (v) lokalisierten selbstausrichtenden lateralen Metall-Nanobrücken und (vi) lokalisierten selbstausrichtenden vertikalen Leiterbahnen.



https://doi.org/10.22032/dbt.59621
Pikushina, Alena; Centeno, Luis Fernando; Stehr, Uwe; Jacobs, Heiko O.; Hein, Matthias
Electrical lengths and phase constants of stretchable coplanar transmission lines at GHz frequencies. - In: Flexible and printed electronics, ISSN 2058-8585, Bd. 9 (2024), 1, 015005, S. 1-12

Elastic, bendable and stretchable electronics establish a new and promising area of multi-physics engineering for a variety of applications, e.g. on wearables or in complex-shaped machine parts. While the area of metamorphic electronics has been investigated comprehensively, the behavior at radio frequencies (RFs), especially in the GHz range, is much less well studied. The mechanical deformation of the soft substrates, for instance, due to stretching, changes the geometrical dimensions and the electrical properties of RF transmission lines. This effect could be desirable in some cases, e.g. for smart devices with shape-dependent transmission or radiation characteristics, or undesirable in other cases, e.g. in feed and distribution networks due to the variable electrical lengths and thus phase variations. This contribution describes the results of a systematic study of the broadband RF properties of coplanar transmission lines on Ecoflex® substrates, based on numerical simulations and experimental data. Two types of stretchable transmission line structures were studied: Meander- and circular ring-segmented lines. Modeling and simulation were performed combining a 2D circuit simulation software with electromagnetic full-wave simulations. The experimental part of the work included the fabrication of metamorphic substrates metallized with thin copper layers and systematic measurements of the electrical lengths and phase constants of coplanar waveguides in the frequency range from 1 to 5 GHz based on vector network analysis for different stretching levels. With the given substrate technology, we succeeded in demonstrating stretchability up to a level of 21%, while the theoretical limit is expected at 57%. The meander- and circular-shaped line structures revealed markedly different sensitivities to the stretching level, which was lower for circular structures compared to the meander structures by approximately a factor of three.



https://doi.org/10.1088/2058-8585/ad1efd
Shekhawat, Deepshikha; Sindhani, Kashish; Raheja, Vishal Amarbhai; Baloochi, Mostafa; Isaac, Nishchay Angel; Pezoldt, Jörg
Modelling reaction transfer velocities in disconnected compact heterogeneous multilayer reactive material systems. - In: MRS advances, ISSN 2059-8521, Bd. 0 (2024), 0, S. 1-6

The tuning of the self-propagating reaction is studied theoretically by introducing a non-reactive material between two reactive material elements. For the study, the Ni/Al bilayer system was chosen. The Ni/Al elements were placed on a silicon wafer covered with a 1-µm-thick silicon dioxide. The spaces between the multilayer reactive material elements were filled with different non-reactive materials covering a wide range of thermal properties. On top of this heterogeneous layer, a 1-µm-thick sealing layer was placed consisting of the filler material. The carried out two-dimensional simulations demonstrated that embedding material allows to scale the ignition transfer time and the heat propagation velocity. For example, for a transfer length of 1 µm, the ignition time can be tuned from nano- to microseconds. Consequently, in contrast to previous results embedding materials allow scaling the properties of the self-propagating reaction in heterogeneous reactive material systems.



https://doi.org/10.1557/s43580-024-00822-3
Shekhawat, Deepshikha; Sulman, Muhammad; Breiter, Manuela; Pezoldt, Jörg
Controlling reaction transfer between Al/Ni reactive multilayer elements on substrates. - In: MRS advances, ISSN 2059-8521, Bd. 0 (2024), 0, S. 1-6

Reactive multilayers produce exothermic reaction with definite velocity and maximum temperature after ignition, which are the fundamental properties of the reactive multilayer systems. The generated heat with certain velocity makes it widely used in joining, bonding in the packaging, thermal batteries and many more applications. In this work, a distinct approach for achieving a reaction transfer between the reactive multilayers and different materials is demonstrated which can affect the generated temperature and velocity from the self-propagating properties of the reaction. For these intensions, we fabricated the Al/Ni reactive elements with certain separations between elements which allow to observe the reaction front transfer and emitted temperature in the reaction chain. The created separation between reactive elements are periodical and ordered systems with different thermal conductive properties. The temperature and definite velocity were measured by time-resolved pyrometer and high-speed camera measurements. SEM analysis showed the characteristics of the reaction transfer between reactive multilayer elements. It is predicted that: (I) The reaction front stops at a space with critical length; (II) Reducing heat loss through the substrate supports reaction front propagation through spaces; (III) Thermal property design of the spaces between the reactive elements enables property modification of the self-propagating reaction.



https://doi.org/10.1557/s43580-024-00804-5
Wang, Honglei; Bo, Yifan; Klingenhof, Malte Philipp Helmuth; Peng, Jiali; Wang, Dong; Wu, Bing; Pezoldt, Jörg; Cheng, Pengfei; Knauer, Andrea; Hua, Weibo; Wang, Hongguang; Aken, Peter Antonie van; Sofer, Zdeněk; Strasser, Peter; Guldi, Dirk; Schaaf, Peter
A universal design strategy based on NiPS3 nanosheets towards efficient photothermal conversion and solar desalination. - In: Advanced functional materials, ISSN 1616-3028, Bd. 34 (2024), 8, 2310942, S. 1-11

2D nanomaterials are proposed as promising photothermal materials for interfacial photothermal water evaporation. However, low evaporation efficiency, the use of hazardous hydrofluoric solution, and poor stability severely limit their practical applications. Here, a mixed solvent exfoliation surface deposition (MSESD) strategy for the preparation of NiPS3 nanosheets and NiPS3/polyvinyl alcohol (PVA) converter is successfully developed. The converter is obtained by drop-casting the NiPS3/PVA nanosheets onto a sponge. The PVA is mainly deposited on the edge of NiPS3 nanosheets, which not only improves the stability of NiPS3 nanosheets, but also adheres to the sponge to prepare a 3D photothermal converter, which shows an evaporation rate of 1.48 kg m−2 h−1 and the average photothermal conversion efficiency (PTCE) of 93.5% under a light intensity of 1 kW m−2. The photothermal conversion mechanism reveals that the energy of absorbed photons in NiPS3 nanosheets can be effectively converted into heat through non-radiative photon transitions as well as multiple optical interactions. To the best of the knowledge, this is the first report on the application of 2D metal-phosphorus-chalcogen (MPChx) for solar desalination, which provides new insights and guidance for the development of high-performance 2D photothermal materials.



https://doi.org/10.1002/adfm.202310942
Reuter, Christoph; Ecke, Gernot; Strehle, Steffen
Exploring the surface oxidation and environmental instability of 2H-/1T’-MoTe2 using field emission based scanning probe lithography. - In: Advanced materials, ISSN 1521-4095, Bd. 36 (2024), 4, 2310887, S. 1-14

An unconventional approach for the resistless nanopatterning 2H- and 1T’-MoTe2 by means of scanning probe lithography is presented. A Fowler-Nordheim tunneling current of low energetic electrons (E = 30-60 eV) emitted from the tip of an atomic force microscopy (AFM) cantilever is utilized to induce a nanoscale oxidation on a MoTe2 nanosheet surface under ambient conditions. Due to the water solubility of the generated oxide, a direct pattern transfer into the MoTe2 surface can be achieved by a simple immersion of the sample in deionized water. The tip-grown oxide was characterized using Auger electron and Raman spectroscopy, revealing it consists of amorphous MoO3/MoOx as well as TeO2/TeOx. With the presented technology in combination with subsequent AFM imaging it was possible to demonstrate a strong anisotropic sensitivity of 1T’-/(Td)-MoTe2 to aqueous environments. We finally used the discussed approach to structure a nanoribbon field effect transistor out of a few-layer 2H-MoTe2 nanosheet. This article is protected by copyright. All rights reserved



https://doi.org/10.1002/adma.202310887
Mathew, Sobin; Reiprich, Johannes; Narasimha, Shilpashree; Abedin, Saadman; Kurtash, Vladislav; Thiele, Sebastian; Scheler, Theresa; Hähnlein, Bernd; Schaaf, Peter; Jacobs, Heiko O.; Pezoldt, Jörg
Gate-tunable hysteresis response of field effect transistor based on sulfurized Mo. - In: AIP Advances, ISSN 2158-3226, Bd. 13 (2023), 9, 095224, S. 095224-1-095224-7

Hysteresis effects and their tuning with electric fields and light were studied in thin film molybdenum disulfide transistors fabricated from sulfurized molybdenum films. The influence of the back-gate voltage bias, voltage sweep range, illumination, and AlOx encapsulation on the hysteresis effect of the back-gated field effect transistors was studied and quantified. This study revealed the distinctive contribution of MoS2 surface, MoS2/SiO2 interface defects and their associated traps as primary sources of of hysteresis.



https://doi.org/10.1063/5.0165868
Mejia Chueca, Maria del Carmen; Graske, Marcus; Winter, Andreas; Baumer, Christoph; Stich, Michael; Mattea, Carlos; Ispas, Adriana; Isaac, Nishchay Angel; Schaaf, Peter; Stapf, Siegfried; Jacobs, Heiko O.; Bund, Andreas
Electrodeposition of reactive aluminum-nickel coatings in an AlCl3:[EMIm]Cl ionic liquid containing nickel nanoparticles. - In: Journal of the Electrochemical Society, ISSN 1945-7111, Bd. 170 (2023), 7, 072504

The electrodeposition of aluminum-nickel coatings was performed by pulsed direct current in the ionic liquid (IL) 1.5:1 AlCl3:EMIm]Cl containing nickel nanoparticles (Ni NPs), for reactive dispersion coating application. Several electrochemical and characterization techniques were used to shed more light on the mechanism of Ni particle incorporation into the Al matrix. Thus, particle incorporation at the early stage of the deposition would mainly take place via particle adsorption at the substrate. However, as the thickness of the coating increases, it seems that the main mechanism for particle incorporation is via the reduction of ions adsorbed at the particles surface. Although a considerable high incorporation of Ni NPs has been achieved from the IL containing the highest concentration of Ni NPs (i.e. ∼33 wt% from a 20 g/L of Ni NPs bath), a high concentration of NPs in the IL resulted having a negative effect in terms of quality of the coatings, due to solidification of the electrolyte in a poorly conductive compound. Moreover, almost equivalent amounts of Ni and Al (Ni ∼45 wt.%and Al ∼44 wt.%) have been detected in some areas of the coatings. Such a layer composition would be desired for the targeted application.



https://doi.org/10.1149/1945-7111/ace382
Hossain, Mohammad Mobassar; Schlag, Leslie; Wolz, Benedikt; Ziegler, Mario; Nahrstedt, Helene; Reichel, Helene; Pezoldt, Jörg; Jacobs, Heiko O.
Ruthenium and rhodium vertical interconnect formation using gas phase electrodeposition. - In: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM) (IITC/MAM), (2023), insges. 3 S.

This paper presents localized gas phase electrodeposition of ruthenium (Ru) and rhodium (Rh) species into vertical interconnects. A spark discharge generates gas ions and charged species of the desired metal, which are transported by a gas flow and form a plasma jet. Prior lateral nano-bridge growth is further developed and enables the localized metal species deposition into vertical interconnect openings. This approach is additive and saves rare materials during processing. The process allows precise adjustment of the diameter, airgap size, and top finishing bump of the vertical interconnect.



https://doi.org/10.1109/IITC/MAM57687.2023.10154806
Isaac, Nishchay Angel; Schlag, Leslie; Ispas, Adriana; Reiprich, Johannes; Soydan, Alper K.; Moreira, Pedro H. O.; Thiele, Sebastian; Aliabadian, Bardia; Flock, Dominik; Knauer, Andrea; Jiménez, Juan J.; Bund, Andreas; Morales Sánchez, Francisco Miguel; Pezoldt, Jörg; Jacobs, Heiko O.
Novel gas phase route toward patterned deposition of sputter-free Pt/Al nanofoils. - In: Advanced Materials Technologies, ISSN 2365-709X, Bd. 8 (2023), 18, 2300448, S. 1-8

This article reports a new approach toward fabrication and directed assembly of nanoparticulate reactive system (Nanofoils) on patterned substrates. Different from current state-of-the-art, gas phase electrodeposition uses nanoparticles instead of atoms to form densely packed multilayered thin films at room temperature-pressure. On ignition, the multilayer system undergoes an exothermic self-propagating reaction. The numerous contact points between two metallic nanoparticulate layers aid in high heat release. Sub-10-nm Platinum (Pt) and Aluminum (Al) particles are synthesized through cathode erosion of metal electrodes in a flow of pure nitrogen gas (spark ablation). Pt/Al bilayer stacks with total thickness of 3–8 µm undergo self-propagating reaction with a 10.3 mm s−1 wavefront velocity on local ignition. The reaction wavefront is captured using high speed videography. Calorimetry studies reveal two exothermic peaks suggesting Pt/Al alloy formation. The peak at 135 ˚C has a higher calorific value of 150 mW g−1 while the peak at 400 ˚C has a 12 mW g−1 exothermic peak. X-ray diffraction study shows reaction-products are cubic Al2Pt with small quantities of orthorhombic Al6Pt and orthorhombic AlPt2. Electron microscopy studies help draw a correlation between film morphology, bimetallic interface, nanoparticle oxidation, and self-propagating reaction kinetics that is significant in broadening our understanding towards nanoparticulate reactive systems.



https://doi.org/10.1002/admt.202300448
Mathew, Sobin; Abedin, Saadman; Kurtash, Vladislav; Lebedev, Sergei P.; Lebedev, Alexander A.; Hähnlein, Bernd; Stauffenberg, Jaqueline; Jacobs, Heiko O.; Pezoldt, Jörg
Evaluation of hysteresis response in achiral edges of graphene nanoribbons on semi-insulating SiC. - In: Materials science forum, ISSN 1662-9752, Bd. 1089 (2023), S. 15-22

Hysteresis response of epitaxially grown graphene nanoribbons devices on semi-insulating 4H-SiC in the armchair and zigzag directions is evaluated and studied. The influence of the orientation of fabrication and dimensions of graphene nanoribbons on the hysteresis effect reveals the metallic and semiconducting nature graphene nanoribbons. The hysteresis response of armchair based graphene nanoribbon side gate and top gated devices implies the influence of gate field electric strength and the contribution of surface traps, adsorbents, and initial defects on graphene as the primary sources of hysteresis. Additionally, passivation with AlOx and top gate modulation decreased the hysteresis and improved the current-voltage characteristics.



https://doi.org/10.4028/p-i2s1cm
Mathew, Sobin; Reiprich, Johannes; Narasimha, Shilpashree; Abedin, Saadman; Kurtash, Vladislav; Thiele, Sebastian; Hähnlein, Bernd; Scheler, Theresa; Flock, Dominik; Jacobs, Heiko O.; Pezoldt, Jörg
Three-dimensional MoS2 nanosheet structures: CVD synthesis, characterization, and electrical properties. - In: Crystals, ISSN 2073-4352, Bd. 13 (2023), 3, 448, S. 1-14

The proposed study demonstrates a single-step CVD method for synthesizing three-dimensional vertical MoS2 nanosheets. The postulated synthesizing approach employs a temperature ramp with a continuous N2 gas flow during the deposition process. The distinctive signals of MoS2 were revealed via Raman spectroscopy study, and the substantial frequency difference in the characteristic signals supported the bulk nature of the synthesized material. Additionally, XRD measurements sustained the material’s crystallinity and its 2H-MoS2 nature. The FIB cross-sectional analysis provided information on the origin and evolution of the vertical MoS2 structures and their growth mechanisms. The strain energy produced by the compression between MoS2 islands is assumed to primarily drive the formation of vertical MoS2 nanosheets. In addition, vertical MoS2 structures that emerge from micro fissures (cracks) on individual MoS2 islands were observed and examined. For the evaluation of electrical properties, field-effect transistor structures were fabricated on the synthesized material employing standard semiconductor technology. The lateral back-gated field-effect transistors fabricated on the synthesized material showed an n-type behavior with field-effect mobility of 1.46 cm2 V^-1 s^-1 and an estimated carrier concentration of 4.5 × 10^12 cm^-2. Furthermore, the effects of a back-gate voltage bias and channel dimensions on the hysteresis effect of FET devices were investigated and quantified.



https://doi.org/10.3390/cryst13030448
Shekhawat, Deepshikha; Sudhahar, Dwarakesh; Döll, Joachim; Grieseler, Rolf; Pezoldt, Jörg
Phase formation of cubic silicon carbide from reactive silicon-carbon multilayers. - In: MRS advances, ISSN 2059-8521, Bd. 8 (2023), 9, S. 494-498

Silicon carbide layers were fabricated using self-propagating high-temperature synthesis of binary silicon-carbon based reactive multilayers. The silicon and carbon bilayers were fabricated with two different bilayer thicknesses. They are deposited by magnetron sputtering in an alternating layer system with a total thickness of 1 μm. The entire system is annealed by rapid thermal annealing at different temperatures ranging from 500 to 1100 ˚C. From XRD analysis we could find that the formation of the silicon carbide phase was initiated from 700 ˚C. With increasing bilayer thickness the silicon carbide phase formation was partially suppressed by the silicon recrystallization due to resulting lower carbon diffusion into silicon. The transformation process proceeds in a four-step process: densification/recrystallization, interdiffusion, nucleation and transformation. From this, it was noted that when compared to low bilayer thickness samples, the formation of the silicon carbide phase is delayed with increasing bilayer thickness and needs higher reaction initiation temperatures.



https://doi.org/10.1557/s43580-023-00531-3
Kurtash, Vladislav; Jacobs, Heiko O.; Pezoldt, Jörg
Energy-efficient operation conditions of MoS2-based memristors. - In: Physica status solidi, ISSN 1862-6319, Bd. 220 (2023), 13, 2200893, S. 1-12

Sufficient energy consumption for conventional information processing makes it necessary to look for new computational methods. One of the possible solutions to this problem is neuromorphic computations using memristive devices. Memristors based on molybdenum disulfide (MoS2) are a promising way to provide a sizeable amount of hysteresis at low energy costs. Herein, different configurations of MoS2 memristors as well as the mechanisms involved in hysteresis formation are shown. Bottom gated configuration is beneficial in terms of hysteresis area and energy efficiency. The impact of device channel dimensions on the hysteresis area and energy consumption is discussed. Different operation conditions with triangular, rectangular, sinusoidal, and sawtooth drain-to-source pulses are simulated, and rectangular pulses demonstrate the highest energy efficiency. The study shows the potential to realize low-power neuromorphic systems using MoS2 memristive devices.



https://doi.org/10.1002/pssa.202200893
Shekhawat, Deepshikha; Baloochi, Mostafa; Sudhahar, Dwarakesh; Raheja, Vishal Amarbhai; Döll, Joachim; Jacobs, Heiko O.; Pezoldt, Jörg
Influence of environment on self-propagating reactions in Al/Ni multilayer foils. - In: MRS advances, ISSN 2059-8521, Bd. 8 (2023), 9, S. 477-483

Reactive aluminum-nickel multilayer system shows exothermic energetic materials which act as a heat source for packaging and bonding of microsystems. The main challenge is controlling the self-propagation reaction velocity and temperature generated by thermal management through different thermal conductive substrate materials. The current work investigates the heat distribution of Al/Ni multilayer foils from different thermal conductive substrates which act as heat sink materials during the self-propagating reaction. A two-dimensional numerical model was developed to study thermal conductive heat loss and substrate thermal properties on the self-propagating reaction in Al/Ni multilayer foils. The self-propagating reaction was introduced on the surface of the foils by an electrical spark. Here we investigate the minimum critical thickness of Al/Ni multilayer foils which shows the self-propagation reaction on different substrates and verified from the two-dimensional numerical model. The outcomes of this investigation will facilitate the integration of Al/Ni multilayer foils on different substrates as intrinsic heat sources for different applications of micro/nanodevices.



https://doi.org/10.1557/s43580-023-00574-6
Schlag, Leslie; Isaac, Nishchay Angel; Hossain, Mohammad M.; Hess, Anna-Lena; Wolz, Benedikt C.; Reiprich, Johannes; Ziegler, Mario; Pezoldt, Jörg; Jacobs, Heiko O.
Self-aligning metallic vertical interconnect access formation through microlensing gas phase electrodeposition controlling airgap and morphology. - In: Advanced electronic materials, ISSN 2199-160X, Bd. 9 (2023), 1, 2200838, S. 1-8

This publication reports self-aligning metallic via microlensing gas phase electrodeposition formation. Key operational parameters to fabricate vertical ruthenium and rhodium interconnects (via) with a diameter of 100 nm are discussed. Moreover, airgaps are implemented during the deposition process, which utilizes spark discharge to generate a flux of charged nanoparticles. An inert gas flow transports the nanoparticles through a reactor chamber close to the target substrate. The substrate uses a pre-patterned resist with openings to a silicon/silicon dioxide/metal stack to direct the deposition of the nanoparticles to form localized self-aligning vertical interconnects. Five process parameters were identified, which impact the morphology and conductance of the resulting interconnects: spark discharge power, gas flow rate, microlens via dimensions, substrate surface potential, and in situ flash lamp power. This parameter set enables a controlled adjustment of the via interconnect morphology and its minimum feature size. Gas flow rate in combination with spark discharge power contribute significantly to the morphology of the interconnect. Spark power and microlens via dimensions have the largest influence on the surface potential of the insulating resist cover, which enables a localized microlensing gas phase electrodeposition of a via with a controlled ratio between conducting diameter and airgap.



https://doi.org/10.1002/aelm.202200838
Zahn, Diana; Landers, Joachim; Buchwald, Juliana; Diegel, Marco; Salamon, Soma; Müller, Robert; Köhler, Moritz; Ecke, Gernot; Wende, Heiko; Dutz, Silvio
Large single domain iron oxide nanoparticles as thermal markers for lateral flow assays. - In: Biomedical engineering, ISSN 1862-278X, Bd. 67 (2022), S. 63

https://doi.org/10.1515/bmt-2022-2001
Kurtash, Vladislav; Mathew, Sobin; Thiele, Sebastian; Scheler, Theresa; Reiprich, Johannes; Hähnlein, Bernd; Stauffenberg, Jaqueline; Manske, Eberhard; Narasimha, Shilpashree; Abedin, Saadman; Jacobs, Heiko O.; Pezoldt, Jörg
Hysteresis associated with intrinsic-oxide traps in gate-tunable tetrahedral CVD-MoS2 memristor. - In: IEEE 22nd International Conference on Nanotechnology (NANO), (2022), S. 527-530

We introduce back gated memristor based on CVD-grown 30-40 nm thick MoS2 channel. The device demonstrates bipolar behaviour and the measurements are consistent with the simulations performed within the intrinsic-oxide traps model. This confirms the theory that the source of hysteresis in thin-film MoS2 memristors is charge trapping on MoS2/SiO2 interface and the grain boundaries. The impact of back gate voltage bias, voltage sweep range and channel area on memristive effect was studied and quantified using hysteresis area. Hysteresis in bipolar memristors can be tuned by back gate voltage, which makes these devices promising for neuromorphic computing.



https://doi.org/10.1109/NANO54668.2022.9928717
Mathew, Sobin; Narasimha, Shilpashree; Reiprich, Johannes; Scheler, Theresa; Hähnlein, Bernd; Thiele, Sebastian; Stauffenberg, Jaqueline; Kurtash, Vladislav; Abedin, Saadman; Manske, Eberhard; Jacobs, Heiko O.; Pezoldt, Jörg
Formation and characterization of three-dimensional tetrahedral MoS2 thin films by chemical vapor deposition. - In: Crystal growth & design, ISSN 1528-7505, Bd. 22 (2022), 9, S. 5229-5238

A method to synthesize the three-dimensional arrangement of bulk tetrahedral MoS2 thin films by solid source chemical vapor deposition of MoO3 and S is presented. The developed synthesizing recipe uses a temperature ramping with a constant N2 gas flow in the deposition process to grow tetrahedral MoS2 thin film layers. The study analyses the time-dependent growth morphologies, and the results are combined and presented in a growth model. A combination of optical, electron, atomic force microscopy, Raman spectroscopy, and X-ray diffraction are used to study the morphological and structural features of the tetrahedral MoS2 thin layers. The grown MoS2 is c-axis oriented 2H-MoS2. Additionally, the synthesized material is further used to fabricate back-gated field-effect transistors (FETs). The fabricated FET devices on the tetrahedral MoS2 show on/off current ratios of 10^6 and mobility up to ∼56 cm^2 V^-1 s^-1 with an estimated carrier concentration of 4 × 10^16 cm-3 for VGS = 0 V.



https://doi.org/10.1021/acs.cgd.2c00333
Hähnlein, Bernd; Kellner, Maria; Krey, Maximilian; Nikpourian, Alireza; Pezoldt, Jörg; Michael, Steffen; Töpfer, Hannes; Krischok, Stefan; Tonisch, Katja
The angle dependent ΔE effect in TiN/AlN/Ni micro cantilevers. - In: Sensors and actuators, ISSN 1873-3069, Bd. 345 (2022), 113784, S. 1-12

In this work, magnetoelectric MEMS sensors based on a TiN/AlN/Ni laminate are investigated for the first time in regards of the anisotropic elastic properties when using hard magnetic Nickel as magnetostrictive layer. The implications of crystalline, uniaxial and shape anisotropy are analysed arising from the anisotropic ΔE effect in differently oriented cantilevers with 25 µm length and 15˚ spacing. The ΔE effect is derived analytically to consider the angular dependency of the different anisotropies within the sensors. In the measured frequency spectra complex profiles are observable consisting of contributions from neighbouring structures which are connected by a common electrode. The crosstalk effect is strongly depending on the cantilever orientation and reflects the anisotropic mechanical properties of the material stack. The intensity of the crosstalk effect is increasing for shortened cantilevers and narrowing distance between structures. The ΔE effect is investigated based on cantilevers of different angular spacing and of a single cantilever that is rotated in the magnetic field. The derived peak sensitivities are reaching values of 1.15 and 1.31T-1. The angular dependency of the sensitivity is found to be approximately constant for differently oriented cantilevers. In contrast, for a singly rotated cantilever an angular dependency of the 4th order is observed.



https://doi.org/10.1016/j.sna.2022.113784
Grieseler, Rolf; Gallino, Isabella; Duboiskaya, Natallia; Döll, Joachim; Shekhawat, Deepshikha; Reiprich, Johannes; Guerra, Jorge A.; Hopfeld, Marcus; Honig, Hauke; Schaaf, Peter; Pezoldt, Jörg
Silicon carbide formation in reactive silicon-carbon multilayers. - In: Materials science forum, ISSN 1662-9752, Bd. 1062 (2022), S. 44-48

An alternative low thermal budget silicon carbide syntheses route is presented. The method is based on self-propagating high-temperature synthesis of binary silicon-carbon-based reactive mul­tilayers. With this technique, it is possible to obtain cubic polycrystalline silicon carbide at relatively low annealing temperatures by a solid state reaction. The reaction starts above 600 ˚C. The transformation process proceeds in a four-step process. The reaction enthalpy was determined to be (-70 ± 4) kJ/mol.



https://doi.org/10.4028/p-7u1v90
Mathew, Sobin; Lebedev, Sergey P.; Lebedev, Alexander A.; Hähnlein, Bernd; Stauffenberg, Jaqueline; Manske, Eberhard; Pezoldt, Jörg
Silicon carbide - graphene nano-gratings on 4H and 6H semi-insulating SiC. - In: Materials science forum, ISSN 1662-9752, Bd. 1062 (2022), S. 170-174

A technical methodology of fabrication of hierarchically scaled multitude graphene nanogratings with varying pitches ranging from the micrometer down to sub 40 nm scale combined with sub 10 nm step heights on 4H and 6H semi-insulating SiC for length scale measurements is proposed. The nanogratings were fabricated using electron-beam lithography combined with dry etching of graphene, incorporating a standard semiconductor processing technology. A scientific evaluation of critical dimension, etching step heights, and surface characterization of graphene nanograting on both polytypes were compared and evaluated.



https://doi.org/10.4028/p-wn4zya
Kurtash, Vladislav; Thiele, Sebastian; Mathew, Sobin; Jacobs, Heiko O.; Pezoldt, Jörg
Designing MoS2 channel properties for analog memory in neuromorphic applications. - In: Journal of vacuum science & technology, ISSN 2166-2754, Bd. 40 (2022), 3, S. 030602-1-030602-5

In this paper, we introduce analog nonvolatile random access memory cells for neuromorphic computing. The analog memory cell MoS2 channel is designed based on the simulation model including Fowler-Nordheim tunneling through a charge-trapping stack, trapping process, and transfer characteristics to describe a full write/read circle. 2D channel materials provide scaling to higher densities as well as preeminent modulation of the conductance by the accumulated space charge from the oxide trapping layer. In this paper, the main parameters affecting the distribution of memory states and their total number are considered. The dependence of memory state distribution on channel doping concentration and the number of layers is given. In addition, how the nonlinearity of memory state distribution can be overcome by variation of operating conditions and by applying pulse width modulation to the bottom gate voltage is also shown.



https://doi.org/10.1116/6.0001815
Shekhawat, Deepshikha; Vauth, Maximilian; Pezoldt, Jörg
Size dependent properties of reactive materials. - In: Inorganics, ISSN 2304-6740, Bd. 10 (2022), 4, 56, S. 1-19

The nature of the self-sustained reaction of reactive materials is dependent on the physical, thermal, and mechanical properties of the reacting materials. These properties behave differently at the nano scale. Low-dimensional nanomaterials have various unusual size dependent transport properties. In this review, we summarize the theoretical and experimental reports on the size effect on melting temperature, heat capacity, reaction enthalpy, and surface energy of the materials at nano scale because nanomaterials possess a significant change in large specific surface area and surface effect than the bulk materials. According to the theoretical analysis of size dependent thermodynamic properties, such as melting temperature, cohesive energy, thermal conductivity and specific heat capacity of metallic nanoparticles and ultra-thin layers varies linearly with the reciprocal of the critical dimension. The result of this scaling relation on the material properties can affect the self-sustained reaction behavior in reactive materials. Resultant, powder compacts show lower reaction propagation velocities than bilayer system, if the particle size of the reactants and the void density is decreased an increase of the reaction propagation velocity due to an enhanced heat transfer in reactive materials can be achieved. Standard theories describing the properties of reactive material systems do not include size effects.



https://doi.org/10.3390/inorganics10040056
Isaac, Nishchay Angel; Pikaar, Ilje; Biskos, George
Metal oxide semiconducting nanomaterials for air quality gas sensors: operating principles, performance, and synthesis techniques. - In: Microchimica acta, ISSN 1436-5073, Bd. 189 (2022), 5, 196, S. 1-22

To meet requirements in air quality monitoring, sensors are required that can measure the concentration of gaseous pollutants at concentrations down to the ppb and ppt levels, while at the same time they exhibiting high sensitivity, selectivity, and short response/recovery times. Among the different sensor types, those employing metal oxide semiconductors (MOSs) offer great promises as they can be manufactured in easy/inexpensive ways, and designed to measure the concentration of  a wide range of target gases. MOS sensors rely on the adsorption of target gas molecules on the surface of the sensing material and the consequent capturing of electrons from the conduction band that in turn affects their conductivity. Despite their simplicity and ease of manufacturing, MOS gas sensors are restricted by high limits of detection (LOD; which are typically in the ppm range) as well as poor sensitivity and selectivity. LOD and sensitivity can in principle be addressed by nanostructuring the MOSs, thereby increasing their porosity and surface-to-volume ratio, whereas selectivity can be tailored through their chemical composition. In this paper we provide a critical review of the available techniques for nanostructuring MOSs using chemiresistive materials, and discuss how these can be used to attribute desired properties to the end gas sensors. We start by describing the operating principles of chemiresistive sensors, and key material properties that define their performance. The main part of the paper focuses on the available methods for synthesizing nanostructured MOSs for use in gas sensors. We close by addressing the current needs and provide perspectives for improving sensor performance in ways that can fulfill requirements for air quality monitoring.



https://doi.org/10.1007/s00604-022-05254-0
Thiele, Sebastian; Eliseyev, Ilya A.; Smirnov, Alexander N.; Jacobs, Heiko O.; Davydov, Valery Y.; Schwierz, Frank; Pezoldt, Jörg
Electric bias-induced edge degradation of few-layer MoS2 devices. - In: Materials today, ISSN 2214-7853, Bd. 53 (2022), 2, S. 281-284

In this work, we experimentally investigate the effects of electric bias on the degradation of few-layer MoS2 back-gated field-effect transistors in ambient air. The devices were fabricated using mechanically exfoliated MoS2 flakes, which were transferred to a Si/SiO2 substrate by a PDMS-based transfer. We report an accelerated electric bias-induced degradation of the devices under investigation and used optical and scanning electron microscopy (SEM) to monitor changes of the morphology of the MoS2 channel. In particular, we found a linear dependency of the degradation on the electric field between the Ti/Au source and drain contacts. In addition, we identify four regions in which morphological changes occur, of which the edges of the MoS2 channel are most affected.



https://doi.org/10.1016/j.matpr.2021.05.298
Mathew, Sobin; Lebedev, Sergey P.; Lebedev, Alexander A.; Hähnlein, Bernd; Stauffenberg, Jaqueline; Udas, Kashyap; Jacobs, Heiko O.; Manske, Eberhard; Pezoldt, Jörg
Nanoscale surface morphology modulation of graphene - i-SiC heterostructures. - In: Materials today, ISSN 2214-7853, Bd. 53 (2022), 2, S. 289-292

A multitude gratings design consists of gratings with different pitches ranging from the micrometre down to sub 40 nm scale combined with sub 10 nm step heights modulating the surface morphology for length scale measurements is proposed. The surface morphology modulation was performed using electron beam lithography incorporating a standard semiconductor processing technology. The critical dimension, edge roughness, step heights and line morphology in dependence on the grating pitch is studied.



https://doi.org/10.1016/j.matpr.2021.06.427
Reiprich, Johannes;
Localized and programmable material transport and deposition by corona discharge. - Ilmenau : Universitätsbibliothek, 2022. - 1 Online-Ressource (xiii, 133, XXIX Seiten)
Technische Universität Ilmenau, Dissertation 2022

Der Transport von Materialien und Gütern bestimmt unseren Alltag. Materialtransport passiert in globalen Logistikunternehmen, in Fertigungslinien, in alltäglichen Situationen wie dem Einkaufen und selbst in unserem menschlichen Körper. Zu jedem Zeitpunkt werden Materialien von A nach B transportiert, ohne dass uns dies in vielen Situationen bewusst wird. Mit dem Unterschreiten von Größenordnungen im Mikro- und Nanometerbereich wird ein gezielter Materialtransport zu einer Herausforderung, da eine manuelle Manipulation nicht mehr möglich ist. Dennoch wäre es wünschenswert, wenn wir gezielt Material an einen gewünschten Ort transportieren und dort abscheiden könnten, denn diese Lokalisierung wird in vielen Anwendungsfeldern benötigt, um z.B. physikalische Eigenschaften auszunutzen oder chemische oder biologische Reaktionen auszulösen. Daher soll in dieser Arbeit eine Methode zum lokalisierten Materialtransport im Mikro- und Nanometerbereich vorgestellt werden. Diese Methode basiert auf elektrischen Kräften. Einfach ausgedrückt, laden wir ein beliebiges Material elektrisch auf und können es dann in einem elektrischen Feld manipulieren. Negativ geladenes Material wird von negativ geladenen Flächen abgestoßen und von positiv geladenen Flächen angezogen. So lässt sich ein gerichteter Materialtransport erzeugen. Das Material wird mithilfe einer negativen DC Corona-Entladung aufgeladen. Durch die Strukturierung von isolierenden Flächen auf leitfähigen Substraten lassen sich sogenannte elektrodynamische Trichter erzeugen, die das geladene Material zu den gewünschten Orten führen, es dort konzentrieren und abscheiden. Die Nutzung von elektrischen Kräften ermöglicht zudem eine Programmierbarkeit, da durch das Ändern der elektrischen Felder oder durch An- und Ausschalten von Elektroden die Position der Abscheidung, die Abscheideart oder die Abscheiderate geändert werden kann. Die Nutzung der Corona-Entladung ermöglicht eine hohe Freiheit bei der Materialwahl. Die Abscheidung von Metallen, Halbleitern, Isolatoren und biologischen Materialien in einem Größenbereich von Mikropartikeln bis hin zu einzelnen Molekülen wird gezeigt. Die Anwendungsgebiete der vorgestellten Methode sind vielfältig: Sie reichen von Luftüberwachung, Nanodrahtwachstum, Gassensorik bis hin zur Kristallzucht. Die experimentellen Ergebnisse werden mit elektrischen, optischen und materialspezifischen Analysen verifiziert. Darüber hinaus werden Simulationen durchgeführt, um die Art der Lokalisierung zu demonstrieren.



https://doi.org/10.22032/dbt.51508
Zahn, Diana; Landers, Joachim; Buchwald, Juliana; Diegel, Marco; Salamon, Soma; Müller, Robert; Köhler, Moritz; Ecke, Gernot; Wende, Heiko; Dutz, Silvio
Ferrimagnetic large single domain iron oxide nanoparticles for hyperthermia applications. - In: Nanomaterials, ISSN 2079-4991, Bd. 12 (2022), 3, 343, S. 1-12

This paper describes the preparation and obtained magnetic properties of large single domain iron oxide nanoparticles. Such ferrimagnetic particles are particularly interesting for diagnostic and therapeutic applications in medicine or (bio)technology. The particles were prepared by a modified oxidation method of non-magnetic precursors following the green rust synthesis and characterized regarding their structural and magnetic properties. For increasing preparation temperatures (5 to 85 ˚C), an increasing particle size in the range of 30 to 60 nm is observed. Magnetic measurements confirm a single domain ferrimagnetic behavior with a mean saturation magnetization of ca. 90 Am2/kg and a size-dependent coercivity in the range of 6 to 15 kA/m. The samples show a specific absorption rate (SAR) of up to 600 W/g, which is promising for magnetic hyperthermia application. For particle preparation temperatures above 45 ˚C, a non-magnetic impurity phase occurs besides the magnetic iron oxides that results in a reduced net saturation magnetization.



https://doi.org/10.3390/nano12030343
Baloochi, Mostafa; Shekhawat, Deepshikha; Riegler, Sascha Sebastian; Matthes, Sebastian; Glaser, Marcus; Schaaf, Peter; Bergmann, Jean Pierre; Gallino, Isabella; Pezoldt, Jörg
Influence of initial temperature and convective heat loss on the self-propagating reaction in Al/Ni multilayer foils. - In: Materials, ISSN 1996-1944, Bd. 14 (2021), 24, 7815, insges. 15 S.

A two-dimensional numerical model for self-propagating reactions in Al/Ni multilayer foils was developed. It was used to study thermal properties, convective heat loss, and the effect of initial temperature on the self-propagating reaction in Al/Ni multilayer foils. For model adjustments by experimental results, these Al/Ni multilayer foils were fabricated by the magnetron sputtering technique with a 1:1 atomic ratio. Heat of reaction of the fabricated foils was determined employing Differential Scanning Calorimetry (DSC). Self-propagating reaction was initiated by an electrical spark on the surface of the foils. The movement of the reaction front was recorded with a high-speed camera. Activation energy is fitted with these velocity data from the high-speed camera to adjust the numerical model. Calculated reaction front temperature of the self-propagating reaction was compared with the temperature obtained by time-resolved pyrometer measurements. X-ray diffraction results confirmed that all reactants reacted and formed a B2 NiAl phase. Finally, it is predicted that (1) increasing thermal conductivity of the final product increases the reaction front velocity; (2) effect of heat convection losses on reaction characteristics is insignificant, e.g., the foils can maintain their characteristics in water; and (3) with increasing initial temperature of the foils, the reaction front velocity and the reaction temperature increased.



https://doi.org/10.3390/ma14247815
Zgheib, Charbel; Lubov, Maxim N.; Kulikov, Dmitri V.; Kharlamov, Vladimir S.; Thiele, Sebastian; Morales Sánchez, Francisco Miguel; Romanus, Henry; Rahbany, Nancy; Beainy, Georges; Stauden, Thomas; Pezoldt, Jörg
Chemoheteroepitaxy of 3C-SiC(111) on Si(111): influence of predeposited Ge on structure and composition. - In: Physica status solidi, ISSN 1862-6319, Bd. 218 (2021), 24, 2100399, S. 1-10

Secondary ion mass spectroscopy, Fourier transformed infrared spectroscopy, ellipsometry, reflection high energy diffraction and transmission electron microscopy are used to gain inside into the effect of Ge on the formation of ultrathin 3C-SiC layers on Si(111) substrates. Accompanying the experimental investigations with simulations it is found that the ultrathin single crystalline 3C-SiC layer is formed on top of a gradient Si1-x-yGexCy buffer layer due to a complex alloying and alloy decomposition processes promoted by carbon and germanium interdiffusion and SiC nucleation. This approach allows tuning residual stress at very early growth stages as well as the interface properties of the 3C-SiC/Si heterostructure. Useful yields of secondary ions of Ge in Si matrix and Si dimer are estimated.



https://doi.org/10.1002/pssa.202100399
Eliseyev, Ilya A.; Galimov, Aidar I.; Rakhlin, Maxim V.; Evropeitsev, Evgenii A.; Toropov, Aleksej A.; Davydov, Valery Yu.; Thiele, Sebastian; Pezoldt, Jörg; Shubina, Tatiana V.
Photoluminescence kinetics of dark and bright excitons in atomically thin MoS2. - In: Physica status solidi, ISSN 1862-6270, Bd. 15 (2021), 10, 2100263, insges. 14 S.

The fine structure of the exciton spectrum, containing optically allowed (bright) and forbidden (dark) exciton states, determines the radiation efficiency in nanostructures. Time-resolved microphotoluminescence in MoS2 monolayers (MLs) and bilayers (BLs), both unstrained and compressively strained, in a wide temperature range (10-300 K), is studied to distinguish between exciton states optically allowed and forbidden, both in spin and in momentum, as well as to estimate their characteristic decay times and contributions to the total radiation intensity. The decay times are found to either increase or decrease with increasing temperature, indicating the lowest bright or lowest dark state, respectively. The results unambiguously show that, in an unstrained ML, the spin-allowed state is the lowest for a series of A excitons (1.9 eV), with the dark state being <2 meV higher, and that the splitting energy can increase several times at compression. In contrast, in the indirect exciton series in BLs (1.5 eV), the spin-forbidden state is the lowest, being about 3 meV below the bright one. The strong effect of strain on the exciton spectrum can explain the large scatter among the published data and must be taken into account to realize the desired optical properties of 2D MoS2.



https://doi.org/10.1002/pssr.202100263
Isaac, Nishchay Angel; Reiprich, Johannes; Schlag, Leslie; Moreira, Pedro H. O.; Baloochi, Mostafa; Raheja, Vishal Amarbhai; Hess, Anna-Lena; Centeno, Luis F.; Ecke, Gernot; Pezoldt, Jörg; Jacobs, Heiko O.
Three-dimensional platinum nanoparticle-based bridges for ammonia gas sensing. - In: Scientific reports, ISSN 2045-2322, Bd. 11 (2021), 12551, S. 1-9

This study demonstrates the fabrication of self-aligning three-dimensional (3D) platinum bridges for ammonia gas sensing using gas-phase electrodeposition. This deposition scheme can guide charged nanoparticles to predetermined locations on a surface with sub-micrometer resolution. A shutter-free deposition is possible, preventing the use of additional steps for lift-off and improving material yield. This method uses a spark discharge-based platinum nanoparticle source in combination with sequentially biased surface electrodes and charged photoresist patterns on a glass substrate. In this way, the parallel growth of multiple sensing nodes, in this case 3D self-aligning nanoparticle-based bridges, is accomplished. An array containing 360 locally grown bridges made out of 5 nm platinum nanoparticles is fabricated. The high surface-to-volume ratio of the 3D bridge morphology enables fast response and room temperature operated sensing capabilities. The bridges are preconditioned for ˜ 24 h in nitrogen gas before being used for performance testing, ensuring drift-free sensor performance. In this study, platinum bridges are demonstrated to detect ammonia (NH3) with concentrations between 1400 and 100 ppm. The sensing mechanism, response times, cross-sensitivity, selectivity, and sensor stability are discussed. The device showed a sensor response of ˜ 4% at 100 ppm NH3 with a 70% response time of 8 min at room temperature.



https://doi.org/10.1038/s41598-021-91975-w
Wang, Honglei; Cheng, Pengfei; Shi, Jun; Wang, Dong; Wang, Hongguang; Pezoldt, Jörg; Stich, Michael; Chen, Runfeng; Aken, Peter Antonie van; Huang, Wei; Schaaf, Peter
Efficient fabrication of MoS2 nanocomposites by water-assisted exfoliation for nonvolatile memories. - In: Green chemistry, ISSN 1463-9270, Bd. 23 (2021), 10, S. 3642-3648

Efficient and green exfoliation of bulk MoS2 into few-layered nanosheets in the semiconducting hexagonal phase (2H-phase) remains a great challenge. Here, we developed a new method, water-assisted exfoliation (WAE), for the scalable synthesis of carboxylated chitosan (CC)/2H-MoS2 nanocomposites. With facile hand grinding of the CC powder, bulk MoS2 and water followed by conventional liquid-phase exfoliation in water, this method can not only efficiently exfoliate the 2H-MoS2 nanosheets, but also produce two-dimensional (2D) CC/2H-MoS2 nanocomposites. Interestingly, the intercalated CC in MoS2 nanosheets increases the interlayer spacing of 2H-MoS2 to serve as good candidates for the semiconductor devices. 2D CC/2H-MoS2 nanocomposites show superior electronic rectification effects in nonvolatile write-once-read-many-times memory (WORM) behavior with an ON/OFF ratio over 103, which can be rationally controlled by the weight ratios of CC and MoS2. These findings by the WAE method would open tremendous potential opportunities to prepare commercially available semiconducting 2D nanocomposites for promising high-performance device applications.



https://doi.org/10.1039/D1GC00162K
Wang, Anni; Gallino, Isabella; Riegler, Sascha Sebastian; Lin, Yi-Ting; Isaac, Nishchay Angel; Sauni Camposano, Yesenia Haydee; Matthes, Sebastian; Flock, Dominik; Jacobs, Heiko O.; Yen, Hung-Wei; Schaaf, Peter
Ultrafast formation of single phase B2 AlCoCrFeNi high entropy alloy films by reactive Ni/Al multilayers as heat source. - In: Materials and design, ISSN 1873-4197, Bd. 206 (2021), 109790, insges. 12 S.

High entropy alloy films of AlCoCrFeNi B2-ordered structure are formed during an ultrafast heating process by reactive Ni/Al multilayers. The self-propagating high-temperature reaction occurring in reactive Ni/Al multilayers after ignition represents an ultrafast heat source which is used for the transformation of a thin films Al/CoFe/CrNi multilayer structure into a single-phase high entropy alloy film. The materials design of the combined multilayers thus determines the phase formation. Conventional rapid thermal annealing transforms the multilayer into a film with multiple equilibrium phases. Ultrafast combustion synthesis produces films with ultrafine-grained single-phase B2-ordered compound alloy. The heating rates during the combustion synthesis are in the order of one million K/s, much higher than those of the rapid thermal annealing, which is about 7 K/s. The results are compared with differential scanning calorimetry experiments with heating rates ranging from about 100 K/s up to 25000 K/s. It is shown that the heating rate clearly determines the phase formation in the multilayers. The rapid kinetics of the combustion prevents long-range diffusion and promotes the run-away transformation. Thus, multilayer combustion synthesis using reactive Ni/Al multilayers as heat source represents a new pathway for the fabrication of single phase high-entropy alloy films.



https://doi.org/10.1016/j.matdes.2021.109790
Schlag, Leslie; Isaac, Nishchay Angel; Nahrstedt, Helene; Reiprich, Johannes; Ispas, Adriana; Stauden, Thomas; Pezoldt, Jörg; Bund, Andreas; Jacobs, Heiko O.
Nanoparticle gas phase electrodeposition: fundamentals, fluid dynamics, and deposition kinetics. - In: Journal of aerosol science, ISSN 1879-1964, Bd. 151 (2021), 105652, S. 1-15

This communication uncovers missing fundamental elements and an expanded model of gas phase electrodeposition; a relatively new and in large parts unexplored process, which combines particle generation, transport zone and deposition zone in an interacting setup. The process enables selected area deposition of charged nanoparticles that are dispersed and transported by a carrier gas at atmospheric pressure conditions. Two key parameters have been identified: carrier gas flow rate and spark discharge power. Both parameters affect electrical current carried by charged species, nanoparticle mass, particle size and film morphology. In combination, these values enable to provide an estimate of the gas flow dependent Debye length. Together with Langmuir probe measurements of electric potential and field distribution, the transport can be described and understood. First, the transport of the charged species is dominated by the carrier gas flow. In close proximity, the transport is electric field driven. The transition region is not fixed and correlates with the electric potential profile, which is strongly dependent on the deposition rate. Considering the film morphology, the power of the discharge turns out to be the most relevant parameter. Low spark power combined with low gas flow leads to dendritic film growth. In contrast, higher spark power combined with higher gas flow produces compact layers.



https://doi.org/10.1016/j.jaerosci.2020.105652
Schlag, Leslie; Grau, Richard; Hossain, Mobassar; Nahrstedt, Helene; Isaac, Nishchay Angel; Reiprich, Johannes; Pezoldt, Jörg; Jacobs, Heiko O.
Self-aligning ruthenium interconnects. - In: 2020 IEEE International Interconnect Technology Conference (IITC), (2020), S. 82-84

This contribution shows self-aligning ruthenium interconnects. The underlying process is gas phase electrodeposition, which allows metallic particles to be deposited locally. This is performed with an adjustable airgap between the insulator and the deposited metallic structure. The size of the enclosed airgap can be adjusted directly. The deposition power has a direct influence on the growth rate and the morphology of the structure. With increasing deposition power, the resulting self-aligning nano-bridge becomes more compact.



https://doi.org/10.1109/IITC47697.2020.9515654
Kleinschmidt, Peter; Mutombo, Pingo; Berthold, Theresa; Paszuk, Agnieszka; Steidl, Matthias; Ecke, Gernot; Nägelein, Andreas; Koppka, Christian; Supplie, Oliver; Krischok, Stefan; Romanyuk, Oleksandr; Himmerlich, Marcel; Hannappel, Thomas
Atomic surface structure of MOVPE-prepared GaP(111)B. - In: Applied surface science, Bd. 534 (2020), 147346

Controlling the surface formation of the group-V face of (111)-oriented III-V semiconductors is crucial for subsequent successful growth of III-V nanowires for electronic and optoelectronic applications. With a view to preparing GaP/Si(111) virtual substrates, we investigate the atomic structure of the MOVPE (metalorganic vapor phase epitaxy)-prepared GaP(111)B surface (phosphorus face). We find that upon high-temperature annealing in the H2-based MOVPE process ambience, the surface is phosphorus-depleted, as evidenced by X-ray photoemission spectroscopy (XPS). However, a combination of density functional theory calculations and scanning tunneling microscopy (STM) suggests the formation of a partially H-terminated phosphorus surface, where the STM contrast is due to electrons tunneling from non-terminated dangling bonds of the phosphorus face. Atomic force microscopy (AFM) reveals that a high proportion of the surface is covered by islands, which are confirmed as Ga-rich by Auger electron spectroscopy (AES). We conclude that the STM images of the samples after high-temperature annealing only reflect the flat regions of the partially H-terminated phosphorus face, whereas an increasing coverage with Ga-rich islands, as detected by AFM and AES, forms upon annealing and underlies the higher proportion of Ga in the XPS measurements.



https://doi.org/10.1016/j.apsusc.2020.147346
Geng, Zhansong; Ziebold, Christian; Thiele, Sebastian; Pezoldt, Jörg; Ziegler, Martin; Schwierz, Frank
Resistive switching behavior of lateral and vertical MoS2 devices. - In: Mikro-Nano-Integration, (2020), S. 80-84

Isaac, Nishchay Angel; Schlag, Leslie; Katzer, Simeon; Nahrstedt, Helene; Reiprich, Johannes; Pezoldt, Jörg; Stauden, Thomas; Jacobs, Heiko O.
Combinatorial gas phase electrodeposition for fabrication of three-dimensional multimodal gas sensor array. - In: Materials today, ISSN 2214-7853, Bd. 33 (2020), 6, S. 2451-2457

https://doi.org/10.1016/j.matpr.2020.01.335
Reiprich, Johannes; Isaac, Nishchay Angel; Schlag, Leslie; Kups, Thomas; Hopfeld, Marcus; Ecke, Gernot; Stauden, Thomas; Pezoldt, Jörg; Jacobs, Heiko O.
Localized and programmable chemical vapor deposition using an electrically charged and guided molecular flux. - In: ACS nano, ISSN 1936-086X, Bd. 14 (2020), 10, S. 12885-12894

Chemical vapor deposition is a widely used material deposition technique. It commonly provides a uniform material flux to the substrate to cause uniform thin film growth. However, the ability to precisely adjust the local deposition rate would be highly preferable. This communication reports on a chemical vapor deposition method performed in a localized and programmable fashion by introducing an electrically charged and guided molecular flux. This allows for local adjustments of the deposition rate and three-dimensional shape by controlling the electric fields. Specifically, the precursor molecules are charged and then guided by arrays of electrodynamic funnels, which are created by a patterned dielectric layer, to predetermined deposition locations with a minimal spot size of 250 nm. Furthermore, nearest neighbor coupling is reported as a shaping method to cause the deposition of three-dimensional nanostructures. Additionally, the integration of individually addressable domain electrodes offers programmable charge dissipation to achieve an ON/OFF control. The described method is applicable to a wide variety of materials and precursors. Here, the localized and programmable deposition of three-dimensional copper oxide, chromium oxide, zinc oxide, and carbon nanowires is demonstrated.



https://doi.org/10.1021/acsnano.0c03726
Hähnlein, Bernd; Hofmann, Tim; Tonisch, Katja; Pezoldt, Jörg; Kovac, Jaroslav; Krischok, Stefan
Structural analysis of sputtered Sc(x)Al(1-x)N layers for sensor applications. - In: Materials science and smart materials, (2020), S. 13-18

Hähnlein, Bernd; Lebedev, Sergei P.; Eliseyev, Ilya A.; Smirnov, Alexander N.; Davydov, Valery Yu.; Zubov, Alexander V.; Lebedev, Alla A.; Pezoldt, Jörg
Investigation of epitaxial graphene via Raman spectroscopy: origins of phonon mode asymmetries and line width deviations. - In: Carbon, ISSN 1873-3891, Bd. 170 (2020), S. 666-676

In this work a comprehensive study is presented for the analysis of epitaxial graphene layers using Raman spectroscopy. A wide range of graphene types is covered, from defective/polycrystalline single layer graphene to multilayer graphene with low defect density. On this basis the influence of strain type, Fermi level and number of layers on the Raman spectrum of graphene is investigated. A detailed view on the 2D/G dispersion and the respective slopes of uniaxially and biaxially strained graphene is given and its implications on the asymmetry of the G peak analyzed. A linear dependency of the phonon mode asymmetry on uniaxial strain is presented in addition to the known Fermi level dependence. Additional impacts on the asymmetry are found to be arising from the defect density and transfer doping of adsorbates. The discovered transfer doping mechanism is contrary to pure phonon excitation through excitons and exhibits increasing asymmetry with increasing Fermi level. A new characteristic correlation between the 2D mode line width and the inverse I(D)/I(G) ratio is introduced that allows the determination of the strain type and layer number and explains the difference between Raman line widths of monolayer graphene on different substrates.



https://doi.org/10.1016/j.carbon.2020.07.016
Reiprich, Johannes; Isaac, Nishchay Angel; Schlag, Leslie; Hopfeld, Marcus; Pezoldt, Jörg; Jacobs, Heiko O.
Corona assisted tuning of gallium oxide growth on 3C-SiC(111)/Si(111) pseudosubstrates. - In: Materials science forum, ISSN 1662-9752, Bd. 1004 (2020), S. 102-109

Gallium oxide was grown on silicon carbide substrates using a corona discharge assisted vapor phase epitaxy process and gold catalyst. It is shown that by implementing the corona discharge the morphology of the gallium oxide can be transformed. The excitation of the gas phase and the generation of excited species directly influence the growth morphology suppressing nanowire growth and supporting the transformation into heteroepitaxial growth.



https://doi.org/10.4028/www.scientific.net/MSF.1004.102
Pezoldt, Jörg; Kalnin, Andrei Alexandrovich
Wurtzite SiC formation in plastic deformed 3C and 6H. - In: Materials science forum, ISSN 1662-9752, Bd. 1004 (2020), S. 243-248

Single side clamped 3C and 6H single crystal silicon carbide beams were elastic deformed using a special designed deformation stage in an electron microscope and subjected to high temperatures. The structural transitions occurring during the plastic relaxation process were recorded in situ in the electron microscope using reflection high energy electron diffraction in {110} azimuthal direction. For both polytypes, a polytype phase transition into the wurtzite silicon carbide polytype was observed independent on the surface polarity. The critical initial elastic deformation of the polytype phase transition into the wurtzite phase for the cubic silicon carbide polytype is larger compared to the 6H-SiC. This is due to the higher partial dislocation densities needed to transform the cubic modification into the wurtzite phase.



https://doi.org/10.4028/www.scientific.net/MSF.1004.243
Hähnlein, Bernd; Lebedev, Sergey P.; Eliseyev, Ilya A.; Davydov, Valery Yu.; Lebedev, Alexander A.; Pezoldt, Jörg
Graphene quality assessment using an entropy approach of SEM images. - In: Materials science forum, ISSN 1662-9752, Bd. 1004 (2020), S. 525-530

In this work a new approach of analyzing epitaxial graphene layers on semi-insulating SiC through the gray-scale entropy of SEM images as a measure for the graphene inhomogeneity is demonstrated. Raman spectroscopy as a versatile and the standard tool for graphene characterization allows additionally the determination of the layer properties such as layer count, Fermi level, defect concentration and strain. It is shown that the gray-scale entropy correlates with the defect density derived from Raman measurements and thus can be used as an additional characterization technique with much higher resolution than the conventional Raman spectroscopy allows. As a consequence, the results are used to reflect the two-stepped growth itself and to conclude for advantageous growth conditions.



https://doi.org/10.4028/www.scientific.net/MSF.1004.525
Omidian, Maryam; Néel, Nicolas; Manske, Eberhard; Pezoldt, Jörg; Lei, Yong; Kröger, Jörg
Structural and local electronic properties of clean and Li-intercalated graphene on SiC(0001). - In: DPG-Frühjahrstagung (DPG Spring Meeting) of the Condensed Matter Section (SKM) together with the DPG Division Environmental Physics and the Working Groups Accelerator Physics; Equal Opportunities; Energy; Industry and Business; Physics, Modern IT and Artificial Intelligence, Young DPG, (2020), O 80.3

Kleinschmidt, Peter; Mutombo, Pingo; Berthold, Theresa; Paszuk, Agnieszka; Steidl, Matthias; Ecke, Gernot; Nägelein, Andreas; Koppka, Christian; Supplie, Oliver; Krischok, Stefan; Romanyuk, Oleksandr; Himmerlich, Marcel; Hannappel, Thomas
Surface structure of MOVPE-prepared GaP(111)B. - In: DPG-Frühjahrstagung (DPG Spring Meeting) of the Condensed Matter Section (SKM) together with the DPG Division Environmental Physics and the Working Groups Accelerator Physics; Equal Opportunities; Energy; Industry and Business; Physics, Modern IT and Artificial Intelligence, Young DPG, (2020), O 91.2

Racko, Juraj; Lalinský, Tibor; Mikolášek, Miroslav; Benko, Peter; Thiele, Sebastian; Schwierz, Frank; Breza, Juraj
Vertical current transport processes in MOS-HEMT heterostructures. - In: Applied surface science, Bd. 527 (2020), 146605

https://doi.org/10.1016/j.apsusc.2020.146605
Pezoldt, Jörg; Cimalla, Volker
Imprinting the polytype structure of silicon carbide by rapid thermal processing. - In: Crystals, ISSN 2073-4352, Bd. 10 (2020), 6, 523, insges. 21 S.

https://doi.org/10.3390/cryst10060523
Stehr, Uwe; Centeno, Luis F.; Ni, Yuliana; Jacobs, Heiko O.; Hein, Matthias
RF properties of stretchable transmission line structures. - In: 2020 German Microwave Conference, (2020), S. 272-275

https://ieeexplore.ieee.org/document/9080242
Omidian, Maryam; Néel, Nicolas; Manske, Eberhard; Pezoldt, Jörg; Lei, Yong; Kröger, Jörg
Structural and local electronic properties of clean and Li-intercalated graphene on SiC(0001). - In: Surface science, ISSN 1879-2758, Bd. 699 (2020), 121638

https://doi.org/10.1016/j.susc.2020.121638
Eliseyev, Ilya A.; Smirnov, Alexander N.; Lebedev, Sergey P.; Panteleev, V. N.; Dementev, Peter A.; Pezoldt, Jörg; Hartung, Gerd; Kröger, Jörg; Zubov, Alexander V.; Lebedev, Alexander A.
Transformation of the buffer layer grown on 4H-SiC to single-layer graphene by ex situ hydrogen intercalation. - In: Fullerenes, nanotubes & carbon nanostructures, ISSN 1536-4046, Bd. 28 (2020), 4, S. 316-320

https://doi.org/10.1080/1536383X.2019.1708733
Schricker, Klaus; Samfaß, Lisa; Grätzel, Michael; Ecke, Gernot; Bergmann, Jean Pierre
Bonding mechanisms in laser-assisted joining of metal-polymer composites. - In: Journal of advanced joining processes, ISSN 2666-3309, Bd. 1 (2020), 100008, insges. 12 S.

Metal-Plastic hybrid components and assemblies are gaining importance due to novel lightweight constructions and a growing integration of functions by using the right material at the right place. Thermal joining enables a joining technology for thermoplastic materials and engineering metals without using adhesive or joining elements. The paper provides novel investigations on the interaction between form fit and physicochemical interactions due to the combined use of specifically used oxide layers, interaction barriers and defined surface structuring by laser processing. Thereby, the design of experiments allows the investigation of the form fit as dominant interaction mode.



https://doi.org/10.1016/j.jajp.2020.100008
Krey, Maximilian; Hähnlein, Bernd; Tonisch, Katja; Krischok, Stefan; Töpfer, Hannes
Automated parameter extraction of ScAlN MEMS devices using an extended Euler-Bernoulli beam theory. - In: Sensors, ISSN 1424-8220, Bd. 20 (2020), 4, 1001, insges. 19 S.

https://doi.org/10.3390/s20041001
Ispas, Adriana; Schlag, Leslie; Eggert, Lara; Böttcher, René; Bund, Andreas; Jacobs, Heiko O.
Electrodeposition of aluminium-nickel films in 1-butyl-1-methylpyrrolidinium-bis(trifluoromethylsulfonyl) amide. - In: Meeting abstracts, ISSN 2151-2043, Bd. MA2019-02 (2019), 17, 963

https://doi.org/10.1149/MA2019-02/17/963
Pezoldt, Jörg; Lubov, Maxim N.; Kharlamov, Vladimir S.
Impurity effects on nucleation and growth of SiC clusters and layers on Si(100) and Si(111). - In: Physics of the solid state, ISSN 1090-6460, Bd. 61 (2019), 12, S. 2468-2472

https://doi.org/10.1134/S1063783419120382
Eliseyev, Ilya A.; Davydov, Valery Yu.; Smirnov, Alexander N.; Nestoklon, M. O.; Dementev, Peter A.; Lebedev, Sergey P.; Lebedev, Alexander A.; Zubov, Alexander V.; Mathew, Sumy; Pezoldt, Jörg; Bokai, Kirill A.; Usachov, Dmitry Yu.
Optical estimation of the carrier concentration and the value of strain in monolayer graphene grown on 4H-SiC. - In: Semiconductors, ISSN 1090-6479, Bd. 53 (2019), 14, S. 1904-1909

https://doi.org/10.1134/S1063782619140057
Bartsch, Heike; Pezoldt, Jörg; Morales Sanchez, Francico M.; Jimenez Rios, Juan J.; Mánuel Delgado, Jose M.; Breiling, Jonas; Müller, Jens
LTCC as substrate - enabling semiconductor and packaging integration. - In: 2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC), (2019), insges. 4 S.

https://doi.org/10.23919/EMPC44848.2019.8951794
Reiprich, Johannes; Isaac, Nishchay Angel; Schlag, Leslie; Hopfeld, Marcus; Ecke, Gernot; Stauden, Thomas; Pezoldt, Jörg; Jacobs, Heiko O.
Corona discharge assisted growth morphology switching of tin-doped gallium oxide for optical gas sensing applications. - In: Crystal growth & design, ISSN 1528-7505, Bd. 19 (2019), 12, S. 6945-6953

https://doi.org/10.1021/acs.cgd.9b00678
Pezoldt, Jörg; Zgheib, Charbel; Stauden, Thomas; Ecke, Gernot; Kups, Thomas; Jacobs, Heiko O.; Weih, Petia
Germanium Incorporation in Silicon Carbide Epitaxial Layers Using Molecular Beam Epitaxy on 4H-SiC Substrates. - In: Silicon carbide and related materials 2018, (2019), S. 127-130

Kaltwasser, Mahsa; Karmaleevah, Kseniia; Müller, Jens
Dünnschichtstrukturierung metallorganischer Resinatpasten auf Glaswafern. - In: MikroSystemTechnik Kongress 2019, (2019), S. 607-609

Isaac, Nishchay Angel; Schlag, Leslie; Reiprich, Johannes; Katzer, Simeon; Nahrstedt, Helene; Pezoldt, Jörg; Stauden, Thomas; Jacobs, Heiko O.
Gas phase electrodeposition enabling the programmable three-dimensional growth of a multimodal room temperature nanobridge gas sensor array. - In: ACS applied materials & interfaces, ISSN 1944-8252, Bd. 11 (2019), 36, S. 33497-33504

https://doi.org/10.1021/acsami.9b12545
Biswas, Shantonu; Schöberl, Andreas; Hao, Yufei; Reiprich, Johannes; Stauden, Thomas; Pezoldt, Jörg; Jacobs, Heiko O.
Integrated multilayer stretchable printed circuitboards paving the way for deformable active matrix. - In: Nature Communications, ISSN 2041-1723, Bd. 10 (2019), 4909, S. 1-8

https://doi.org/10.1038/s41467-019-12870-7
Kaltwasser, Mahsa; Schmidt, Udo; Lösing, Lars; Biswas, Shantonu; Stauden, Thomas; Bund, Andreas; Jacobs, Heiko O.
Fluidic self-assembly on electroplated multilayer solder bumps with tailored transformation imprinted melting points. - In: Scientific reports, ISSN 2045-2322, Bd. 9 (2019), 11325, S. 1-8

https://doi.org/10.1038/s41598-019-47690-8
Hofmann, Tim; Tonisch, Katja; Hähnlein, Bernd; Kovic, Jaroslav; Pezoldt, Jörg; Krischok, Stefan
Spectroscopic characterization of sputtered ScAlN thinfilms. - In: DPG-Frühjahrstagung 2019 (DPG Spring Meeting 2019) of the Condensed Matter Section (SKM) together with the Division Radiation and Medical Physics and the Working Groups Equal Opportunities, Industry and Business, Young DPG; Symposia, exhibition of scientific instruments and literature, (2019), HL 35.6

Biswas, Shantonu; Reiprich, Johannes; Pezoldt, Jörg; Stauden, Thomas; Jacobs, Heiko O.
Metamorphic stretchable touchpad. - In: Advanced Materials Technologies, ISSN 2365-709X, Bd. 4 (2019), 4, 1800446, insges. 6 S.

https://doi.org/10.1002/admt.201800446
Jiménez, Juan Jesús; Mánuel, José Manuel; Bartsch, Heike; Breiling, Jonas; García, Rafael; Jacobs, Heiko O.; Müller, Jens; Pezoldt, Jörg; Morales Sánchez, Francisco Miguel
Comprehensive (S)TEM characterization of polycrystalline GaN/AlN layers grown on LTCC substrates. - In: Ceramics international, ISSN 1873-3956, Bd. 45 (2019), 7, S. 9114-9125

https://doi.org/10.1016/j.ceramint.2019.01.250
Reiprich, Johannes; Kups, Thomas; Schlag, Leslie; Isaac, Nishchay Angel; Biswas, Shantonu; Breiling, Jonas; Schaaf, Peter; Stauden, Thomas; Pezoldt, Jörg; Jacobs, Heiko O.
Corona assisted gallium oxide nanowire growth on silicon carbide. - In: Journal of crystal growth, Bd. 509 (2019), S. 107-111

https://doi.org/10.1016/j.jcrysgro.2018.12.033
Biswas, Shantonu; Kaltwasser, Mahsa; Reiprich, Johannes; Schlag, Leslie; Isaac, Nishchay Angel; Stauden, Thomas; Pezoldt, Jörg; Jacobs, Heiko O.
Metamorphic and stretchable electronic systems - a materials, assembly, and interconnection challenge. - In: Microsystems technology in Germany, ISSN 2191-7183, (2018), S. 64-65

Schlag, Leslie; Isaac, Nishchay Angel; Nahrstedt, Helene; Reiprich, Johannes; Pezoldt, Jörg; Jacobs, Heiko O.
Self aligning growth of nanoparticle-based interconnects. - In: 2018 IEEE 13th Nanotechnology Materials and Devices Conference (NMDC), (2018), insges. 4 S.

https://doi.org/10.1109/NMDC.2018.8605857
Lebedev, Alexander A.; Davydov, Valery Yu.; Usachov, Dmitry Yu.; Lebedev, Sergey P.; Smirnov, Alexander N.; Eliseyev, Ilya A.; Dunaevskiy, M. S.; Gushchina, E. V.; Bokai, K. A.; Pezoldt, Jörg
High quality graphene grown by sublimation on 4H-SiC (0001). - In: Semiconductors, ISSN 1090-6479, Bd. 52 (2018), 14, S. 1882-1885

https://doi.org/10.1134/S1063782618140154
Kaltwasser, Mahsa; Schmidt, Udo; Biswas, Shantonu; Reiprich, Johannes; Schlag, Leslie; Isaac, Nishchay Angel; Stauden, Thomas; Jacobs, Heiko O.
Core-shell transformation-imprinted solder bumps enabling low-temperature fluidic self-assembly and self-alignment of chips and high melting point interconnects. - In: ACS applied materials & interfaces, ISSN 1944-8252, Bd. 10 (2018), 47, S. 40608-40613

https://doi.org/10.1021/acsami.8b12390
Biswas, Shantonu; Reiprich, Johannes; Pezoldt, Jörg; Hein, Matthias; Stauden, Thomas; Jacobs, Heiko O.
Stress-adaptive meander track for stretchable electronics. - In: Flexible and printed electronics, ISSN 2058-8585, Bd. 3 (2018), 3, 032001, S. 1-7

Stretchable metallic interconnects are commonly designed using a meander-shaped metal track with a uniform width. This article reports on a 'stress-adaptive' metal track design which varies in width to accommodate the produced torque in the metal track during stretching. The stress-adaptive design is inspired by computational and experimental studies of two conventional meander-shape metal tracks identifying a common failure mode; specifically, the propagation of torque leading to twist and mechanical fatigue. The understanding gained led to the stress-adaptive design. The stress-adaptive structure is compared with horseshoe- and U-shaped references and shows improvements in the stress distribution, levels of twist, maximum level of elongation (>320%), and required stretch and release cycles (>6000 at 150% elongation) to cause failure in a long term cycling test.



https://doi.org/10.1088/2058-8585/aad583
Pezoldt, Jörg; Kalnin, Andrei Alexandrovich
Defects and polytype instabilities. - In: Silicon carbide and related materials 2017, (2018), S. 147-150

Auge, Manuel; Hähnlein, Bernd; Pezoldt, Jörg
Infrared reflectance study of the graphene/semi-insulating 6H-SiC(0001) heterostructure. - In: Silicon carbide and related materials 2017, (2018), S. 314-317

Eckstein, Marco; Koppka, Christian; Thiele, Sebastian; Mi, Yan; Xu, Rui; Lei, Yong; Hähnlein, Bernd; Schwierz, Frank; Pezoldt, Jörg
MOCVD compatible atomic layer deposition process of Al2O3 on SiC and graphene/SiC heterostructures. - In: Silicon carbide and related materials 2017, (2018), S. 506-510
Im Titel sind "2" und "3" tiefgestellt

Hesamedini, Sanez; Ecke, Gernot; Bund, Andreas
Structure and formation of trivalent chromium conversion coatings containing cobalt on zinc plated steel. - In: Journal of the Electrochemical Society, ISSN 1945-7111, Bd. 165 (2018), 10, Seite C657-C669

https://doi.org/10.1149/2.0951810jes
Zakharko, Yuriy; Rother, Marcel; Graf, Arko; Hähnlein, Bernd; Brohmann, Maximilian; Pezoldt, Jörg; Zaumseil, Jana
Radiative pumping and propagation of plexcitons in diffractive plasmonic crystals. - In: Nano letters, ISSN 1530-6992, Bd. 18 (2018), 8, S. 4927-4933, insges. 7 S.
Gesehen am 11.03.2020

Strong coupling between plasmons and excitons leads to the formation of plexcitons: quasiparticles that combine nanoscale energy confinement and pronounced optical nonlinearities. In addition to these localized modes, the enhanced control over the dispersion relation of propagating plexcitons may enable coherent and collective coupling of distant emitters. Here, we experimentally demonstrate strong coupling between carbon nanotube excitons and spatially extended plasmonic modes formed via diffractive coupling of periodically arranged gold nanoparticles (nanodisks, nanorods). Depending on the light-matter composition, the rather long-lived plexcitons (>100 fs) undergo highly directional propagation over 20 m. Near-field energy distributions calculated with the finite-difference time-domain method fully corroborate our experimental results. The previously demonstrated compatibility of this plexcitonic system with electrical excitation opens the path to the realization of a variety of ultrafast active plasmonic devices, cavity-assisted energy transport and low-power optoelectronic components.



https://doi.org/10.1021/acs.nanolett.8b01733
Bartsch, Heike; Grieseler, Rolf; Mánuel, Jose; Pezoldt, Jörg; Müller, Jens
Magnetron sputtered AlN layers on LTCC multilayer and silicon substrates. - In: Coatings, ISSN 2079-6412, Bd. 8 (2018), 8, 289, insges. 19 S.

https://doi.org/10.3390/coatings8080289
Reiprich, Johannes; Gebinoga, Michael; Traue, Lutz-Philipp; Schlag, Leslie; Biswas, Shantonu; Kaltwasser, Mahsa; Honecker, Maria Christine; Stauden, Thomas; Pezoldt, Jörg; Schober, Andreas; Jacobs, Heiko O.
Localized collection of airborne biological hazards for environmental monitoring. - In: Sensors and actuators, ISSN 0925-4005, Bd. 273 (2018), S. 906-915

https://doi.org/10.1016/j.snb.2018.06.129
Biswas, Shantonu;
Metamorphic stretchable electronics. - Ilmenau : Universitätsbibliothek, 2018. - 1 Online-Ressource (XXIV, 139 Seiten)
Technische Universität Ilmenau, Dissertation 2018

Die jüngsten Fortschritte auf dem Gebiet der Elektronik wenden sich der Realisierung mechanischer dehnbarer Elektroniken zu. Diese sind in der Lage sich umzuwandeln um neue Formfaktoren anzunehmen. Um eine nahtlose Integration der Elektronik in unsere Alltagsgegenstände und viele weitere Anwendungsfelder zu ermöglichen, bei denen herkömmliche starre elektronische Systeme nicht ausreichen, ist mechanische Dehnbarkeit notwendig. Diese Arbeit zielt darauf ab, eine dehnbare Leiterplattentechnologie (sPCB) zu demonstrieren, die mit industriellen Herstellungsprozessen kompatibel ist. Idealerweise soll das starre Trägersubstrat der konventionellen Elektronik durch ein dehnbares Gummisubstrat mit dehnbaren Leiterbahnen ersetzt werden. Zunächst wurde eine Methode entwickelt, um eine industrietaugliche, einlagige, dehnbare Leiterplatte zu realisieren. Der dargestellte Ansatz unterscheidet sich von anderen Methoden in diesem Bereich, welche die Metallisierung auf dem Gummisubstrat aufbringen und die Komponenten anschließend darauf montieren. Dadurch leiden diese unter einer geringeren Ausrichtung und Fixierung. Stattdessen wird im dargestellten Ansatz ein harter Träger verwendet, der den Einsatz des dehnbaren Gummimaterials bis ans Ende der Prozesskette verschiebt. Diese Single-Layer-Methode wurde weiterentwickelt, um mehrschichtige, integrierte sPCB zu realisieren, bei der verschiedene Metallisierungsebenen durch vertikalen Durchkontaktierungen (VIA) miteinander verbunden werden. Auch dieses Verfahren verwendet konventionelle starre Träger für den Herstellungsprozess. Wie in der konventionellen Leiterplattentechnologie ist auch die Herstellung auf starren Trägern wichtig, da sie Folgendes ermöglicht: Ausrichtung und Registrierung, Hochtemperaturprozesse, konventionelle Chip-Bestückung durch Roboter und "On-Hard-Carrier"-Bauteiltests. Darüber hinaus ermöglicht die dargestellte Methode den direkten Einsatz handelsüblicher SMDs, was für die einfache Realisierung komplexer elektronischer Schaltungen wichtig ist. Als Endsubstrat kommt ein hochelastisches Silikonmaterial (EcoFlex) zum Einsatz, welches die Bauelementebenen einkapselt. Um die Bauelementebenen vom harten Träger auf das weiche Substrat zu übertragen, wird ein einstufiges, waferbasiertes und lösungsmittelfreies Ablöseverfahren eingesetzt, bei dem die differentielle Grenzflächenadhäsion einer Multi-Opferschichten genutzt wird. Für die hochelastischen Leiterbahnen wurde ein neues Mäander-Metallbahndesign entwickelt, welches als "spannungsadaptiv" bezeichnet wird. Die neue Mäander-Metallbahn variiert in ihrer Breite, um das einwirkende Drehmoment in den Metallbahnen, aufgrund der ungleichmäßigen Spannungsverteilung über die Mäander-Schleifen, aufzunehmen. Das spannungsadaptive Design zeigt eine signifikante Verbesserung der Spannungsverteilungen auf den Metallbahnen und führt experimentell zu einem höheren Niveau der maximalen Dehnung und der Anzahl der Dehnungszyklen. Es wurde eine breite Palette von dehnbaren Systemen demonstriert, darunter Elektronik, Optoelektronik, Akustoelektronik und Sensor-Arrays. Die Demonstratoren, auf Basis einer einzigen Metallisierungsschicht in einer Gummimatrix, enthalten Arrays mit gehäusten SMDs, LED-Nacktchips, laborgefertigte Si [my]-Transistoren und MEMS-Mikrofone. Weiterhin wird eine integrierte Multilayer-sPCB mit Chip-großen LEDs und Transistoren demonstriert, um eine adressierbare aktive Matrix zu realisieren. Dieser Prototyp demonstriert die Machbarkeit von integrierten Multilayer-sPCB und wird im Prinzip dazu führen, dass jedes heute bekannte elektronische System in ein äquivalentes dehnbares System überführt werden kann. Schließlich stellt diese Arbeit das bahnbrechende Konzept der metamorphen Elektronik vor, welche sich umwandeln kann um neue Topologien und Formfaktoren anzunehmen. Es werden verschiedene Arten von Deformationsmechanismen demonstriert, darunter das Aufblasen von gleichförmigen oder strukturierten Gummimembranen, 3D-geführte Deformationen und Vakuumformung in Kombination mit 3D-Schablonen. Die Palette der Topologien reicht dabei von halbkugelförmig, kugelförmig, konkav/konvex, pyramidenförmig, turmartig, bis hin zu komplexeren 3D-Formen, darunter Bienenaugen-Strukturen.



http://nbn-resolving.de/urn:nbn:de:gbv:ilm1-2018000172
Kharlamov, Vladimir S.; Kulikov, Dmitri V.; Lubov, Maxim N.; Zgheib, Charbel; Romanus, Henry; Trushin, Yuri V.; Pezoldt, Jörg
Reconstruction of concentration profiles in heterostructures with chemically modified interfaces. - In: Journal of applied physics, ISSN 1089-7550, Bd. 123 (2018), 21, 215302, insges. 9 S.

https://doi.org/10.1063/1.5010287
Ispas, Adriana; Schlag, Leslie; Böttcher, René; Jacobs, Heiko O.; Bund, Andreas
Electrodeposition of aluminum and aluminum-ruthenium films in ionic liquids. - In: Meeting abstracts, ISSN 2151-2043, Bd. MA2017-02 (2017), 19, 971

https://doi.org/10.1149/MA2017-02/19/971
Kaltwasser, Mahsa; Park, Se-Chul; Stauden, Thomas; Jacobs, Heiko O.
Automated reel-to-reel fluidic self-assembly enabling the production of solid state lighting panels. - In: 21. Deutsche Physikerinnentagung, (2017), S. 100

Alexandrov, Dimiter; Tot, Jonny; Dubreuil, Robert; Morales, Francisco Miguel; Mánuel, José Manuel; Jiménez, Juan Jesús; Lacroix, Bertrand; García, Rafael; Videkov, Valentin; Andreev, Svetozar; Tzaneva, Boriana; Bartsch, Heike; Pezoldt, Jörg; Fischer, Michael; Müller, Jens
Low temperature epitaxial deposition of GaN on LTCC substrates. - In: 2017 WiPDA, ISBN 978-1-5386-3117-1, (2017), S. 48-54

https://doi.org/10.1109/WiPDA.2017.8170501
Reiprich, Johannes; Fang, Jun; Park, Se-Chul; Schlag, Leslie; Stauden, Thomas; Pezoldt, Jörg; Jacobs, Heiko O.
Lokalisierter Transport von Schwebstoffen zu programmierbaren, mikroskopischen Sensorpunkten durch Korona-Entladung. - In: MikroSystemTechnik Kongress 2017 "MEMS, Mikroelektronik, Systeme", (2017), S. 578-581

Kaltwasser, Mahsa; Biswas, Shantonu; Stauden, Thomas; Schmidt, Udo; Bund, Andreas; Jacobs, Heiko O.
Bleifreier Lotstapel für fluidische Selbstmontage von Siliziumchips. - In: MikroSystemTechnik Kongress 2017 "MEMS, Mikroelektronik, Systeme", (2017), S. 437-439

Schlag, Leslie; Reiprich, Johannes; Stauden, Thomas; Pezoldt, Jörg; Ispas, Adriana; Bund, Andreas; Schaaf, Peter; Jacobs, Heiko O.
Selbstjustierendes Wachstum von 3D-Nanobrückenverbindungen. - In: MikroSystemTechnik Kongress 2017 "MEMS, Mikroelektronik, Systeme", (2017), S. 317-320

Geng, Zhansong; Hähnlein, Bernd; Granzner, Ralf; Auge, Manuel; Lebedev, Alexander A.; Davydov, Valery Y.; Kittler, Mario; Pezoldt, Jörg; Schwierz, Frank
Graphene nanoribbons for electronic devices. - In: Annalen der Physik, ISSN 1521-3889, Bd. 529 (2017), 11, 1700033, S. 1-15

https://doi.org/10.1002/andp.201700033
Lebedev, Sergey P.; Eliseyev, Ilya A.; Davydov, Valery Yu.; Smirnov, Alexander N.; Levitskii, V. S.; Mynbaeva, M. G.; Kulagina, M. M.; Hähnlein, Bernd; Pezoldt, Jörg; Lebedev, Alexander A.
Transport properties of graphene films grown by thermodestruction of SiC (0001) surface in argon medium. - In: Technical physics letters, ISSN 1090-6533, Bd. 43 (2017), 9, S. 849-852

https://doi.org/10.1134/S106378501709022X
Biswas, Shantonu; Reiprich, Johannes; Cohrs, Thaden; Arboleda, David T.; Schöberl, Andreas; Kaltwasser, Mahsa; Schlag, Leslie; Stauden, Thomas; Pezoldt, Jörg; Jacobs, Heiko O.
3D metamorphic stretchable microphone arrays. - In: Advanced Materials Technologies, ISSN 2365-709X, Bd. 2 (2017), 10, 1700131, insges. 11 S.

https://doi.org/10.1002/admt.201700131
Zakharko, Yuriy; Held, Martin; Graf, Arko; Rödlmeier, Tobias; Eckstein, Ralph; Hernandez-Sosa, Gerardo; Hähnlein, Bernd; Pezoldt, Jörg; Zaumseil, Jana
Multispectral electroluminescence enhancement of single-walled carbon nanotubes coupled to periodic nanodisk arrays. - In: Optics express, ISSN 1094-4087, Bd. 25 (2017), 15, S. 18092-18106

https://doi.org/10.1364/OE.25.018092
Biswas, Shantonu; Reiprich, Johannes; Cohrs, Thaden; Stauden, Thomas; Pezoldt, Jörg; Jacobs, Heiko O.
Metamorphic hemispherical microphone array for three-dimensional acoustics. - In: Applied physics letters, ISSN 1077-3118, Bd. 111 (2017), 4, 043109, insges. 5 S.

http://dx.doi.org/10.1063/1.4985710
Hähnlein, Bernd; Breiter, Manuela; Stauden, Thomas; Pezoldt, Jörg
Nanostructuring of graphene on semi-insulating SiC. - In: Materials science forum, ISSN 1662-9752, Bd. 897 (2017), S. 735-738

https://doi.org/10.4028/www.scientific.net/MSF.897.735
Auge, Manuel; Hähnlein, Bernd; Eckstein, Marco; Woltersdorf, Georg; Pezoldt, Jörg
High temperature grown graphene on SiC studied by raman and FTIR spectroscopy. - In: Materials science forum, ISSN 1662-9752, Bd. 897 (2017), S. 727-730

https://doi.org/10.4028/www.scientific.net/MSF.897.727
Reiprich, Johannes; Stauden, Thomas; Berthold, Theresa; Himmerlich, Marcel; Pezoldt, Jörg; Jacobs, Heiko O.
Corona assisted Ga based nanowire growth on 3C-SiC(111)/Si(111) pseudosubstrates. - In: Materials science forum, ISSN 1662-9752, Bd. 897 (2017), S. 642-645

https://doi.org/10.4028/www.scientific.net/MSF.897.642
Tucto Salinas, Karem Yoli; Flores Escalante, Loreleyn F.; Guerra Torres, Jorge Andres; Grieseler, Rolf; Kups, Thomas; Pezoldt, Jörg; Osvet, Andres; Batentschuk, Miroslaw; Weingärtner, Roland
Effect of post-annealing treatment on the structure and luminescence properties of AIN:Tb3+ thin films prepared by radio frequency magnetron sputtering. - In: Materials science forum, ISSN 1662-9752, Bd. 890 (2017), S. 299-302
Im Titel ist "3+" hochgestellt

https://doi.org/10.4028/www.scientific.net/MSF.890.299
Hähnlein, Bernd; Kovac, Jaroslav; Pezoldt, Jörg
Size effect of the silicon carbide Young's modulus. - In: Physica status solidi, ISSN 1862-6319, Bd. 214 (2017), 4, S. 1600390, insges. 9 S.

https://doi.org/10.1002/pssa.201600390
Jatal, Wael; Baumann, Uwe; Jacobs, Heiko O.; Schwierz, Frank; Pezoldt, Jörg
Enhancement- and depletion-mode AlGaN/GaN HEMTs on 3C-SiC(111)/Si(111) pseudosubstrates. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 214 (2017), 4, S. 1600415, insges. 7 S.

https://doi.org/10.1002/pssa.201600415
Jatal, Wael; Hörselmann, Ingo; Jacobs, Heiko O.; Schwierz, Frank; Pezoldt, Jörg
AlGaN HEMT based digital circuits on 3C-SiC(111)/Si(111) pseudosubstrates. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 214 (2017), 4, S. 1600416, insges. 6 S.

https://doi.org/10.1002/pssa.201600416
Biswas, Shantonu; Schöberl, Andreas; Kaltwasser, Mahsa; Pezoldt, Jörg; Stauden, Thomas; Jacobs, Heiko O.
Deformable printed circuit boards that enable metamorphic electronics. - In: NPG Asia Materials, ISSN 1884-4057, 8 (2016), e336, 8 Seiten

http://dx.doi.org/10.1038/am.2016.186
Zakharko, Yuriy; Held, Martin; Graf, Arko; Rödlmeier, Tobias; Eckstein, Ralph; Hernandez-Sosa, Gerardo; Hähnlein, Bernd; Pezoldt, Jörg; Zaumseil, Jana
Surface lattice resonances for enhanced and directional electroluminescence at high current densities. - In: ACS photonics, ISSN 2330-4022, Bd. 3 (2016), 12, S. 2225-2230, insges. 6 S.
Gesehen am 01.10.2021

http://dx.doi.org/10.1021/acsphotonics.6b00491
Berthold, Theresa; Stauden, Thomas; Krischok, Stefan; Himmerlich, Marcel; Mischo, Markus; Cimalla, Volker; Rombach, Julius; Bierwagen, Oliver
Influence of thermal and oxidative treatments on the electronic surface properties of In2O3 films. - In: 80th Annual Meeting of the DPG and DPG-Frühjahrstagung (Spring Meeting) of the Condensed Matter Section (SKM), (2016), HL 23.6, insges. 1 S.
Im Titel ist "2" und "3" tiefgestellt

Bagheri, Shahin; Zgrabik, Christine M.; Gissibl, Timo; Tittl, Andreas; Sterl, Florian; Walter, Ramon; De Zuani, Stefano; Berrier, Audrey; Stauden, Thomas; Richter, Gunther; Hu, Evelyn L.; Giessen, Harald
Large-area fabrication of TiN nanoantenna arrays for refractory plasmonics in the mid-infrared. - In: 80th Annual Meeting of the DPG and DPG-Frühjahrstagung (Spring Meeting) of the Condensed Matter Section (SKM), (2016), O 33.11, insges. 1 S.

Geng, Zhansong; Kinberger, Wilhelm; Granzner, Ralf; Pezoldt, Jörg; Schwierz, Frank
2D electronics - opportunities and limitations. - In: 2016 46th European Solid-State Device Research Conference (ESSDERC), ISBN 978-1-5090-2969-3, (2016), S. 230-235

http://dx.doi.org/10.1109/ESSDERC.2016.7599628
Pezoldt, Jörg; Kharlamov, Vladimir S.; Kulikov, Dmitri V.; Lubov, Maxim N.; Trushin, Yuri V.
Concentration profile simulation of SiC/Si heterostructures. - In: Materials science forum, ISSN 1662-9752, Bd. 858 (2016), S. 501-504

http://dx.doi.org/10.4028/www.scientific.net/MSF.858.501
Pezoldt, Jörg;
Heteropolytypic superlattices. - In: Materials science forum, ISSN 1662-9752, Bd. 858 (2016), S. 278-282

http://dx.doi.org/10.4028/www.scientific.net/MSF.858.278
Jatal, Wael; Baumann, Uwe; Jacobs, Heiko O.; Schwierz, Frank; Pezoldt, Jörg
Tri-gate Al0.2Ga0.8N/AlN/GaN HEMTs on SiC/Si-substrates. - In: Materials science forum, ISSN 1662-9752, Bd. 858 (2016), S. 1174-1177
Im Titel sind "0.2" und "0.8" tiefgestellt

http://dx.doi.org/10.4028/www.scientific.net/MSF.858.1174
Pezoldt, Jörg; Hähnlein, Bernd; Jacobs, Heiko O.; Schwierz, Frank
Amplification in graphene nanoribbon junctions. - In: Materials science forum, ISSN 1662-9752, Bd. 858 (2016), S. 1141-1144

http://dx.doi.org/10.4028/www.scientific.net/MSF.858.1141
Zakharko, Yuriy; Graf, Arko; Schießl, Stefan P.; Hähnlein, Bernd; Pezoldt, Jörg; Gather, Malte C.; Zaumseil, Jana
Broadband tunable, polarization-selective and directional emission of (6,5) carbon nanotubes coupled to plasmonic crystals. - In: Nano letters, ISSN 1530-6992, Bd. 16 (2016), 5, S. 3278-3284, insges. 7 S.
Gesehen am 01.10.2021

http://dx.doi.org/10.1021/acs.nanolett.6b00827
Nanmeni Bondja, Cedric; Geng, Zhansong; Granzner, Ralf; Pezoldt, Jörg; Schwierz, Frank
Simulation of 50-nm gate graphene nanoribbon transistors. - In: Electronics, ISSN 2079-9292, Bd. 5 (2016), 1, 3, insges. 17 S.
This article belongs to the Special Issue "Two-dimensional electronics - prospects and challenges", ISBN 978-3-03842-250-1

https://doi.org/10.3390/electronics5010003
Biswas, Shantonu; Kaltwasser, Mahsa; Stauden, Thomas; Jacobs, Heiko O.
Surface tension directed fluidic self-assembly of semiconductor chips across length scales and material boundaries. - In: Micromachines, ISSN 2072-666X, Bd. 7 (2016), 4, 54, insges. 13 S.

https://doi.org/10.3390/mi7040054
Fang, Jun; Schlag, Leslie; Park, Se-Chul; Stauden, Thomas; Pezoldt, Jörg; Schaaf, Peter; Jacobs, Heiko O.
Approaching gas phase electrodeposition: process and optimization to enable the self-aligned growth of 3D nanobridge-based interconnects. - In: Advanced materials, ISSN 1521-4095, Bd. 28 (2016), 9, S. 1770-1779

https://doi.org/10.1002/adma.201503039
Grieseler, Rolf; Theska, Felix; Stürzel, Thomas; Hähnlein, Bernd; Stubenrauch, Mike; Hopfeld, Marcus; Kups, Thomas; Pezoldt, Jörg; Schaaf, Peter
Elastic properties of nanolaminar Cr2AlC films and beams determined by in-situ scanning electron microscope bending tests. - In: Thin solid films, ISSN 1879-2731, Bd. 604 (2016), S. 85-89
Im Titel ist "2" tiefgestellt

http://dx.doi.org/10.1016/j.tsf.2016.03.026
Müller, Jens; Hannappel, Thomas; Hoffmann, Martin; Jacobs, Heiko O.; Lei, Yong; Rangelow, Ivo W.; Schaaf, Peter
Application of nanostructuring, nanomaterials and micro-nano-integration for improved components and system's performance. - In: 2016 Pan Pacific Microelectronics Symposium (Pan Pacific), ISBN 978-0-9888873-9-8, (2016), insges. 10 S.

http://dx.doi.org/10.1109/PanPacific.2016.7428387
Hähnlein, Bernd; Alsioufy, Mohamad Adnan; Lootze, Michael; Jacobs, Heiko O.; Schwierz, Frank; Pezoldt, Jörg
Planar nanowire transistors from two-dimensional materials. - In: Materials science in semiconductor processing, ISSN 1873-4081, Volume 42 (2016), Part 2 (Feb.), Seite 183-187

https://doi.org/10.1016/j.mssp.2015.07.068
Park, Se-Chul; Fang, Jun; Biswas, Shantonu; Kaltwasser, Mahsa; Stauden, Thomas; Jacobs, Heiko O.
Approaching roll-to-roll fluidic self-assembly: relevant parameters, machine design, and applications. - In: Journal of microelectromechanical systems, ISSN 1941-0158, Bd. 24 (2015), 6, S. 1928-1937

https://doi.org/10.1109/JMEMS.2015.2452772
Bagheri, Shahin; Zgrabik, Christine M.; Gissibl, Timo; Tittl, Andreas; Sterl, Florian; Walter, Ramon; De Zuani, Stefano; Berrier, Audrey; Stauden, Thomas; Richter, Gunther; Hu, Evelyn L.; Giessen, Harald
Large-area fabrication of TiN nanoantenna arrays for refractory plasmonics in the mid-infrared by femtosecond direct laser writing and interference lithography. - In: Optical materials express, ISSN 2159-3930, Bd. 5 (2015), 11, S. 2625-2633

https://doi.org/10.1364/OME.5.002625
Hähnlein, Bernd; Stubenrauch, Mike;
Mechanical properties and residual stress of thin 3C-SiC(100) films determined using MEMS structures. - In: Materials science forum, ISSN 1662-9752, Bd. 821/823 (2015), S. 281-284

http://dx.doi.org/10.4028/www.scientific.net/MSF.821-823.281
Park, Se-Chul; Fang, Jun; Biswas, Shantonu; Kaltwasser, Mahsa; Stauden, Thomas; Jacobs, Heiko O.
Automated reel-to-reel fluidic self-assembly for the production of solid state lighting modules. - In: MRS online proceedings library, ISSN 1946-4274, Bd. 1761 (2015), insges. 6 S.

We report the implementation of a first automated reel-to-reel fluidic self-assembly system based on surface tension driven self-assembly for macroelectronics application. The reported system incorporates precisely controlled and automated agitation, web moving and component recycling and dispensing system and enables continuous parallel assembly of semiconductor chips at a high rate (15k chips per hour using 2.5 cm wide web) and assembly yield (>99%) under optimal condition. In principle, scaling to any throughput should be possible considering the parallel nature of self-assembly. The process overcomes the limitations on area and throughput of prior methods. It provides a new platform for macroelectronics to enable the integration of microscopic high performance inorganic semiconductors on flexible or stretchable substrates with any desired location, pitch, and integration density. As an example we demonstrate the fabrication of a solid state area lighting panel.



https://doi.org/10.1557/opl.2015.679
Soulière, Veronique; Alassaad, Kassem; Cauwet, Fran¸cois; Peyre, Herve; Kups, Thomas; Pezoldt, Jörg; Kwasnicki, Pawel; Ferro, Gabriel
Ge addition during 4H-SiC epitaxial growth by CVD: mechanism of incorporation. - In: Materials science forum, ISSN 1662-9752, Bd. 821/823 (2015), S. 115-120

http://dx.doi.org/10.4028/www.scientific.net/MSF.821-823.115
Park, Se-Chul; Biswa, Shantonu; Fang, Jun; Kaltwasser, Mahsa; Stauden, Thomas; Jacobs, Heiko O.
Millimeter thin and rubber-like solid-state lighting modules fabricated using roll-to-roll fluidic self-assembly and lamination. - In: Advanced materials, ISSN 1521-4095, Bd. 27 (2015), 24, S. 3661-3668

http://dx.doi.org/10.1002/adma.201500839
Hiller, Lars;
Nanostrukturierte Ladungsträgergase für nicht-klassische Bauelementekonzepte, 2015. - Online-Ressource (PDF-Datei: XVIII, 132 Bl., 9,47 MB) Ilmenau : Techn. Univ., Diss., 2015

In der Forschung rücken neben der etablierten Siliziumtechnologie immer mehr auch alternative Bauelemente und Materialien in den Mittelpunkt, die bestehenden Grenzen der Funktionalität überschreiten können. Die Arbeit beschäftigt sich mit diesen beiden Ansätzen. Zum einen wird AlGaN/GaN als Beispiel für Heterosysteme vorgestellt. Es wird gezeigt, wie ein zweidimensionales Ladungsträgergas an der AlGaN/GaN-Grenzfläche entsteht. Mit Hilfe von Simulationen wird der Einfluss von Parametern wie Aluminiumgehalt und Barrieredicke auf Ladungsträgerdichte und -beweglichkeit untersucht. Der praktische Schwerpunkt dieser Arbeit liegt auf dem Entwurf und der Realisierung von AlGaN/GaN-basierten Nanostrukturen, die durch nicht-klassische Effekte eine Vielzahl von Anwendungsmöglichkeiten als Gleichrichter, Seitengate-Transistoren, logischer Gatter und selektiven Schaltern eröffnen. Eine solche universelle Struktur ist das Three-Terminal Junction (TTJ) Bauelement. Der von anderen Materialsystemen bekannte Aufbau wird auf AlGaN/GaN überführt. Es wird gezeigt, wie sich geometrische Anordnung (T- und Y-Aufbau) sowie strukturelle und externe Parameter (Kontaktbalkenbreite, -länge, Temperatur) auf seine Funktion auswirken. Durch eine Fortentwicklung des T-Aufbaus kann der Self-Gating-Effekt dieser Bauelementeart forciert werden. Darüber hinaus wurde in den hergestellten Strukturen erstmalig eine positive Gleichrichtung beobachtet. In der vorliegenden Arbeit wird auch dieser untersucht und die bestimmenden Effekte für sein Auftreten (physikalische Effekte sowie essentielle Strukturparameter) systematisch analysiert und erläutert. Aufgrund des Aufbaus und der Funktion kann man auch von T-Gleichrichtbauelementen und Y-Gleichrichtbauelementen sprechen. Darüber hinaus wird ein Ausblick auf weitere Bauelemente gegeben, die sich in AlGaN/GaN- Heterosysteme überführen lassen und neue Anwendungsfelder eröffnen. Dabei werden Dioden vorgestellt, die auf geometrischer Grundlage ohne Dotierstoff- oder Materialübergang realisiert werden können und daher besonders für alle Arten von zweidimensionalen Materialien geeignet sind. Zudem lassen sich die TTJ-Bauelemente durch leichte Veränderungen in Transistoren mit Seitengate-Steuerung überführen. Diese Bauelemente wurden ebenfalls hergestellt und untersucht.



http://www.db-thueringen.de/servlets/DocumentServlet?id=26139
Ecke, Gernot; Vesely, Marian
Partnerschaft 2 - Institut für Mikro- und Nanoelektronik, Fachgebiet Nanotechnologie (TU Ilmenau) und Institut für Elektronik und Photonik, Lehrstuhl Mikroelektronik (STU Bratislava). - In: Retrospektive 50 Jahre Zusammenarbeit Slowakische Technische Universität Bratislava - Technische Universität Ilmenau, (2015), S. 38-48

Schwierz, Frank; Pezoldt, Jörg; Granzner, Ralf
Two-dimensional materials and their prospects in transistor electronics. - In: Nanoscale, ISSN 2040-3372, Bd. 7 (2015), 18, S. 8261-8283

https://doi.org/10.1039/C5NR01052G
Fang, Jun; Park, Se-Chul; Schlag, Leslie; Stauden, Thomas; Pezoldt, Jörg; Jacobs, Heiko O.
Localized collection of airborne analytes: a transport driven approach to improve the response time of existing gas sensor designs including SERS based detection of small molecules. - In: MRS online proceedings library, ISSN 1946-4274, Bd. 1746 (2015)

We describe a new transport mechanism that supports the localized collection of airborn analytes at higher rates when compared to diffusion based standard commonly used. It combines advanced aerosol science with novel nanosensor designs. Background: The detection of single molecular binding events has been a recent trend in sensor research introducing various sensor designs where the active sensing elements are nanoscopic in size. While it is possible to detect single binding events, the research has not yet addressed the question of how to effectively transport airborne analytes to these point-like sensing structures. Currently, diffusion-only-transport is used and it becomes increasingly unlikely for an analyte molecule to "find" and interact with sensing structures where the active area is shrunk in size, trading an increased sensitivity with a long response time. Approach: Instead of using diffusion-only-transport, this report introduces various analyte charging methods and electrodynamic nanolens based analyte concentration concepts to transport airborne analytes to nanoscopic sensing points to improve the response time of existing gas sensor designs. We demonstrate localized collection of analytes over a wide range of molecular weights ranging from 3×1017 to 1×102 Daltons, including (i) microscopic analyte particles, (ii) inorganic nanoparticles, all the way down to (iii) small organic molecules. We also demonstrate first experimental results towards an programmable active matrix based analyte collection approach referred to as "Airborn Analyte Memory Chip/Recorder" for "OFFSITE" analyte analysis, which (i) takes samples of the particles or molecules in an Aerosol at specific points in time, (ii) transports the analyte sample to a designated spot on a surface, (iii) concentrates the analyte at this spot to achieve an amplification, (iv) repeats this sequence until the recording matrix is full, and (v) reads out the analyte matrix on the chip. Implications: In all cases we find that the collection rate is several orders of magnitudes higher than in the case where the discovered collection schemes is turned off and where collection is driven by diffusion-only-transport. The collection scheme is integrated on an existing surface-enhanced Raman spectroscopy based sensor. In terms of response time, the process is able to detect analytes at 9 parts per million within 1 second. As a comparison, 1 hour is required to reach the same signal level when diffusion-only-transport is used. The novel "Airborn Analyte Memory Chip/Recorder" achieved by this approach could be a commodity item that is placed in an environment that a user would like to keep a record from. The information is retrieved on an as needed basis. Offsite analysis of the chip storing the information would make this approach more economical than an online monitoring system for all kinds of threads.



http://dx.doi.org/10.1557/opl.2015.398
Jatal, Wael; Baumann, Uwe; Tonisch, Katja; Schwierz, Frank; Pezoldt, Jörg
High-frequency performance of GaN high-electron mobility transistors on 3C-SiC/Si substrates with Au-free ohmic contacts. - In: IEEE electron device letters, Bd. 36 (2015), 2, S. 123-125

http://dx.doi.org/10.1109/LED.2014.2379664
Jatal, Wael; Tonisch, Katja; Baumann, Uwe; Schwierz, Frank; Pezoldt, Jörg
GaN HEMTs on Si substrate with high cutoff frequency. - In: 2014 10th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), ISBN 978-1-4799-5476-6, (2014), insges. 4 S.

We report on GaN HEMTs on Si substrates with high cutoff frequency and low contact resistance. HEMTs with two barriers designs and two source/drain metallization schemes have been fabricated and characterized. Our 100-nm gate transistors show a maximum drain current density of 1.4 A/mm and a peak transconductance of 427 mS/mm. The fastet transistors have a gate length of 80 nm and achieve a cutoff frequency fT of 180 GHz. This is the best fT performance reported for GaN HEMTs on Si reported so far and rivals the fastest GaN HEMTs on SiC with comparable gate length.



http://dx.doi.org/10.1109/ASDAM.2014.6998660
Stubenrauch, Mike; Hanitsch, Stefan; Fischer, Robert; Bartsch, Heike; Straube, Anja; Hoffmann, Martin; Witte, Hartmut
BioMEMS for analysis and synthesis in life sciences. - In: Biomedical engineering, ISSN 1862-278X, Bd. 59.2014, Suppl. 1, S. S127

http://dx.doi.org/10.1515/bmt-2014-5001
Fang, Jun; Park, Se-Chul; Schlag, Leslie; Stauden, Thomas; Pezoldt, Jörg; Jacobs, Heiko O.
Active matrix-based collection of airborne analytes: an analyte recording chip providing exposure history and finger print. - In: Advanced materials, ISSN 1521-4095, Bd. 26 (2014), 45, S. 7600-7607

https://doi.org/10.1002/adma.201402589
Fang, Jun; Park, Se-Chul; Schlag, Leslie; Stauden, Thomas; Pezoldt, Jörg; Jacobs, Heiko O.
Localized collection of airborne analytes: a transport driven approach to improve the response time of existing gas sensor designs including SERS based detection of small molecules. - In: Mikro-Nano-Integration, (2014), S. 62-65

We describe a new transport mechanism that supports the localized collection of airborn analytes at higher rates when compared to diffusion based standard commonly used. It combines advanced aerosol science with novel nanosensor designs. Background: The detection of single molecular binding events has been a recent trend in sensor research introducing various sensor designs where the active sensing elements are nanoscopic in size. While it is possible to detect single binding events, the research has not yet addressed the question of how to effectively transport airborne analytes to these point-like sensing structures. Currently, diffusion-only-transport is used and it becomes increasingly unlikely for an analyte molecule to “find” and interact with sensing structures where the active area is shrunk in size, trading an increased sensitivity with a long response time. Approach: Instead of using diffusion-only-transport, this report introduces various analyte charging methods and electrodynamic nanolens based analyte concentration concepts to transport airborne analytes to nanoscopic sensing points to improve the response time of existing gas sensor designs. We demonstrate localized collection of analytes over a wide range of molecular weights ranging from 3×1017 to 1×102 Daltons, including (i) microscopic analyte particles, (ii) inorganic nanoparticles, all the way down to (iii) small organic molecules. We also demonstrate first experimental results towards an programmable active matrix based analyte collection approach referred to as "Airborn Analyte Memory Chip/Recorder" for "OFFSITE" analyte analysis, which (i) takes samples of the particles or molecules in an Aerosol at specific points in time, (ii) transports the analyte sample to a designated spot on a surface, (iii) concentrates the analyte at this spot to achieve an amplification, (iv) repeats this sequence until the recording matrix is full, and (v) reads out the analyte matrix on the chip. Implications: In all cases we find that the collection rate is several orders of magnitudes higher than in the case where the discovered collection schemes is turned off and where collection is driven by diffusion-only-transport. The collection scheme is integrated on an existing surface-enhanced Raman spectroscopy based sensor. In terms of response time, the process is able to detect analytes at 9 parts per million within 1 second. As a comparison, 1 hour is required to reach the same signal level when diffusion-only-transport is used. The novel "Airborn Analyte Memory Chip/Recorder" achieved by this approach could be a commodity item that is placed in an environment that a user would like to keep a record from. The information is retrieved on an as needed basis. Offsite analysis of the chip storing the information would make this approach more economical than an online monitoring system for all kinds of threads.



Park, Se-Chul; Fang, Jun; Biswas, Shantonu; Kaltwasser, Mahsa; Stauden, Thomas; Jacobs, Heiko O.
Automated reel-to-reel fluidic self-assembly enabling the production of solid state lighting panels. - In: Mikro-Nano-Integration, (2014), S. 124-126

We report the implementation of a first automated reel-to-reel fluidic self-assembly system based on surface tension driven self-assembly for macroelectronics application. The reported system incorporates precisely controlled and automated agitation, web moving and component recycling and dispensing system and enables continuous parallel assembly of semiconductor chips at a high rate (15k chips per hour using 2.5 cm wide web) and assembly yield (>99%) under optimal condition. In principle, scaling to any throughput should be possible considering the parallel nature of self-assembly. The system was carefully optimized to accomplish defect free assembly with computations and comparisons of the relevant forces under various operation conditions. The process overcomes the limitations on area and throughput of prior methods. It provides a new platform for macroelectronics to enable the integration of microscopic high performance inorganic semiconductors on flexible or stretchable substrates with any desired location, pitch, and integration density. As an example we demonstrate the fabrication of a solid state area lighting panel.



Cimalla, Volker; Baeumler, Martina; Kirste, Lutz; Prescher, M.; Christian, B.; Passow, Thorsten; Benkhelifa, Fouad; Bernhardt, F.; Eichapfel, Georg; Himmerlich, Marcel
Densification of thin aluminum oxide films by thermal treatments. - In: Materials sciences and applications, ISSN 2153-1188, Bd. 5 (2014), 8, S. 628-638

Thin AlOx films were grown on 4H-SiC by plasma-assisted atomic layer deposition (ALD) and plasma assisted electron-beam evaporation at 300&ring;C. After deposition, the films were annealed in nitrogen at temperatures between 500&ring;C and 1050&ring;C. The films were analyzed by X-ray reflectivity (XRR) and atomic force microscopy (AFM) in order to determine film thickness, surface roughness and density of the AlOx layer. No differences were found in the behavior of AlOx films upon annealing for the two different employed deposition techniques. Annealing results in film densification, which is most prominent above the crystallization temperature (800&ring;C). In addition to the increasing density, a mass loss of ˜5% was determined and attributed to the presence of aluminum oxyhydroxide in as deposited films. All changes in film properties after high temperature annealing appear to be independent of the deposition technique.



http://dx.doi.org/10.4236/msa.2014.58065
Park, Se-Chul; Fang, Jun; Biswas, Shantonu; Kaltwasser, Mahsa; Stauden, Thomas; Jacobs, Heiko O.
A first implementation of an automated reel-to-reel fluidic self-assembly machine. - In: Advanced materials, ISSN 1521-4095, Bd. 26 (2014), 34, S. 5942-5949

A first automated reel-to-reel fluidic selfassembly process for macroelectronic applications is reported. This system enables high-speed assembly of semiconductor dies (15 000 chips per hour using a 2.5 cm-wide web) over large-area substrates. The optimization of the system (>99% assembly yield) is based on identification, calculation, and optimization of the relevant forces. As an application, the production of a solid-state lighting panel is discussed, involving a novel approach to apply a conductive layer through lamination.



http://dx.doi.org/10.1002/adma.201401573
Hähnlein, Bernd; Schaaf, Peter; Schaaf, Peter *1963-*;
Size effect of Young's modulus in AlN thin layers. - In: Journal of applied physics, ISSN 1089-7550, Bd. 116 (2014), 12, 124306, insges. 4 S.

https://doi.org/10.1063/1.4896496
Konkin, Alexander; Ritter, Uwe; Scharff, Peter; Schrödner, Mario; Sensfuss, Steffi; Aganov, Albert; Klochkov, V.; Ecke, Gernot
Improvement of P3HT-ICBA solar cell photovoltaic characteristics due to the incorporation of the maleic anhydride additive: P3HT morphology study of P3HT-ICBA and P3HT-ICBA-MA films by means of X-band LESR. - In: Synthetic metals, Bd. 197 (2014), S. 210-216

http://dx.doi.org/10.1016/j.synthmet.2014.09.012
Hanitsch, Stefan; Hampl, Jörg; Fischer, Robert; Tobola, Justyna; Stubenrauch, Mike; Schober, Andreas; Witte, Hartmut; Hoffmann, Martin
Integration of hydrogels into BioMEMS. - In: Shaping the future by engineering, (2014), insges. 9 S.

Konkin, Alexander; Ritter, Uwe; Scharff, Peter; Mamin, G.; Aganov, Albert; Orlinskii, S.; Krinichnyi, V.; Egbe, Daniel Ayuk Mbi; Ecke, Gernot; Romanus, Henry
Multifrequency X,W-band ESR study on photo-induced ion radical formation in solid films of mono- and di-fullerenes embedded in conjugated polymers. - In: Carbon, ISSN 1873-3891, Bd. 77 (2014), S. 11-17

http://dx.doi.org/10.1016/j.carbon.2014.04.062
Hiller, Lars; Stauden, Thomas; Kemper, Ricarda M.; Lindner, Jörg K. N.; As, Donat J.; Pezoldt, Jörg
Hydrogen effects in ECR-etching of 3C-SiC(100) mesa structures. - In: Materials science forum, ISSN 1662-9752, Bd. 778/780 (2014), S. 730-733

http://dx.doi.org/10.4028/www.scientific.net/MSF.778-780.730
Hähnlein, Bernd; Stubenrauch, Mike; Michael, Steffen; Pezoldt, Jörg
Mechanical properties and residual stress of thin 3C-SiC(111) films determined using MEMS structures. - In: Materials science forum, ISSN 1662-9752, Bd. 778/780 (2014), S. 444-448

http://dx.doi.org/10.4028/www.scientific.net/MSF.778-780.444
Fang, Jun; Park, Se-Chul; Schlag, Leslie; Stauden, Thomas; Pezoldt, Jörg; Jacobs, Heiko O.
Localized collection of airborne analytes: a transport driven approach to improve the response time of existing gas sensor designs. - In: Advanced functional materials, ISSN 1616-3028, Bd. 24 (2014), 24, S. 3706-3714

http://dx.doi.org/10.1002/adfm.201303829
Alassaad, Kassem; Soulière, Véronique; Cauwet, Fran¸cois; Peyre, Hervé; Carole, Davy; Kwasnicki, Pawel; Juillaguet, Sandrine; Kups, Thomas; Pezoldt, Jörg; Ferro, Gabriel
Ge incorporation inside 4H-SiC during homoepitaxial growth by chemical vapor deposition. - In: Acta materialia, ISSN 1873-2453, Bd. 75 (2014), S. 219-226

http://dx.doi.org/10.1016/j.actamat.2014.04.057
Synooka, Olesia; Eberhardt, Kai-Rudi; Singh, Chetan Raj; Hermann, Felix; Ecke, Gernot; Ecker, Bernhard; Hauff, Elizabeth von; Gobsch, Gerhard; Hoppe, Harald
Influence of thermal annealing on PCDTBT:PCBM composition profiles. - In: Advanced energy materials, ISSN 1614-6840, Bd. 4.2014, 5, 1300981

http://dx.doi.org/10.1002/aenm.201300981
Kemper, Ricarda M.; Mietze, C.; Hiller, Lars; Stauden, Thomas; Pezoldt, Jörg; Meertens, D.; Luysberg, M.; As, Donat J.; Lindner, Jörg K. N.
Cubic GaN/AlN multi-quantum wells grown on pre-patterned 3C-SiC/Si (001). - In: Physica status solidi. Current topics in solid state physics. - Berlin : Wiley-VCH, 2002-2017 , ISSN: 1610-1642 , ZDB-ID: 2102966-0, ISSN 1610-1642, Bd. 11 (2014), 2, S. 265-268

http://dx.doi.org/10.1002/pssc.201300292
Hiller, Lars; Tonisch, Katja; Pezoldt, Jörg
Side gate AlGaN/GaN FET on silicon and sapphire. - In: Physica status solidi. Current topics in solid state physics. - Berlin : Wiley-VCH, 2002-2017 , ISSN: 1610-1642 , ZDB-ID: 2102966-0, ISSN 1610-1642, Bd. 11 (2014), 2, S. 280-283

http://dx.doi.org/10.1002/pssc.201300298
Hähnlein, Bernd; Tonisch, Katja; Ecke, Gernot; Grieseler, Rolf; Michael, Steffen; Schaaf, Peter; Pezoldt, Jörg
AlGaN based MEMS structures. - In: Physica status solidi, ISSN 1610-1642, Bd. 11 (2014), 2, S. 239-243

http://dx.doi.org/10.1002/pssc.201300153
Grieseler, Rolf; Hähnlein, Bernd; Stubenrauch, Mike; Kups, Thomas; Wilke, Marcus; Hopfeld, Marcus; Pezoldt, Jörg; Schaaf, Peter
Nanostructured plasma etched, magnetron sputtered nanolaminar Cr 2 AlC MAX phase thin films. - In: Applied surface science, Bd. 292 (2014), S. 997-1001

http://dx.doi.org/10.1016/j.apsusc.2013.12.099
Händel, Benjamin; Hähnlein, Bernd; Göckeritz, Robert; Schwierz, Frank; Pezoldt, Jörg
Electrical gating and rectification in graphene three-terminal junctions. - In: Applied surface science, Bd. 291 (2014), S. 87-92

http://dx.doi.org/10.1016/j.apsusc.2013.09.066
Pezoldt, Jörg; Hähnlein, Bernd; Stubenrauch, Mike; Tonisch, Katja; Grieseler, Rolf; Vanco, Lubomir; Schaaf, Peter
Verspannungsanalyse mit Raman-Spektroskopie an MEMS aus Gruppe III-Nitriden. - In: Thüringer Werkstofftag 2013, (2013), S. 101-106
Parallel als Druckausg. erschienen

http://www.db-thueringen.de/servlets/DocumentServlet?id=22997
Pezoldt, Jörg; Tonisch, Katja
FTIR-Ellipsometrie an Mischkristallen von Gruppe III-Nitriden. - In: Thüringer Werkstofftag 2013, (2013), S. 107-114

http://www.db-thueringen.de/servlets/DocumentServlet?id=22997
Stauden, Thomas; Himmerlich, Marcel; Grewe, Adrian; Krischok, Stefan
Die Herstellung haftfester Metallschichten auf PMMA-Oberflächen. - In: Thüringer Werkstofftag 2013, (2013), S. 207-208

http://www.db-thueringen.de/servlets/DocumentServlet?id=22997
Grieseler, Rolf; Stubenrauch, Mike; Michael, Steffen; Klaus, Jenny; Tonisch, Katja; Pezoldt, Jörg; Schaaf, Peter
Ermittlung mechanischer Eigenschaften neuer Materialien mittels freistehender Balkenstrukturen. - In: Thüringer Werkstofftag 2013, (2013), S. 209-210

http://www.db-thueringen.de/servlets/DocumentServlet?id=22997
Grieseler, Rolf; Stubenrauch, Mike; Michael, Steffen; Klaus, Jenny; Tonisch, Katja; Pezoldt, Jörg; Schaaf, Peter
Ermittlung mechanischer Eigenschaften neuer Materialien mittels freistehender Balkenstrukturen. - In: Thüringer Werkstofftag 2013, (2013), S. 209-210

Hiller, Lars;
AlGaN/GaN three-terminal junction devices for rectification and transistor applications on 3C-SiC/Si pseudosubstrates. - In: IEEE transactions on electron devices, ISSN 1557-9646, Bd. 60 (2013), 10, S. 3047-3052

https://doi.org/10.1109/TED.2013.2265741
Lin, En-Chiang; Fang, Jun; Park, Se-Chul; Johnson, Forrest W.; Jacobs, Heiko O.
Effective localized collection and identification of airborne species through electrodynamic precipitation and SERS-based detection. - In: Nature Communications, ISSN 2041-1723, Bd. 4 (2013), 1636, S. 1-8

https://doi.org/10.1038/ncomms2590
Lin, En-Chiang; Fang, Jun; Park, Se-Chul; Stauden, Thomas; Pezoldt, Jörg; Jacobs, Heiko O.
Effective collection and detection of airborne species using SERS-based detection and localized electrodynamic precipitation. - In: Advanced materials, ISSN 1521-4095, Bd. 25 (2013), 26, S. 3554-3559

http://dx.doi.org/10.1002/adma.201300472
Kemper, Ricarda M.; Hiller, Lars; Stauden, Thomas; Pezoldt, Jörg; Duschik, K.; Niendorf, T.; Maier, H. J.; Meertens, D.; Tillmann, K.; As, Donat J.
Growth of cubic GaN on 3C-SiC/Si (001) nanostructures. - In: Journal of crystal growth, Bd. 378 (2013), S. 291-294

http://dx.doi.org/10.1016/j.jcrysgro.2012.10.011
Williamson, Adam; Schumann, Lars; Hiller, Lars; Klefenz, Frank; Hörselmann, Ingo; Husar, Peter; Schober, Andreas
Synaptic behavior and STDP of asymmetric nanoscale memristors in biohybrid systems. - In: Nanoscale, ISSN 2040-3372, Bd. 5 (2013), 16, S. 7297-7303

https://doi.org/10.1039/C3NR01834B
Lübbers, Benedikt;
AlGaN-based pH-sensors : impedance characterisation, optimisation and application for foetal blood sampling. - Ilmenau : Universitätsverlag Ilmenau, 2013. - Online-Ressource (PDF-Datei: XXVIII, 352 S., 5,67 MB) : Ilmenau, Techn. Univ., Diss., 2012
Parallel als Druckausg. erschienen

Die fötale Mikroblutuntersuchung wird zur Überwachung der Sauerstoffversorgung von Föten während der Geburt eingesetzt. Mit herkömmlichen Blutgasanalysatoren kommt es allerdings immer wieder zu Schwierigkeiten da nur sehr geringe Mengen fötalen Blutes (wenige 10 myl) für die Untersuchung zur Verfügung stehen. Ionensensitiven Feldeffekttransistoren (ISFET) bieten durch ihre Miniaturisierbarkeit das Potential das benötigte Volumen wesentlich zu reduzieren. In der vorliegenden Arbeit wird die Grundlage für die Anwendung von Aluminium-Gallium-Nitrid(AlGaN)-basierten ISFETs für die fötale Mikroblutuntersuchung geschaffen. Dazu werden AlGaN/GaN-Heterostrukturen mit Metall- und Elektrolytkontakt impedanzspektroskopisch charakterisiert. Es wird gezeigt, dass das standardmäßig verwendete eindimensionale Ersatzschaltbild die zweidimensionale Verarmungscharakteristik des zweidimensionalen Elektronengases nicht ausreichend genau beschreibt. Daher wird ein erweitertes Ersatzschaltbild unter Verwendung von sogenannten "constant phase elements" hergeleitet und verifiziert. Auf Basis des neuen Ersatzschaltbildes werden Drifteinflüsse charakterisiert sowie die pH-Sensitivität der AlGaN-pH-Sensoren bestimmt. Neben der lichtinduzierten Drift durch persistente Photoleitung, kann auch eine langsame elektrochemische Korrosion des Sensors nachgewiesen werden. Für die Reduzierung der lichtinduzierten Drift wird die kontinuierliche Beleuchtung der Sensoren untersucht und eine deutliche Verkürzung der Driftdauer für rotes Licht festgestellt. Die Vergrößerung der Dicke der GaN-Deckschicht und die Reduzierung des Aluminiumgehalts in der AlGaN Barriereschicht erhöht nachweislich die Korrosionbeständigkeit der Sensoren.Unter Verwendung dieser Optimierungsschritte wird gezeigt, dass eine Genauigkeit von ±0.03pH für die pH-Wert-Bestimmung in verschiedenste wässrige Lösungen sowie für Nabelschnurblut erreicht werden kann. Die erzielten Ergebnisse werden für die Entwicklung eines Mikro-Blut-pH Analysators mit einem Minimal-Probenvolumen von nur 10myl verwendet, der die Genauigkeits- und Präzisionsanforderungen der Richtlinie der Bundesärtzekammer erfüllt. Im Rahmen dieser Arbeit wird damit erstmalig gezeigt, dass AlGaN-basierte pH-Sensoren für die genaue und präzise Bestimmung des pH-Wertes in komplexen biochemischen Flüssigkeiten wie z.B. Nabelschnurblut geeignet sind.



http://www.db-thueringen.de/servlets/DocumentServlet?id=21442
Hiller, Lars; Tonisch, Katja; Tonisch, Katja *1980-*;
SiC/Si pseudosubstrates for AlGaN nanoelectronic devices. - In: Silicon carbide and related materials 2012, (2013), S. 1119-1122

Jatal, Wael; Tonisch, Katja; Baumann, Uwe; Schwierz, Frank; Pezoldt, Jörg
AlGaN/GaN based HEMTs on SiC/Si-substrates: influences on high frequency performance. - In: Silicon carbide and related materials 2012, (2013), S. 1115-1118

Hähnlein, Bernd; Händel, Benjamin; Schwierz, Frank; Pezoldt, Jörg
Properties of graphene side gate transistors. - In: Silicon carbide and related materials 2012, (2013), S. 1028-1031

Lubov, Maxim N.; Pezoldt, Jörg; Trushin, Yuri V.
Kinetic Monte Carlo simulation of impurity effects on nucleation and growth of SiC clusters on Si(100). - In: Silicon carbide and related materials 2012, (2013), S. 393-396

Tonisch, Katja; Benzig, Robert; Ecke, Gernot; Pezoldt, Jörg
AlGaN solid solution grown on 3C-SiC(111)/Si(111) pseudosubstrates. - In: Silicon carbide and related materials 2012, (2013), S. 103-106

Himmerlich, Marcel; Knübel, Andreas; Aidam, Rolf; Kirste, Lutz; Eisenhardt, Anja; Krischok, Stefan; Pezoldt, Jörg; Schley, Pascal; Sakalauskas, Egidijus; Goldhahn, Rüdiger; Félix, Rocío; Mánuel, José Manuel; Morales Sánchez, Francisco Miguel; Carvalho, Daniel; Ben, T.; García, Rafael; Koblmüller, Gregor
N-type conductivity and properties of carbon-doped InN(0001) films grown by molecular beam epitaxy. - In: Journal of applied physics, ISSN 1089-7550, Bd. 113 (2013), 3, S. 033501, insges. 11 S.

https://doi.org/10.1063/1.4775736
Tonisch, Katja;
Polarization-induced effects in heterostructures. - In: N - P, (2012), S. 2158-2167

Maus, Christopher; Stauden, Thomas; Ecke, Gernot; Tonisch, Katja; Pezoldt, Jörg
Smooth ceramic titanium nitride contacts on AlGaN/GaN-heterostructures. - In: Semiconductor science and technology, ISSN 1361-6641, Bd. 27 (2012), 11, S. 115007, insges. 6 S.

http://dx.doi.org/10.1088/0268-1242/27/11/115007
Schwierz, Frank; Pezoldt, Jörg
Device concepts using two-dimensional electronic materials: graphene, MoS2, etc.. - In: IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2012, ISBN 978-1-4673-2472-4, (2012), insges. 4 S.

http://dx.doi.org/10.1109/ICSICT.2012.6467941
Hähnlein, Bernd; Händel, Benjamin; Pezoldt, Jörg; Töpfer, Hannes; Granzner, Ralf; Schwierz, Frank
Side-gate graphene field-effect transistors with high transconductance. - In: Applied physics letters, ISSN 1077-3118, Bd. 101 (2012), 9, S. 093504, insges. 3 S.

We have fabricated epitaxial side-gate graphene field-effect transistors (FETs) with high transconductance. A side-gate graphene FET with 5560 nm2 active channel dimensions and a lateral gate-channel separation of 95 nm showing a high transconductance of 590 mS/mm is presented. An estimation of the electrostatic gate-channel capacitance of epitaxial side-gate graphene FETs shows that it is in the same order as the electrostatic gate capacitance of common top-gate graphene MOSFETs justifying the high transconductances of our devices. The results of the present paper demonstrate the potential of the side-gate architecture for graphene transistors.



http://dx.doi.org/10.1063/1.4748112
Pezoldt, Jörg; Kulikov, Dmitri V.; Kharlamov, Vladimir S.; Lubov, Maxim N.; Trushin, Yuri V.
Multi-scale simulation of nucleation and growth of nanoscale SiC on Si . - In: Journal of computational and theoretical nanoscience, ISSN 1546-1963, Bd. 9 (2012), 11, S. 1941-1966

http://dx.doi.org/10.1166/jctn.2012.2601
Grieseler, Rolf; Klaus, Jenny; Stubenrauch, Mike; Tonisch, Katja; Michael, Steffen; Pezoldt, Jörg; Schaaf, Peter
Residual stress measurements and mechanical properties of AlN thin films as ultra-sensitive materials for nanoelectromechanical systems. - In: The philosophical magazine: a journal of theoretical experimental and applied physics, ISSN 1941-5869, Bd. 92 (2012), 25/27, S. 3392-3401

https://doi.org/10.1080/14786435.2012.669074
Stubenrauch, Mike; Fischer, Robert; Fröber, Ulrike; Witte, Hartmut
BioMEMS for processing and testing of hydrogel-based bio-interfaces. - In: Biomedical engineering, ISSN 1862-278X, Bd. 57.2012, Suppl. 1, Track-E, S. 415-417

https://doi.org/10.1515/bmt-2012-4354
Stubenrauch, Mike; Fischer, Robert; Creutzburg, Heide; Teichman, Caecilie; Groß, Gregor Alexander; Witte, Hartmut
Segmented flow microfluidics in multilumen tubing. - In: Biomedical engineering, ISSN 1862-278X, Bd. 57.2012, Suppl. 1, Track-E, S. 926

https://doi.org/10.1515/bmt-2012-4360
Pezoldt, Jörg; Grieseler, Rolf; Schupp, Thorsten; As, Donat J.; Schaaf, Peter
Mechanical properties of cubic SiC, GaN and AlN thin films. - In: Materials science forum, ISSN 1662-9752, Bd. 717/720 (2012), S. 513-516

http://dx.doi.org/10.4028/www.scientific.net/MSF.717-720.513
Pezoldt, Jörg; Göckeritz, Robert; Hähnlein, Bernd; Händel, Benjamin; Schwierz, Frank
T- and Y-branched three-terminal junction graphene devices. - In: Materials science forum, ISSN 1662-9752, Bd. 717/720 (2012), S. 683-686

http://dx.doi.org/10.4028/www.scientific.net/MSF.717-720.683
Hiller, Lars; Stauden, Thomas; Kemper, Ricarda M.; Lindner, Jörg K. N.; As, Donat J.; Pezoldt, Jörg
ECR-etching of submicron and nanometer sized 3C-SiC(100) mesa structures. - In: Materials science forum, ISSN 1662-9752, Bd. 717/720 (2012), S. 901-904

http://dx.doi.org/10.4028/www.scientific.net/MSF.717-720.901
Knoblauch, Michael; Stubenrauch, Mike; Van Bel, Aart J. E.; Peters, Winfried S.
Forisome performance in artificial sieve tubes. - In: Plant, cell & environment, ISSN 1365-3040, Bd. 35 (2012), 8, S. 1419-1427

http://dx.doi.org/10.1111/j.1365-3040.2012.02499.x
Pezoldt, Jörg; Hummel, Christian; Schwierz, Frank
Graphene field effect transistor improvement by graphene-silicon dioxide interface modification. - In: Physica. Low-dimensional systems & nanostructures. - Amsterdam [u.a.] : North-Holland, Elsevier Science, 1998- , ISSN: 1386-9477 , ZDB-ID: 1466595-5, ISSN 1386-9477, Bd. 44 (2012), 6, S. 985-988

http://dx.doi.org/10.1016/j.physe.2011.05.008
Eisenhardt, Anja; Himmerlich, Marcel; Lorenz, Pierre; Tonisch, Katja; Pezoldt, Jörg; Krischok, Stefan
Epitaxial growth and characterization of InN and GaN on C-face SiC(111)/Si(111). - In: 75th Annual Meeting of the DPG and combined DPG Spring Meeting of the Condensed Matter Section and the Section AMOP, 2011, HL 44.27

Göckeritz, Robert; Pezoldt, Jörg; Schwierz, Frank
Intrinsic voltage rectification in a graphene nano device. - In: 75th Annual Meeting of the DPG and combined DPG Spring Meeting of the Condensed Matter Section and the Section AMOP, 2011, O 60.55

Liday, Jozef; Vogrinčič, Peter; Ecke, Gernot
Some aspects of quantitative analysis of ternary alloys of group III-nitrides by Auger electron spectroscopy. - In: Journal of electrical engineering, ISSN 1339-309X, Bd. 62 (2011), 6, S. 367-369
Richtiger Name des 3. Verfassers: Gernot Ecke

https://doi.org/10.2478/v10187-011-0059-2
Nader, Richard; Pezoldt, Jörg
Quantitative evaluation of strain in epitaxial 2H-AlN layers. - In: Advances in innovative materials and applications, (2011), S. 213-216

Pezoldt, Jörg; Schröter, Bernd
Polarity control of CVD grown 3C-SiC on Si(111). - In: Materials science forum, ISSN 1662-9752, Bd. 679/680 (2011), S. 91-94

http://dx.doi.org/10.4028/www.scientific.net/MSF.679-680.91
Göckeritz, Robert; Tonisch, Katja; Jatal, Wael; Hiller, Lars; Schwierz, Frank; Pezoldt, Jörg
Side gate graphene and AlGaN/GaN unipolar nanoelectronic devices. - In: Advances in innovative materials and applications, (2011), S. 427-430

Pezoldt, Jörg; Kalnin, Andrei Alexandrovich
Defect interactions and polytype transitions. - In: Advances in innovative materials and applications, (2011), S. 217-220

Konkin, Alexander; Bounioux, C.; Ritter, Uwe; Scharff, Peter; Katz, Eugene A.; Aganov, Albert; Gobsch, Gerhard; Hoppe, Harald; Ecke, Gernot; Roth, Hans-Klaus
ESR and LESR X-band study of morphology and charge carrier interaction in blended P3HT-SWCNT and P3HT-PCBM-SWCNT solid thin films. - In: Synthetic metals, Bd. 161 (2011), 21/22, S. 2241-2248

http://dx.doi.org/10.1016/j.synthmet.2011.08.027
Tonisch, Katja; Jatal, Wael; Niebelschütz, Florentina; Romanus, Henry; Baumann, Uwe; Schwierz, Frank; Pezoldt, Jörg
AlGaN/GaN-heterostructures on (111) 3C-SiC/Si pseudo substrates for high frequency applications. - In: Thin solid films, ISSN 1879-2731, Bd. 520 (2011), 1, S. 491-496

http://dx.doi.org/10.1016/j.tsf.2011.07.003
Göckeritz, Robert; Pezoldt, Jörg; Schwierz, Frank
Epitaxial graphene three-terminal junctions. - In: Applied physics letters, ISSN 1077-3118, Bd. 99 (2011), 17, S. 173111, insges. 3 S.

http://dx.doi.org/10.1063/1.3653469
Granzner, Ralf; Tschumak, Elena; Kittler, Mario; Tonisch, Katja; Jatal, Wael; Pezoldt, Jörg; As, Donat J.; Schwierz, Frank
Vertical design of cubic GaN-based high electron mobility transistors. - In: Journal of applied physics, ISSN 1089-7550, Bd. 110 (2011), 11, 114501, insges. 8 S.

https://doi.org/10.1063/1.3663364
Göckeritz, Robert; Schmidt, Denny; Beleites, Moritz; Seifert, Gerhard; Krischok, Stefan P.; Himmerlich, Marcel; Pezoldt, Jörg
High temperature graphene formation on capped and uncapped SiC. - In: Materials science forum, ISSN 1662-9752, Bd. 679/680 (2011), S. 785-788

http://dx.doi.org/10.4028/www.scientific.net/MSF.679-680.785
Nader, Richard; Pezoldt, Jörg
Strain modification in epitaxial 2H-AlN layers on 3C-SiC/Si(111) pseudo-substrates. - In: Diamond and related materials, ISSN 0925-9635, Bd. 20 (2011), 5/6, S. 717-721

http://dx.doi.org/10.1016/j.diamond.2011.03.006
Pezoldt, Jörg; Kups, Thomas; Stubenrauch, Mike; Fischer, Michael
Black luminescent silicon. - In: Physica status solidi. Current topics in solid state physics. - Berlin : Wiley-VCH, 2002-2017 , ISSN: 1610-1642 , ZDB-ID: 2102966-0, ISSN 1610-1642, Bd. 8 (2011), 3, S. 1021-1026

http://dx.doi.org/10.1002/pssc.201000388
Schaaf, Peter; Spieß, Lothar; Kups, Thomas; Romanus, Henry; Grieseler, Rolf; Hopfeld, Marcus; Wilke, Marcus; Stauden, Thomas; Lorenz, David; Fischer, Andreas
Schichten über Schichten : innovative Beschichtungen für komplexe Anwendungen. - In: Vakuum in Forschung und Praxis, ISSN 1522-2454, Bd. 23 (2011), 3, S. 24-32

http://dx.doi.org/10.1002/vipr.201100457
Brückner, Klemens; Niebelschütz, Florentina; Tonisch, Katja; Förster, Christian; Cimalla, Volker; Stephan, Ralf; Pezoldt, Jörg; Stauden, Thomas; Ambacher, Oliver; Hein, Matthias A.
Micro- and nano-electromechanical resonators based on SiC and group III-nitrides for sensor applications. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 208 (2011), 2, S. 357-376

http://dx.doi.org/10.1002/pssa.201026343
Räthel, Jochen; Schley, Pascal; Sakalauskas, Egidijus; Gobsch, Gerhard; Müller, René; Klar, Thomas A.; Pezoldt, Jörg; Goldhahn, Rüdiger; Koblmüller, Gregor; Speck, James S.
Optical anisotropy of a- and m-plane InN grown on free-standing GaN substrates. - In: DPG Spring Meeting of the Condensed Matter Section with the divisions: Biological Physics, Chemical and Polymer Physics, Crystallography, Dielectric Solids, Dynamics and Statistical Physics, Low Temperature Physics, Magnetism, Metal and Material Physics, Physics of Socio-Economic Systems, Radiation and Medical Physics, Semiconductor Physics, Surface Science, Thin Films, Vacuum Science and Technology as well as the working group: Industry and Business, 2010, HL 56.1

Liday, Jozef; Vogrinčič, Peter; Hotový, Ivan; Bonanni, Alberta; Sitter, Helmut; Lalinský, Tibor; Vanko, Gabriel; Reháček, Vlastimil; Breza, Juraj; Ecke, Gernot
Ohmic contacts to p-GaN using Au/Ni-Mg-O metallization. - In: Journal of electrical engineering, ISSN 1339-309X, Bd. 61 (2010), 6, S. 378-381

https://doi.org/10.2478/v10187-010-0058-8
Skriniarov`a, J.; Novotn`y, I.; Tonisch, Katja; Schaaf, Peter
UV-source assisted GaN wet etching. - In: Programme and book of abstracts, ISBN 978-80-7399969-8, (2010), S. 61

As, Donat J.; Tschumak, Elena; Niebelschütz, Florentina; Jatal, Wael; Petzoldt, Joerg; Granzner, Ralf; Schwierz, Frank; Lischka, Klaus
Cubic AlGaN/GaN hetero-field effect transistors with normally on and normally off operation. - In: III-Nitride materials for sensing, energy conversion and controlled light-matter interactions, ISBN 978-1-605-11175-9, (2010), S. 107-112

Pezoldt, Jörg;
FTIR ellipsometry of SiC heterostructures. - In: AIP conference proceedings, ISSN 1551-7616, Bd. 1292 (2010), S. 83-86

http://dx.doi.org/10.1063/1.3518318
Cimalla, Volker; Röhlig, Claus-Christian; Lebedev, Vadim; Ambacher, Oliver; Tonisch, Katja; Niebelschütz, Florentina; Brückner, Klemens; Hein, Matthias
AlGaN/GaN based heterostructures for MEMS and NEMS applications. - In: Solid state phenomena, ISSN 1662-9779, Bd. 159 (2010), S. 27-38

http://dx.doi.org/10.4028/www.scientific.net/SSP.159.27
Röhlig, Claus-Christian; Niebelschütz, Merten; Brückner, Klemens; Tonisch, Katja; Ambacher, Oliver; Cimalla, Volker
Elastic properties of nanowires. - In: Physica status solidi, ISSN 1521-3951, Bd. 247 (2010), 10, S. 2557-2570

http://dx.doi.org/10.1002/pssb.201046378
Niebelschütz, Florentina; Brückner, Klemens; Tonisch, Katja; Stephan, Ralf; Cimalla, Volker; Ambacher, Oliver; Hein, Matthias A.
Piezoelectric actuated epitaxially grown AlGaN/GaN-resonators. - In: Physica status solidi. Current topics in solid state physics. - Berlin : Wiley-VCH, 2002-2017 , ISSN: 1610-1642 , ZDB-ID: 2102966-0, ISSN 1610-1642, Bd. 7 (2010), 7/8, S. 1829-1831

http://dx.doi.org/10.1002/pssc.200983616
Hofer, Manuel; Stauden, Thomas; Kouakouo Nomvussi, Serge Ayme; Pezoldt, Jörg; Rangelow, Ivo W.
Silizium-Nanoresonatoren. - In: Sensoren und Messsysteme 2010, (2010), S. 330-333

Niebelschütz, Florentina;
Mikrostrukturierungstechniken zur Herstellung von MEMS aus Halbleitern großer Bandlücke. - Ilmenau : Univ.-Verl. Ilmenau, 2010. - Online-Ressource (PDF-Datei: 200 S., 23,50 MB) : Ilmenau, Techn. Univ., Diss., 2009
Parallel als Druckausg. erschienen

Die Erweiterung des Anwendungsspektrums Mikroelektromechanischer Systeme (MEMS) um das Einsatzgebiet der chemischen, biologischen, gasartspezifischen und mikrofluidischen Sensoren stellt hohe Anforderungen an Stabilität (chemisch und mechanisch), Biokompatibilität, Miniaturisier- und Integrierbarkeit der verwendeten Materialien. Trotz der für diese Sensoren vorteilhaften Materialeigenschaften von Gruppe III-Nitriden gibt es bis heute nur eine beschränkte Anzahl von Forschergruppen, die sich mit der Prozessierung von MEMS auf Basis von GaN bzw. AlGaN/GaN-Heterostrukturen beschäftigen. Eine Hauptursache besteht vor allem in der aufwendigen Strukturierung dieser chemisch hoch stabilen Materialien. Die vorliegende Arbeit widmet sich daher der Entwicklung von Strukturierungstechniken zur Herstellung von MEMS aus Halbleitern großer Bandlücke mit einem besonderen Fokus auf nass- und trockenchemische Ätzverfahren. Diese sollen dazu verwendet werden, AlGaN/GaN-Resonatoren auf Si- und 4H-SiC-Substraten, sowie 3C-SiC/Si- und AlN/Saphir-Pseudosubstraten zu realisieren. Dabei wird das zweidimensionale Elektronengas (2DEG), welches sich an der Grenzfläche der AlGaN/GaN-Heterostruktur ausbildet, als Rückelektrode zur piezoelektrischen Anregung genutzt. Das entwickelte Technologiepaket vermeidet daher eine negative Beeinflussung der 2DEG-Rückelektrode und somit gleichzeitig der Funktionalität der MEMS. Zuletzt konnte die Funktionalität der so gefertigten piezoelektrisch angeregten AlGaN/GaN-Resonatoren nachgewiesen und zusätzlich die uniaxiale Verspannung der freigelegten AlGaN/GaN-Schichten auf den unterschiedlichen Substraten unter Anwendung einer Resonanzfrequenzanalyse ermittelt werden.



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Hotovy, Ivan; Pezoldt, Jörg; Kadlecikova, M.; Kups, Thomas; Spieß, Lothar; Breza, Juraj; Sakalauskas, Egidius; Goldhahn, Rüdiger; Rehacek, Vlastimil
Structural characterization of sputtered indium oxide films deposited at room temperature. - In: Thin solid films, ISSN 1879-2731, Bd. 518 (2010), 16, S. 4508-4511

http://dx.doi.org/10.1016/j.tsf.2009.12.018
Sakalauskas, Egidijus; Schley, Pascal; Räthel, Jochen; Klar, Thomas; Müller, René; Pezoldt, Jörg; Tonisch, Katja; Grandal, J.; Sánchez-García, M. A.; Calleja, E.
Optical properties of InN grown on Si(111) substrate. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 207 (2010), 5, S. 1066-1069

http://dx.doi.org/10.1002/pssa.200983102
Kharlamov, Vladimir S.; Kulikov, Dmitri V.; Trushin, Yuri V.; Nader, Richard; Mazri, Pierre; Stauden, Thomas; Pezoldt, Jörg
Investigation of Ge and C layer deposition on a Si substrate using SIMS profiling. - In: Bulletin of the Russian Academy of Sciences. Physics. - New York, NY : Allerton Press, 2007- , ISSN: 1934-9432 , ZDB-ID: 2403169-0, ISSN 1934-9432, Bd. 74 (2010), 2, S. 241-244

http://dx.doi.org/10.3103/S1062873810020292
Hummel, Christian; Schwierz, Frank; Hanisch, Antonia; Pezoldt, Jörg
Ambient and temperature dependent electric properties of backgate graphene transistors. - In: Physica status solidi. Basic solid state physics. - Weinheim : Wiley-VCH, [1971]- , ISSN: 1521-3951 , ZDB-ID: 1481096-7, ISSN 1521-3951, Bd. 247 (2010), 4, S. 903-906

http://dx.doi.org/10.1002/pssb.200982958
Pezoldt, Jörg; Stauden, Thomas; Niebelschütz, Florentina; Alsioufy, Mohamad Adnan; Nader, Richard; Masri, Pierre M.
Tuning residual stress in 3C-SiC(100) on Si(100). - In: Materials science forum, ISSN 1662-9752, Bd. 645/648 (2010), S. 159-162

http://dx.doi.org/10.4028/www.scientific.net/MSF.645-648.159
Hofer, Manuel; Stauden, Thomas; Rangelow, Ivo W.; Pezoldt, Jörg
Nanostructuring techniques for 3C-SiC(100) NEMS structures. - In: Materials science forum, ISSN 1662-9752, Bd. 645/648 (2010), S. 841-844

http://dx.doi.org/10.4028/www.scientific.net/MSF.645-648.841
Niebelschütz, Florentina; Stauden, Thomas; Tonisch, Katja; Pezoldt, Jörg
Temperature facilitated ECR-etching for isotropic SiC structuring. - In: Materials science forum, ISSN 1662-9752, Bd. 645/648 (2010), S. 849-852

http://dx.doi.org/10.4028/www.scientific.net/MSF.645-648.849
Tonisch, Katja; Jatal, Wael; Granzner, Ralf; Kittler, Mario; Baumann, Uwe; Schwierz, Frank; Pezoldt, Jörg
2H-AlGaN/GaN HEMTs on 3C-SiC(111)/Si(111) substrates. - In: Materials science forum, ISSN 1662-9752, Bd. 645/648 (2010), S. 1219-1222

http://dx.doi.org/10.4028/www.scientific.net/MSF.645-648.1219
Niebelschütz, Florentina; Zhao, Wei Hong; Brückner, Klemens; Tonisch, Katja; Linß, Matthias; Hein, Matthias A.; Pezoldt, Jörg
Property modification of 3C-SiC MEMS on Ge-modified Si(100) substrates. - In: Materials science forum, ISSN 1662-9752, Bd. 645/648 (2010), S. 861-864

http://dx.doi.org/10.4028/www.scientific.net/MSF.645-648.861
Tonisch, Katja; Niebelschütz, Florentina; Brückner, Klemens; Buchheim, Carsten; Goldhahn, Rüdiger; Cimalla, Volker; Ambacher, Oliver; Hein, Matthias
Piezoelektrisch angeregte MEMS aus epitaktischen AlGaN/GaN-Heterostrukturen. - In: Thüringer Werkstofftag 2010, (2010), S. 85-90
Parallel als Druckausg. erschienen

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Göckeritz, Robert; Koch, Roland; Himmerlich, Marcel; Endlich, Michael; Hummel, Christian; Alsioufy, Mohamad Adnan; Krischok, Stefan; Schäfer, Jürgen A.; Schwierz, Frank; Pezoldt, Jörg
Graphenprozessierung für Transistoren: materialanalytische Fragestellungen. - In: Thüringer Werkstofftag 2010, (2010), S. 91-98

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Stauden, Thomas; Tonisch, Katja; Niebelschütz, Florentina; Masri, Pierre; Pezoldt, Jörg
Grenzflächenmodifikation und Eigenschaften in Heterostrukturen mit großer Gitterfehlpassung. - In: Thüringer Werkstofftag 2010, (2010), S. 99-104

http://www.db-thueringen.de/servlets/DocumentServlet?id=15197
Tonisch, Katja;
AlGaN/GaN-Schichtsysteme für piezoelektrisch angeregte Resonatoren. - Ilmenau : Univ.-Verl. Ilmenau, 2010. - Online-Ressource (PDF-Datei: 192 S., 15,02 MB) : Ilmenau, Techn. Univ., Diss., 2009
Enth. außerdem: Thesen

Auf Grund der gestiegenen Anforderungen für mikroelektromechanische Systeme (MEMS) hinsichtlich Stabilität, Miniaturisier- und Integrierbarkeit, steigt das Interesse an neuen Materialsystemen wie den Halbleitern großer Bandlücke. Die vorliegende Arbeit gliedert sich in zwei Schwerpunkte, die für die Herstellung GaN-basierter MEMS bewältigt werden mussten: zum Einen wurde das Wachstum auf selektiv zu GaN ätzbaren Substraten untersucht. In der vorliegenden Arbeit werden drei Substrate vorgestellt, welche sowohl das epitaktische Wachstum von GaN als auch das Freistellen der Struktur erlauben. Dazu gehört die Verwendung von 4H-SiC als Substrat, welches sich kürzlich als isotrop ätzbar erwiesen hat. Als zweites wird das epitaktische GaN-Wachstum auf nanokristallinen, gesputterten AlN-Opferschichten gezeigt, welches die MEMS-Herstellung auf Saphir ermöglicht. Im letzten Fall erfolgt das Wachstum auf Siliziumsubstraten mit Hilfe einer 3C-SiC-Zwischenschicht. Die piezoelektrischen Eigenschaften von (GaN/)AlGaN/GaN-Heterostrukturen standen im zweiten Schwerpunkt im Fokus. Dabei dient die AlGaN-Schicht und in einigen Fällen eine zusätzliche GaN-Deckschicht als piezoelektrisch aktive Schicht. Das hochleitfähige 2D Elektronengas (2DEG) an der unteren AlGaN/GaN-Grenzfläche stellt dabei die zur Anregung benötige Rückelektrode zur Verfügung. Mit Hilfe der Elektroreflexion konnte die elektrische Feldverteilung in Abhängigkeit von der angelegten elektrischen Spannung bestimmt werden. In Kombination mit der Piezokraftmikroskopie, bei welcher die spannungsabhängige Auslenkung der Schichten untersucht wurde, konnte das piezoelektrische Modul d33 für Al0.31Ga0.69N zuverlässig mit 5 pm/V bestimmt werden. Die Prozessierung der ersten GaN-basierten MEMS wird schließlich auf allen drei zuvor eingeführten Substraten vorgestellt, das Schwingungsverhalten für die piezoelektrische Anregung von Transversalschwingungen mit Hilfe von Vibrometermessungen sowie das rein elektrische Auslesen von Longitudinalschwingungen (ebenfalls für piezoelektrische Anregung) demonstriert



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Nader, Richard; Niebelschütz, Florentina; Kulikov, Dmitri V.; Kharlamov, Vladimir V.; Trushin, Yurii V.; Masri, Pierre; Pezoldt, Jörg
Designing the Si(100) conversion into SiC(100) by Ge. - In: Physica status solidi, ISSN 1610-1642, Bd. 7 (2010), 2, S. 141-144

https://doi.org/10.1002/pssc.200982448
Pezoldt, Jörg; Hummel, Christian; Hanisch, Antonia; Hotovy, Ivan; Kadlecikova, Magdalena; Schwierz, Frank
Top gated graphene transistors with different gate insulators. - In: Physica status solidi, ISSN 1610-1642, Bd. 7 (2010), 2, S. 390-393

https://doi.org/10.1002/pssc.200982440
Liday, Jozef; Ecke, Gernot; Baumann, Tim; Vogrinčič, Peter; Breza, Juraj
Contribution to the quantitative analysis of ternary alloys of group III-nitrides by Auger spectroscopy. - In: Journal of electrical engineering, ISSN 1339-309X, Bd. 61 (2010), 1, S. 62-64
Richtiger Name des 2. Verfassers: Gernot Ecke

https://doi.org/10.2478/v10187-010-0009-4
Niebelschütz, Florentina; Brueckner, Klemens; Jatal, Wael; Tschumak, Elena; As, Donat Josef; Hein, Matthias A.; Pezoldt, Jörg
Resonant MEMS based on cubic GaN layers. - In: Physica status solidi. Current topics in solid state physics. - Berlin : Wiley-VCH, 2002-2017 , ISSN: 1610-1642 , ZDB-ID: 2102966-0, ISSN 1610-1642, Bd. 7 (2010), 1, S. 116-119

http://dx.doi.org/10.1002/pssc.200982613
Grandal, J.; Sánchez-García, M. A.; Calleja, E.; Laziâc, S.; Gallardo, E.; Calleja, J. M.; Luna, E.; Trampert, A.; Niebelschütz, Merten; Cimalla, Volker
InN nanocolumns. - In: Indium nitride and related alloys, (2010), S. 599-615

Cimalla, Volker; Lebedev, Vadim; Ambacher, Oliver; Polyakov, Vladimir M.; Schwierz, Frank; Niebelschütz, Merten; Ecke, Gernot; Myers, Thomas H.; Schaff, William J.
Transport properties of InN. - In: Indium nitride and related alloys, (2010), S. 139-179

Jarošková, Silvia; Škriniarová, Jaroslava; Novotný, Ivan; Veselý, Marian; Tonisch, Katja
UV electrodeless wet chemical etching of n-GaN. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2009), insges. 4 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=14805
Hotovy, Ivan; Predanocy, Martin; Hotovy, Juraj; Pezoldt, Jörg; Wilke, Marcus; Kups, Thomas; Kosc, Ivan; Rehacek, Vlastimil; Spieß, Lothar
Nanostructured indium oxide thin films deposited at room temperature. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2009), insges. 4 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=14795
Lübbers, Benedikt; Schober, Andreas;
Comparing the ISFET to the glass electrode: advantages, challenges and similarities. - In: Chemical analysis, ISSN 0009-2223, Bd. 54 (2009), 6, S. 1121-1148

Andreadou, Ariadne; Pezoldt, Jörg; Förster, Christian; Polychroniadis, Efstathios K.; Voelskow, Matthias; Skorupa, Wolfgang
Buckling stabilization and stress reduction in SiC on Si by i-FLASiC processing. - In: Materials science forum, ISSN 1662-9752, Bd. 600/603 (2009), S. 239-242

http://dx.doi.org/10.4028/www.scientific.net/MSF.600-603.239
Niebelschütz, Florentina; Brückner, Klemens; Cimalla, Volker; Hein, Matthias; Pezoldt, Jörg
Performance modification of SiC MEMS. - In: Silicon carbide and related materials 2008, (2009), S. 621-624

http://dx.doi.org/10.4028/www.scientific.net/MSF.615-617.621
Kolaklieva, Lilyana; Kakanakov, Roumen; Stefanov, Plamen; Cimalla, Volker; Maroldt, Stephan; Ambacher, Oliver; Tonisch, Katja; Niebelschütz, Florentina
Composition and interface chemistry dependence in Ohmic contacts to GaN HEMT structures on the Ti/Al ratio and annealing conditions. - In: Silicon carbide and related materials 2008, (2009), S. 951-954

http://dx.doi.org/10.4028/www.scientific.net/MSF.615-617.951
Peyre, Hervé; Pezoldt, Jörg; Voelskow, Matthias; Skorupa, Wolfgang; Camassel, Jean
SIMS investigation of Ge x(4H-SiC) 1-x solid solutions synthesized by Ge-ion implantation up to x=0.2. - In: Silicon carbide and related materials 2008, (2009), S. 465-468

http://dx.doi.org/10.4028/www.scientific.net/MSF.615-617.465
Pezoldt, Jörg;
Formation of different carbon phases on SiC. - In: Silicon carbide and related materials 2008, (2009), S. 227-230

http://dx.doi.org/10.4028/www.scientific.net/MSF.615-617.227
Nader, Richard; Kazan, Michel; Zgheib, Charbel; Pezoldt, Jörg; Masri, Pierre
Properties of surface and interface structure of AlN/3CSiC/Ge/Si (1 1 1) heterostructure. - In: Journal of crystal growth, Bd. 311 (2009), 23/24, S. 4665-4669

http://dx.doi.org/10.1016/j.jcrysgro.2009.08.034
Pezoldt, Jörg; Kups, Thomas; Stauden, Thomas; Schröter, Bernd
Polarity determination and control of SiC grown on Si. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 165 (2009), 1/2, S. 28-33

http://dx.doi.org/10.1016/j.mseb.2009.03.015
Tschumak, Elena; Tonisch, Katja; Pezoldt, Jörg; As, Donat J.
Comparative study of 3C-GaN grown on semi-insulating 3C-SiC/Si(100) substrates. - In: Silicon carbide and related materials 2008, (2009), S. 943-946

http://dx.doi.org/10.4028/www.scientific.net/MSF.615-617.943
Kups, Thomas; Tonisch, Katja; Voelskow, Matthias; Skorupa, Wolfgang; Konkin, Alexander L.; Pezoldt, Jörg
Structure and lattice location of Ge implanted 4H-SiC. - In: Materials science forum, ISSN 1662-9752, Bd. 600/603 (2009), S. 623-626

http://dx.doi.org/10.4028/www.scientific.net/MSF.600-603.623
Stauden, Thomas; Niebelschütz, Florentina; Tonisch, Katja; Cimalla, Volker; Ecke, Gernot; Haupt, Christian; Pezoldt, Jörg
Isotropic etching of SiC. - In: Materials science forum, ISSN 1662-9752, Bd. 600/603 (2009), S. 651-654

http://dx.doi.org/10.4028/www.scientific.net/MSF.600-603.651
Morales, Francisco M.; González, David; Lozano, Juan Gabriel; García, Rafael; Hauguth-Frank, Sindy; Lebedev, Vadim; Cimalla, Volker; Ambacher, Oliver
Determination of the composition of In x Ga 1-x N from strain measurements. - In: Acta materialia, ISSN 1873-2453, Bd. 57 (2009), 19, S. 5681-5692

http://dx.doi.org/10.1016/j.actamat.2009.07.063
Schwierz, Frank; Pezoldt, Jörg
Graphene as FET channel material - what are the benefits?. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2009), S. 223-224

Niebelschütz, Merten;
Multifunktionale Nanoanalytik für eine Nanopositionier-und Messmaschine, 2009. - Online-Ressource (PDF-Datei: II, 113 Bl., 5,17 MB) : Ilmenau, Techn. Univ., Diss., 2009
Enth. außerdem: Thesen

Der stetige Fortschritt der Herstellungsverfahrem von Nanoobjekten benötigt eine zeitgleiche Weiterentwicklung von Mess- und Analyseverfahren, die eine Qualitätssicherung und ein ungehindertes Vorstoßen in den Nanometerbereich zulassen bzw. unterstützen. Nur mithilfe geeigneter Werkzeuge und Analysetechniken können Objekte des Nanometerbereiches hergestellt, manipuliert, vermessen und visualisiert werden. Die von der Technischen Universität Ilmenau im Rahmen eines Sonderforschungsbereichs entwickelte Nanopositionier- und Nanomessmaschine (NPM-Maschine) mit einem Messvolumen von 25 × 25 × 5 mm3 stellt ein Werkzeug genau für diese Analyseaufgaben im nanoskaligen Bereich dar. In dieser Arbeit wird die Integration verschiedener Analysetechniken in die NPM-Maschine gezeigt, um ein möglichst breites Anwendungsspektrum dieser Maschine zu erreichen. Neben der Entwicklung und Analyse, der für die Positionierunsicherheit benötigten Referenzstrukturen, werden in dieser Arbeit auch Messverfahren auf AFM-Basis zur Integration in die NPM-Maschine untersucht. Verschiedenartige Nanomessverfahren, insbesondere verschiedenen Modi der AFM-Technik, die zur Bestätigung und zur Analyse der Ergebnisse benutzt wurden, werden vorgestellt, wobei der Schwerpunkt auf Verfahren liegt, die sich für eine Integration in die NPM-Maschine eignen. Hierbei werden verschiedene Modi der AFM-Technik vorgestellt, die dafür geeignet sind.Anhand von Beispielmessungen werden die folgenden AFM-Sondermodi vorgestellt: die Kelvinsonden-Kraftmikroskopie (KPFM), die Magnetkraftmikroskopie (MFM), die Piezoelektrische Kraftmikroskopie (PFM) und die Spektroskopie mit dem AFM. Auf die Notwendigkeit von Referenzstrukturen zur Referenzierung wird ebenso eingegangen wie auf die Herstellung solcher Strukturen.



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Himmerlich, Marcel; Koufaki, Maria; Ecke, Gernot; Mauder, Christof; Cimalla, Volker; Schäfer, Jürgen A.; Kondilis, Antonis; Pelekanos, Nikos T.; Modreanu, Mircea; Krischok, Stefan
Effect of annealing on the properties of indium-tin-oxynitride films as ohmic contacts for GaN-based optoelectronic devices. - In: ACS applied materials & interfaces, ISSN 1944-8252, Bd. 1 (2009), 7, S. 1451-1456

http://dx.doi.org/10.1021/am900138f
Michael, Steffen; Brückner, Klemens; Niebelschütz, Florentina; Tonisch, Katja; Schäffel, Christoph
Parameter identification of piezoelectric AlGaN/GaN beam resonators by dynamic measurements. - In: 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, 2009, ISBN 978-1-4244-4161-7, (2009), insges. 4 S.

http://dx.doi.org/10.1109/ESIME.2009.4938498
Polyakov, Vladimir M.; Schwierz, Frank; Cimalla, Irina Nicoleta; Kittler, Mario; Lübbers, Benedikt; Schober, Andreas
Intrinsically limited mobility of the two-dimensional electron gas in gated AlGaN/GaN and AlGaN/AlN/GaN heterostructures. - In: Journal of applied physics, ISSN 1089-7550, Bd. 106 (2009), 2, 023715, insges. 5 S.

https://doi.org/10.1063/1.3174441
Brückner, Klemens; Niebelschütz, Florentina; Tonisch, Katja; Stephan, Ralf; Cimalla, Volker; Ambacher, Oliver; Hein, Matthias
Resonant piezoelectric ALGaN/GaN MEMS sensors in longitudinal mode operation. - In: IEEE 22nd International Conference on Micro Electro Mechanical Systems, 2009, ISBN 978-1-4244-2977-6, (2009), S. 927-930

http://dx.doi.org/10.1109/MEMSYS.2009.4805536
Voelskow, Matthias; Skorupa, Wolfgang; Pezoldt, Jörg; Kups, Thomas
Controlled localised melting in silicon by high dose germanium implantation and flash lamp annealing. - In: Nuclear instruments & methods in physics research. Beam interactions with materials and atoms. - Amsterdam [u.a.] : Elsevier, 1984- , ZDB-ID: 1466524-4, Bd. 267 (2009), 8/9, S. 1269-1272

http://dx.doi.org/10.1016/j.nimb.2009.01.143
Nader, Richard; Kazan, Michel; Moussaed, Elie; Zgheib, Charbel; Nsouli, B.; Pezoldt, Jörg; Masri, Pierre
SiC polytype stability influenced by Ge impurities. - In: Silicon carbide and related materials 2007, (2009), S. 533-536

Morales Sánchez, Francisco Miguel; Lozano, Juan Gabriel; García, Rafael; Lebedev, Vadim; Wang, Chunyu; Cimalla, Volker; Ambacher, Oliver; González, David
Structure of cubic polytype indium nitride layers on top of modified sapphire substrates. - In: Physica status solidi, ISSN 1610-1642, Bd. 5 (2008), 2, S. 514-517

The occurrence of cubic indium nitride thin layers grown by molecular beam epitaxy on top of c-plane sapphire substrates modified by an intermediate layer of cubic indium oxide is reported. An orientation relationship between the (0001) plane of Al2O3 and both (001) surfaces of body-centered cubic In2O3 and zinc-blende InN is demonstrated by means of electron and X-ray diffraction and by transmission electron microscopy. We propose that the demonstrated approach is able to stabilize the non equilibrium phase of InN (i. e., the cubic polytype) due to a low lattice mismatch together with a four fold surface atomic arrangement of the indium oxide-indium nitride interface.



https://doi.org/10.1002/pssc.200777472
Cimalla, Irina Nicoleta; Gebinoga, Michael; Klett, Maren-Jördis; Lübbers, Benedikt; Lebedev, Vadim; Tonisch, Katja; Cimalla, Volker; Ambacher, Oliver; Schober, Andreas
Bioreactor with integrated nanosensor for the recording of extracellular potential of nerve cells: response to inhibitors record with AlGaN/GaN field - effect transistor. - In: Life sciences, medicine, and bio materials, ISBN 978-1-420-08504-4, (2008), S. 566-568

Hotovy, Ivan; Predanocy, Martin; Hotovy, Juraj; Kups, Thomas; Spieß, Lothar; Wang, Chunyu; Rehacek, Vlastimil
Growth and characterization of indium oxide films for ozone detection. - In: Prospects in mechanical engineering, (2008), insges. 11 S.

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Brückner, Klemens; Niebelschütz, Florentina; Tonisch, Katja; Michael, Steffen; Dadgar, Armin; Krost, Alois; Cimalla, Volker; Ambacher, Oliver; Stephan, Ralf; Hein, Matthias
Multimode frequency response of piezoelectric AlGaN/GaN micro-electromechanical RF resonators. - In: Technical digest, (2008), S. 165-168

Morales, Francisco M.; Lozano, Juan Gabriel; García, Rafael; Lebedev, Vadim; Hauguth-Frank, Sindy; Cimalla, Volker; Ambacher, Oliver; González, David
Study of microstructure and strain relaxation on thin InXGa1-xN epilayers with medium and high In contents. - In: Materials science, ISBN 978-3-540-85225-4, (2008), S. 77-78

Ambacher, Oliver; Cimalla, Volker
Polarization induced effects in GaN-based heterostructures and novel sensors. - In: Polarization effects in semiconductors, (2008), S. 27-109

Kups, Thomas; Voelskow, Matthias; Skorupa, Wolfgang; Soueidan, M.; Ferro, G.; Pezoldt, Jörg
Lattice location determination of Ge in SiC by ALCHEMI. - In: Microscopy of semiconducting materials 2007, (2008), S. 353-358

Niebelschütz, Florentina; Pezoldt, Jörg; Stauden, Thomas; Cimalla, Volker; Tonisch, Katja; Brückner, Klemens; Hein, Matthias; Ambacher, Oliver; Schober, Andreas
Isotropic dry-etching of SiC for AlGaN/GaN MEMS fabrication. - In: Conference on Optoelectronic and Microelectronic Materials and Devices, 2008, ISBN 978-1-4244-2716-1, (2008), S. 26-29

http://dx.doi.org/10.1109/COMMAD.2008.4802084
Huran, Jozef; Kobzev, A. P.; Balalykin, N. I.; Pezoldt, Jörg
Hydrogenated amorphous carbon films prepared by plasma-enhanced chemical vapor deposition. - In: International Conference on Advanced Semiconductor Devices and Microsystems, 2008, ISBN 978-1-4244-2326-2, (2008), S. 127-130

http://dx.doi.org/10.1109/ASDAM.2008.4743297
Bohacek, P.; Huran, Jozef; Kobzev, A. P.; Balalykin, N. I.; Pezoldt, Jörg
PECVD silicon carbon nitrid thin films: properties. - In: International Conference on Advanced Semiconductor Devices and Microsystems, 2008, ISBN 978-1-4244-2326-2, (2008), S. 291-294

http://dx.doi.org/10.1109/ASDAM.2008.4743340
Gebinoga, Michael; Cimalla, Irina Nicoleta; Silveira, Liele; Klett, Maren; Kittler, Mario; Lebedev, Vadim; Niebelschütz, Florentina; Ambacher, Oliver; Schober, Andreas
Detektion von inhibitorischen Effekten auf Nervenzellen mit Aluminium-Galliumnitrid/Galliumnitrid Sensoren. - In: 2. Dresdner Medizintechnik-Symposium - Innovation durch Einheit von Therapie und Monitoring, (2008), S. 78-83
Richtiger Name des Verf.: Florentina Niebelschütz

Liday, Jozef; Hotovy, Ivan; Sitter, Helmut; Vogrincic, Peter; Vincze, Andrej; Vávra, I.; Satka, A.; Ecke, Gernot; Bonnani, A.; Breza, Juraj
Investigation of NiOx-based contacts on p-GaN. - In: Journal of materials science. Materials in electronics. - Dordrecht [u.a.] : Springer Science + Business Media B.V, 1990- , ISSN: 1573-482X , ZDB-ID: 2016994-2, ISSN 1573-482X, Bd. 19 (2008), 8/9, S. 855-862

http://dx.doi.org/10.1007/s10854-007-9520-1
Hauguth, Sindy; Lebedev, Vadim; Mauder, Christof; Niebelschütz, Florentina; Büchner, Hans-Joachim; Jäger, Gerd; Ambacher, Oliver
Novel III-nitride based transparent photodetectors for standing wave interferometry. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 205 (2008), 8, S. 2080-2084

http://dx.doi.org/10.1002/pssa.200778888
Jebril, Seid; Elbahri, Mady; Titazu, Getachew; Subannajui, Kittitat; Essa, Samia; Niebelschütz, Florentina; Röhlig, Claus-Christian; Cimalla, Volker; Ambacher, Oliver; Schmidt, Bernd; Kabiraj, Debdulal; Avasti, Devesh; Adelung, Rainer
Integration of thin-film-fracture-based nanowires into microchip fabrication. - In: Small, ISSN 1613-6829, Bd. 4 (2008), 12, S. 2214-2221

http://dx.doi.org/10.1002/smll.200800228
Hauguth-Frank, Sindy; Lebedev, Vadim; Tonisch, Katja; Romanus, Henry; Kups, Thomas; Büchner, Hans-Joachim; Jäger, Gerd; Ambacher, Oliver; Schober, Andreas
Structural and photoconducting properties of MBE and MOCVD grown III-nitride double-heterostructures. - In: Materials and devices for laser remote sensing and optical communication, ISBN 978-1-60511-046-2, (2008), S. 155-161

Wang, Chunyu; Dai, Ye; Pezoldt, Jörg; Lu, Bo; Kups, Thomas; Cimalla, Volker; Ambacher, Oliver
Phase stabilization and phonon properties of single crystalline rhombohedral indium oxide. - In: Crystal growth & design, ISSN 1528-7505, Bd. 8 (2008), 4, S. 1257-1260

http://dx.doi.org/10.1021/cg700910n
Nader, Richard; Kazan, Michel; Moussaed, Elie; Stauden, Thomas; Niebelschütz, Merten; Masri, Pierre; Pezoldt, Jörg
Surface morphology of Ge-modified 3C-SiC/Si films. - In: Surface and interface analysis, ISSN 1096-9918, Bd. 40 (2008), 9, S. 1310-1317

http://dx.doi.org/10.1002/sia.2895
Voelskow, Matthias; Yankov, Rossen; Skorupa, Wolfgang; Pezoldt, Jörg; Kups, Thomas
Buried melting in germanium implanted silicon by millisecond flash lamp annealing. - In: Applied physics letters, ISSN 1077-3118, Bd. 93 (2008), 15, S. 151903, insges. 3 S.

http://dx.doi.org/10.1063/1.2993332
Kharlamov, Vladimir S.; Trushin, Yuri V.; Zhurkin, E. E.; Lubov, Maxim N.; Pezoldt, Jörg
Study of Si and C adatoms and SiC clusters on the silicon surface by the molecular dynamics method. - In: Technical physics, ISSN 1090-6525, Bd. 53 (2008), 11, S. 1490-1503

http://dx.doi.org/10.1134/S1063784208110157
Brückner, Klemens; Niebelschütz, Florentina; Tonisch, Katja; Michael, Steffen; Dadgar, Armin; Krost, Alois; Cimalla, Volker; Ambacher, Oliver; Stephan, Ralf; Hein, Matthias
Two-dimensional electron gas based actuation of piezoelectric AlGaN/GaN microelectromechanical resonators. - In: Applied physics letters, ISSN 1077-3118, Bd. 93 (2008), 17, S. 173504, insges. 3 S.

http://dx.doi.org/10.1063/1.3002296
Gutt, Richard; Lorenz, Pierre; Tonisch, Katja; Himmerlich, Marcel; Schäfer, Jürgen A.; Krischok, Stefan
Electronic structure of GaN(0001)-2 × 2 thin films grown by PAMBE. - In: Physica status solidi, ISSN 1862-6270, Bd. 2 (2008), 5, S. 212-214

http://dx.doi.org/10.1002/pssr.200802146
Tonisch, Katja; Buchheim, Carsten; Niebelschütz, Florentina; Schober, Andreas; Gobsch, Gerhard; Cimalla, Volker; Ambacher, Oliver; Goldhahn, Rüdiger
Piezoelectric actuation of (GaN/)AlGaN/GaN heterostructures. - In: Journal of applied physics, ISSN 1089-7550, Bd. 104 (2008), 8, 084516, insges. 8 S.

https://doi.org/10.1063/1.3005885
Nader, Richard; Moussaed, Elie; Kazan, Michel; Pezoldt, Jörg; Masri, Pierre
SiC polytypes process affected by Ge predeposition on Si(111) substrates. - In: Superlattices and microstructures, ISSN 1096-3677, Bd. 44 (2008), 2, S. 191-196

http://dx.doi.org/10.1016/j.spmi.2008.06.001
Ali, Majdeddin;
Wide band gap materials and devices for NOx, H2 and O2 gas sensing applications, 2008. - Online-Ressource (PDF-Datei: 275 S., 7948 KB) Ilmenau : Techn. Univ., Diss., 2008
Enth. außerdem: Thesen

Im Rahmen dieser Arbeit sind Feldeffektgassensoren (Schottky Dioden, MOS Kapazitäten, und MOSFET Transistoren) auf der Basis von Halbleitern mit großer Bandlücke (Siliziumkarbid (SiC) und Gallium Nitrid (GaN), sowie resistive Gassensoren, die auf aktiven Indiumoxid-Schichten (In2O3) basieren, für die Detektion von reduzierenden Gasen (H2, D2) und oxidierenden Gasen (NOx, O2), entwickelt worden. Die Entwicklung der Sensoren ist am Institut für Mikro- und Nanoelektronik der Technischen Universität Ilmenau in Zusammenarbeit mit General Electric (GE) Global Research (USA) und der Umwelt- und Sensortechnik GmbH (Geschwenda) durchgeführt worden. Kapitel 1: dient als eine Einführung in das mit dieser Arbeit verbundene wissenschaftliche Feld. Die theoretischen Grundlagen der Festkörper-Gassensoren werden dargestellt. Zusätzlich werden in diesem Kapitel die relevanten Eigenschaften der Materialien mit großer Bandlücke (SiC und GaN) präsentiert. Kapitel 2: Pt/GaN Schottky Dioden mit verschiedener Dicke des katalytischen Metalls werden als Wasserstoffgasdetektoren vorgestellt. Die Fläche sowie die Dicke von Pt-gates wurden zwischen 250 × 250 ?m2 und 1000 × 1000 ?m2, 8 und 40 nm, systematisch variiert. Die Sensorantwort (Sensorsreaktion) auf 1 vol.% Wasserstoff in synthetischer Luft wurde in Abhängigkeit von der aktiven Fläche, der Pt-Dicke, und der Betriebstemperatur untersucht. Durch Anheben der Betriebstemperatur auf ca. 350&ring;C und durch Reduzierung der Dicke des Pt auf 8 nm beobachteten wir eine beträchtliche Erhöhung der Empfindlichkeit sowie eine Verkürzung der Ansprech- und Erholzeiten. Untersuchungen am Elektronenmikroskop zeigten, dass das dünnere Platin eine höhere Korngrenzendichte aufwies. Die Erhöhung der Empfindlichkeit gemeinsam mit der Reduzierung der Dicke des Pt deuten auf die Dissoziierung von molekularem Wasserstoff an der Oberfläche, die Diffusion atomaren Wasserstoffs entlang der Korngrenzen des Platins und die Adsorption von Wasserstoff an der Pt/GaN Grenzfläche als ein möglicher Mechanismus der Detektion von Wasserstoff durch Schottky Dioden hin. Die Reaktion auf D2, NOx, and O2 von Metall-Oxid-Halbleiter (MOS) Strukturen mit Rhodium Schottky-Kontakten mit einer Dicke von 30 nm in Abhängigkeit von der Betriebstemperatur und der Gaspartialdrücke wurde in Kapitel 3 untersucht. Die Reaktion dieses Gates wurde als Verschiebung entlang der Spannungsachse in der Kapazität-Spannungs Kurve (C-V) nachgewiesen. Posi...



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Lübbers, Benedikt; Kittler, Gabriel; Ort, Peter; Linkohr, Stefanie; Wegener, Dennis; Baur, B.; Gebinoga, Michael; Weise, Frank; Eickhoff, Martin; Maroldt, Stephan; Schober, Andreas; Ambacher, Oliver
A novel GaN-based multiparameter sensor system for biochemical analysis. - In: Physica status solidi, ISSN 1610-1642, Bd. 5 (2008), 6, S. 2361-2363

http://dx.doi.org/10.1002/pssc.200778726
Hauguth-Frank, Sindy; Lebedev, Vadim; Büchner, Hans-Joachim; Jäger, Gerd; Ambacher, Oliver
Ultra-thin InGaN photodetectors for standing wave interferometry. - In: Physica status solidi, ISSN 1610-1642, Bd. 5 (2008), 6, S. 2117-2119

http://dx.doi.org/10.1002/pssc.200778467
Kittler, Gabriel;
GaN-basierte pH-Sensoren : Empfindlichkeit, Drift und Passivierungstechnologien, 2008. - Online-Ressource (PDF-Datei: 148 S., 29,3 MB) : Ilmenau, Techn. Univ., Diss., 2008
Enth. außerdem: Thesen

In der vorliegenden Arbeit werden Heterostrukturen aus Aluminium-Gallium-Nitrid (AlGaN) und Gallium-Nitrid (GaN) als pH-Sensoren prozessiert, charakterisiert und optimiert. Dabei werden Untersuchungen zur pH-Empfindlichkeit, zum Driftverhalten der Sensoren und zu Passivierungstechnologien für industrielle Applikationen durchgeführt. Seit Anfang der 70-iger Jahre gibt es das Konzept der pH-Messung durch ionensensitive Feldeffekttransistoren (ISFETs) auf Silizium-Basis. Vorteil dieser Bauelemente ist die Miniaturisierbarkeit der Sensoren. Als nachteilig erweist sich die geringe chemische Stabilität der Sensoroberflächen und die damit verbundene geringe Langzeitstabilität und Drift. pH-Sensoren aus AlGaN/GaN-Heterostrukturen bieten eine vorteilhafte Alternative zu den Si-basierten ISFETs auf Grund ihrer besonderen Materialeigenschaften. Die vorliegende Arbeit beschäftigt sich mit der Charakterisierung und Optimierung der pH-Sensoren. Dabei stehen Untersuchungen der Empfindlichkeit und vor allem der lichtinduzierten Drift dieser Bauelemente im Vordergrund. Wechselnde Beleuchtungsverhältnisse, wie sie bei industriellen Applikationen auftreten, führen zu Driftphänomenen mit großen Zeitkonstanten. Die Reduzierung dieser Drift und die Erhöhung der Lichtunempfindlichkeit der Sensorstrukturen werden mit verschiedenen Lösungsansätzen und Verfahren bearbeitet. Dabei kommen sowohl technologische Verbesserungen der Halbleiterstrukturen als auch Varianten der Verschaltung von mehreren Sensorelementen und einer kontinuierlichen Bias-Beleuchtung zum Einsatz. Weiterhin werden in dieser Arbeit verschiedene Passivierungstechnologien untersucht und auf ihre Eignung bezüglich der chemischen Stabilität in industriellen Reinigungsprozessen geprüft. Im Rahmen dieser Experimente wurden Dickschichtverfahren zur Passivierung von GaN-basierten Sensoren mit Keramiken und Glasuren eingesetzt und weitere alternative Verfahren untersucht. Das große Potential des Materialsystems der Gruppe-III Nitride für pH-Messungen und biosensorische Anwendungen wird in dieser Arbeit erschlossen und bestimmte Eigenschaften der Sensoren entscheidend optimiert.



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Ali, Majdeddin; Wang, Chunyu; Röhlig, Claus-Christian; Cimalla, Volker; Stauden, Thomas; Ambacher, Oliver
NOx sensing properties of In2O3 thin films grown by MOCVD. - In: Sensors and actuators, ISSN 0925-4005, Bd. 129 (2008), 1, S. 467-472

http://dx.doi.org/10.1016/j.snb.2007.08.011
Wang, Chunyu; Ali, Majdeddin; Kups, Thomas; Röhlig, Claus-Christian; Cimalla, Volker; Stauden, Thomas; Ambacher, Oliver
NOx sensing properties of In2O3 nanoparticles prepared by metal organic chemical vapor deposition. - In: Sensors and actuators, ISSN 0925-4005, Bd. 130 (2008), 2, S. 589-593

http://dx.doi.org/10.1016/j.snb.2007.10.015
Matthäus, Gabor; Cimalla, Volker; Pradarutti, Boris; Riehemann, Stefan; Notni, Gunther; Lebedev, Vadim; Ambacher, Oliver; Nolte, Stefan; Tünnermann, Andreas
Highly efficient THz emission from differently grown InN at 800 nm and 1060 nm excitation. - In: Optics communications, ISSN 1873-0310, Bd. 281 (2008), 14, S. 3776-3780

http://dx.doi.org/10.1016/j.optcom.2008.03.057
Lebedev, Vadim; Polyakov, Vladimir; Hauguth-Frank, Sindy; Cimalla, Volker; Wang, Chunyu; Ecke, Gernot; Schwierz, Frank; Schober, Andreas; Lozano, Juan Gabriel; Morales Sánchez, Francisco Miguel; González, David; Ambacher, Oliver
Electronic and photoconductive properties of ultrathin InGaN photodetectors. - In: Journal of applied physics, ISSN 1089-7550, Bd. 103 (2008), 7, 073715, insges. 7 S.

https://doi.org/10.1063/1.2903146
Hofmann, Meike; Hauguth-Frank, Sindy; Lebedev, Vadim; Ambacher, Oliver; Sinzinger, Stefan
Sapphire-GaN-based planar integrated free-space optical system. - In: Applied optics, ISSN 2155-3165, Bd. 47 (2008), 16, S. 2950-2955

https://doi.org/10.1364/AO.47.002950
Schober, Andreas; Weise, Frank; Fischer, Michael; Augspurger, Caroline; Cimalla, Irina Nicoleta; Gebinoga, Michael; Hildmann, Christian; Klett, Maren-Jördis; Lübbers, Benedikt; Lebedev, Vadim; Tonisch, Katja; Cimalla, Volker; Ambacher, Oliver; Schlingloff, Gregor; Wegener, Dennis; Schwienhorst, Andreas; Groß, Gregor Alexander
Miniaturisation of synthesis and screening assays. - In: 4. Workshop "Chemische und biologische Mikrolabortechnik", (2008), insges. 2 S.

Lorenz, Pierre; Lebedev, Vadim; Niebelschütz, Florentina; Hauguth, Sindy; Ambacher, Oliver; Schäfer, Jürgen A.; Krischok, Stefan
Characterization of GaN-based lateral polarity heterostructures. - In: Physica status solidi, ISSN 1610-1642, Bd. 5 (2008), 6, S. 1965-1967

http://dx.doi.org/10.1002/pssc.200778550
Niebelschütz, Florentina; Cimalla, Volker; Tonisch, Katja; Haupt, Christian; Brückner, Klemens; Stephan, Ralf; Hein, Matthias; Ambacher, Oliver
AlGaN/GaN-based MEMS with two-dimensional electron gas for novel sensor applications. - In: Physica status solidi, ISSN 1610-1642, Bd. 5 (2008), 6, S. 1914-1916

http://dx.doi.org/10.1002/pssc.200778424
Tonisch, Katja; Buchheim, Carsten; Niebelschütz, Florentina; Donahue, Mary; Goldhahn, Rüdiger; Cimalla, Volker; Ambacher, Oliver
Piezoelectric actuation of all-nitride MEMS. - In: Physica status solidi, ISSN 1610-1642, Bd. 5 (2008), 6, S. 1910-1913

http://dx.doi.org/10.1002/pssc.200778423
Wang, Chunyu; Cimalla, Volker; Lebedev, Vadim; Kups, Thomas; Ecke, Gernot; Hauguth, Sindy; Ambacher, Oliver; Lozano, Juan Gabriel; Morales, Francisco M.; González, David
InN/In2O3 heterostructures. - In: Physica status solidi, ISSN 1610-1642, Bd. 5 (2008), 6, S. 1627-1629

http://dx.doi.org/10.1002/pssc.200778549
Niebelschütz, Merten; Cimalla, Volker; Ambacher, Oliver; Machleidt, Torsten; Franke, Karl-Heinz; Ristic, J.; Grandal, J.; Sánchez-García, M. A.; Calleja, E.
Space charged region in GaN and InN nanocolumns investigated by atomic force microscopy. - In: Physica status solidi, ISSN 1610-1642, Bd. 5 (2008), 6, S. 1609-1611

http://dx.doi.org/10.1002/pssc.200778533
Ecke, Gernot; Wang, Chunyu; Cimalla, Volker; Ambacher, Oliver
Ozone and UV assisted oxidation of InN surfaces. - In: Physica status solidi, ISSN 1610-1642, Bd. 5 (2008), 6, S. 1603-1605

http://dx.doi.org/10.1002/pssc.200778519
Cimalla, Volker; Röhlig, Claus-Christian; Pezoldt, Jörg; Niebelschütz, Merten; Ambacher, Oliver; Brückner, Klemens; Hein, Matthias; Weber, Jochen; Milenkovic, Srdjan; Smith, Andrew Jonathan; Hassel, Achim Walter
Nanomechanics of single crystalline tungsten nanowires. - In: Journal of nanomaterials, ISSN 1687-4129, Bd. 2008 (2008), 638947, S. 1-9

https://doi.org/10.1155/2008/638947
Pezoldt, Jörg; Nader, Richard; Niebelschütz, Florentina; Cimalla, Volker; Stauden, Thomas; Zgheib, Charbel; Masri, Pierre
Stress and stress monitoring in SiC-Si heterostructures. - In: Physica status solidi, ISSN 1862-6319, Bd. 205 (2008), 4, S. 867-871

http://dx.doi.org/10.1002/pssa.200777785
Pezoldt, Jörg; Nader, Richard; Zgheib, Charbel; Ecke, Gernot; Pieterwas, Ralph; Stauden, Thomas; Wöhner, Thomas; Masri, Pierre
Spectroscopic investigations of the role of Ge in modifying the Si to SiC conversion process. - In: Surface and interface analysis, ISSN 1096-9918, Bd. 40 (2008), 3/4, S. 794-797

http://dx.doi.org/10.1002/sia.2618
Lebedev, Vadim; Wang, Chunyu; Hauguth, Sindy; Polyakov, Vladimir; Schwierz, Frank; Cimalla, Volker; Kups, Thomas; Morales Sánchez, Francisco Miguel; Lozano, Juan Gabriel; González, David; Himmerlich, Marcel; Schäfer, Jürgen A.; Krischok, Stefan; Ambacher, Oliver
Electron transport properties of indium oxide - indium nitride metal-oxide-semiconductor heterostructures. - In: Physica status solidi, ISSN 1610-1642, Bd. 5 (2008), 2, S. 495-498

https://doi.org/10.1002/pssc.200777455
Buchheim, Carsten; Goldhahn, Rüdiger; Gobsch, Gerhard; Tonisch, Katja; Cimalla, Volker; Niebelschütz, Florentina; Ambacher, Oliver
Electric field distribution in GaN/AlGaN/GaN heterostructures with two-dimensional electron and hole gas. - In: Applied physics letters, ISSN 1077-3118, Bd. 92 (2008), 1, S. 013510, insges. 3 S.

http://dx.doi.org/10.1063/1.2830836
Lorenz, Pierre; Lebedev, Vadim; Gutt, Richard; Schäfer, Jürgen A.; Ambacher, Oliver; Krischok, Stefan
Oxidation of lateral polarity heterostructure GaN. - In: 71st annual meeting of the DPG and spring meeting of the Condensed Matter Division and the sections: Biological Physics, Environmental Physics, Extraterrestrial Physics, History of Physics, Physics Education, Radiation and Medical Physics as well as the working groups: Energy Matters, Equal Opportunities, Industry and Economy, Information, Physics and Disarmament, Physics of Socio-Economic Systems, 2007, O 17.77

Kittler, Gabriel; Spitznas, Armin; Lübbers, Benedikt; Lebedev, Vadim; Wegener, Dennis; Gebinoga, Michael; Weise, Frank; Schober, Andreas; Ambacher, Oliver
AlGaN/GaN-sensors for monitoring of enzyme activity by pH measurements. - In: Advances in III-V nitride semiconductor materials and devices, ISBN 978-1-60423-411-4, (2007), S. 85-87

Himmerlich, Marcel; Wang, Chunyu; Cimalla, Volker; Schäfer, Jürgen A.; Ambacher, Oliver; Krischok, Stefan
Surface properties of indium oxide and its interaction with ozone for the use as gas sensor. - In: 71st annual meeting of the DPG and spring meeting of the Condensed Matter Division and the sections: Biological Physics, Environmental Physics, Extraterrestrial Physics, History of Physics, Physics Education, Radiation and Medical Physics as well as the working groups: Energy Matters, Equal Opportunities, Industry and Economy, Information, Physics and Disarmament, Physics of Socio-Economic Systems, 2007, O 44.58

Lebedev, Vadim; Cherkashinin, G.; Ecke, Gernot; Cimalla, Irina Nicoleta; Ambacher, Oliver
Space charge limited electron transport in AlGaN photoconductors. - In: Journal of applied physics, ISSN 1089-7550, Bd. 101 (2007), 3, 033705, insges. 9 S.

https://doi.org/10.1063/1.2433139
Ecke, Gernot; Cimalla, Volker; Tonisch, Katja; Lebedev, Vadim; Romanus, Henry; Ambacher, Oliver; Liday, Jozef
Analysis of nanostructures by means of Auger electron spectroscopy. - In: Journal of electrical engineering, ISSN 1335-3632, Bd. 58 (2007), 6, S. 301-306

Niebelschütz, Florentina; Cimalla, Volker; Brückner, Klemens; Stephan, Ralf; Tonisch, Katja; Hein, Matthias A.; Ambacher, Oliver
Sensing applications of micro- and nanoelectromechanical resonators. - In: Proceedings of the Institution of Mechanical Engineers, ISSN 2041-3092, Bd. 221 (2007), 2, S. 59-65

http://dx.doi.org/10.1243/17403499JNN100
Tonisch, Katja; Niebelschuetz, Florentina; Cimalla, Volker; Romanus, Henry; Ambacher, Oliver
Fully unstrained GaN on thick AlN layers for MEMS application. - In: Advances in III-V nitride semiconductor materials and devices, ISBN 978-1-60423-411-4, (2007), S. 138-143

Pezoldt, Jörg; Kups, Thomas; Voelskow, Matthias; Skorupa, Wolfgang
Ion beam synthesis of 4H-(Si 1-x C 1-y )Ge x+y solid solutions. - In: Physica status solidi, ISSN 1862-6319, Bd. 204 (2007), 4, S. 998-1001

http://dx.doi.org/10.1002/pssa.200674122
Pezoldt, Jörg; Morales, Francisco M.; Kalnin, Andrei Alexandrovich
Local control of SiC polytypes. - In: Physica status solidi, ISSN 1862-6319, Bd. 204 (2007), 4, S. 1056-1062

http://dx.doi.org/10.1002/pssa.200674123
Cimalla, Volker;
Mikro-und nanostrukturierte keramische Halbleiter für die Sensorik von MEMS zu NEMS. - Getr. Zählung Ilmenau : Techn. Univ., Habil.-Schr., 2007

Lebedev, Vadim B.;
Mechanism of heterogeneous crystal growth in highly-mismatched thin films. - 235 S. Ilmenau : Techn. Univ., Habil.-Schr., 2007

Kups, Thomas; Wang, Chunyu; Gubisch, Maik; Spieß, Lothar; Ambacher, Oliver
TEM investigation of sputtered and epitaxial grown indium oxide layers for ozone sensors. - In: Microscopy and microanalysis, ISSN 1435-8115, Bd. 13.2007, Suppl. S03, S. 406-407

http://dx.doi.org/10.1017/S1431927607082037
Krischok, Stefan; Blank, Claudia; Engel, Michael; Gutt, Richard; Ecke, Gernot; Schawohl, Jens; Spieß, Lothar; Schrempel, Frank; Hildebrand, Gerhard; Liefeith, Klaus
Influence of ion implantation on titanium surfaces for medical applications. - In: Surface science, ISSN 1879-2758, Bd. 601 (2007), 18, S. 3856-3860

http://dx.doi.org/10.1016/j.susc.2007.04.060
Brückner, Klemens; Cimalla, Volker; Niebelschütz, Florentina; Stephan, Ralf; Tonisch, Katja; Ambacher, Oliver; Hein, Matthias A.
Gas pressure sensing based on MEMS resonators. - In: IEEE sensors, 2007, ISBN 978-1-4244-1262-4, (2007), S. 1251-1254

http://dx.doi.org/10.1109/ICSENS.2007.4388636
Polster, Tobias; Hoffmann, Martin; Albrecht, Arne; Tonisch, Katja; Ambacher, Oliver; Stauden, Thomas; Donahue, Mary; Michael, Steffen
AlN as a piezoelectric material for integrated micro and nano sensors on silicon. - In: Smart Systems Integration 2007, (2007), S. 249-255

Brückner, Klemens; Cimalla, Volker; Niebelschütz, Florentina; Stephan, Ralf; Tonisch, Katja; Ambacher, Oliver; Hein, Matthias A.
Strain- and pressure-dependent RF response of microelectromechanical resonators for sensing applications. - In: Journal of micromechanics and microengineering, ISSN 1361-6439, Bd. 17 (2007), 10, S. 2016-2023

http://dx.doi.org/10.1088/0960-1317/17/10/013
Cimalla, Volker; Pezoldt, Jörg; Ambacher, Oliver
Group III nitride and SiC based MEMS and NEMS: materials properties, technology and applications. - In: Journal of physics, ISSN 1361-6463, Bd. 40 (2007), 20, S. 6386-6434

https://doi.org/10.1088/0022-3727/40/20/S19
Lebedev, Vadim; Cengher, Dorin; Fischer, Michael; Tonisch, Katja; Cimalla, Volker; Niebelschütz, Merten; Ambacher, Oliver
Fabrication of one-dimensional "trenched" GaN nanowires and their interconnections. - In: Physica status solidi, ISSN 1862-6319, Bd. 204 (2007), 10, S. 3387-3391

http://dx.doi.org/10.1002/pssa.200723163
Sparrer, Erik; Machleidt, Torsten; Nestler, Rico; Franke, Karl-Heinz; Niebelschütz, Merten
Deconvolution of atomic force measurements in special modes - methodology and application. - In: , (2007), S. 245-250

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Shokhovets, Sviatosla; Ambacher, Oliver; Gobsch, Gerhard
Conduction-band dispersion relation and electron effective mass in III-V and II-VI zinc-blende semiconductors. - In: Physical review. Condensed matter and materials physics / American Physical Society. - College Park, Md. : APS, 1970-2015 , ISSN: 1550-235X , ZDB-ID: 1473011-X, ISSN 1550-235X, Bd. 76 (2007), 12, S. 125203, insges. 18 S.

http://dx.doi.org/10.1103/PhysRevB.76.125203
Tonisch, Katja; Cimalla, Volker; Niebelschütz, Florentina; Romanus, Henry; Eickhoff, Martin; Ambacher, Oliver
Fully unstrained GaN on sacrificial AlN layers by nano-heteroepitaxy. - In: Physica status solidi, ISSN 1610-1642, Bd. 4 (2007), 7, S. 2248-2251

http://dx.doi.org/10.1002/pssc.200674813
Wang, Chunyu; Cimalla, Volker; Kups, Thomas; Röhlig, Claus-Christian; Stauden, Thomas; Ambacher, Oliver; Kunzer, M.; Passow, Thorsten; Schirmacher, W.; Pletschen, Wilfried; Köhler, Klaus; Wagner, J.
Integration of In2O3 nanoparticle based ozone sensors with GaInN/GaN light emitting diodes. - In: Applied physics letters, ISSN 1077-3118, Bd. 91 (2007), 10, S. 103509, insges. 3 S.

http://dx.doi.org/10.1063/1.2779971
Cimalla, Volker; Niebelschütz, Florentina; Tonisch, Katja; Förster, Christian; Brückner, Klemens; Cimalla, Irina; Friedrich, Thomas; Pezoldt, Jörg; Stephan, Ralf; Hein, Matthias
Nanoelectromechanical devices for sensing applications. - In: Sensors and actuators, ISSN 0925-4005, Bd. 126 (2007), 1, S. 24-34

http://dx.doi.org/10.1016/j.snb.2006.10.049
Himmerlich, Marcel; Koufaki, Maria; Mauder, Christof; Ecke, Gernot; Cimalla, Volker; Schäfer, Jürgen A.; Aperathitis, Elias; Krischok, Stefan
Surface composition and electronic properties of indium tin oxide and oxynitride films. - In: Surface science, ISSN 1879-2758, Bd. 601 (2007), 18, S. 4082-4086

http://dx.doi.org/10.1016/j.susc.2007.04.061
Konkin, Alexander; Wendler, Frank; Meister, Frank; Roth, Hans-Klaus; Aganov, Albert; Ambacher, Oliver
Degradation processes in the cellulose/N-methylmorpholine-N-oxide system studied by HPLC and ESR. Radical formation/recombination kinetics under UV photolysis at 77 K. - In: Cellulose, ISSN 1572-882X, Bd. 14 (2007), 5, S. 457-468

http://dx.doi.org/10.1007/s10570-007-9140-1
Wang, Chunyu; Cimalla, Volker; Kups, Thomas; Röhlig, Claus-Christian; Romanus, Henry; Lebedev, Vadim; Pezoldt, Jörg; Stauden, Thomas; Ambacher, Oliver
Photoreduction and oxidation behavior of In2O3 nanoparticles by metal organic chemical vapor deposition. - In: Journal of applied physics, ISSN 1089-7550, Bd. 102 (2007), 4, 044310, insges. 6 S.

https://doi.org/10.1063/1.2770831
Pezoldt, Jörg; Förster, Christian; Cimalla, Volker; Will, Florentina; Stephan, Ralf; Brückner, Klemens; Hein, Matthias; Ambacher, Oliver
FTIR ellipsometry analysis of the internal stress in SiC/Si MEMS. - In: Silicon carbide and related materials 2006, (2007), S. 363-366

Pezoldt, Jörg; Förster, Christian; Stauden, Thomas; Cimalla, Volker; Morales, Francisco M.; Zgheib, Charbel; Masri, Pierre; Ambacher, Oliver
Morphology and stress control in UHVCVD of 3C-SiC(100) on Si. - In: Silicon carbide and related materials 2006, (2007), S. 203-206

Machleidt, Torsten; Franke, Karl-Heinz; Romanus, Henry; Cimalla, Volker; Niebelschütz, Merten; Spieß, Lothar; Ambacher, Oliver
Using defined structures on very thin foils for characterizing AFM tips. - In: Ultramicroscopy, ISSN 1879-2723, Bd. 107 (2007), 10/11, S. 1086-1090

http://dx.doi.org/10.1016/j.ultramic.2007.05.004
Cimalla, Volker; Machleidt, Torsten; Spieß, Lothar; Gubisch, Maik; Hotovy, Ivan; Romanus, Henry; Ambacher, Oliver
Analysis of nanocrystalline films on rough substrates. - In: Ultramicroscopy, ISSN 1879-2723, Bd. 107 (2007), 10/11, S. 989-994

http://dx.doi.org/10.1016/j.ultramic.2007.02.046
Himmerlich, Marcel; Krischok, Stefan; Lebedev, Vadim; Ambacher, Oliver; Schäfer, Jürgen A.; Ambacher, Oliver
Morphology and surface electronic structure of MBE grown InN. - In: Journal of crystal growth, Bd. 306 (2007), 1, S. 6-11

http://dx.doi.org/10.1016/j.jcrysgro.2007.04.014
Calleja, E.; Grandal, J.; Sánchez-García, M. A.; Niebelschütz, Merten; Cimalla, Volker; Ambacher, Oliver
Evidence of electron accumulation at nonpolar surfaces of InN nanocolumns. - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 26, S. 262110, insges. 3 S.

http://dx.doi.org/10.1063/1.2749871
Lebedev, Vadim; Wang, Chunyu; Cimalla, Volker; Hauguth, Sindy; Kups, Thomas; Ali, Majdeddin; Ecke, Gernot; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Ambacher, Oliver; Polyakov, Vladimir M.; Schwierz, Frank
Effect of surface oxidation on electron transport in InN thin films. - In: Journal of applied physics, ISSN 1089-7550, Bd. 101 (2007), 12, 123705, insges. 6 S.

https://doi.org/10.1063/1.2747592
Ali, Majdeddin; Cimalla, Volker; Lebedev, Vadim; Stauden, Thomas; Wang, Chunyu; Ecke, Gernot; Tilak, Vinayak; Sandvik, Peter; Ambacher, Oliver
Reactively sputtered InxVyOz films for detection of NOx, D2, and O2. - In: Sensors and actuators, ISSN 0925-4005, Bd. 123 (2007), 2, S. 779-783

http://dx.doi.org/10.1016/j.snb.2006.10.018
Liday, Jozef; Hotovy, Ivan; Sitter, Helmut; Schmidegg, K.; Vogrincic, Peter; Bonnani, A.; Breza, Juraj; Ecke, Gernot; Vávra, I.
Auger electron spectroscopy of Au/NiOx contacts on p-GaN annealed in N2 and O2 + N2 ambients. - In: Applied surface science, Bd. 253 (2007), 6, S. 3174-3180

http://dx.doi.org/10.1016/j.apsusc.2006.07.011
Lozano, Juan Gabriel; Morales, Francisco M.; García, Rafael; Lebedev, Vadim; Cimalla, Volker; Ambacher, Oliver; González, David
Evaluation of the influence of GaN and AlN as pseudosubstrates on the crystalline quality of InN layers. - In: Physica status solidi, ISSN 1610-1642, Bd. 4 (2007), 4, S. 1454-1457

http://dx.doi.org/10.1002/pssc.200674114
Cimalla, Volker; Pradarutti, Boris; Matthäus, Gabor; Brückner, Claudia; Riehemann, Stefan; Notni, Gunther; Nolte, Stefan; Tünnermann, Andreas; Lebedev, Vadim; Ambacher, Oliver
High efficient terahertz emission from InN surfaces. - In: Physica status solidi, ISSN 1521-3951, Bd. 244 (2007), 6, S. 1829-1833

http://dx.doi.org/10.1002/pssb.200674893
Schley, Pascal; Goldhahn, Rüdiger; Winzer, Andreas T.; Gobsch, Gerhard; Cimalla, Volker; Ambacher, Oliver; Lu, Hai; Schaff, William J.; Kurouchi, M.; Nanishi, Y.; Rakel, Munise; Cobet, Christoph; Esser, Norbert
Dielectric function and Van Hove singularities for In-rich InxGa1-xN alloys: comparison of N- and metal-face materials. - In: Physical review, ISSN 1550-235X, Bd. 75 (2007), 20, S. 205204, insges. 8 S.

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Wang, Chunyu; Cimalla, Volker; Romanus, Henry; Kups, Thomas; Niebelschütz, Merten; Ambacher, Oliver
Tuning of electrical and structural properties of indium oxide films grown by metal organic chemical vapor deposition. - In: Thin solid films, ISSN 1879-2731, Bd. 515 (2007), 16, S. 6611-6614

http://dx.doi.org/10.1016/j.tsf.2006.11.079
Cimalla, Irina Nicoleta; Will, Florentina; Tonisch, Katja; Niebelschütz, Merten; Cimalla, Volker; Lebedev, Vadim; Kittler, Gabriel; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Gebinoga, Michael; Schober, Andreas; Friedrich, Thomas; Ambacher, Oliver
AlGaN/GaN biosensoreffect of device processing steps on the surface properties and biocompatibility. - In: Sensors and actuators, ISSN 0925-4005, Bd. 123 (2007), 2, S. 740-748

http://dx.doi.org/10.1016/j.snb.2006.10.030
Somogyi, A.; Martinez-Criado, Gema; Homs, A.; Hernandez-Fenollosa, M. A.; Vantelon, D.; Ambacher, Oliver
Formation of Si clusters in AlGaN: a study of local structure. - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 18, S. 181129, insges. 3 S.

http://dx.doi.org/10.1063/1.2736649
Wang, Chunyu; Lebedev, Vadim; Cimalla, Volker; Kups, Thomas; Tonisch, Katja; Ambacher, Oliver
Structural studies of single crystalline In2O3 films epitaxially grown on InN(0001). - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 22, S. 221902, insges. 3 S.

http://dx.doi.org/10.1063/1.2743907
Schwarz, R.; Cabe¸ca, Ricardo; Morgado, Eduardo; Niehus, Manfred; Ambacher, Oliver; Marques, C. P.; Alves, Eduardo
Stability of GaN films under intense MeV He ion irradiation. - In: Diamond and related materials, ISSN 0925-9635, Bd. 16 (2007), 4/7, S. 1437-1440

http://dx.doi.org/10.1016/j.diamond.2007.01.017
Tonisch, Katja; Weise, Frank; Stubenrauch, Mike; Cimalla, Volker; Ecke, Gernot; Will, Florentina; Romanus, Henry; Mrotzek, Susanne; Hofmeister, H.; Hoffmann, Martin; Hülsenberg, Dagmar; Ambacher, Oliver
Growth of silicon nanowires on UV-structurable glass using self-organized nucleation centres. - In: Physica, ISSN 1386-9477, Bd. 38 (2007), 1/2, S. 40-43

http://dx.doi.org/10.1016/j.physe.2007.01.001
Cimalla, Volker; Lebedev, Vadim; Wang, Chunyu; Ali, Majdeddin; Ecke, Gernot; Polyakov, Vladimir M.; Schwierz, Frank; Ambacher, Oliver; Lu, Hai; Schaff, William J.
Reduced surface electron accumulation at InN films by ozone induced oxidation. - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 15, S. 152106, insges. 3 S.

http://dx.doi.org/10.1063/1.2721365
Romanus, Henry; Schadewald, Jens; Cimalla, Volker; Niebelschütz, Merten; Machleidt, Torsten; Franke, Karl-Heinz; Spieß, Lothar; Ambacher, Oliver
Preparation of defined structures on very thin foils for characterization of AFM probes. - In: Microelectronic engineering, Bd. 84 (2007), 3, S. 528-531

http://dx.doi.org/10.1016/j.mee.2006.10.077
Romanus, Henry; Schadewald, Jens; Cimalla, Volker; Niebelschütz, Merten; Machleidt, Torsten; Franke, Karl-Heinz; Spieß, Lothar; Ambacher, Oliver
Markers prepared by focus ion beam technique for nanopositioning procedures. - In: Microelectronic engineering, Bd. 84 (2007), 3, S. 524-527

http://dx.doi.org/10.1016/j.mee.2006.10.076
Niebelschütz, Merten; Cimalla, Volker; Ambacher, Oliver; Machleidt, Torsten; Ristic, J.; Calleja, E.
Electrical performance of gallium nitride nanocolumns. - In: Physica, ISSN 1386-9477, Bd. 37 (2007), 1/2, S. 200-203

http://dx.doi.org/10.1016/j.physe.2006.10.007
Tonisch, Katja; Cimalla, Volker; Will, Florentina; Weise, Frank; Stubenrauch, Mike; Albrecht, Arne; Hoffmann, Martin; Ambacher, Oliver
Nanowire-based electromechanical biomimetic sensor. - In: Physica, ISSN 1386-9477, Bd. 37 (2007), 1/2, S. 208-211

http://dx.doi.org/10.1016/j.physe.2006.06.002
Lebedev, Vadim; Tonisch, Katja; Niebelschütz, Florentina; Cimalla, Volker; Cengher, Dorin; Cimalla, Irina Nicoleta; Mauder, Christof; Hauguth, Sindy; Ambacher, Oliver; Morales Sánchez, Francisco Miguel; Lozano, Juan Gabriel; González, David
Coalescence aspects of III-nitride epitaxy. - In: Journal of applied physics, ISSN 1089-7550, Bd. 101 (2007), 5, 054906, insges. 12 S.

https://doi.org/10.1063/1.2464195
Cimalla, Volker; Stubenrauch, Mike; Weise, Frank; Fischer, Michael; Tonisch, Katja; Hoffmann, Martin; Ambacher, Oliver
Suspended nanowire web. - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 10, S. 101504, insges. 3 S.

http://dx.doi.org/10.1063/1.2711753
Ali, Majdeddin; Cimalla, Volker; Lebedev, Vadim; Stauden, Thomas; Ecke, Gernot; Tilak, Vinayak; Sandvik, Peter; Ambacher, Oliver
SiC-based FET for detection of NOx and O2 using InSnOx as a gate material. - In: Sensors and actuators, ISSN 0925-4005, Bd. 122 (2007), 1, S. 182-186

http://dx.doi.org/10.1016/j.snb.2006.05.021
Lozano, Juan Gabriel; Morales, Francisco M.; García, Rafael; González, David; Lebedev, Vadim; Wang, Chunyu; Cimalla, Volker; Ambacher, Oliver
Cubic InN growth on sapphire (0001) using cubic indium oxide as buffer layer. - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 9, S. 091901, insges. 3 S.

http://dx.doi.org/10.1063/1.2696282
Lebedev, Vadim; Cimalla, Volker; Morales, Francisco M.; Lozano, Juan Gabriel; González, David; Mauder, Christof; Ambacher, Oliver
Effect of island coalescence on structural and electrical properties of InN thin films. - In: Journal of crystal growth, Bd. 300 (2007), 1, S. 50-56

http://dx.doi.org/10.1016/j.jcrysgro.2007.02.003
Krinichnyi, V. I.; Roth, Hans-Klaus; Sensfuss, Steffi; Schrödner, Mario; Al-Ibrahim, Maher
Dynamics of photoinduced radical pairs in poly(3-dodecylthiophene)/fullerene composite. - In: Physica, ISSN 1386-9477, Bd. 36 (2007), 1, S. 98-101

http://dx.doi.org/10.1016/j.physe.2006.08.004
Wang, Chunyu; Cimalla, Volker; Cherkashinin, Genady; Romanus, Henry; Ali, Majdeddin; Ambacher, Oliver
Transparent conducting indium oxide thin films grown by low-temperature metal organic chemical vapor deposition. - In: Thin solid films, ISSN 1879-2731, Bd. 515 (2007), 5, S. 2921-2925

http://dx.doi.org/10.1016/j.tsf.2006.08.030
Soueidan, Maher; Ferro, Gabriel; Jacquier, Christophe; Godignon, Philippe; Pezoldt, Jörg; Lazar, Mihai; Nsouli, Bilal; Monteil, Yves
Improvement of 4H-SiC selective epitaxial growth by VLS mechanism using Al and Ge-based melts. - In: Diamond and related materials, ISSN 0925-9635, Bd. 16 (2007), 1, S. 37-45

http://dx.doi.org/10.1016/j.diamond.2006.03.015
Ibrahim, Maher al-; Ambacher, Oliver; Klemm, Elisabeth; Scharff, Peter; Ritter, Uwe; Gobsch, Gerhard; Sensfuss, Steffi
Polymer solar cells based on new low bandgap polymers and new derivates of fullerene. - In: 2nd International Symposium Technologies for Polymer Electronics - TPE 06, (2006), Blatt 77

Huran, Jozef; Hotový, Ivan; Pezoldt, Jörg; Balalykin, N. I.; Kobzev, A. P.
RF plasma deposition of thin amorphous silicon carbide films using a combination of silan and methane. - In: International Conference on Advanced Semiconductor Devices and Microsystems, 2006, (2006), insges. 4 S.
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Ashraf, Raja Shahid; Shahid, Munazza; Klemm, Elisabeth; Ibrahim, Maher al-; Sensfuss, Steffi
Thienopyrazine-based low-bandgap poly(heteroaryleneethynylene)s for photovoltaic devices. - In: Macromolecular rapid communications, ISSN 1521-3927, Bd. 27 (2006), 17, S. 1454-1459

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Dmowski, L. H.; Dybko, K.; Plesiewicz, J.; Suski, T.; Lu, Hai; Schaff, William; Kurouchi, M.; Nanishi, Y.; Konczewicz, L.; Cimalla, Volker
Localized donor state above the conduction band minimum in InN revealed by high pressure and temperature transport experiments. - In: Physica status solidi. Basic solid state physics. - Weinheim : Wiley-VCH, [1971]- , ISSN: 1521-3951 , ZDB-ID: 1481096-7, ISSN 1521-3951, Bd. 243 (2006), 7, S. 1537-1540

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Adelung, Rainer; Cengher, Dorin; Cimalla, Volker; Will, Florentina; Foerster, Christian; Elbahri, Mady; Jebril, Seid; Raudra, Shiva Kumar; Ambacher, Oliver
New approach for nanowires fabrication for integration in sensor applications. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=13466
Fischer, Michael; Stubenrauch, Mike; Kups, Thomas; Romanus, Henry; Morales, Francisco M.; Ecke, Gernot; Hoffmann, Martin; Knedlik, Christian; Ambacher, Oliver; Pezoldt, Jörg
Self organization and properties of Black Silicon. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 9 S.

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Will, Florentina; Tonisch, Katja; Cimalla, Volker; Cengher, Dorin; Haupt, Christian; Brückner, Klemens; Stephan, Ralf; Hein, Matthias; Ambacher, Oliver
Micro- and nanomechanical resonators for sensing applications. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.

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Tonisch, Katja; Cimalla, Volker; Will, Florentina; Haupt, Christian; Cengher, Dorin; Weise, Frank; Stubenrauch, Mike; Albrecht, Arne; Hoffmann, Martin; Ambacher, Oliver
First steps towards a nanowire-based electromechanical biomimetic sensor. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.

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Ali, Majdeddin; Ecke, Gernot; Cimalla, Volker; Stauden, Thomas; Tilak, Vinayak; Sandvik, Peter; Ambacher, Oliver
SiC-based FET for NOx gas sensing applications using InVOx metal oxides as a gate material. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 5 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=13489
Lübbers, Benedikt; Kittler, Gabriel; Cimalla, Volker; Gebinoga, Michael; Buchheim, Carsten; Wegener, Dennis; Schober, Andreas; Ambacher, Oliver
Setup for colorimetric measurements of aqueous micro- and nanoliter droplets. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 4 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=13491
Kittler, Gabriel; Spitznas, Armin; Lübbers, Benedikt; Lebedev, Vadim; Wegener, Dennis; Schober, Andreas; Gebinoga, Michael; Schwierz, Frank; Polyakov, Vladimir M.; Weise, Frank; Ambacher, Oliver
AlGaN/GaN-sensors for monitoring of enzyme activity by pH-measurements. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 3 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=13493
Ecke, Gernot; Baumann, Tim; Ambacher, Oliver
Composition measurements of group-III nitride ternary and quaternary compound nanostructures by AES. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 4 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=13492
Niebelschütz, Merten; Ecke, Gernot; Cimalla, Volker; Tonisch, Katja; Ambacher, Oliver
Work function analysis of GaN-based lateral polarity structures by Auger electron energy measurements. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.

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Cimalla, Irina; Will, Florentina; Tonisch, Katja; Lebedev, Vadim; Niebelschütz, Merten; Himmerlich, Marcel; Krischok, Stefan; Cimalla, Volker; Kittler, Gabriel; Kremin, Christoph
Impact of device processing on the surface properties and the biocompatibility of AlGaN/GaN HEMT sensors. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.

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Cimalla, Volker; Lebedev, Vadim; Morales, Francisco M.; Niebelschütz, Merten; Ecke, Gernot; Goldhahn, Rüdiger; Ambacher, Oliver
Origin of n-type conductivity in nominally undoped InN. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.

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Kulikov, Dimitrii V.; Schmidt, Alexander A.; Korolev, Sergey A.; Morales, Francisco M.; Stauden, Thomas; Pezoldt, Jörg; Trushin, Yuri V.
Simulation of quality of SiC/Si interface during MBE deposition of C on Si. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 9 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=13547
Wang, Chunyu; Cimalla, Volker; Ambacher, Oliver
Tuning of electrical properties of InxOy thin films grown by MOCVD for different applications. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=13549
Sandvik, Peter; Ali, Majeddin; Tilak, Vinayak; Matocha, Kevin; Stauden, Thomas; Tucker, Jesse; Deluca, John; Ambacher, Oliver
SiC-based MOSFETS for harsh environment emissions sensors. - In: Silicon carbide and related materials - 2005, (2006), S. 1457-1460

Niebelschütz, Florentina; Tonisch, Katja; Cimalla, Volker; Brückner, Klemens; Stephan, Ralf; Hein, Matthias; Schober, Andreas; Ambacher, Oliver
Resonant sensors for microfluidic applications. - In: Nanofunctional materials, nanostructures, and novel devices for biological and chemical detection, ISBN 978-1-60423-407-7, (2006), S. 149-154

Cherkashinin, Genady; Lebedev, Vadim; Wagner, Roland; Cimalla, Irina; Ambacher, Oliver
The performance of AlGaN solar blind UV photodetectors : responsivity and decay time. - In: Physica status solidi, ISSN 1521-3951, Bd. 243 (2006), 7, S. 1713-1717

http://dx.doi.org/10.1002/pssb.200565213
Huran, Jozef; Zatko, B.; Hotovy, Ivan; Pezoldt, Jörg; Kobzev, A. P.; Balalykin, N. I.
PECVD silicon carbide deposited at different temperature. - In: Czechoslovak journal of physics, ISSN 1572-9486, Bd. 56.2006, Suppl. 2, S. B1207-B1211

http://dx.doi.org/10.1007/s10582-006-0351-8
Wang, Chunyu; Cimalla, Volker; Röhlig, Claus-Christian; Stauden, Thomas; Niebelschütz, Florentina; Ambacher, Oliver; Kiesewetter, Olaf; Kittelmann, S.
A new type of highly sensitive portable ozone sensor operating at room temperature. - In: 2006 IEEE sensors, (2006), S. 81-84

Schober, Andreas; Weise, Frank; Cimalla, Irina Nicoleta; Gebinoga, Michael; Fischer, Michael; Lilienthal, Katharina; Kremin, Christoph; Lübbers, Benedikt; Kittler, Gabriel; Ambacher, Oliver; Friedrich, Thomas
Neuartige Sensoren für nano- und pikofluidische Systeme in biotechnischen Anwendungen. - In: Technische Systeme für Biotechnologie und Umwelt, (2006), S. 141-147

Cherkashinin, Genady; Krischok, Stefan; Himmerlich, Marcel; Ambacher, Oliver; Schäfer, Jürgen A.
Electronic properties of C 60 /InP(0 0 1) heterostructures. - In: Journal of physics. Condensed matter. - Bristol : IOP Publ., 1989- , ISSN: 1361-648X , ZDB-ID: 1472968-4, ISSN 1361-648X, Bd. 18 (2006), 43, S. 9841-9848

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Brückner, Klemens; Will, Florentina; Tonisch, Katja; Cimalla, Volker; Ambacher, Oliver; Stephan, Ralf; Hein, Matthias A.
Systematic study of the RF properties of micro-electromechanical RF resonators for sensor applications. - In: The 17th MicroMechanics Europe Workshop, MME'06, (2006), S. 13-16

Cimalla, Volker; Niebelschütz, Merten; Ecke, Gernot; Lebedev, Vadim; Ambacher, Oliver; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Lu, Hai; Schaff, William J.
Surface band bending at nominally undoped and Mg-doped InN by Auger Electron Spectroscopy. - In: Physica status solidi, ISSN 1862-6319, Bd. 203 (2006), 1, S. 59-65

http://dx.doi.org/10.1002/pssa.200563505
Ecke, Gernot; Niebelschütz, Merten; Kosiba, Rastislav; Rossow, Uwe; Cimalla, Volker; Liday, Jozef; Vogrinčič, Peter; Pezoldt, Jörg; Lebedev, Vadim; Ambacher, Oliver
Fermi level analysis of group III nitride semiconductor device structures by Auger peak position measurements. - In: Journal of electrical engineering, ISSN 1335-3632, Bd. 57 (2006), 6, S. 354-359

Hotovy, Ivan; Huran, Jozef; Spieß, Lothar; Romanus, Henry; Buc, D.; Kosiba, Rastislav
NiO-based nanostructured thin films with Pt surface modification for gas detection. - In: Thin solid films, ISSN 1879-2731, Bd. 515 (2006), 2, S. 658-661

http://dx.doi.org/10.1016/j.tsf.2005.12.232
Huran, Jozef; Hotovy, Ivan; Pezoldt, Jörg; Balalykin, N. I.; Kobzev, A. P.
Effect of deposition temperature on the properties of amorphous silicon carbide thin films. - In: Thin solid films, ISSN 1879-2731, Bd. 515 (2006), 2, S. 651-653

http://dx.doi.org/10.1016/j.tsf.2005.12.231
Zgheib, Charbel; Nassar, E.; Hamad, M.; Nader, Richard; Masri, Pierre; Pezoldt, Jörg; Ferro, Gabriel
5[mu]m thick 3C-SiC layers grown on Ge-modified Si(100) substrates. - In: Superlattices and microstructures, ISSN 1096-3677, Bd. 40 (2006), 4/6, S. 638-643

http://dx.doi.org/10.1016/j.spmi.2006.06.005
Pezoldt, Jörg; Zgheib, Charbel; Lebedev, Vadim; Masri, Pierre; Ambacher, Oliver
Determination of strain and composition in SiC/Si and AlN/Si heterostructures by FTIR-ellipsometry. - In: Superlattices and microstructures, ISSN 1096-3677, Bd. 40 (2006), 4/6, S. 612-618

http://dx.doi.org/10.1016/j.spmi.2006.07.030
Pezoldt, Jörg; Trushin, Yuri V.; Kharlamov, Vladimir S.; Schmidt, Alexander A.; Cimalla, Volker; Ambacher, Oliver
Carbon surface diffusion and SiC nanocluster self-ordering. - In: Nuclear instruments & methods in physics research, Bd. 253 (2006), 1/2, S. 241-245

http://dx.doi.org/10.1016/j.nimb.2006.10.058
Hermann, Martin; Furtmayr, Florian; Morales Sánchez, Francisco Miguel; Ambacher, Oliver; Stutzmann, Martin; Eickhoff, Martin
Impact of silicon incorporation on the formation of structural defects in AlN. - In: Journal of applied physics, ISSN 1089-7550, Bd. 100 (2006), 11, 113531, insges. 9 S.

https://doi.org/10.1063/1.2363239
Lebedev, Vadim; Morales, Francisco M.; Cimalla, Volker; Lozano, Juan Gabriel; Gonzales, D.; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Ambacher, Oliver
Correlation between structural and electrical properties of InN thin films prepared by molecular beam epitaxy. - In: Superlattices and microstructures, ISSN 1096-3677, Bd. 40 (2006), 4/6, S. 289-294

http://dx.doi.org/10.1016/j.spmi.2006.07.006
Tonisch, Katja; Cimalla, Volker; Förster, Christian; Romanus, Henry; Ambacher, Oliver; Dontsov, Denis
Piezoelectric properties of polycrystalline AlN thin films for MEMS application. - In: Sensors and actuators. Physical. - Amsterdam [u.a.] : Elsevier Science, 1990- , ISSN: 1873-3069 , ZDB-ID: 1500729-7, ISSN 1873-3069, Bd. 132 (2006), 2, S. 658-663

http://dx.doi.org/10.1016/j.sna.2006.03.001
Wang, Chunyu; Cimalla, Volker; Ambacher, Oliver
Tuning of electrical properties of In x O y thin films grown by MOCVD for different applications. - In: Materials science and engineering technology, ISSN 1521-4052, Bd. 37 (2006), 11, S. 945-946

http://dx.doi.org/10.1002/mawe.200600079
Niebelschütz, Merten; Ecke, Gernot; Cimalla, Volker; Tonisch, Katja; Ambacher, Oliver
Austrittsarbeitsanalyse von GaN basierten Lateral Polarity Strukturen durch Auger-Elektronen-Energie-Messungen. - In: Materials science and engineering technology, ISSN 1521-4052, Bd. 37 (2006), 11, S. 937-940

http://dx.doi.org/10.1002/mawe.200600083
Cimalla, Volker; Lebedev, Vadim; Morales, Francisco M.; Niebelschütz, Merten; Ecke, Gernot; Goldhahn, Rüdiger; Ambacher, Oliver
Origin of n-type conductivity in nominally undoped InN. - In: Materials science and engineering technology, ISSN 1521-4052, Bd. 37 (2006), 11, S. 924-928

http://dx.doi.org/10.1002/mawe.200600082
Cimalla, Irina Nicoleta; Will, Florentina; Tonisch, Katja; Niebelschütz, Merten; Cimalla, Volker; Lebedev, Vadim; Kittler, Gabriel; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Gebinoga, Michael; Schober, Andreas; Friedrich, Thomas; Ambacher, Oliver
Einfluss von Prozessen der Bauelementtechnologie auf die Oberflächeneigenschaften und die Biokompatibilität von Gruppe III-Nitrid-basierenden Sensoren :
Impact of device technology processes on the surface properties and biocompatibility of group III nitride based sensors. - In: Materials science and engineering technology, ISSN 1521-4052, Bd. 37 (2006), 11, S. 919-923

http://dx.doi.org/10.1002/mawe.200600078
Pezoldt, Jörg; Kups, Thomas; Weih, Petia; Stauden, Thomas; Ambacher, Oliver
Atomic layer epitaxy of (Si1-xC1-y)Gex+y layers on 4H-SiC. - In: Silicon carbide and related materials - 2005, (2006), S. 1559-1562

Förster, Christian; Cimalla, Volker; Stubenrauch, Mike; Rockstuhl, Carsten; Brueckner, Klemens; Hein, Matthias; Pezoldt, Jörg; Ambacher, Oliver
Micromachining of novel SiC on Si structures for device and sensor applications. - In: Silicon carbide and related materials - 2005, (2006), S. 1111-1114

Kups, Thomas; Weih, Petia; Voelskow, Matthias; Skorupa, Wolfgang; Pezoldt, Jörg
High dose high temperature ion implantation of Ge into 4H-SiC. - In: Silicon carbide and related materials - 2005, (2006), S. 851-854

Förster, Christian; Kosiba, Rastislav; Ecke, Gernot; Cimalla, Volker; Ambacher, Oliver; Pezoldt, Jörg
Low energy ion modification of 3C-SiC surfaces. - In: Silicon carbide and related materials - 2005, (2006), S. 685-688

Schmidt, Alexander A.; Trushin, Yuri V.; Safonov, K. L.; Kharlamov, Vladimir S.; Kulikov, Dmitri V.; Ambacher, Oliver; Pezoldt, Jörg
Multi-scale simulation of MBE-grown SiC/Si nanostructures. - In: Silicon carbide and related materials - 2005, (2006), S. 315-318

Pezoldt, Jörg; Morales, Francisco M.; Stauden, Thomas; Förster, Christian; Polychroniadis, E. K.; Stoemenos, J.; Panknin, D.; Skorupa, Wolfgang
Growth acceleration in FLASiC assisted short time liquid phase epitaxy by melt modification. - In: Silicon carbide and related materials - 2005, (2006), S. 295-298

Ferro, Gabriel; Soueidan, Maher; Jacquier, C.; Godignon, P.; Stauden, Thomas; Pezoldt, Jörg; Lazar, M.; Montserrat, J.; Monteil, Y.
Improvement of 4H-SiC selective epitaxial growth by VLS mechanism using Al and Ge based melts. - In: Silicon carbide and related materials - 2005, (2006), S. 275-278

Kulikov, Dmitrii V.; Schmidt, Alexander A.; Korolev, Sergey A.; Morales, Francisco M.; Stauden, Thomas; Trushin, Yuri V.; Pezoldt, Jörg
Simulation of quality of SiC/Si interface during MBE deposition of C on Si. - In: Materials science and engineering technology, ISSN 1521-4052, Bd. 37 (2006), 11, S. 929-932

http://dx.doi.org/10.1002/mawe.200600080
Lebedev, Vadim; Cimalla, Volker; Baumann, Tim; Ambacher, Oliver; Morales Sánchez, Francisco Miguel; Lozano, Juan Gabriel; González, David
Effect of dislocations on electrical and electron transport properties of InN thin films : II. density and mobility of the carriers. - In: Journal of applied physics, ISSN 1089-7550, Bd. 100 (2006), 9, 094903, insges. 8 S.

https://doi.org/10.1063/1.2363234
Lebedev, Vadim; Cimalla, Volker; Pezoldt, Jörg; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Ambacher, Oliver; Morales Sánchez, Francisco Miguel; Lozano, Juan Gabriel; González, David
Effect of dislocations on electrical and electron transport properties of InN thin films : I. strain relief and formation of a dislocation network. - In: Journal of applied physics, ISSN 1089-7550, Bd. 100 (2006), 9, 094902, insges. 13 S.

https://doi.org/10.1063/1.2363233
Koufaki, Maria; Sifakis, M.; Iliopoulos, E.; Pelekanos, Nikos; Modreanu, Mircea; Cimalla, Volker; Ecke, Gernot; Aperathitis, Elias
Optical emission spectroscopy during fabrication of indium-tin-oxynitride films by RF-sputtering. - In: Applied surface science, Bd. 253 (2006), 1, S. 405-408

http://dx.doi.org/10.1016/j.apsusc.2006.06.023
Shokhovets, Sviatoslav; Gobsch, Gerhard; Ambacher, Oliver
Excitonic contribution to the optical absorption in zinc-blende III-V semiconductors. - In: Physical review. Condensed matter and materials physics / American Physical Society. - College Park, Md. : APS, 1970-2015 , ISSN: 1550-235X , ZDB-ID: 1473011-X, ISSN 1550-235X, Bd. 74 (2006), 15, S. 155209, insges. 11 S.

http://dx.doi.org/10.1103/PhysRevB.74.155209
Shokhovets, Sviatoslav; Gobsch, Gerhard; Lebedev, Vadim; Ambacher, Oliver
"Anomalous" pseudodielectric function of GaN: experiment, modelling and application to the study of surface properties. - In: Applied surface science, Bd. 253 (2006), 1, S. 224-227

http://dx.doi.org/10.1016/j.apsusc.2006.05.108
Gubisch, Maik; Liu, Yonghe; Schwenke, B.; Spieß, Lothar; Krischok, Stefan; Ecke, Gernot; Schäfer, Jürgen A.; Knedlik, Christian
Tribological characteristics of tungsten carbide films. - In: Festschrift zum Ehrenkolloquium anlässlich der Emeritierung von Univ.-Prof. Dr.-Ing. habil. Dr. rer. nat. Christian Knedlik, (2006), S. 18-19

Al-Ibrahim, Maher;
Effects of solvent and annealing on the improved performance of solar cells based on poly (3-hexylthiophene):fullerene. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), S. 317-318

Pezoldt, Jörg;
Heteropolytype and low dimensional structures in SiC. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), S. 263-264

Cimalla, Volker; Lebedev, Vadim; Morales, Francisco M.; Goldhahn, Rüdiger; Ambacher, Oliver
Model for the thickness dependence of electron concentration in InN films. - In: Applied physics letters, ISSN 1077-3118, Bd. 89 (2006), 17, S. 172109, insges. 3 S.

http://dx.doi.org/10.1063/1.2364666
Ali, Majdeddin; Cimalla, Volker; Lebedev, Vadim; Tilak, Vinayak; Sandvik, Peter M.; Merfeld, Danielle W.; Ambacher, Oliver
A study of hydrogen sensing performance of Pt-GaN Schottky diodes. - In: IEEE sensors journal, ISSN 1558-1748, Bd. 6 (2006), 5, S. 1115-1119

https://doi.org/10.1109/JSEN.2006.881346
Niebelschütz, Merten; Ecke, Gernot; Cimalla, Volker; Tonisch, Katja; Ambacher, Oliver
Work function analysis of GaN-based lateral polarity structures by Auger electron energy measurements. - In: Journal of applied physics, ISSN 1089-7550, Bd. 100 (2006), 7, 074909, insges. 3 S.

https://doi.org/10.1063/1.2353785
Pezoldt, Jörg; Morales, Francisco M.; Zgheib, Charbel; Förster, Christian; Stauden, Thomas; Ecke, Gernot; Wang, Chunyu; Masri, Pierre
Investigation of the interface manipulation in SiC(100) on Si(100) with isovalent impurities. - In: Surface and interface analysis, ISSN 1096-9918, Bd. 38 (2006), 4, S. 444-447

http://dx.doi.org/10.1002/sia.2240
Pradarutti, Boris; Matthäus, Gabor; Brückner, Claudia; Riehemann, Stefan; Notni, Gunther; Nolte, Stefan; Cimalla, Volker; Lebedev, Vadim; Ambacher, Oliver; Tünnermann, Andreas
InN as THz emitter excited at 1060 nm and 800 nm. - In: Millimeter-wave and terahertz photonics, 2006, S. 61940I, insges. 9 S.

Förster, Christian;
Mikro- und nanoelektromechanische Resonatoren für die Sensorik. - Aachen : Shaker, 2006. - 162 S.. - (Berichte aus der Halbleitertechnik) Zugl.: Ilmenau : Techn. Univ., Diss., 2005
ISBN 3832252754 = 978-3-8322-5275-5

Das Hauptziel der vorliegenden Dissertation war die Realisierung von unter normalen Umgebungsbedingungen arbeitenden Mikro- und Nanoresonatoren für die Sensorik. Das angestrebte Anwendungsgebiet ist die Viskositätsmessung, eine Temperaturmessung und selektive Sensoren für die Bio-Medizin. Hoch sensitive Sensorsysteme erfordern die Entwicklung und Optimierung einer Technologie für die Herstellung SiC-basierender mikro- und nanoelektromechanischer Resonatoren möglichst kleiner Masse. Der theoretische Anteil dieser Arbeit befasst sich mit der Resonatortheorie, dem Resonatordesign und dem Einfluss unterschiedlich verspannter Epitaxieschichten auf die zu erzielenden Resonanzfrequenzen. Die technologische Herausforderung bestand in der Entwicklung eines Epitaxieprozesses für gering verspanntes 3C-SiC und die Optimierung der Schichteigenschaften hinsichtlich der Anwendung als MEMS- und NEMS-Resonatoren. Des weiteren musste eine geeignete Strukturierungstechnik für das chemisch sehr stabile Material SiC mit der entsprechenden Ätzcharakteristik entwickelt werden. Diese Optimierung erfolgte bezüglich anisotroper und isotroper Ätzprofile sowie der Selektivität zwischen Silizium und Siliziumkarbid. Hierzu wurden drei unterschiedliche Plasmatechnologien charakterisiert und ihrer Anwendbarkeit für Mikro- und Nanostrukturen diskutiert. Die experimentelle Bestimmung der Resonanzfrequenzen und Resonatorgüten unter normalen Messbedingungen erfolgt mit einer Impulsmessmethode. Die unter Luft charakterisierten Resonatoren erzielen Resonanzfrequenzen bis 2 MHz und Resonatorgüten bis 350. Die Güte wird hauptsächlich durch die viskose Dämpfung der Luft bestimmt.



Buchheim, Carsten; Kittler, Gabriel; Cimalla, Volker; Lebedev, Vadim; Fischer, Michael; Krischok, Stefan; Yanev, Vasil; Himmerlich, Marcel; Ecke, Gernot; Schäfer, Jürgen A.; Ambacher, Oliver
Tuning of surface properties of AlGaN/GaN sensors for nanodroplets and picodroplets. - In: IEEE sensors journal, ISSN 1558-1748, Bd. 6 (2006), 4, S. 881-886

https://doi.org/10.1109/JSEN.2006.877984
Lebedev, Vadim; Morales, Francisco M.; Fischer, Michael; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Ambacher, Oliver
Nanocrystalline AlN:Si field emission arrays for vacuum electronics. - In: Physica status solidi, ISSN 1862-6319, Bd. 203 (2006), 7, S. 1839-1844

http://dx.doi.org/10.1002/pssa.200565238
Cimalla, Volker; Förster, Christian; Will, Florentina; Tonisch, Katja; Brückner, Klemens; Stephan, Ralf; Hein, Matthias; Ambacher, Oliver; Aperathitis, Elias
Pulsed mode operation of strained microelectromechanical resonators in air. - In: Applied physics letters, ISSN 1077-3118, Bd. 88 (2006), 25, S. 253501, insges. 3 S.

http://dx.doi.org/10.1063/1.2213950
Wang, Chunyu; Cimalla, Volker; Romanus, Henry; Kups, Thomas; Ecke, Gernot; Stauden, Thomas; Ali, Majdeddin; Lebedev, Vadim; Pezoldt, Jörg; Ambacher, Oliver
Phase selective growth and properties of rhombohedral and cubic indium oxide. - In: Applied physics letters, ISSN 1077-3118, Bd. 89 (2006), 1, S. 011904, insges. 3 S.

http://dx.doi.org/10.1063/1.2219125
Cimalla, Volker; Förster, Christian; Cengher, Dorin; Tonisch, Katja; Ambacher, Oliver
Growth of AlN nanowires by metal organic chemical vapour deposition. - In: Physica status solidi, ISSN 1521-3951, Bd. 243 (2006), 7, S. 1476-1480

http://dx.doi.org/10.1002/pssb.200565205
Schley, Pascal; Goldhahn, Rüdiger; Winzer, Andreas T.; Gobsch, Gerhard; Cimalla, Volker; Ambacher, Oliver; Rakel, Munise; Cobet, Christoph; Esser, Norbert; Lu, Hai; Schaff, William J.
Transition energies and Stokes shift analysis for In-rich InGaN alloys. - In: Physica status solidi, ISSN 1521-3951, Bd. 243 (2006), 7, S. 1572-1576

http://dx.doi.org/10.1002/pssb.200565303
Erb, Tobias; Zhokhavets, Uladzimir; Hoppe, Harald; Gobsch, Gerhard; Ibrahim, Maher al-; Ambacher, Oliver
Absorption and crystallinity of poly(3-hexylthiophene)/fullerene blends in dependence on annealing temperature. - In: Thin solid films, ISSN 1879-2731, Bd. 511/512 (2006), S. 483-485

http://dx.doi.org/10.1016/j.tsf.2005.12.064
Lebedev, Vadim; Morales, Francisco M.; Romanus, Henry; Ecke, Gernot; Cimalla, Volker; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Ambacher, Oliver
Doping efficiency and segregation of Si in AlN grown by molecular beam epitaxy. - In: Physica status solidi, ISSN 1610-1642, Bd. 3 (2006), 6, S. 1420-1424

http://dx.doi.org/10.1002/pssc.200565178
Buchheim, Carsten; Goldhahn, Rüdiger; Winzer, Andreas T.; Cobet, Christoph; Rakel, Munise; Esser, Norbert; Rossow, Uwe; Fuhrmann, Daniel; Hangleiter, Andreas; Ambacher, Oliver
Critical points of the bandstructure of AlN/GaN superlattices investigated by spectroscopic ellipsometry and modulation spectroscopy. - In: Physica status solidi, ISSN 1610-1642, Bd. 3 (2006), 6, S. 2009-2013

http://dx.doi.org/10.1002/pssc.200565300
Cimalla, Irina; Förster, Christian; Cimalla, Volker; Lebedev, Vadim; Cengher, Dorin; Ambacher, Oliver
Wet chemical etching of AlN in KOH solution. - In: Physica status solidi, ISSN 1610-1642, Bd. 3 (2006), 6, S. 1767-1770

http://dx.doi.org/10.1002/pssc.200565206
Cimalla, Volker; Niebelschütz, Merten; Ecke, Gernot; Ambacher, Oliver; Goldhahn, Rüdiger; Lu, Hai; Schaff, William J.
The conductivity of Mg-doped InN. - In: Physica status solidi, ISSN 1610-1642, Bd. 3 (2006), 6, S. 1721-1724

http://dx.doi.org/10.1002/pssc.200565473
Tonisch, Katja; Cimalla, Volker; Förster, Christian; Dontsov, Denys; Ambacher, Oliver
Piezoelectric properties of thin AlN layers for MEMS application determined by piezoresponse force microscopy. - In: Physica status solidi, ISSN 1610-1642, Bd. 3 (2006), 6, S. 2274-2277

http://dx.doi.org/10.1002/pssc.200565123
Kosiba, Rastislav; Liday, Jozef; Ecke, Gernot; Ambacher, Oliver; Breza, Juraj; Vogrinčič, Peter
Quantitative Auger electron spectroscopy of SiC. - In: Vacuum, ISSN 0042-207X, Bd. 80 (2006), 9, S. 990-995

http://dx.doi.org/10.1016/j.vacuum.2006.01.003
Zgheib, Charbel; McNeil, L. E.; Masri, Pierre; Förster, Christian; Morales, Francisco M.; Stauden, Thomas; Ambacher, Oliver; Pezoldt, Jörg
Ge-modified Si(100) substrates for the growth of 3C-SiC(100). - In: Applied physics letters, ISSN 1077-3118, Bd. 88 (2006), 21, S. 211909, insges. 3 S.

http://dx.doi.org/10.1063/1.2206558
Förster, Christian; Cimalla, Volker; Lebedev, Vadim; Pezoldt, Jörg; Brückner, Klemens; Stephan, Ralf; Hein, Matthias; Aperathitis, Elias; Ambacher, Oliver
Group III-nitride and SiC based micro- and nanoelectromechanical resonators for sensor applications. - In: Physica status solidi, ISSN 1862-6319, Bd. 203 (2006), 7, S. 1829-1833

http://dx.doi.org/10.1002/pssa.200565232
Shokhovets, Sviatoslav; Gobsch, Gerhard; Ambacher, Oliver
Conduction band parameters of ZnO. - In: Superlattices and microstructures, ISSN 1096-3677, Bd. 39 (2006), 1/4, S. 299-305

http://dx.doi.org/10.1016/j.spmi.2005.08.052
Zhokhavets, Uladzimir; Erb, Tobias; Gobsch, Gerhard; Al-Ibrahim, Maher; Ambacher, Oliver
Relation between absorption and crystallinity of poly(3-hexylthiophene)/fullerene films for plastic solar cells. - In: Chemical physics letters, Bd. 418 (2006), 4/6, S. 347-350

http://dx.doi.org/10.1016/j.cplett.2005.11.020
Schober, Andreas; Kittler, Gabriel; Lübbers, Benedict; Cimalla, Volker; Fischer, Michael; Spitznas, Armin; Gebinoga, Michael; Cimalla, Irina Nicoleta; Yanev, Vasil; Himmerlich, Marcel; Kerekes, Tibor; Kittler, Mario; Drüe, Karl-Heinz; Hintz, Michael; Krischok, Stefan; Burgold, Jörg; Weise, Frank; Ambacher, Oliver; Kremin, Christoph; Lilienthal, Katharina
Eine neue Klasse von Sensoren für mikro- und nanofluidische Systeme für biotechnologische Anwendungen. - In: Abstracts, (2006), insges. 1 S.

Will, Florentina; Tonisch, Katja; Cimalla, Volker; Förster, Christian; Brückner, Klemens; Stephan, Ralf; Hein, Matthias; Ambacher, Oliver
Nanoelectromechanical resonators and their application for viscosity measurements in smallest amounts of liquids. - In: Abstracts, (2006), insges. 1 S.

Kittler, Gabriel; Spitznas, Armin; Buchheim, Carsten; Lebedev, Vadim; Wegener, Dennis; Schober, Andreas; Cimalla, Volker; Ambacher, Oliver
GaN based pH-sensors for monitoring of bioreactions. - In: Abstracts, (2006), insges. 1 S.

Ali, Majdeddin; Cimalla, Volker; Lebedev, Vadim; Romanus, Henry; Tilak, V.; Merfeld, D.; Sandvik, P.; Ambacher, Oliver
Pt/GaN Schottky diodes for hydrogen gas sensors. - In: Sensors and actuators, ISSN 0925-4005, Bd. 113 (2006), 2, S. 797-804

http://dx.doi.org/10.1016/j.snb.2005.03.019
Monroy, E.; Zenneck, J.; Cherkashinin, G.; Ambacher, Oliver; Hermann, Martin; Stutzmann, Martin; Eickhoff, Martin
Luminescence properties of highly Si-doped AlN. - In: Applied physics letters, ISSN 1077-3118, Bd. 88 (2006), 7, S. 071906, insges. 3 S.

http://dx.doi.org/10.1063/1.2173622
Goldhahn, Rüdiger; Schley, Pascal; Winzer, Andreas T.; Gobsch, Gerhard; Cimalla, Volker; Ambacher, Oliver; Rakel, Munise; Esser, Norbert; Cobet, Christoph; Lu, Hai; Schaff, William J.
Detailed analysis of the dielectric function for wurtzite InN and In-rich InAlN alloys. - In: Physica status solidi, ISSN 1862-6319, Bd. 203 (2006), 1, S. 42-49

http://dx.doi.org/10.1002/pssa.200563507
Brückner, Klemens; Förster, Christian; Tonisch, Katja; Cimalla, Volker; Ambacher, Oliver; Stephan, Ralf; Blau, Kurt; Hein, Matthias A.
Electromechanical resonances of SiC and AIN beams under ambient conditions. - In: Maschinenbau von Makro bis Nano, 2005, [04.P.01], insges. 2 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=17356
Förster, Christian; Cimalla, Volker; Will, Florentina; Ambacher, Oliver; Brückner, Klemens; Stephan, Ralf; Hein, Matthias; Aperathitis, Elias
Group III-nitrides and 3C-SiC for micro- and nanoelectromechanical resonators. - In: Maschinenbau von Makro bis Nano, 2005, [04.11], insges. 2 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=17311
Tonisch, Katja; Cimalla, Volker; Förster, Christian; Dontsov, Denis; Ambacher, Oliver
Estimation of the piezoelectric properties of thin AIN layers for MEMS applications. - In: Maschinenbau von Makro bis Nano, 2005, [04.07], insges. 4 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=17305
Spieß, Lothar; Machleidt, Torsten; Cimalla, Volker; Gubisch, Maik; Ambacher, Oliver; Franke, Karl-Heinz
Development of a reference field for a NPM-machine. - In: Maschinenbau von Makro bis Nano, 2005, [01.P.01], insges. 2 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=16760
Elbahri, Mady; Jebril, Seid; Raudra, Shiva Kumar; Cengher, Dorin; Cimalla, Volker; Ambacher, Oliver; Paretkar, Dadhichi; Wille, Sebastian; Adelung, Rainer
New route of nanowire integration in microfabrication processes for sensor applications. - In: Nanofair 2005, (2005), S. 17-20

Förster, Christian; Cimalla, Volker; Aperathitis, Elias; Brückner, Klemens; Stephan, Ralf; Hein, Matthias; Pezoldt, Jörg; Ambacher, Oliver
Fabrication of 3C-SiC/Si MEMS and NEMS for sensor applications. - In: HeT-SiC-05, (2005), S. 44-49

Pezoldt, Jörg; Zgheib, Charbel; Förster, Christian; Morales, Francisco M.; Cherkachinin, G.; Wang, Chunyu; Leycuras, A.; Ferro, Gabriel; Monteil, Y.; Cimalla, Irina
Stress design in 3C-SiC/Si heteroepitaxial systems. - In: HeT-SiC-05, (2005), S. 20-26

Förster, Christian; Cimalla, Volker; Brueckner, Klemens; Lebedev, Vadim; Stephan, Ralf; Hein, Matthias; Ambacher, Oliver
Processing of novel SiC and group III-nitride based micro- and nanomechanical devices. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 202 (2005), 4, S. 671-676

http://dx.doi.org/10.1002/pssa.200460471
Morales, Francisco M.; Förster, Christian; Ambacher, Oliver; Pezoldt, Jörg
Beta to alpha transition and defects on SiC on Si grown by CVD. - In: Microscopy of semiconducting materials, (2005), S. 131-134

Morales, Francisco M.; Weih, Petia; Wang, Chunyu; Stauden, Thomas; Ambacher, Oliver; Pezoldt, Jörg
Strain relaxation and void reduction in SiC on Si by Ge predeposition. - In: Microscopy of semiconducting materials, (2005), S. 135-138

Voigt, Stefan; Zhokhavets, Uladzimir; Gobsch, Gerhard; Al-Ibrahim, Maher; Ambacher, Oliver; Sensfuss, Steffi
Determination of hole mobility and lifetime in bulk heterojunction solar cells by photoinduced absorption spectroscopy. - In: Arbeitskreis Festkörperphysik, chemische Physik und Polymerphysik, dielektrische Physik, dünne Schichten, Dynamik und statische Physik, Halbleiterphysik, Magnetismus, Metallphysik, Oberflächenphysik, tiefe Temperaturen, Vakuumphysik und Vakuumtechnik, Arbeitskreise biologische Physik, Physik sozioökonomischer Systeme, Symposien, 2005, HL 57.7

Schley, Pascal; Goldhahn, Rüdiger; Gobsch, Gerhard; Cimalla, Volker; Ambacher, Oliver; Cobet, Christoph; Esser, Norbert; Furthmüller, Jürgen; Bechstedt, Friedhelm; Lu, Hai; Schaff, William J.
Selection rules for optical transitions of wurtzite InN. - In: Arbeitskreis Festkörperphysik, chemische Physik und Polymerphysik, dielektrische Physik, dünne Schichten, Dynamik und statische Physik, Halbleiterphysik, Magnetismus, Metallphysik, Oberflächenphysik, tiefe Temperaturen, Vakuumphysik und Vakuumtechnik, Arbeitskreise biologische Physik, Physik sozioökonomischer Systeme, Symposien, 2005, HL 43.4

Shokhovets, Sviatoslav; Gobsch, Gerhard; Ambacher, Oliver
kp parameters of wurtzite GaN. - In: Arbeitskreis Festkörperphysik, chemische Physik und Polymerphysik, dielektrische Physik, dünne Schichten, Dynamik und statische Physik, Halbleiterphysik, Magnetismus, Metallphysik, Oberflächenphysik, tiefe Temperaturen, Vakuumphysik und Vakuumtechnik, Arbeitskreise biologische Physik, Physik sozioökonomischer Systeme, Symposien, 2005, HL 15.3

Al-Ibrahim, Maher; Sensfuss, Steffi; Gobsch, Gerhard; Ambacher, Oliver
Effects of solvent and annealing on the improved performance of solar cells based on poly(3-hexylthiophene):fullerene. - In: Arbeitskreis Festkörperphysik, chemische Physik und Polymerphysik, dielektrische Physik, dünne Schichten, Dynamik und statische Physik, Halbleiterphysik, Magnetismus, Metallphysik, Oberflächenphysik, tiefe Temperaturen, Vakuumphysik und Vakuumtechnik, Arbeitskreise biologische Physik, Physik sozioökonomischer Systeme, Symposien, 2005, SYOO 6.17

Al-Ibrahim, Maher; Roth, Hans-Klaus; Zhokhavets, Uladzimir; Gobsch, Gerhard; Sensfuss, Steffi
Flexible large area polymer solar cells based on poly(3-hexylthiophene)/fullerene. - In: Solar energy materials & solar cells, ISSN 1879-3398, Bd. 85 (2005), 1, S. 13-20

http://dx.doi.org/10.1016/j.solmat.2004.03.001
Tonisch, Katja; Will, Florentina; Förster, Christian; Cimalla, Volker; Brückner, Klemens; Hein, Matthias; Ambacher, Oliver
SiC and AlN-based micro- and nanomechanical resonators for sensing applications. - In: 7. Dresdner Sensor-Symposium - neue Herausforderungen und Anwendungen in der Sensortechnik, (2005), S. 239-242

Kittler, Gabriel; Spitznas, Armin; Buchheim, Carsten; Lebedev, Vadim; Wegener, Dennis; Schober, Andreas; Ambacher, Oliver
pH-Wert Messungen mit GaN-basierten Sensoren. - In: 7. Dresdner Sensor-Symposium - neue Herausforderungen und Anwendungen in der Sensortechnik, (2005), S. 207-210

Schober, Andreas; Kittler, Gabriel; Lübbers, Benedict; Buchheim, Carsten; Majdeddin, Ali; Cimalla, Volker; Fischer, Michael; Spitznas, Armin; Gebinoga, Michael; Yanev, Vasil; Himmerlich, Marcel; Kerekes, Tibor; Kittler, Mario; Drüe, Karl-Heinz; Hintz, Michael; Krischok, Stefan; Burgold, Jörg; Weise, Frank; Ambacher, Oliver; Gottwald, Eric
A novel class of sensors for micro- and nanofluidic systems in biotechnological applications. - In: 7. Dresdner Sensor-Symposium - neue Herausforderungen und Anwendungen in der Sensortechnik, (2005), S. 143-146

Schober, Andreas; Kittler, Gabriel; Buchheim, Carsten; Majdeddin, Ali; Cimalla, Volker; Fischer, Michael; Yanev, Vasil; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Romanus, Henry; Sändig, Torsten; Burgold, Jörg; Weise, Frank; Wurmus, Helmut; Drüe, Karl-Heinz; Hintz, Michael; Thust, Heiko; Gebinoga, Michael; Kittler, Mario
A novel class of sensors for system integrative concepts in biotechnological applications. - In: NSTI BioNano, (2005), S. 489-492

Lebedev, Vadim; Morales Sánchez, Francisco Miguel; Romanus, Henry; Krischok, Stefan; Ecke, Gernot; Cimalla, Volker; Himmerlich, Marcel; Stauden, Thomas; Cengher, Dorin; Ambacher, Oliver
The role of Si as surfactant and donor in molecular-beam epitaxy of AlN. - In: Journal of applied physics, ISSN 1089-7550, Bd. 98 (2005), 9, 093508, insges. 6 S.

https://doi.org/10.1063/1.2126786
Goldhahn, Rüdiger; Buchheim, Carsten; Lebedev, Vadim; Cimalla, Volker; Ambacher, Oliver; Cobet, Christoph; Rakel, Munise; Esser, Norbert; Rossow, Uwe; Fuhrmann, Daniel; Hangleiter, Andreas; Potthast, Stefan; As, Donat J.
Dielectric function and critical points of the band structure for hexagonal and cubic GaN and AlN. - Ilmenau : Univ.-Bibliothek. - 3 S. = 1,06 MB, TextCD-ROM-Ausg.: Highlights / Annual report 2004 // Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung m.b.H. - Berlin : BESSY, 2005, S. 206-208

http://www.db-thueringen.de/servlets/DocumentServlet?id=6255
Cimalla, Volker; Lebedev, Vadim; Kaiser, Ute; Goldhahn, Rüdiger; Förster, Christian; Pezoldt, Jörg; Ambacher, Oliver
Polytype control and properties of AlN on silicon. - In: Physica status solidi, ISSN 1610-1642, Bd. 2 (2005), 7, S. 2199-2203

http://dx.doi.org/10.1002/pssc.200461579
Cimalla, Volker; Ecke, Gernot; Niebelschütz, Merten; Ambacher, Oliver; Goldhahn, Rüdiger; Lu, Hai; Schaff, William J.
Surface conductivity of epitaxial InN. - In: Physica status solidi, ISSN 1610-1642, Bd. 2 (2005), 7, S. 2254-2257

http://dx.doi.org/10.1002/pssc.200461448
Zgheib, Charbel; Kazan, Michel; Weih, Petia; Ambacher, Oliver; Masri, Pierre; Pezoldt, Jörg
Effect of Ge incorporation on stoichiometric composition of 3C-SiC thin films grown on Si(111) substrates. - In: Physica status solidi, ISSN 1610-1642, Bd. 2 (2005), 4, S. 1284-1287

http://dx.doi.org/10.1002/pssc.200460427
Lebedev, Vadim; Cimalla, Irina; Cimalla, Volker; Wagner, R.; Kaiser, Ute; Ambacher, Oliver
Defect related absorption and emission in AlGaN solar-blind UV photodetectors. - In: Physica status solidi, ISSN 1610-1642, Bd. 2 (2005), 4, S. 1360-1365

http://dx.doi.org/10.1002/pssc.200460458
Konkin, Alexander L.; Sensfuss, Steffi; Roth, Hans-Klaus; Nazmutdinova, Gulnara; Schrödner, Mario; Al-Ibrahim, Maher; Egbe, Daniel A. M.
LESR study on PPV-PPE/PCBM composites for organic photovoltaics. - In: Synthetic metals, Bd. 148 (2005), 2, S. 199-204

http://dx.doi.org/10.1016/j.synthmet.2004.09.023
Brückner, Klemens; Förster, Christian; Tonisch, Katja; Cimalla, Volker; Ambacher, Oliver; Stephan, Ralf; Blau, Kurt; Hein, Matthias
Electromechanical resonances of SiC and AlN beams under ambient conditions. - In: Conference proceedings, (2005), S. 1531-1534

Jishiashvili, D.; Gobsch, Gerhard; Ecke, Gernot; Gobronidze, V.; Mtskeradze, G.; Shiolashvili, Z.
Surface passivation of GaAs using a Ge interface control layer. - In: Physica status solidi, ISSN 1862-6319, Bd. 202 (2005), 9, S. 1778-1785

http://dx.doi.org/10.1002/pssa.200420026
Ibrahim, Maher al-; Konkin, Alexander; Roth, Hans-Klaus; Ayuk Mbi Egbe, Daniel; Klemm, Elisabeth; Zhokhavets, Uladzimir; Gobsch, Gerhard; Sensfuss, Steffi
Phenylene-ethynylene/phenylene-vinylene hybrid polymers: optical and electrochemical characterization, comparison with poly[2-methoxy-5-(3,7-dimethyloctyloxy)-1,4-phenylene vinylene] and application in flexible polymer solar cells. - In: Thin solid films, ISSN 1879-2731, Bd. 474 (2005), 1/2, S. 201-210

http://dx.doi.org/10.1016/j.tsf.2004.08.188
Pezoldt, Jörg; Zgheib, Charbel; Morales, Francisco M.; Förster, Christian; Stauden, Thomas; Wang, Chunyu; Masri, Pierre; Leycuras, A.; Ferro, Gabriel; Ambacher, Oliver
Stress manipulation in CVD grown SiC on Si by mono- and submonolayer Ge precoverages. - In: EUROCVD-15, (2005), S. 707-714

Morales, Francisco M.; Förster, Christian; Ambacher, Oliver; Pezoldt, Jörg
Silicon carbide nanoheteropolytypic structures grown by UHV-CVD on Si(111). - In: EUROCVD-15, (2005), S. 699-706

Gubisch, Maik; Liu, Yonghe; Krischok, Stefan; Ecke, Gernot; Spieß, Lothar; Schäfer, Jürgen A.; Knedlik, Christian
Tribological characteristics of WC1-x9 W2C and WC tungsten carbide films. - In: Life cycle tribology, (2005), S. 409-417

Förster, Christian; Cimalla, Volker; Brückner, Klemens; Hein, Matthias; Pezoldt, Jörg; Ambacher, Oliver
Micro-electromechanical systems based on 3C-SiC/Si heterostructures. - In: Materials science & engineering, ISSN 1873-0191, Bd. 25 (2005), 5/8, S. 804-808

http://dx.doi.org/10.1016/j.msec.2005.07.016
Morales, Francisco M.; Förster, Christian; Ambacher, Oliver; Pezoldt, Jörg
[alpha]-SiC-[beta]-SIC heteropolytype structures on Si (111). - In: Applied physics letters, ISSN 1077-3118, Bd. 87 (2005), 20, S. 201910, insges. 3 S.

http://dx.doi.org/10.1063/1.2131179
Weise, Frank; Burgold, Jörg; Dressler, Lothar; Wurmus, Helmut; Ambacher, Oliver
Dosierung von Flüssigkeiten im Pikoliterbereich. - In: Mikrosystemtechnik Kongress 2005, (2005), S. 697-699

Sensfuss, Steffi; Al-Ibrahim, Maher
Optoelectronic properties of conjugated polymer/fullerene binary pairs with variety of LUMO level differences. - In: Organic photovoltaics, (2005), S. 529-557

Weih, Petia; Stauden, Thomas; Ecke, Gernot; Shokhovets, Sviatoslav; Zgheib, Charbel; Voelskow, Matthias; Skorupa, Wolfgang; Ambacher, Oliver; Pezoldt, Jörg
Ion beam synthesis of 3C-(Si 1-x C 1-y ) Ge x+y solid solution. - In: Physica status solidi, ISSN 1862-6319, Bd. 202 (2005), 4, S. 545-549

http://dx.doi.org/10.1002/pssa.200460418
Schmidt, Alexander A.; Kharlamov, Vladimir S.; Safanov, K. L.; Trushin, Yuri V.; Zhurkin, E. E.; Cimalla, Volker; Ambacher, Oliver; Pezoldt, Jörg
Growth of tree-dimensional SiC clusters on simodelled by KMC. - In: Computational materials science, Bd. 33 (2005), 1/3, S. 375-381

http://dx.doi.org/10.1016/j.commatsci.2004.12.005
Lebedev, Vladimir S.; Cimalla, Volker; Kaiser, Ute; Pezoldt, Jörg; Biskupek, Johannes; Ambacher, Oliver
Effect of nanoscale surface morphology on the phase stability of 3C-AIN films on Si(111). - In: Journal of applied physics, ISSN 1089-7550, Bd. 97 (2005), 11, 114306, insges. 6 S.

https://doi.org/10.1063/1.1915535
Zgheib, Charbel; McNeil, L. E.; Kazan, Michel; Masri, Pierre; Morales, Francisco M.; Ambacher, Oliver; Pezoldt, Jörg
Raman studies of Ge-promoted stress modulation in 3C-SiC grown on Si(111). - In: Applied physics letters, ISSN 1077-3118, Bd. 87 (2005), 4, S. 041905, insges. 3 S.

http://dx.doi.org/10.1063/1.1999858
Kharlamov, Vladimir S.; Lubov, Maxim N.; Pezoldt, Jörg; Trushin, Yuri V.; Zhurkin, Evgeni E.
Molecular dynamics study of diffusion barriers of Si and C adatoms on Si surfaces. - In: Eighth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (2005), S. 51-55

Al-Ibrahim, Maher; Ambacher, Oliver; Sensfuss, Steffi; Gobsch, Gerhard
Effects of solvent and annealing on the improves performance of solar cells based on poly(3-hexylthiophene): fullerene. - In: Applied physics letters, ISSN 1077-3118, Bd. 86 (2005), 20, S. 201120, insges. 3 S.

http://dx.doi.org/10.1063/1.1929875
Dmowski, L. H.; Plesiewicz, J. A.; Suski, T.; Lu, Hai; Schaff, William; Kurouchi, M.; Nanishi, Y.; Konczewicz, L.; Cimalla, Volker; Ambacher, Oliver
Resonant localized donor state above the conduction band minimum in InN. - In: Applied physics letters, ISSN 1077-3118, Bd. 86 (2005), 26, S. 262105, insges. 3 S.

http://dx.doi.org/10.1063/1.1977212
Al-Ibrahim, Maher; Sensfuss, Steffi; Uziel, Jutta; Ecke, Gernot; Ambacher, Oliver
Comparison of normal and inverse poly(3-hexylthiophene)/fullerene solar cell architectures. - In: Solar energy materials & solar cells, ISSN 1879-3398, Bd. 85 (2005), 2, S. 277-283

http://dx.doi.org/10.1016/j.solmat.2004.08.001
Shokhovets, Sviatoslav; Gobsch, Gerhard; Ambacher, Oliver
Momentum matrix element and conduction band nonparabolicity in wurtzite GaN. - In: Applied physics letters, ISSN 1077-3118, Bd. 86 (2005), 16, S. 161908, insges. 3 S.

http://dx.doi.org/10.1063/1.1906313
Gubisch, Maik; Liu, Yonghe; Spieß, Lothar; Romanus, Henry; Krischok, Stefan; Ecke, Gernot; Schäfer, Jürgen A.; Knedlik, Christian
Nanoscale multilayer WC/C coatings developed for nanopositioning: Part I. Microstructures and mechanical properties. - In: Thin solid films, ISSN 1879-2731, Bd. 488 (2005), 1, S. 132-139

http://dx.doi.org/10.1016/j.tsf.2005.04.107
Al-Ibrahim, Maher; Roth, Hans-Klaus; Schrödner, Mario; Konkin, Alexander; Zhokhavets, Uladzimir; Gobsch, Gerhard; Scharff, Peter; Sensfuss, Steffi
The influence of the optoelectronic properties of poly(3-alkylthiophenes) on the device parameters in flexible polymer solar cells. - In: Organic electronics, Bd. 6 (2005), 2, S. 65-77

http://dx.doi.org/10.1016/j.orgel.2005.02.004
Kosiba, Rastislav;
Augerelektronenspektroskopie und niederenergetischer Ionenbeschuss von Siliziumkarbid, 2005. - Online-Ressource (PDF-Datei: 147 S., 3620 KB) : Ilmenau, Techn. Univ., Diss., 2005
Parallel als Druckausg. erschienen

Die vorliegende Arbeit behandelt den Einsatz der Augerelektronenspektroskopie bei der Untersuchung von SiC-Schichten und -Einkristallen mit besonderem Augenmerk auf die Wirkung des Ionenstrahls auf die SiC-Oberfläche beim Sputtern. Die Augerelektronenspektroskopie eignet sich zur Bestimmung vieler Eigenschaften einer SiC-Oberfläche nach dem Beschuss mit Edelgasionen. Der theoretische Teil beinhaltet einen Beitrag zur Anwendung der Faktorenanalyse bei der Auswertung von Auger-Spektren. Ein weiteres Thema des theoretischen Teils ist die Sputtertheorie. Hier wird eine Korrektur der Sigmundschen Formel zur Berechnung der Sputterausbeuten präsentiert. Im experimentellen Teil der Arbeit werden Aussagen über die Abweichungen der Oberflächenzusammensetzung nach dem Sputtern und über die Konzentration der eingebauten Edelgase getroffen. Aus dem Vergleich zwischen den experimentell gemessenen und theoretisch berechneten bzw. simulierten Werten der Sputterausbeuten wird die effektive Oberflächenbindungsenergie von 4 eV/Atom für das Sputtern von SiC mit Edelgasen bestimmt. Sowohl der Nachweis der Änderungen der elektronischen Struktur bei den durch Ionenbeschuss zerstörten einkristallinen SiC-Oberflächen bzw. -Schichten als auch die Bestimmung des Leitungstyps mittels Augerelektronenspektroskopie erweitern das Einsatzgebiet dieser analytischen Methode in der SiC-Technologie.



http://www.db-thueringen.de/servlets/DocumentServlet?id=2966
Rockstuhl, Carsten; Herzig, H. P.; Förster, Christian; Leycuras, A.; Ambacher, Oliver; Pezoldt, Jörg
Infrared gratings based on SiC/Si-heterostructures. - In: Silicon carbide and related materials 2004, (2005), S. 433-436

Pezoldt, Jörg; Polychroniadis, E.; Stauden, Thomas; Ecke, Gernot; Chassagne, T.; Vennegues, P.; Leycuras, A.; Panknin, D.; Stoemenos, J.; Skorupa, Wolfgang
Nucleation control in FLASIC assisted short time liquid phase epitaxy by melt modification. - In: Silicon carbide and related materials 2004, (2005), S. 213-216

Förster, Christian; Cimalla, Volker; Ambacher, Oliver; Pezoldt, Jörg
Low temperature chemical vapor deposition of 3C-SiC on Si substrates. - In: Silicon carbide and related materials 2004, (2005), S. 201-204

Weih, Petia; Romanus, Henry; Stauden, Thomas; Spieß, Lothar; Ambacher, Oliver; Pezoldt, Jörg
Growth of 3C-(Si1-xC1-y)Gex+y layers on 4H-SiC by molecular beam epitaxy. - In: Silicon carbide and related materials 2004, (2005), S. 173-176

Safonov, K. L.; Trushin, Yuri V.; Ambacher, Oliver; Pezoldt, Jörg
Computer simulation of the early stages of nano scale SiC growth on Si. - In: Silicon carbide and related materials 2004, (2005), S. 169-172

Herrera, M.; Cremades, Ana; Piqueras, Javier; Stutzmann, Martin; Ambacher, Oliver
Study of pinholes and nanotubes in AlInGaN films by cathodoluminescence and atomic force microscopy. - In: Journal of applied physics, ISSN 1089-7550, Bd. 95 (2004), 10, S. 5305-5310

https://doi.org/10.1063/1.1690454
Förster, Christian; Schnabel, F.; Weih, Petia; Stauden, Thomas; Ambacher, Oliver; Pezoldt, Jörg
In situ spectroscopic ellipsometry of hydrogen-argon plasma cleaned silicon surfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 455/456 (2004), S. 695-699

https://doi.org/10.1016/j.tsf.2003.11.255
Zgheib, Charbel; Förster, Christian; Weih, Petia; Cimalla, Volker; Kazan, Michel; Masri, Pierre; Ambacher, Oliver; Pezoldt, Jörg
Infrared ellipsometry of SiC/Si heterostructures with Ge modified interfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 455/456 (2004), S. 183-186

https://doi.org/10.1016/j.tsf.2003.11.208
Shokhovets, Sviatoslav; Fuhrmann, Daniel; Goldhahn, Rüdiger; Gobsch, Gerhard; Ambacher, Oliver; Hermann, Martin; Eickhoff, Martin
Temperature-dependent electric fields in GaN Schottky diodes studied by electroreflectance. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 163-166

http://dx.doi.org/10.1016/j.tsf.2003.10.064
Buchheim, Carsten; Winzer, Andreas T.; Goldhahn, Rüdiger; Gobsch, Gerhard; Ambacher, Oliver; Link, Angela; Eickhoff, Martin; Stutzmann, Martin
Photoreflectance studies of (Al)Ga- and N-face AlGaN/GaN heterostructures. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 155-158

http://dx.doi.org/10.1016/j.tsf.2003.10.062
Schmidt, Alexander A.; Safonov, K. L.; Trushin, Yuri V.; Cimalla, Volker; Ambacher, Oliver; Pezoldt, Jörg
Kinetic Monte Carlo simulation of SiC nucleation on Si(111). - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 201 (2004), 2, S. 333-337

http://dx.doi.org/10.1002/pssa.200303962
Cimalla, Volker; Schmidt, Alexander A.; Stauden, Thomas; Zekentes, K.; Ambacher, Oliver; Pezoldt, Jörg
Linear alignment of SiC dots on silicon substrates. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 22.2004, 5, S. L20-L23

http://dx.doi.org/10.1116/1.1787520
Arndt, Christian; Zhokhavets, Uladzimir; Mohr, Martina; Gobsch, Gerhard; Al-Ibrahim, Maher; Sensfuss, Steffi
Determination of polaron lifetime and mobility in a polymer/fullerene solar cell by means of photoinduced absorption. - In: Synthetic metals, Bd. 147 (2004), 1/3, S. 257-260

http://dx.doi.org/10.1016/j.synthmet.2004.06.037
Skorupa, Wolfgang; Panknin, D.; Voelskow, Matthias; Anwand, W.; Ferro, Gabriel; Moteil, Y.; Leycuras, A.; Pezoldt, Jörg; McMahon, R.; Smith, M.
Advanced thermal processing of semiconductor materials by flash lamp annealing. - In: Silicon front-end junction formation - physics and technology, 2004, S. C4.16.1-C4.16.6, insges. 6 S.

Martinez-Criado, Gema; Miskys, Claudio; Karrer, Uwe; Ambacher, Oliver; Stutzmann, Martin
Two-dimensional electron gas recombination in undoped AlGaN/GaN heterostructures. - In: Japanese journal of applied physics, ISSN 1347-4065, Bd. 43.2004, Pt. 1, 6A, S. 3360-3366

http://dx.doi.org/10.1143/JJAP.43.3360
Aperathitis, Elias; Modreanu, Mircea; Bender, Marcus; Cimalla, Volker; Ecke, Gernot; Androulidaki, M.; Pelekanos, Nikos
Optical characterization of indium-tin-oxynitride fabricated by RF-sputtering. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 101-104

http://dx.doi.org/10.1016/j.tsf.2003.10.046
Martins, Rodrigo; Fortunato, Elvira; Nunes, Patricia; Ferreira, Isabel; Marques, António; Bender, Marcus; Katsarakis, Nikos; Cimalla, Volker; Kiriakidis, George
Zinc oxide as an ozone sensor. - In: Journal of applied physics, ISSN 1089-7550, Bd. 96 (2004), 3, S. 1398-1408

https://doi.org/10.1063/1.1765864
Buchheim, Carsten; Lebedev, Vadim; Yanev, Vasil; Kittler, Gabriel; Fischer, Michael; Ecke, Gernot; Ambacher, Oliver; Cimalla, Volker; Krischok, Stefan; Schäfer, Jürgen A.
Surface modifications of AlGaN/GaN sensors for water based nano- and picodroplets [chemical and biosensors]. - In: Proceedings of IEEE sensors 2004, (2004), S. 1007-1010

Cui, Shen; Scharff, Peter; Siegmund, Carmen; Schneider, Doreen; Risch, Katrin; Klötzer, Susann; Spieß, Lothar; Romanus, Henry; Schawohl, Jens
Investigation on preparation of multiwalled carbon nanotubes by DC arc discharge under N2 atmosphere. - In: Carbon, ISSN 1873-3891, Bd. 42 (2004), 5/6, S. 931-939

http://dx.doi.org/10.1016/j.carbon.2003.12.060
Tilak, V.; Ali, Majdeddin; Cimalla, Volker; Manivannan, V.; Sandvik, P.; Fedison, J.; Ambacher, Oliver; Merfeld, D.
Influence of metal thickness to sensitivity of Pt/GaN Schottky diodes for gas sensing applications. - In: GaN and related alloys - 2003, (2004), S. 593-597

Lu, Hai; Schaff, William J.; Eastman, Lester F.; Cimalla, Volker; Pezoldt, Jörg; Ambacher, Oliver; Wu, J.; Walukiewicz, Wladek
Growth of non-polar a-plane and cubic InN on r-plane sapphire by molecular beam epitaxy. - In: GaN and related alloys - 2003, (2004), S. 213-218

Förster, Christian; Cimalla, Volker; Lebedev, Vadim; Cengher, Dorin; Ambacher, Oliver; Brückner, Klemens; Stephan, Ralf; Hein, Matthias
SiC/Si and AlN/Si heterostructures for microelectromechanical RF sensors. - In: CAS 2004 proceedings, (2004), S. 371-374

Goldhahn, Rüdiger; Cimalla, Volker; Ambacher, Oliver; Cobet, Christoph; Richter, Wolfgang; Esser, Norbert; Lu, Hai; Schaff, William J.
Anisotropy of the dielectric function for hexagonal InN. - 3 S. = 758,9 KB, TextCD-ROM-Ausg.: Highlights / Annual report 2003 // Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung m.b.H. - Berlin : BESSY, 2004, S. 377-379

http://www.db-thueringen.de/servlets/DocumentServlet?id=6252
Hermann, Martin; Monroy, E.; Helman, A.; Baur, B.; Albrecht, M.; Daudin, B.; Ambacher, Oliver; Stutzmann, Martin; Eickhoff, Martin
Vertical transport in group III-nitride heterostructures and application in AlN/GaN resonant tunneling diodes. - In: Physica status solidi, ISSN 1610-1642, Bd. 1 (2004), 8, S. 2210-2227

http://dx.doi.org/10.1002/pssc.200404771
Lebedev, Vadim; Cimalla, Irina; Kaiser, Ute; Ambacher, Oliver
Gap state absorption in AlGaN photoconductors and solar-blind photodetectors. - In: Physica status solidi, ISSN 1610-1642, Bd. 1 (2004), 2, S. 233-237

http://dx.doi.org/10.1002/pssc.200303907
Cimalla, Volker; Pezoldt, Jörg; Stauden, Thomas; Schmidt, Alexander A.; Zekentes, K.; Ambacher, Oliver
Lateral alignment of SiC dots on Si. - In: Physica status solidi, ISSN 1610-1642, Bd. 1 (2004), 2, S. 337-340

http://dx.doi.org/10.1002/pssc.200303951
Morales, Francisco M.; Zgheib, Charbel; Molina, Sergio I.; Araújo, Daniel; García, Rafael; Fernández, C.; Sanz-Hervás, A.; Masri, Pierre; Weih, Petia; Stauden, Thomas
The role of Ge predeposition temperature in the MBE epitaxy of SiC on silicon. - In: Physica status solidi, ISSN 1610-1642, Bd. 1 (2004), 2, S. 341-346

http://dx.doi.org/10.1002/pssc.200303940
Weih, Petia; Cimalla, Volker; Stauden, Thomas; Kosiba, Rastislav; Ecke, Gernot; Spieß, Lothar; Romanus, Henry; Gubisch, Maik; Bock, W.; Freitag, Th.
3C-SiC:Ge alloys grown on Si (111) substrates by SSMBE. - In: Physica status solidi, ISSN 1610-1642, Bd. 1 (2004), 2, S. 347-350

http://dx.doi.org/10.1002/pssc.200303953
Ambacher, Oliver;
GaN-based sensors for applications in nano- and picofluidic systems. - In: Abstracts, (2004), insges. 1 S.

Schober, Andreas; Kittler, Gabriel; Buchheim, Carsten; Majdeddin, Ali; Cimalla, Volker; Fischer, Michael; Yanev, Vasil; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Romanus, Henry; Sändig, Torsten; Burgold, Jörg; Weise, Frank; Wurmus, Helmut; Drüe, Karl-Heinz; Hintz, Michael; Thust, Heiko; Gessner, Jörg; Kittler, Mario; Schwierz, Frank; Doll, Theodor; Manske, Eberhard; Mastylo, Rostyslav; Jäger, Gerd; Knedlik, Christian; Winkler, Gerd; Kern, Heinrich; Hoffmann, R.; Spieß, Lothar; Spitznas, Armin; Gottwald, Eric; Weibezahn, Karl-Friedrich; Wegener, Dennis; Schwienhorst, Andreas; Ambacher, Oliver
A novel class of sensors for system integrative concepts in biotechnological applications. - In: Technische Systeme für Biotechnologie und Umwelt, (2004), S. 163-169

Goldhahn, Rüdiger; Winzer, Andreas T.; Cimalla, Volker; Ambacher, Oliver; Cobet, Christoph; Richter, Wolfgang; Esser, Norbert; Furthmüller, Jürgen; Bechstedt, Friedhelm; Lu, Hai; Schaff, William J.
Anisotropy of the dielectric function for wurtzite InN. - In: Superlattices and microstructures, ISSN 1096-3677, Bd. 36 (2004), 4/6, S. 591-597

http://dx.doi.org/10.1016/j.spmi.2004.09.016
Cimalla, Volker; Spieß, Lothar; Romanus, Henry; Ambacher, Oliver
Lateralkraftmikroskopie an elektrischen Kontakten. - In: Thüringer Werkstofftag 2004, (2004), S. 203-211

Förster, Christian; Cimalla, Volker; Kerekes, Tibor; Ecke, Gernot; Ambacher, Oliver; Pezoldt, Jörg
Ionenstrahlätzen von Siliziumkarbid. - In: Thüringer Werkstofftag 2004, (2004), S. 185-190

Cimalla, Volker; Spieß, Lothar; Gubisch, Maik; Hotovy, Ivan; Romanus, Henry; Ambacher, Oliver
Analyse nanokristalliner Schichten auf rauen Substraten. - In: Thüringer Werkstofftag 2004, (2004), S. 177-183

Pezoldt, Jörg; Kalnin, Andrei Alexandrovich
Strukturselektion in multivariablen Kristallen. - In: Thüringer Werkstofftag 2004, (2004), S. 167-175

Pezoldt, Jörg; Wang, Chunyu
Infrarotellipsometrie ein Verfahren für die Materialcharakterisierung. - In: Thüringer Werkstofftag 2004, (2004), S. 159-165

Fröhlich, Toni; Scharff, Peter; Schliefke, Willy; Romanus, Henry; Gupta, Vinay; Siegmund, Carmen; Ambacher, Oliver; Spiess, Lothar
Insertion of C60 into multi-wall carbon nanotubes : a synthesis of C60MWCNT. - In: Carbon, ISSN 1873-3891, Bd. 42 (2004), 12/13, S. 2759-2762

http://dx.doi.org/10.1016/j.carbon.2004.05.025
Erb, Tobias; Raleva, Sofiya; Zhokhavets, Uladzimir; Gobsch, Gerhard; Stühn, Bernd; Spode, Matthias; Ambacher, Oliver
Structural and optical properties of both pure poly(3-octylthiophene) (P3OT) and P3OT/fullerene films. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 97-100

http://dx.doi.org/10.1016/j.tsf.2003.10.045
Al-Ibrahim, Maher; Roth, Hans Klaus; Sensfuss, Steffi; Knedlik, Christian; Ambacher, Oliver
Anforderungen an Werkstoffe und Technologien zur Herstellung von effizienten langzeitstabilen Polymersolarzellen. - In: Thüringer Werkstofftag 2004, (2004), S. 31-36

Ambacher, Oliver; Cimalla, Volker; Lebedev, Vadim; Kittler, Gabriel; Ali, Majdeddin
Electronics and sensors based on pyroelectric AlGaN/GaN heterostructures. - In: Thüringer Werkstofftag 2004, (2004), S. 1-18

Danis, S.; Hol, V.; Zhong, Z.; Bauer, G.; Ambacher, Oliver
High-resolution diffuse x-ray scattering from threading dislocations in heteroepitaxial layers. - In: Applied physics letters, ISSN 1077-3118, Bd. 85 (2004), 15, S. 3065-3067

http://dx.doi.org/10.1063/1.1806279
Al-Ibrahim, Maher; Roth, Hans Klaus; Sensfuss, Steffi
Efficient large-area polymer solar cells on flexible substrates. - In: Applied physics letters, ISSN 1077-3118, Bd. 85 (2004), 9, S. 1481-1483

http://dx.doi.org/10.1063/1.1787158
Bechstedt, Friedhelm; Furthmüller, Jürgen; Ambacher, Oliver; Goldhahn, Rüdiger
Comment on "Mie resonances, infrared emission, and the band gap of InN". - In: Physical review letters, ISSN 1079-7114, Bd. 93 (2004), 26, 269701, insges. 1 S.

https://doi.org/10.1103/PhysRevLett.93.269701
Krischok, Stefan; Yanev, Vasil; Balykov, Oleg; Himmerlich, Marcel; Schäfer, Jürgen A.; Kosiba, Rastislav; Ecke, Gernot; Cimalla, Irina Nicoleta; Cimalla, Volker; Ambacher, Oliver; Lu, Hai; Schaff, William J.; Eastman, Lester F.
Investigations of MBE grown InN and the influence of sputtering on the surface composition. - In: Surface science, ISSN 1879-2758, Bd. 566/568 (2004), 2, S. 849-855

http://dx.doi.org/10.1016/j.susc.2004.06.020
Trushin, Yuri V.; Zhurkin, E. E.; Safonov, K. L.; Schmidt, Alexander A.; Kharlamov, Vladimir S.; Korolev, Sergey A.; Lubov, Maxim N.; Pezoldt, Jörg
Initial stages of the MBE growth of silicon carbide nanoclusters on a silicon substrate. - In: Technical physics letters, ISSN 1090-6533, Bd. 30 (2004), 8, S. 641-643

http://dx.doi.org/10.1134/1.1792299
Rossow, Uwe; Fuhrmann, Daniel; Greve, M.; Bläsing, Jürgen; Krost, Alois; Ecke, Gernot; Riedel, N.; Hangleiter, Andreas
Growth of AlxGa1-xN-layers on planar and patterned substrates. - In: Journal of crystal growth, Bd. 272 (2004), 1/4, S. 506-514

http://dx.doi.org/10.1016/j.jcrysgro.2004.09.044
Cimalla, Volker; Kaiser, Ute; Cimalla, Irina; Ecke, Gernot; Pezoldt, Jörg; Spieß, Lothar; Ambacher, Oliver; Lu, Hai; Schaff, William
Cubic InN on r-plane sapphire. - In: Superlattices and microstructures, ISSN 1096-3677, Bd. 36 (2004), 4/6, S. 487-495

http://dx.doi.org/10.1016/j.spmi.2004.09.054
Cimalla, Volker; Schmidt, Alexander A.; Förster, Christian; Zekentes, K.; Ambacher, Oliver; Pezoldt, Jörg
Self-organized SiC nanostructures on silicon. - In: Superlattices and microstructures, ISSN 1096-3677, Bd. 36 (2004), 1/3, S. 345-351

http://dx.doi.org/10.1016/j.spmi.2004.08.001
Panknin, D.; Godignon, P.; Mestres, N.; Polychroniadis, E.; Stoemenos, J.; Ferro, Gabriel; Pezoldt, Jörg; Skorupa, Wolfgang
Formation of 3C-SiC films embedded in SiO2 by sacrificial oxidation. - In: Silicon carbide and related materials 2003, (2004), S. 1515-1518

Förster, Christian; Cimalla, Volker; Kosiba, Rastislav; Ecke, Gernot; Weih, Petia; Ambacher, Oliver; Pezoldt, Jörg
Etching of SiC with fluorine ECR plasma. - In: Silicon carbide and related materials 2003, (2004), S. 821-824

Zgheib, Charbel; Masri, Pierre; Weih, Petia; Ambacher, Oliver; Pezoldt, Jörg
Stress control in 3C-SiC films grown on Si(111). - In: Silicon carbide and related materials 2003, (2004), S. 301-304

Morales, Francisco M.; Zgheib, Charbel; Molina, Sergio I.; Araújo, Daniel; García, Rafael; Fernández, C.; Sanz-Hervás, A.; Masri, Pierre; Weih, Petia; Stauden, Thomas
Influence of the Ge coverage prior to carbonization on the structure of SiC grown on Si(111). - In: Silicon carbide and related materials 2003, (2004), S. 297-300

Kosiba, Rastislav; Ecke, Gernot; Cimalla, Volker; Spieß, Lothar; Krischok, Stefan; Schäfer, Jürgen A.; Ambacher, Oliver; Schaff, William J.
Sputter depth profiling of InN layers. - In: Nuclear instruments & methods in physics research, Bd. 215 (2004), 3/4, S. 486-494

http://dx.doi.org/10.1016/j.nimb.2003.08.039
Weih, Petia; Cimalla, Volker; Stauden, Thomas; Kosiba, Rastislav; Spieß, Lothar; Romanus, Henry; Gubisch, Maik; Bock, W.; Freitag, Th.; Fricke, P.
Structure and composition of 3C-SiC:Ge alloys grown on Si (111) substrates by SSMBE. - In: Silicon carbide and related materials 2003, (2004), S. 293-296

Skorupa, Wolfgang; Panknin, D.; Anwand, W.; Voelskow, Matthias; Ferro, Gabriel; Monteil, Y.; Leycuras, A.; Pezoldt, Jörg; McMahon, R.; Smith, M.
Flash lamp supported deposition of 3C-SiC (FLASiC) - a promising technique to produce high quality cubic SiC layers. - In: Silicon carbide and related materials 2003, (2004), S. 175-180

Kosiba, Rastislav; Liday, Jozef; Ecke, Gernot; Ambacher, Oliver; Breza, Juraj
Auger electron spectroscopy of silicon carbide. - In: Journal of electrical engineering, ISSN 1335-3632, Bd. 55 (2004), 9/10, S. 269-272

Pezoldt, Jörg; Zgheib, Charbel; Masri, Pierre; Averous, Michel; Morales, Francisco M.; Kosiba, Rastislav; Ecke, Gernot; Weih, Petia; Ambacher, Oliver
SIMS investigation of the influence of Ge pre-deposition on the interface quality between SiC and Si. - In: Surface and interface analysis, ISSN 0142-2421, Bd. 36 (2004), 8, S. 969-972

Bechstedt, Friedhelm; Furthmüller, Jürgen; Ferhat, M.; Teles, L. K.; Scolfaro, L. M. R.; Leite, J. R.; Davydov, Valery Yu.; Ambacher, Oliver; Goldhahn, Rüdiger
Energy gap and optical properties of In x Ga 1-x N. - In: Physica status solidi, ISSN 1862-6319, Bd. 195 (2003), 3, S. 628-633

http://dx.doi.org/10.1002/pssa.200306164
Morales, Francisco M.; Molina, Sergio I.; Araújo, Daniel; Cimalla, Volker; Pezoldt, Jörg; Barbadillo, L.; Hernández, M. J.; Piqueras, Javier
Transmission electron microscopy study of ultra-thin SiC layers obtained by rapid thermal carbonization of Si wafers. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 195 (2003), 1, S. 116-121

http://dx.doi.org/10.1002/pssa.200306278
Winzer, Andreas T.; Goldhahn, Rüdiger; Buchheim, Carsten; Ambacher, Oliver; Link, Angela; Stutzmann, Martin; Smorchkova, Y.; Mishra, Umesh K.; Speck, James S.
Photoreflectance studies of N- and Ga-face AlGaN/GaN heterostructures confining a polarisation induced 2DEG. - In: Physica status solidi, ISSN 1521-3951, Bd. 240 (2003), 2, S. 380-383

http://dx.doi.org/10.1002/pssb.200303351
Sensfuss, Steffi; Konkin, Alexander; Roth, Hans-Klaus; Ibrahim, Maher al-; Zhokhavets, Uladzimir; Gobsch, Gerhard; Krinichnyi, V. I.; Nazmutdinova, Gulnara A.; Klemm, Elisabeth
Optical and ESR studies on poly(3-alkylthiophene)/fullerene composites for solar cells. - In: Synthetic metals, Bd. 137 (2003), 1/3, S. 1433-1434

http://dx.doi.org/10.1016/S0379-6779(02)01167-0
Liebold, Ulrich
Verbundprojekt ZULES : Schlussbericht zum Teilvorhaben der TU Ilmenau ; Fachgebiet Festkörperelektronik ; Projektzeitraum: 01.01.2000 - 30.06.2003 ; Förderschwerpunkt "Mikrosystemtechnik 2000+" des Bundesministeriums für Bildung und Forschung. - Ilmenau. - 73 Bl.Förderkennzeichen BMBF 16 SV 1183/4. - Verbund-Nr. 01017713. - Engl. Zsfassung u.d.T.: ZULES - Final report subproject of Technische Universität Ilmenau. - Literaturverz. Bl. 73

https://edocs.tib.eu/files/e01fbdig09/595781071.pdf
Drakopoulos, M.; Zegenhagen, J.; Lee, T.-L.; Snigirev, A.; Snigireva, I.; Cimalla, Volker; Ambacher, Oliver
GaN polarity domains spatially resolved by x-ray standing wave microscopy. - In: Journal of physics, ISSN 1361-6463, Bd. 36 (2003), 10A, S. A214-A216

https://doi.org/10.1088/0022-3727/36/10A/344
Schwierz, Frank; Ambacher, Oliver
Recent advances in GaN HEMT development. - In: EDMO 2003, (2003), S. 204-209

Spieß, Lothar; Gubisch, Maik; Romanus, Henry; Breiter, Manuela; Müller, Ch.; Cimalla, Volker; Ecke, Gernot; Liu, Yonghe; Knedlik, Christian
Tungsten carbide layers for nanomeasuring systems. - In: Proceedings, (2003), S. 165-170

Bender, Marcus; Fortunato, Elvira; Nunes, Patricia; Ferreira, Isabel; Marques, António; Martins, Rodrigo; Katsarakis, Nikos; Cimalla, Volker; Kiriakidis, George
Highly sensitive ZnO ozone detectors at room temperature. - In: Japanese journal of applied physics, ISSN 1347-4065, Bd. 42.2003, Pt. 2, 4B, S. L435-L437

http://dx.doi.org/10.1143/JJAP.42.L435
Cros, Ana; Joshi, N. V.; Smith, T.; Cantarero, A.; Martínez-Criado, Gema; Ambacher, Oliver; Stutzmann, Martin
Optical study of gallium and nitrogen polarity layers of GaN grown on sapphire. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2003), 7, S. 2699-2702

http://dx.doi.org/10.1002/pssc.200303533
Aperathitis, Elias; Bender, Marcus; Cimalla, Volker; Ecke, Gernot; Modreanu, Mircea
Properties of rf-sputtered indiumtin-oxynitride thin films. - In: Journal of applied physics, ISSN 1089-7550, Bd. 94 (2003), 2, S. 1258-1266

https://doi.org/10.1063/1.1582368
Cengher, Dorin; Hatzopoulos, Z.; Gallis, S.; Deligeorgis, G.; Aperathitis, E.; Androulidaki, M.; Alexe, M.; Dragoi, V.; Kyriakis-Bitzaros, E. D.; Halkias, G.
Fabrication of GaAs laser diodes on Si using low-temperature bonding of MBE-grown GaAs wafers with Si wafers. - In: Journal of crystal growth, Bd. 251 (2003), 1/4, S. 754-759

http://dx.doi.org/10.1016/S0022-0248(02)02218-2
Katsarakis, Nikos; Bender, Marcus; Cimalla, Volker; Gagaoudakis, E.; Kiriakidis, George
Ozone sensing properties of DC-sputtered, c-axis oriented ZnO films at room temperature. - In: Sensors and actuators, ISSN 0925-4005, Bd. 96 (2003), 1/2, S. 76-81

http://dx.doi.org/10.1016/S0925-4005(03)00488-X
Joshi, N. V.; Medina, H.; Cantarero, Andres; Ambacher, Oliver
Mid gap photoluminescence from GaN:Mn, a magnetic semiconductor. - In: Journal of physics and chemistry of solids, Bd. 64 (2003), 9/10, S. 1685-1689

http://dx.doi.org/10.1016/S0022-3697(03)00070-2
Graf, T.; Gjukic, M.; Görgens, L.; Ambacher, Oliver; Brandt, M. S.; Stutzmann, Martin
Charge transfer at the Mn acceptor level in GaN. - In: Journal of superconductivity, ISSN 1572-9605, Bd. 16 (2003), 1, S. 83-86

http://dx.doi.org/10.1023/A:1023288718903
Dimakis, E.; Georgakilas, A.; Androulidaki, M.; Tsagaraki, K.; Kittler, Gabriel; Kalaitzakis, F.; Cengher, Dorin; Bellet-Amalric, E.; Jalabert, D.; Pelekanos, Nikos T.
Plasma-assisted MBE growth of quaternary InAlGaN quantum well heterostructures with room temperature luminescence. - In: Journal of crystal growth, Bd. 251 (2003), 1/4, S. 476-480

http://dx.doi.org/10.1016/S0022-0248(02)02275-3
Martínez-Criado, Gema; Cros, Ana; Cantarero, A.; Joshi, N. V.; Ambacher, Oliver; Stutzmann, Martin
Study of inversion domain pyramids formed during the GaN:Mg growth. - In: Solid state electronics, Bd. 47 (2003), 3, S. 565-568

http://dx.doi.org/10.1016/S0038-1101(02)00414-8
Kassamakova-Kolaklieva, L.; Kakanakov, Roumen; Cimalla, Volker; Hristeva, N.; Lepoeva, G.; Kuznetsov, N.; Zekentes, K.
Pd-based ohmic contacts to LPE 4H-SiC with improved thermal stability. - In: Silicon carbide and related materials 2002, (2003), S. 713-716

Cimalla, Volker; Förster, Christian; Kittler, Gabriel; Cimalla, Irina Nicoleta; Kosiba, Rastislav; Ecke, Gernot; Ambacher, Oliver; Goldhahn, Rüdiger; Žochovec, Svjatoslav; Georgakilas, A.; Lu, Hai; Schaff, William
Correlation between strain, optical and electrical properties of InN grown by MBE. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2003), 7, S. 2818-2821

http://dx.doi.org/10.1002/pssc.200303419
Miskys, Claudio R.; Kelly, Michael K.; Ambacher, Oliver; Stutzmann, Martin
Freestanding GaN-substrates and devices. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2003), 6, S. 1627-1650

http://dx.doi.org/10.1002/pssc.200303140
Ambacher, Oliver; Eickhoff, Martin; Link, Angela; Hermann, Martin; Stutzmann, Martin; Bernardini, F.; Fiorentini, V.; Smorchkova, Y.; Speck, James; Mishra, Umesh; Schaff, William; Tilak, V.; Eastman, Lester F.
Electronics and sensors based on pyroelectric AlGaN/GaN heterostructures, Part A: polarization and pyroelectronics. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2003), 6, S. 1878-1907

http://dx.doi.org/10.1002/pssc.200303138
Eickhoff, Martin; Schalwig, J.; Steinhoff, G.; Weidemann, Olaf; Görgens, L.; Neuberger, R.; Herrmann, M.; Baur, B.; Müller, G.; Ambacher, Oliver
Electronics and sensors based on pyroelectric AlGaN/GaN heterostructures, Part B: sensor applications. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2003), 6, S. 1908-1918

http://dx.doi.org/10.1002/pssc.200303139
Shokhovets, Sviatoslav; Goldhahn, Rüdiger; Gobsch, Gerhard; Ambacher, Oliver; Smorchkova, I. P.; Speck, James S.; Mishra, Umesh; Link, Angela; Hermann, Martin; Eickhoff, Martin
Electroreflectance and photoreflectance studies of electric fields in Pt/GaN Schottky diodes and AlGaN/GaN heterostructures. - In: GaN and related alloys - 2002, 2003, S. L3.57.1-L3.57.6, insges. 6 S.

Goldhahn, Rüdiger; Žochovec, Svjatoslav; Cimalla, Volker; Spieß, Lothar; Ecke, Gernot; Ambacher, Oliver; Furthmüller, Jürgen; Bechstedt, Friedhelm; Lu, Hai; Schaff, William J.
Dielectric function of "narrow" band gap InN. - In: GaN and related alloys - 2002, 2003, S. L5.9.1-L5.9.6, insges. 6 S.

Shokhovets, Sviatoslov; Fuhrmann, Daniel; Goldhahn, Rüdiger; Gobsch, Gerhard; Ambacher, Oliver; Hermann, Martin; Karrer, Uwe; Eickhoff, Martin
Exciton quenching in Pt/GaN Schottky diodes with Ga- and N-face polarity. - In: Applied physics letters, ISSN 1077-3118, Bd. 82 (2003), 11, S. 1712-1714

http://dx.doi.org/10.1063/1.1561160
Paasch, Gernot; Scheinert, Susanne; Scheinert, Susanne *1953-*; Doll, Theodor
Designing organic field effect transistors. - In: Proceedings and our portrait, (2003), insges. 3 S.

Erb, Tobias; Raleva, Sofiya; Zhokhavets, Uladzimir; Gobsch, Gerhard; Stühn, Bernd; Spode, Matthias; Ambacher, Oliver
Optical and structural anisotropy of conjugated polymer films. - In: Proceedings and our portrait, (2003), insges. 1 S.

Spode, M.; Zhokhavets, Uladzimir; Gobsch, Gerhard; Schliefke, Willi; Cimalla, Ilona; Ambacher, Oliver
Mischschichten aus Polymeren, Fullerenen und Sensibilisatoren für Solarzellen. - In: Proceedings and our portrait, (2003), insges. 3 S.

Ibrahim, Maher al-; Sensfuss, Steffi; Roth, Hans-Klaus; Zhokhavets, Uladzimir; Gobsch, Gerhard; Ayuk Mbi Egbe, Daniel; Klemm, Elisabeth; Knedlik, Christian
Optical and electrochemical measurements looking for new donor-acceptor pairs and their application in polymer solar cells. - In: Proceedings and our portrait, (2003), insges. 2 S.

Förster, Christian; Ambacher, Oliver; Pezoldt, Jörg
Etching of SiC with fluorine ECR plasma. - In: Proceedings and our portrait, (2003), insges. 2 S.

Weih, Petia; Kosiba, Rastislav; Gubisch, Maik; Freitag, Th.; Pezoldt, Jörg; Ambacher, Oliver
Molekularstrahlepitaxie von SiC:Ge Mischkristallen. - In: Proceedings and our portrait, (2003), insges. 2 S.

Pezoldt, Jörg;
Polytype transitions in wide band gap materials: bane or benefit. - In: Proceedings and our portrait, (2003), insges. 2 S.

Kosiba, Rastislav; Ecke, Gernot; Krischok, Stefan; Lebedev, Vadim; Ambacher, Oliver
AES Untersuchungen an Gruppe-III-Nitriden. - In: Proceedings and our portrait, (2003), insges. 2 S.

Cimalla, Volker; Förster, Christian; Cimalla, Irina; Kosiba, Rastislav; Ecke, Gernot; Schaff, William; Lu, Hai; Goldhahn, Rüdiger; Shokhovets, Sviatoslav; Georgakilas, Alexandros
InN - ein Halbleiter mit weitem oder niedrigem Bandabstand?. - In: Proceedings and our portrait, (2003), insges. 2 S.

Cimalla, Irina; Lebedev, Vadim; Cimalla, Volker; Ambacher, Oliver
Investigation of the absorption behavior of thin layers of group III-nitrides by PDS and SRP. - In: Proceedings and our portrait, (2003), insges. 2 S.

Winzer, Andreas T.; Goldhahn, Rüdiger; Buchheim, Carsten; Gobsch, Gerhard; Ambacher, Oliver; Link, Angela; Eickhoff, Martin; Stutzmann, Martin
Photoreflectance studies of Ga- and N-face AIGaN/GaN heterostructures confining a polarization induced 2DEG. - In: Proceedings and our portrait, (2003), insges. 2 S.

Ecke, Gernot; Schulz, Oliver; Kosiba, Rastislav; Hermann, Martin; Eickhoff, Martin; Ambacher, Oliver
AES-Tiefenprofilierung von Resonanztunneldioden aus AIGaN/AIN/GaN-Heterostrukturen. - In: Proceedings and our portrait, (2003), insges. 2 S.

Scheinert, Susanne; Schliefke, Willy
Analyzes of field effect devices based on poly(3-octylthiophene). - In: Synthetic metals, Bd. 139 (2003), 2, S. 501-509

http://dx.doi.org/10.1016/S0379-6779(03)00205-4
Nebel, Christoph E.; Miskys, Claudio R.; Garrido, Jose A.; Hermann, Martin; Ambacher, Oliver; Eickhoff, Martin; Stutzmann, Martin
AlN/Diamond np-junctions. - In: Diamond and related materials, ISSN 0925-9635, Bd. 12 (2003), 10/11, S. 1873-1876

http://dx.doi.org/10.1016/S0925-9635(03)00313-3
Cimalla, Volker; Pezoldt, Jörg; Ecke, Gernot; Kosiba, Rastislav; Ambacher, Oliver; Spieß, Lothar; Teichert, Gerd; Lu, Hai; Schaff, William J.
Growth of cubic InN on r-plane sapphire. - In: Applied physics letters, ISSN 1077-3118, Bd. 83 (2003), 17, S. 3468-3470

http://dx.doi.org/10.1063/1.1622985
Lu, Hai; Schaff, William J.; Eastman, Lester F.; Wu, J.; Walukiewicz, Wladek; Cimalla, Volker; Ambacher, Oliver
Growth of a-plane InN on r-plane sapphire with a GaN buffer by molecular-beam epitaxy. - In: Applied physics letters, ISSN 1077-3118, Bd. 83 (2003), 6, S. 1136-1138

http://dx.doi.org/10.1063/1.1599634
Trushin, Yuri V.; Safonov, K. L.; Ambacher, Oliver; Pezoldt, Jörg
The transition from 2D to 3D nanoclusters of silicon carbide on silicon. - In: Technical physics letters, ISSN 1090-6533, Bd. 29 (2003), 8, S. 663-665

http://dx.doi.org/10.1134/1.1606782
Jena, Debdeep; Heikman, Sten; Speck, James S.; Gossard, Arthur; Mishra, Umesh K.; Link, Angela; Ambacher, Oliver
Magnetotransport properties of a polarization-doped three-dimensional electron slab in graded AlGaN. - In: Physical review. Condensed matter and materials physics / American Physical Society. - College Park, Md. : APS, 1970-2015 , ISSN: 1550-235X , ZDB-ID: 1473011-X, ISSN 1550-235X, Bd. 67 (2003), 15, S. 153306, insges. 4 S.

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Graf, T.; Gjukic, M.; Hermann, Martin; Brandt, M. S.; Stutzmann, Martin; Ambacher, Oliver
Spin resonance investigations of Mn 2+ in wurtzite GaN and AlN films. - In: Physical review. Condensed matter and materials physics / American Physical Society. - College Park, Md. : APS, 1970-2015 , ISSN: 1550-235X , ZDB-ID: 1473011-X, ISSN 1550-235X, Bd. 67 (2003), 16, S. 165215, insges. 12 S.

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Weih, Petia; Cimalla, Volker; Förster, Christian; Pezoldt, Jörg; Stauden, Thomas; Spieß, Lothar; Romanus, Henry; Hermann, Martin; Eickhoff, Martin; Masri, Pierre; Ambacher, Oliver
High-resolution XRD investigations of the strain reduction in 3C-SiC thin films grown on Si (111) substrates. - In: Silicon carbide and related materials 2002, (2003), S. 433-436

Kosiba, Rastislav; Ecke, Gernot; Ambacher, Oliver; Menyhard, M.
Sputtering of SiC with low energy He and Ar ions under grazing incidence. - In: Radiation effects and defects in solids, ISSN 1029-4953, Bd. 158 (2003), 10, S. 721-730

http://dx.doi.org/10.1080/10420150310001599180
Morales, Francisco M.; Molina, Sergio I.; Araújo, Daniel; García, Rafael; Cimalla, Volker; Pezoldt, Jörg
SiC voids, mosaic microstructure and dislocations distribution in Si carbonized layers. - In: Diamond and related materials, ISSN 0925-9635, Bd. 12 (2003), 3/7, S. 1227-1230

http://dx.doi.org/10.1016/S0925-9635(02)00300-X
Kosiba, Rastislav; Ecke, Gernot; Liday, Jozef; Breza, Juraj; Ambacher, Oliver
Auger depth profiling and factor analysis of sputter induced altered layers in SiC. - In: Journal of electrical engineering, ISSN 1335-3632, Bd. 54 (2003), 1/2, S. 52-56

Zhokhavets, Uladzimir; Goldhahn, Rüdiger; Gobsch, Gerhard; Schliefke, Willy
Dielectric function and one-dimensional description of the absorption of poly(3-octylthiophene). - In: Synthetic metals, Bd. 138 (2003), 3, S. 491-495

http://dx.doi.org/10.1016/S0379-6779(02)00502-7
Kosiba, Rastislav; Ecke, Gernot; Liday, Jozef; Breza, Juraj; Ambacher, Oliver
Auger electron spectroscopy investigation of sputter induced altered layers in SiC by low energy sputter depth profiling and factor analysis. - In: Applied surface science, Bd. 220 (2003), 1/4, S. 304-312

http://dx.doi.org/10.1016/S0169-4332(03)00833-X
Rossow, Uwe; Fuhrmann, Daniel; Greve, M.; Winzer, Andreas T.; Goldhahn, Rüdiger; Ambacher, Oliver; Link, Angela; Stutzmann, Martin
Role of growth on the electronic performance of 2DEGs confined in AIGaN/GaN heterostructures. - In: Informations- und Elektrotechnik - Werkstoffe, Bauelemente, Systeme und Technologien für die Zukunft, (2003), S. 197-198

Miskys, Claudio R.; Garrido, J. A.; Nebel, Christoph E.; Hermann, Martin; Ambacher, Oliver; Eickhoff, Martin; Stutzmann, Martin
AlN/diamond heterojunction diodes. - In: Applied physics letters, ISSN 0003-6951, Bd. 82 (2003), 2, S. 290-292

Park, M.; Cuomo, J. J.; Rodriguez, B. J.; Yang, W.-C.; Nemanich, R. J.; Ambacher, Oliver
Micro-Raman study of electronic properties of inversion domains in GaN-based lateral polarity heterostructures. - In: Journal of applied physics, ISSN 0021-8979, Bd. 93 (2003), 12, S. 9542-9547

Yang, W.-C.; Rodriguez, B. J.; Park, M.; Nemanich, R. J.; Ambacher, Oliver; Cimalla, Volker
Photoelectron emission microscopy observation of inversion domain boundaries of GaN-based lateral polarity heterostructures. - In: Journal of applied physics, ISSN 0021-8979, Bd. 94 (2003), 9, S. 5720-5725

Graf, T.; Gjukic, M.; Hermann, Martin; Brandt, M. S.; Stutzmann, Martin; Görgens, L.; Philipp, J. B.; Ambacher, Oliver
Growth and characterization of GaN:Mn epitaxial films. - In: Journal of applied physics, ISSN 0021-8979, Bd. 93 (2003), 12, S. 9697-9702

Scharmann, Friedhelm; Attenberger, Wilfried; Lindner, Jörg K. N.; Pezoldt, Jörg
Critical island size of the SiC formation on Si(1 0 0) and Si(1 1 1). - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 89 (2002), 1/3, S. 201-204

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Kosiba, Rastislav; Ecke, Gernot; Kharlamov, Vladimir; Trushin, Yuri; Pezoldt, Jörg
The estimation of sputtering yields for SiC and Si. - In: Nuclear instruments & methods in physics research. Beam interactions with materials and atoms. - Amsterdam [u.a.] : Elsevier, 1984- , ZDB-ID: 1466524-4, Bd. 196 (2002), 1/2, S. 39-50

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Kosiba, Rastislav; Ecke, Gernot
MC simulations of depth profiling by low energy ions. - In: Nuclear instruments & methods in physics research. Beam interactions with materials and atoms. - Amsterdam [u.a.] : Elsevier, 1984- , ZDB-ID: 1466524-4, Bd. 187 (2002), 1, S. 36-47

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Lebedev, Vadim; Pezoldt, Jörg; Cimalla, Volker; Jinschek, J.; Morales Sánchez, Francisco Miguel; Ambacher, Oliver
Preperation of epitaxial templates for molecular beam epitaxy of III-nitrides on silicon substrates. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2002), 1, S. 183-187

http://dx.doi.org/10.1002/pssc.200390018
Martinez-Criado, Gema; Cros, Ana; Cantarero, A.; Karrer, Uwe; Ambacher, Oliver; Miskys, Claudio Ronald; Stutzmann, Martin
Two-dimensional electron gas effects on the photoluminescence from a nonintentionally doped AlGaN/GaN heterojunction. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2002), 1, S. 392-396

http://dx.doi.org/10.1002/pssc.200390070
Gleize, Jerome; Di Carlo, A.; Lugli, P.; Jancu, J. M.; Scholz, R.; Ambacher, Oliver; Gerthsen, D.; Hahn, E.
Tight-binding simulation of an InGaN/GaN quantum well with indium concentration fluctuation. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2002), 1, S. 298-301

http://dx.doi.org/10.1002/pssc.200390047
Masri, Pierre; Cimalla, Volker; Pezoldt, Jörg; Camassel, Jean; Gil, Bernard; Averous, Michel
Theoretical evaluation of the interface modification for aluminium nitride growth on Si. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2002), 1, S. 355-359

http://dx.doi.org/10.1002/pssc.200390062
Shokhovets, Sviatoslav; Fuhrmann, Daniel; Goldhahn, Rüdiger; Gobsch, Gerhard; Ambacher, Oliver; Hermann, Martin; Karrer, Uwe
Study of exciton dead layers in GaN Schottky diodes with N and Ga-face polarity. - In: Physica status solidi, ISSN 1862-6319, Bd. 194 (2002), 2, S. 480-484

http://dx.doi.org/10.1002/1521-396X(200212)194:2<480::AID-PSSA480>3.0.CO;2-J
Graf, T.; Gjukic, M.; Brandt, M. S.; Stutzmann, Martin; Ambacher, Oliver
The Mn3+/2+ acceptor level in group III nitrides. - In: Applied physics letters, ISSN 1077-3118, Bd. 81 (2002), 27, S. 5159-5161

http://dx.doi.org/10.1063/1.1530374
Schalwig, J.; Müller, G.; Karrer, Uwe; Eickhoff, Martin; Ambacher, Oliver; Stutzmann, Martin; Görgens, L.; Dollinger, G.
Hydrogen response mechanism of Pt-GaN Schottky diodes. - In: Applied physics letters, ISSN 0003-6951, Bd. 80 (2002), 7, S. 1222-1224

Fiorentini, Vincenzo; Bernardini, Fabio; Ambacher, Oliver
Evidence for nonlinear macroscopic polarization in III-V nitride alloy heterostructures. - In: Applied physics letters, ISSN 0003-6951, Bd. 80 (2002), 7, S. 1204-1206

Goldhahn, Rüdiger; Buchheim, Carsten; Žochovec, Svjatoslav; Gobsch, Gerhard; Ambacher, Oliver; Link, Angela; Hermann, Martin; Stutzmann, Martin; Smorchkova, Y.; Mishra, Umesh K.; Speck, James S.
Photoreflectance studies of AlGaN/GaN heterostructures containing a polarisation induced 2DEG. - In: Physica status solidi, ISSN 0370-1972, Bd. 234 (2002), 3, S. 713-716

Pezoldt, Jörg; Wöhner, Thomas; Stauden, Thomas; Schäfer, Jürgen A.; Masri, Pierre
The influence of Ge on the SiC nucleation on (111)Si surfaces. - In: Silicon carbide and related materials, (2001), S. 183-186

Scharmann, Friedhelm; Maslarski, P.; Lehmkuhl, Dirk; Stauden, Thomas; Pezoldt, Jörg
Evaluation of carbon surface diffusion on silicon by using surface phase transitions. - In: Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, 12 - 17 June 2000, St. Petersburg, Russia, (2001), S. 173-177

Pezoldt, Jörg; Stauden, Thomas; Förster, Christian; Masri, Pierre
Characterization of SiC grown on Ge modified silicon substrates. - In: Silicon carbide - materials, processing and devices, 2001, H5.7, insges. 6 S.

Masri, Pierre; Rouhani Laridjani, M.; Stauden, Thomas; Pezoldt, Jörg; Averous, Michel
Structural and elasticity-based properties of SiC-based interfaces: their relevance to the heteroepitaxy of III-V nitrides. - In: GaN and related alloys - 2000, 2001, G3.49, insges. 6 S.

Pezoldt, Jörg; Schröter, B.; Cimalla, Volker; Masri, Pierre
The influence of surface preparation on the properties of SiC on Si(111). - In: Physica status solidi, ISSN 1862-6319, Bd. 185 (2001), 1, S. 159-166

http://dx.doi.org/10.1002/1521-396X(200105)185:1<159::AID-PSSA159>3.0.CO;2-B
Masri, Pierre; Stauden, Thomas; Pezoldt, Jörg; Averous, Michel
Elasticity-based approach of interfaces: application to heteroepitaxy and hetero-systems. - In: Physica status solidi, ISSN 1862-6319, Bd. 187 (2001), 2, S. 439-469

http://dx.doi.org/10.1002/1521-396X(200110)187:2<439::AID-PSSA439>3.0.CO;2-6
Masri, Pierre; Rouhani Laridjani, M.; Pezoldt, Jörg; Yankov, Rossen A.; Skorupa, Wolfgang; Averous, Michel
(AlN)x(SiC)1-x buried layers implanted in 6HSiC: a theoretical study of their optimized composition. - In: Applied surface science, Bd. 184 (2001), 1/4, S. 383-386

http://dx.doi.org/10.1016/S0169-4332(01)00522-0
Koitzsch, Christian; Conrad, D.; Scheerschmidt, K.; Scharmann, Friedhelm; Maslarski, P.; Pezoldt, Jörg
Carbon-induced reconstructions on Si(111) investigated by RHEED and molecular dynamics. - In: Applied surface science, Bd. 179 (2001), 1/4, S. 49-54

http://dx.doi.org/10.1016/S0169-4332(01)00262-8
Pezoldt, Jörg; Förster, Christian; Weih, Petia; Masri, Pierre
Electrical characterization of SiC/Si heterostructures with Ge-modified interfaces. - In: Applied surface science, Bd. 184 (2001), 1/4, S. 79-83

http://dx.doi.org/10.1016/S0169-4332(01)00480-9
Rybin, Peter V.; Kulikov, Dmitri V.; Trushin, Yuri V.; Yankov, Rossen A.; Voelskow, Matthias; Scharmann, Friedhelm; Pezoldt, Jörg
Theoretical and experimental investigations of defect evolution in silicon carbide during N+ and Al+ ion implantation taking into account internal stress fields. - In: Nuclear instruments & methods in physics research. Beam interactions with materials and atoms. - Amsterdam [u.a.] : Elsevier, 1984- , ZDB-ID: 1466524-4, Bd. 178 (2001), 1/4, S. 269-274

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Mikroulis, S.; Cimalla, Volker; Kostopoulos, A.; Constandinidis, G.; Drakakis, G.; Zervos, M.; Cengher, M.; Georgakilas, A.
Investigation of the nitridation of Al2O3 (0001) substrates by a nitrogen radio frequency plasma source. - In: Microelectronics, microsystems and nanotechnology, (2001), S. 135-138

Pezoldt, Jörg; Schröter, B.; Cimalla, Volker; Stauden, Thomas; Goldhahn, Rüdiger; Romanus, Henry; Spieß, Lothar
Carbonization induced change of the polarity for MBE grown 3C-SiC/Si(111). - In: Silicon carbide and related materials, (2001), S. 179-182

Pieterwas, Ralf; Kosiba, Rastislav; Ecke, Gernot; Pezoldt, Jörg; Rößler, Hans
Auger depth profiling of thin SiC layers: practical aspects for a better understanding of quantitative analysis. - In: Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (2000), S. 281-287

Pezoldt, Jörg; Teichert, Gerd; Panknin, Dieter; Voelskow, Matthias
Photothermal measurements of Al+- and Al+/N+- implanted 6H-SiC. - In: Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (2000), S. 276-280
Im Titel ist "+" hochgestellt

Wöhner, Thomas; Cimalla, Volker; Stauden, Thomas; Schäfer, Jürgen A.; Pezoldt, Jörg
Real time spectroscopic ellipsometry monitoring of the SiC growth during the interaction process of elemental carbon with Si surfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 364 (2000), 1/2, S. 28-32

https://doi.org/10.1016/S0040-6090(99)00918-9
Scharmann, Friedrich; Maslarski, P.; Attenberger, Wilfried; Lindner, Jörg K. N.; Stritzker, Bernd; Stauden, Thomas; Pezoldt, Jörg
Investigation of the nucleation and growth of SiC nanostructures on Si. - In: Thin solid films, ISSN 1879-2731, Bd. 380 (2000), 1/2, S. 92-96

https://doi.org/10.1016/S0040-6090(00)01476-0
Pieterwas, Ralf; Ecke, Gernot; Kosiba, Rastislav; Rößler, Hans
A new method of the determination of significant factors with factor analysis in AES. - In: Fresenius' journal of analytical chemistry, ISSN 1432-1130, Bd. 368 (2000), 4, S. 326-334

http://dx.doi.org/10.1007/s002160000450
Masri, Pierre; Rouhani Laridjani, M.; Wöhner, Thomas; Pezoldt, Jörg; Averous, Michel
Optimization of 3C-SiC/Si heterointerfaces in epitaxial growth. - In: Computational materials science, Bd. 17 (2000), 2/4, S. 544-550

http://dx.doi.org/10.1016/S0927-0256(00)00085-9
Pezoldt, Jörg; Rybin, Peter V.; Kulikov, Dmitri V.; Trushin, Yuri V.; Yankov, Rossen A.; Voelskow, Matthias; Kreissig, Ulrich
The influence of the implantation sequence on the (SiC) 1-x (AlN) x formation. - In: Nuclear instruments & methods in physics research. Beam interactions with materials and atoms. - Amsterdam [u.a.] : Elsevier, 1984- , ZDB-ID: 1466524-4, Bd. 166/167 (2000), S. 758-763

http://dx.doi.org/10.1016/S0168-583X(99)01059-9
Romanus, Henry; Cimalla, Volker; Schäfer, Jürgen A.; Spieß, Lothar; Ecke, Gernot; Pezoldt, Jörg
Preparation of single phase tungsten carbide by annealing of sputtered tungsten-carbon layers. - In: Thin solid films, ISSN 1879-2731, Bd. 359 (2000), 2, S. 146-149

http://dx.doi.org/10.1016/S0040-6090(99)00732-4
As, Donat J.; Frey, T.; Schikora, D.; Lischka, Klaus; Cimalla, Volker; Pezoldt, Jörg; Goldhahn, Rüdiger; Kaiser, S.; Gebhardt, W.
Cubic GaN epilayers grown by molecular beam epitaxy on thin beta-SiC/Si (001) substrates. - In: Applied physics letters, ISSN 1077-3118, Bd. 76 (2000), 13, S. 1686-1688

http://dx.doi.org/10.1063/1.126136
Pezoldt, Jörg; Yankov, Rossen A.; Werninghaus, Thomas; Zahn, Dietrich R. T.; Fukarek, Wolfgang; Teichert, Gerd; Lübbe, Martin; Skorupa, Wolfgang
Structural and compositional characterization of 6H-SiC implanted with N+ and Al+ ions using optical methods. - In: Diamond and related materials, ISSN 0925-9635, Bd. 8 (1999), 2/5, S. 346-351
Im Titel ist "+" hochgestellt

https://doi.org/10.1016/S0925-9635(98)00307-0
Ecke, Gernot; Kosiba, Rastislav; Pezoldt, Jörg; Rößler, Hans
The influence of ion beam sputtering on the composition of the near-surface region of silicon carbide layers. - In: Fresenius' journal of analytical chemistry, ISSN 1432-1130, Bd. 365 (1999), 1, S. 195-198

http://dx.doi.org/10.1007/s002160051471
Teichert, Gerd; Schleicher, Larissa; Knedlik, Christian; Voelskov, Matthias; Skorupa, Wolfgang; Yankov, Rossen A.; Pezoldt, Jörg
Thermal wave analysis: a tool for non-invasive testing in ion beam synthesis of wide bandgap materials. - In: Microstructural processes in irradiated materials, (1999), S. 103-108

Attenberger, Wilfried; Lindner, Jörg; Cimalla, Volker; Pezoldt, Jörg
Structural and morphological investigations of the initial stages in solid source molecular beam epitaxy of SiC on (111)Si. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 61/62 (1999), S. 544-548

http://dx.doi.org/10.1016/S0921-5107(98)00470-X
Cimalla, Volker; Stauden, Thomas; Eichhorn, Gerd; Pezoldt, Jörg
Influence of the heating ramp on the heteroepitaxial growth of SiC on Si. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 61/62 (1999), S. 553-558

http://dx.doi.org/10.1016/S0921-5107(98)00472-3
Rybin, Peter V.; Kulikov, Dmitri V.; Trushin, Yuri V.; Yankov, Rossen A.; Ecke, Gernot; Fukarek, Wolfgang; Skorupa, Wolfgang; Pezoldt, Jörg
Modelling high-temperature co-implantation of N + and Al + ions in silicon carbide: the effect of stress on the implant and damage distributions. - In: Nuclear instruments & methods in physics research. Beam interactions with materials and atoms. - Amsterdam [u.a.] : Elsevier, 1984- , ZDB-ID: 1466524-4, Bd. 147 (1999), 1/4, S. 279-285

http://dx.doi.org/10.1016/S0168-583X(98)00608-9
Pezoldt, Jörg; Yankov, Rossen A.; Mücklich, Arndt; Fukarek, Wolfgang; Voelskow, Matthias; Reuther, Helfried; Skorupa, Wolfgang
A novel (SiC) 1-x (AlN) x compound synthesized using ion beams. - In: Nuclear instruments & methods in physics research. Beam interactions with materials and atoms. - Amsterdam [u.a.] : Elsevier, 1984- , ZDB-ID: 1466524-4, Bd. 147 (1999), 1/4, S. 273-278

http://dx.doi.org/10.1016/S0168-583X(98)00573-4
Wöhner, Thomas; Stauden, Thomas; Cimalla, Volker; Eichhorn, Gerd; Schäfer, Jürgen A.; Pezoldt, Jörg
In situ spectroscopic ellipsometry studies of the interaction process of ethene with Si surfaces during SiC formation. - In: In situ process diagnostics and modelling, (1999), S. 95-100

Masari, Pierre; Moreaud, N.; Averous, Michel; Stauden, Thomas; Wöhner, Thomas; Pezoldt, Jörg
On the role of foreign atoms in the optimization of 3C-SiC/Si heterointerfaces. - In: Wide-bandgap semiconductors for high-power, high-frequency and high-temperature applications - 1999, (1999), S. 213-218

Romanus, Henry; Cimalla, Volker; Ahmed, Syed Imad-Uddin; Schäfer, Jürgen A.; Ecke, Gernot; Avci, R.; Spieß, Lothar
Preparation of conductive tungsten carbide layers for SiC high temperature applications. - In: Wide-bandgap semiconductors for high-power, high-frequency and high-temperature applications - 1999, (1999), S. 99-104

Scheiner, Jörg; Goldhahn, Rüdiger; Cimalla, Volker; Ecke, Gernot; Attenberger, Wilfried; Lindner, Jörg K. M.; Gobsch, Gerhard; Pezoldt, Jörg
Spectroscopic ellipsometry studies of heteroepitaxially grown cubic silicon carbide layers on silicon. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 61/62 (1999), S. 526-530

http://dx.doi.org/10.1016/S0921-5107(98)00466-8
Truschin, Yuri V.; Yankov, Rossen, A.; Kharlamov, Vladimir S.; Kulikov, Dmitri V.; Tsigankov, D. N.; Kreissig, Ulrich; Voelskow, Matthias; Pezoldt, Jörg; Skorupa, Wolfgang
A computational model for the formation of (SiC)1-x(AlN)x structures by hot, high-dose N+ and Al+ co-implants in 6H-SiC. - In: Silicon carbide, III-nitrides and related materials, (1998), S. 757-760
Im Titel sind "1-x" und "x" tiefgestellt, "+" hochgestellt

Yankov, Rossen, A.; Fukarek, Wolfgang; Voelskow, Matthias; Pezoldt, Jörg; Skorupa, Wolfgang
Ion beam synthesis: a novel method of producing (SiC)1-x(AlN)x layers. - In: Silicon carbide, III-nitrides and related materials, (1998), S. 753-756
Im Titel sind "1-x" und "x" tiefgestellt

Werninghaus, Thomas; Zahn, Dietrich R. T.; Yankov, Rossen A.; Mücklich, Arndt; Pezoldt, Jörg
Cross-sectional micro-Raman spectroscopy: a tool for structural investigations of thin polytypic SiC layers. - In: Silicon carbide, III-nitrides and related materials, (1998), S. 661-664

Pezoldt, Jörg; Yankov, Rossen A.; Voelskow, Matthias; Brauer, Gerhard; Anwand, W.; Heera, Viton; Skorupa, Wolfgang; Coleman, P. G.
Studies of buried (SiC)​1-​x(AlN)​x layers formed by co-​implantation of N+ and Al+ ions into 6H-​SiC. - In: Defect recognition and image processing in semiconductors 1997, (1998), S. 335-338
Im Titel ist "1-x" und "x" tiefgestellt, "+" hochgestellt

Cimalla, Volker; Stauden, Thomas; Ecke, Gernot; Scharmann, Friedhelm; Eichhorn, Gerd; Pezoldt, Jörg; Sloboshanin, Sergej; Schäfer, Jürgen A.
Initial stages in the carbonization of (111)Si by solid-source molecular beam epitaxy. - In: Applied physics letters, ISSN 1077-3118, Bd. 73 (1998), 24, S. 3542-3544

http://dx.doi.org/10.1063/1.122801
Ecke, Gernot; Rößler, Hans; Cimalla, Volker; Pezoldt, Jörg; Stauden, Thomas
Auger investigations of thin SiC films. - In: Fresenius' journal of analytical chemistry, ISSN 1432-1130, Bd. 361 (1998), 6, S. 564-568

http://dx.doi.org/ 10.1007/s002160050949
Rainova, Yu. P.; Antonenko, K. I.; Pezoldt, Jörg; Schenk, André
On the entrance effects and the influence of buoyancy forces on the fluid flow in RTP reactors. - In: Rapid thermal and integrated processing VII, (1998), S. 39-44

Kulikov, Dmitri V.; Trushin, Yuri V.; Yankov, Rossen A.; Pezoldt, Jörg; Skorupa, Wolfgang
Theoretical description of high-temperature implantation of silicon carbide with N+ and Al+ ions. - In: Technical physics letters, ISSN 1090-6533, Bd. 24 (1998), 1, S. 17-19

http://dx.doi.org/10.1134/1.1261975
Pezoldt, Jörg; Stauden, Thomas; Cimalla, Volker; Ecke, Gernot; Romanus, Henry; Eichhorn, Gerd
Growth of SiC layers on (111) Si by solid source molecular beam epitaxy. - In: Silicon carbide, III-nitrides and related materials, (1998), S. 251-254

Ecke, Gernot; Eichhorn, Gerd; Pezoldt, Jörg; Reinhold, C.; Stauden, Thomas; Supplieth, Frank
Deposition of aluminium nitride films by electron cyclotron resonance plasma-enhanced chemical vapour deposition. - In: Surface and coatings technology, ISSN 1879-3347, Bd. 98 (1998), 1/3, S. 1503-1509

https://doi.org/10.1016/S0257-8972(97)00282-X
Wöhner, Thomas; Ecke, Gernot; Rößler, Hans; Hofmann, Siegfried
Sputtering-induced surface roughness of polycrystalline Al films and its influence on AES depth profiles. - In: Surface and interface analysis, ISSN 1096-9918, Bd. 26 (1998), 1, S. 1-8

http://dx.doi.org/10.1002/(SICI)1096-9918(199801)26:1<1::AID-SIA334>3.0.CO;2-Y
Cimalla, Volker; Samlenski, R.; Wöhner, Thomas; Schäfer, Jürgen A.
Kohlenstoffnitrid-Synthese durch Nitridierung von Graphitschichten. - In: 43. Internationales Wissenschaftliches Kolloquium, (1998), insges. 6 S.

Cimalla, Volker; Eichhorn, Gerd; Nakov, Valentin; Pezoldt, Jörg
Der Einfluß der Aufheizgeschwindigkeit auf die Keimbildung von SiC auf Silizium. - In: 43. Internationales Wissenschaftliches Kolloquium, (1998), insges. 6 S.

Scharmann, Friedhelm; Pezoldt, Jörg; Cimalla, Volker; Stauden, Thomas; Eichhorn, Gerd
Kohlenstoff induzierte Rekonstruktionen auf Si-Oberflächen. - In: 43. Internationales Wissenschaftliches Kolloquium, (1998), insges. 6 S.

Wöhner, Thomas; Ecke, Gernot; Rößler, Hans
Ionenstrahl-induzierte Oberflächenrauhigkeit auf Metallisierungsschichten und deren Einfluß auf AES-Tiefenprofile. - In: 43. Internationales Wissenschaftliches Kolloquium, (1998), insges. 5 S.

Scharmann, Friedhelm; Teichert, Gerd; Eichhorn, Gerd; Pezoldt, Jörg
Polytypanalyse von Epitaxieschichten mit RHEED. - In: 43. Internationales Wissenschaftliches Kolloquium, (1998), insges. 6 S.

Liday, Jozef; Ecke, Gernot; Kosiba, Ratislav; Vogrinčič, Peter; Breza, Juraj
Depth profiles of multilayer structures: measured by AES and simulated. - In: 43. Internationales Wissenschaftliches Kolloquium, (1998), insges. 5 S.

Teichert, Gerd; Schleicher, Larissa; Spieß, Lothar; Yankov, Rossen A.; Knedlik, Christian; Pezoldt, Jörg
Thermowellenanalyse an implantiertem SiC. - In: 43. Internationales Wissenschaftliches Kolloquium, (1998), insges. 8 S.

Spieß, Lothar; Romanus, Henry; Teichert, Gerd; Pezoldt, Jörg
Werkstoffanalytische Probleme bei der Charakterisierung von Siliziumkarbid für Mikrotechnikanwendungen. - In: 43. Internationales Wissenschaftliches Kolloquium, (1998), insges. 6 S.

Attenberger, Wilfried; Lindner, Jörg; Stritzker, Bernd; Cimalla, Volker; Stauden, Thomas; Ecke, Gernot; Eichhorn, Gerd; Pezoldt, Jörg
Ein Wachstumsmodell für die Karbonisierung von Siliziumsubstraten unter SSMBE-Bedingungen. - In: 43. Internationales Wissenschaftliches Kolloquium, (1998), insges. 8 S.

Schenk, Andre; Rainova, Yu. P.; Pezoldt, Jörg
Simulation von Strömungsprozessen in einem RTP-Reaktor. - In: 43. Internationales Wissenschaftliches Kolloquium, (1998), insges. 8 S.

Cimalla, Volker; Scheiner, Jörg; Ecke, Gernot; Friedrich, M.; Goldhahn, Rüdiger; Zahn, Dietrich R. T.; Pezoldt, Jörg
The measurement of the thickness of thin SiC layers on silicon. - In: Silicon carbide, III-nitrides and related materials, (1998), S. 641-644

Shokhovets, Sviatoslav; Goldhahn, Rüdiger; Cimalla, Volker; Cheng, T. S.; Foxon, C. Thomas
Analysis of reflectivity measurements for GaN films grown on GaAs: influence of surface roughness and interface layers. - In: Silicon carbide, III-nitrides and related materials, (1998), S. 1347-1350

Werninghaus, Thomas; Friedrich, M.; Cimalla, Volker; Scheiner, Jörg; Goldhahn, Rüdiger; Zahn, Dietrich R. T.; Pezoldt, Jörg
Optical characterization of MBE grown cubic and hexagonal SiC films on Si(111)1. - In: Diamond and related materials, ISSN 0925-9635, Bd. 7 (1998), 9, S. 1385-1389

http://dx.doi.org/10.1016/S0925-9635(98)00224-6
Žochovec, Svjatoslav; Goldhahn, Rüdiger; Cimalla, Volker; Cheng, T. S.; Foxon, Tom
Reflectivity study of hexagonal GaN films grown on GaAs: surface roughness, interface layer, and refractive index. - In: Journal of applied physics, ISSN 1089-7550, Bd. 84 (1998), 3, S. 1561-1566

https://doi.org/10.1063/1.368223
Cimalla, Volker;
Karbonisieren von Siliziumsubstraten. - Aachen : Shaker, 1998. - IV, 166 S.. - (Berichte aus der Physik) Zugl.: Ilmenau : Techn. Univ., Diss., 1998
ISBN 3826544889
Literaturverz. S. 123 - 136

Rainova, Yu. P.; Antonenko, K. I.; Pezoldt, Jörg; Schenk, André; Eichhorn, Gerd
Holographic interferometry of temperature distribution in a RTP reactor. - In: Chemical vapor deposition, (1997), S. 717-724

Pezoldt, Jörg; Cimalla, Volker; Stauden, Thomas; Ecke, Gernot; Eichhorn, Gerd; Scharmann, Friedhelm; Schipanski, Dagmar
Chemical conversion of Si to SiC by solid source MBE and RTCVD. - In: Diamond and related materials, ISSN 0925-9635, Bd. 6 (1997), 10, S. 1311-1315

https://doi.org/10.1016/S0925-9635(97)00087-3
Ecke, Gernot; Rößler, Hans; Cimalla, Volker; Liday, Jozef
AES depth profiles of thin SiC-layers - simulation of ion beam induced mixing. - In: Fresenius' journal of analytical chemistry, ISSN 1432-1130, Bd. 358 (1997), 1, S. 355-357

http://dx.doi.org/10.1007/s002160050428
Cimalla, Volker; Pezoldt, Jörg; Eichhorn, Gerd
A growth model for the carbonization of silicon surfaces. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 46 (1997), 1/3, S. 199-202

http://dx.doi.org/10.1016/S0921-5107(96)01964-2
Ecke, Gernot; Rößler, Hans; Cimalla, Volker; Pezoldt, Jörg
Interpretation of auger depth profiles of thin SiC layers on Si. - In: Microchimica acta, ISSN 1436-5073, Bd. 125 (1997), 1/4, S. 219-222

https://doi.org/10.1007/BF01246186
Yankov, Rossen A.; Voelskow, Matthias; Kreissig, W.; Kulikov, Dmitri V.; Pezoldt, Jörg; Skorupa, Wolfgang; Trushin, Yuri V.; Kharlamov, Vladimir S.; Tsigankov, D. N.
High-temperature high-dose implantation of N + and Al + ions in 6H-SiC. - In: Technical physics letters, ISSN 1090-6533, Bd. 23 (1997), 8, S. 617-620

http://dx.doi.org/10.1134/1.1261883
Yankov, Rossen A.; Hatzopoulos, N.; Fukarek, Wolfgang; Voelskow, Matthias; Heera, Viton; Pezoldt, Jörg; Skorupa, Wolfgang
Formation of buried layers of (SiC)1-x(AlN)x in 6H-SiC using ion-beam synthesis. - In: Materials modification and synthesis by ion beam processing, (1997), S. 271-276

Ecke, Gernot; Rößler, Hans; Wöhner, Thomas; Cimalla, Volker; Scheiner, Jörg; Hofmann, Siegfried
Simulation of Auger depth profiles of thin SiC - layers with respect to atomic mixing, auger electron escape depth and surface roughness. - In: ECASIA 97, (1997), S. 423-426

Wöhner, Thomas; Ecke, Gernot; Rößler, Hans; Hofmann, Siegfried
The influence of surface roughness and sample tilt angle on AES itensity. - In: ECASIA 97, (1997), S. 419-422

Romanus, Henry; Cimalla, Volker; Kromka, Alexander; Scheiner, Jörg; Spieß, Lothar; Pezoldt, Jörg
Atomic force microscopy investigations of rapid thermal carbonized silicon. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 47 (1997), 3, S. 274-278

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Spieß, Lothar; Nennewitz, Olaf; Weishart, H.; Lindner, Jörg; Skorupa, Wolfgang; Romanus, Henry; Erler, Frank; Pezoldt, Jörg
Aluminium implantation of p-SiC for ohmic contacts. - In: Diamond and related materials, ISSN 0925-9635, Bd. 6 (1997), 10, S. 1414-1419

http://dx.doi.org/10.1016/S0925-9635(97)00047-2
Bendler, Michael; Moldenhauer, Frank; Cimalla, Volker; Pezoldt, Jörg
Regelung eines RTP-Reaktors mit Gain-Scheduling. - In: [Vortragsreihen, (1997), S. 697-704

Spieß, Lothar; Nennewitz, Olaf; Pezoldt, Jörg
Improved ohmic contacts to p-type 6H-SiC. - In: Silicon carbide and related materials 1995, (1996), S. 585-588

Heera, Viton; Pezoldt, Jörg; Ning, X. J.; Pirouz, Pirouz
High dose co-implantation of aluminium and nitrogen in 6H-silicon carbide. - In: Silicon carbide and related materials 1995, (1996), S. 509-512

Baumann, Uwe; Pezoldt, Jörg; Cimalla, Volker; Nennewitz, Olaf; Schwierz, Frank; Schipanski, Dagmar
Electrical characterization of SiC/Si-heterostructures formed by rapid thermal carbonization of Si. - In: Silicon carbide and related materials 1995, (1996), S. 149-152

Cimalla, Volker; Pezoldt, Jörg; Ecke, Gernot; Eichhorn, Gerd
The buffer layer in RTCVD of SiC. - In: Silicon carbide and related materials 1995, (1996), S. 153-156

Stauden, Thomas; Eichhorn, Gerd; Cimalla, Volker; Pezoldt, Jörg; Ecke, Gernot
The deposition of aluminum nitride on silicon by plasma-enhanced metal-organic chemical vapour deposition. - In: Diamond and related materials, ISSN 0925-9635, Bd. 5 (1996), 10, S. 1210-1213

https://doi.org/10.1016/0925-9635(96)00512-2
Zahn, Dietrich R. T.; Werninghaus, Thomas; Thümer, M.; Pezoldt, Jörg; Heera, Viton
Raman spectroscopy investigation of (SiC) 1-x (Ain) x layers formed by ion implantation in 6H-SiC. - In: III-Nitride, SiC and diamond materials for electronic devices, (1996), S. 729-734

Rainova, Yu. P.; Pezoldt, Jörg; Antonenko, K. I.; Eichhorn, Gerd
Application of holographic interferometry to flow pattern visualization in an RTCVD reactor. - In: Rapid thermal and integrated processing V, (1996), S. 65-70

Fabricius, Alexander; Nennewitz, Olaf; Spieß, Lothar; Cimalla, Volker; Pezoldt, Jörg
Rapid thermal annealing of tungsten silicide films. - In: Silicide thin films, (1996), S. 625-630

Teichert, Gerd; Pezoldt, Jörg; Cimalla, Volker; Nennewitz, Olaf; Spieß, Lothar
Analysis of reflection high energy electron diffraction pattern of silicon carbide grown on silicon. - In: Evolution of epitaxial structure and morphology, (1996), S. 17-22

Zöllner, Jens-Peter; Eichhorn, Gerd; Cimalla, Volker; Bozmarov, J.; Zaumseil, Peter; Kürschner, Hartmut
Slip generation during rapid thermal processing. - In: Physica status solidi, ISSN 1862-6319, Bd. 156 (1996), 1, S. 63-70

http://dx.doi.org/10.1002/pssa.2211560109
Wöhner, Thomas; Ecke, Gernot; Rößler, Hans; Hofmann, Siegfried
A model of sputtering induced roughness of polycrystalline metallic films. - In: ECASIA 95, (1996), S. 587-590

Cimalla, Volker; Pezoldt, Jörg; Ecke, Gernot; Rößler, Hans; Eichhorn, Gerd
Characterization of buffer layers for SiC CVD. - In: Proceedings of the Tenth European Conference on Chemical Vapour Deposition, (1995), S. 863-870

Cimalla, Volker;
Structural evolution of rapid thermal carbonized Si surfaces. - In: Evolution of thin film and surface structure and morphology, (1995), S. 33-38

Pezoldt, Jörg; Stottko, B.; Kupris, Gerald; Ecke, Gernot
Sputtering effects in hexagonal silicon carbide. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 29 (1995), 1/3, S. 94-98

http://dx.doi.org/10.1016/0921-5107(94)04005-O
Pezoldt, Jörg;
Are polytype transitions possible during boron diffusion?. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 29 (1995), 1/3, S. 99-104

http://dx.doi.org/10.1016/0921-5107(94)04006-P
Cimalla, Volker; Karagodina, K. V.; Pezoldt, Jörg; Eichhorn, Gerd
Growth of thin [beta]-SiC layers by carbonization of Si surfaces by rapid thermal processing. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 29 (1995), 1/3, S. 170-175

http://dx.doi.org/10.1016/0921-5107(94)04047-8
Zöllner, Jens-Peter; Cimalla, Volker; Pezoldt, Jörg
RTP - temperature monitoring by means of oxidation. - In: Journal of non-crystalline solids, ISSN 0022-3093, Bd. 187 (1995), S. 23-28

http://dx.doi.org/10.1016/0022-3093(95)00111-5
Kupris, Gerald; Rößler, Hans; Ecke, Gernot; Hofmann, Siegfried
Interpretation of sputter depth profiles by mixing simulations. - In: Fresenius' journal of analytical chemistry, ISSN 1432-1130, Bd. 353 (1995), 3/4, S. 307-310

http://dx.doi.org/10.1007/BF00322057
Wöhner, Thomas; Ecke, Gernot; Rößler, Hans; Hofmann, Siegfried
Simulation of sputter-induced roughness for depth profiling of thin film structures. - In: Fresenius' journal of analytical chemistry, ISSN 1432-1130, Bd. 353 (1995), 3/4, S. 447-449

http://dx.doi.org/10.1007/BF00322086
Stauden, Thomas; Eichhorn, Gerd; Cimalla, Volker; Pezoldt, Jörg; Ecke, Gernot; Nennewitz, Olaf
ECR-Abscheidung von AlN auf Si. - In: Vortragsreihen, (1995), S. 756-759

Zöllner, Jens-Peter; Eichhorn, Gerd; Stauden, Thomas; Cimalla, Volker; Schliefke, Willy
Zu Problemen der Temperaturmessung beim RTP. - In: Vortragsreihen, (1995), S. 750-755

Cimalla, Volker; Pezoldt, Jörg; Eichhorn, Gerd
Einfluß von Pufferschichten auf die Struktur und Morphologie von SiC-Epitaxieschichten auf Si. - In: Vortragsreihen, (1995), S. 742-749

Fabricius, Alexander; Nennewitz, Olaf; Spieß, Lothar; Cimalla, Volker; Pezoldt, Jörg
Herstellung von WSi 2 und TiSi 2 durch Co-Sputtern und RTA. - In: Vortragsreihen, (1995), S. 724-729

Kalnin, Andrei A.; Neubert, Frank; Pezoldt, Jörg
Polytype patterning in epitaxial layers on the basis of non-equilibrium phase transitions. - In: Diamond and related materials, ISSN 0925-9635, Bd. 3 (1994), 4/6, S. 346-352

https://doi.org/10.1016/0925-9635(94)90184-8
Kretzer, Olaf; Lenk, Gerald; Wesch, Werner; Gunst, Ullrich
SIMS-characterization of ultra shallow boron-profiles after BF2+- and B+-low-energy-implantation in silicon. - In: Fresenius' journal of analytical chemistry, ISSN 1432-1130, Bd. 349 (1994), 1, S. 184-186
Im Titel ist "2" tiefgestellt, "+" hochgestellt

http://dx.doi.org/10.1007/BF00323265
Nennewitz, Olaf; Schmidt, H.; Pezoldt, Jörg; Stauden, Thomas; Schawohl, Jens; Spieß, Lothar
X-ray diffraction analysis of RTP-annealed thin ZnO films. - In: Thin films, (1994), S. 666-669

Nennewitz, Olaf; Schmidt, H.; Pezoldt, Jörg; Stauden, Thomas; Schawohl, Jens; Spieß, Lothar
Rapid thermal annealing of thin ZnO films. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 145 (1994), 2, S. 283-288

http://dx.doi.org/10.1002/pssa.2211450208
Zöllner, Jens-Peter; Patzschke, Ingo; Pietzuch, V.; Pezoldt, Jörg; Leitz, Gunnar
Mathematical modelling of the dynamic behaviour in RTP. - In: Microelectronic engineering, Bd. 25 (1994), 2/4, S. 359-364

http://dx.doi.org/10.1016/0167-9317(94)90037-X
Zöllner, Jens-Peter; Patzschke, Ingo; Pietzuch, V.; Pezoldt, Jörg; Eichhorn, Gerd
To the influence of the wafer edge in RTP. - In: Rapid thermal and integrated processing II, (1993), S. 177-182

Leitz, Gunnar; Pezoldt, Jörg; Patzschke, Ingo; Zöllner, Jens-Peter; Eichhorn, Gerd
Investigation of dynamical temperature behaviour in RTP. - In: Rapid thermal and integrated processing II, (1993), S. 171-176

Zöllner, Jens-Peter; Ullrich, Klaus; Pezoldt, Jörg; Eichhorn, Gerd
New lamp arrangement for rapid thermal processing. - In: Applied surface science, Bd. 69 (1993), 1/4, S. 193-197

http://dx.doi.org/10.1016/0169-4332(93)90503-4
Pezoldt, Jörg; Kalnin, Andrei A.; Moskwina, D. R.; Savelyev, W. D.
Polytype transitions in ion implanted silicon carbide. - In: Nuclear instruments & methods in physics research. Beam interactions with materials and atoms. - Amsterdam [u.a.] : Elsevier, 1984- , ZDB-ID: 1466524-4, Bd. 80/81 (1993), 2, S. 943-948

http://dx.doi.org/10.1016/0168-583X(93)90714-H
Pezoldt, Jörg; Kalnin, Andrei A.; Savelyev, W. D.
Application of nonequilibrium phase transition to heteropolytype structure creation. - In: Nuclear instruments & methods in physics research. Beam interactions with materials and atoms. - Amsterdam [u.a.] : Elsevier, 1984- , ZDB-ID: 1466524-4, Bd. 65 (1992), 1/4, S. 361-365

http://dx.doi.org/10.1016/0168-583X(92)95067-2
Festic, Vladimir; Kocanda, Jozef; Vesely, Marian; Gunst, Ullrich; Müller, Bernhard
Gating technique on SIMS depth profiling - dynamic range of Ga implanted Si. - In: Vortragsreihen Mikroelektronik und Schaltungstechnik, Kommunikations- und Meßtechnik, (1992), S. 485-490

Ullrich, Klaus; Zöllner, Jens-Peter; Pezoldt, Jörg; Eichhorn, Gerd; Patzschke, Ingo
Berechnung der Temperaturverteilung auf dem Si-Wafer während Kurzzeittemperprozessen. - In: Vortragsreihen Mikroelektronik und Schaltungstechnik, Kommunikations- und Meßtechnik, (1992), S. 446-451

Räbiger, Torsten; Pezoldt, Jörg; Torber, Karsten; Zöllner, Jens-Peter; Ullrich, Klaus; Eichhorn, Gerd
Einfluß der Gasströmung auf die Temperaturverteilung des Wafers bei RTP-Prozessen. - In: Vortragsreihen Mikroelektronik und Schaltungstechnik, Kommunikations- und Meßtechnik, (1992), S. 440-445

Müller, Bernhard; Gunst, Ullrich; Schlegel, St.
SIMS-Vergleichsmessungen zur Tiefenprofilierung und Sekundärionenausbeute. - In: Vortragsreihen Mikroelektronik und Schaltungstechnik, Kommunikations- und Meßtechnik, (1992), S. 434-439

Zöllner, Jens-Peter; Ullrich, Klaus
Simulationen zu einem rotationssymmetrischen RTP-Reaktor. - In: Vortragsreihen Mikroelektronik und Schaltungstechnik, Kommunikations- und Meßtechnik, (1992), S. 429-433

Pezoldt, Jörg;
Polytype Phasenübergänge während der plastischen Deformation von SiC. - In: Vortragsreihen Mikroelektronik und Schaltungstechnik, Kommunikations- und Meßtechnik, (1992), S. 424-428

Garg, U.; Rößler, Hans; Procop, Mathias
Bestimmung von Elementtiefenverteilungen im nm-Bereich mittels zerstörungsfreier Analysemethoden. - In: Vortragsreihen Mikroelektronik und Schaltungstechnik, Kommunikations- und Meßtechnik, (1992), S. 419-423

Kupris, Gerald; Rößler, Hans
Untersuchungen zur Durchmischungszone beim Ionenstrahlsputtern dünner Schichten. - In: Vortragsreihen Mikroelektronik und Schaltungstechnik, Kommunikations- und Meßtechnik, (1992), S. 194-197

Kretzer, O.; Lenk, G.; Wesch, W.; Gunst, Ullrich; Müller, Bernhard
Charakterisierung flacher Borprofile in Silizium nach Implantation und Laserausheilung. - In: Vortragsreihen Mikroelektronik und Schaltungstechnik, Kommunikations- und Meßtechnik, (1992), S. 182-187

Brčka, Jozef; Gr&hacek;no, Július; Zur, Albrecht
The radiative flux distribution in the RTP reactor zone. - In: Vortragsreihen Mikroelektronik und Schaltungstechnik, Kommunikations- und Meßtechnik, (1992), S. 122-127

Eichhorn, Gerd; Pezoldt, Jörg; Stauden, Thomas; Zöllner, Jens-Peter
Rapid Thermal Processing in der Mikroelektroniktechnologie. - In: Vortragsreihen Mikroelektronik und Schaltungstechnik, Kommunikations- und Meßtechnik, (1992), S. 118-121

Kalnin, Andreji Aleksandrowitsch; Pezoldt, Jörg; Neubert, Frank
Grundlagen der Struktursteuerung und Herstellung von heteropolytypen Kompositionen auf der Basis von SiC. - In: Vortragsreihen Mikroelektronik und Schaltungstechnik, Kommunikations- und Meßtechnik, (1992), S. 102-112