Kühnel, Michael; Fröhlich, Thomas; Füßl, Roland; Hoffmann, Martin; Manske, Eberhard; Rangelow, Ivo W.; Reger, Johann; Schäffel, Christoph; Sinzinger, Stefan; Zöllner, Jens-Peter
Towards alternative 3D nanofabrication in macroscopic working volumes. - In: Measurement science and technology, ISSN 1361-6501, Bd. 29 (2018), 11, S. 114002, insges. 19 S.
https://doi.org/10.1088/1361-6501/aadb57
Towards alternative 3D nanofabrication in macroscopic working volumes. - In: Measurement science and technology, ISSN 1361-6501, Bd. 29 (2018), 11, S. 114002, insges. 19 S.
https://doi.org/10.1088/1361-6501/aadb57
Fischer, Robert; Bichra, Mohamed; Straube, Anja; Stubenrauch, Mike; Sinzinger, Stefan; Witte, Hartmut
Adaptable, automated platform for miniaturized cell cultivation experiments including Fourier-optical analytics. - In: Basic & clinical pharmacology & toxicology, ISSN 1742-7843, Bd. 122 (2018), Supplement S1, ICBB17-13, Seite 6-7
https://doi.org/10.1111/bcpt.12952
Adaptable, automated platform for miniaturized cell cultivation experiments including Fourier-optical analytics. - In: Basic & clinical pharmacology & toxicology, ISSN 1742-7843, Bd. 122 (2018), Supplement S1, ICBB17-13, Seite 6-7
https://doi.org/10.1111/bcpt.12952
Bourgin, Yannick; Kleindienst, Roman; Nagel, Falk; Bergmann, Jean Pierre; Sinzinger, Stefan
Generation of optimized intensity profile by diffractive elements for high power laser welding applications. - In: EOS Topical Meeting on Diffractive Optics 2017, (2017), S. 43-44
Generation of optimized intensity profile by diffractive elements for high power laser welding applications. - In: EOS Topical Meeting on Diffractive Optics 2017, (2017), S. 43-44
Burada, Dali R.; Pant, Kamal K.; Mishra, Vinod; Bichra, Mohamed; Khan, Gufran S.; Sinzinger, Stefan; Shakher, Chandra
Development of metrology for freeform optics in reflection mode. - In: Optical Measurement Systems for Industrial Inspection X, (2017), Seite 103291K-1-103291K-8
https://doi.org/10.1117/12.2270284
Development of metrology for freeform optics in reflection mode. - In: Optical Measurement Systems for Industrial Inspection X, (2017), Seite 103291K-1-103291K-8
https://doi.org/10.1117/12.2270284
Karthaus, Daniela;
Sandfuchs, Oliver; Sinzinger, Stefan
Transmission holograms for white light illumination. - In: Proceedings of the 12th International Symposium on Automotive Lighting, (2017), S. 53-62
Transmission holograms for white light illumination. - In: Proceedings of the 12th International Symposium on Automotive Lighting, (2017), S. 53-62
Bichra, Mohamed;
Müller, Lutz; Feßer, Patrick; Hoffmann, Martin; Sinzinger, Stefan
Nanostrukturierte Beugungsgitter für integrierte Metrologie. - In: MikroSystemTechnik Kongress 2017 "MEMS, Mikroelektronik, Systeme", (2017), S. 548-551
Nanostrukturierte Beugungsgitter für integrierte Metrologie. - In: MikroSystemTechnik Kongress 2017 "MEMS, Mikroelektronik, Systeme", (2017), S. 548-551
Fischer, Robert; Stubenrauch, Mike; Straube, Anja; Wedrich, Karin; Goj, Boris; Bartsch, Heike; Bichra, Mohamed; Rothe, Holger; Witte, Hartmut
System for automated cell cultivation and analysis. - In: Engineering for a changing world, (2017), insges. 2 S.
http://nbn-resolving.de/urn:nbn:de:gbv:ilm1-2017iwk-109:7
System for automated cell cultivation and analysis. - In: Engineering for a changing world, (2017), insges. 2 S.
http://nbn-resolving.de/urn:nbn:de:gbv:ilm1-2017iwk-109:7
Karthaus, Daniela;
Sandfuchs, Oliver; Sinzinger, Stefan
Transmission volume holograms for LED illumination. - In: Engineering for a changing world, (2017), insges. 9 S.
http://nbn-resolving.de/urn:nbn:de:gbv:ilm1-2017iwk-070:0
Transmission volume holograms for LED illumination. - In: Engineering for a changing world, (2017), insges. 9 S.
http://nbn-resolving.de/urn:nbn:de:gbv:ilm1-2017iwk-070:0
Cao, Xinrui;
Sinzinger, Stefan
Removal of optical aberrations caused by illumination system in Fourier ptychography. - In: Engineering for a changing world, (2017), insges. 6 S.
http://nbn-resolving.de/urn:nbn:de:gbv:ilm1-2017iwk-078:2
Removal of optical aberrations caused by illumination system in Fourier ptychography. - In: Engineering for a changing world, (2017), insges. 6 S.
http://nbn-resolving.de/urn:nbn:de:gbv:ilm1-2017iwk-078:2
Bichra, Mohamed;
Meinecke, Thomas; Müller, Lutz; Feßer, Patrick; Hoffmann, Martin; Sinzinger, Stefan
Innovative freeform measurement method using two dimensional binary diffractive grating based on nanostructured silicon. - In: Engineering for a changing world, (2017), insges. 7 S.
http://nbn-resolving.de/urn:nbn:de:gbv:ilm1-2017iwk-088:9
Innovative freeform measurement method using two dimensional binary diffractive grating based on nanostructured silicon. - In: Engineering for a changing world, (2017), insges. 7 S.
http://nbn-resolving.de/urn:nbn:de:gbv:ilm1-2017iwk-088:9