Krey, Maximilian;
Hähnlein, Bernd; Tonisch, Katja; Krischok, Stefan; Töpfer, Hannes
Automated parameter extraction of ScAlN MEMS devices using an extended Euler-Bernoulli beam theory. - In: Sensors, ISSN 1424-8220, Bd. 20 (2020), 4, 1001, insges. 19 S.
https://doi.org/10.3390/s20041001
Automated parameter extraction of ScAlN MEMS devices using an extended Euler-Bernoulli beam theory. - In: Sensors, ISSN 1424-8220, Bd. 20 (2020), 4, 1001, insges. 19 S.
https://doi.org/10.3390/s20041001
Link, Steffen;
Ivanov, Svetlozar; Dimitrova, Anna; Krischok, Stefan; Bund, Andreas
Understanding the initial stages of Si electrodeposition under diffusion kinetic limitation in ionic liquid-based electrolytes. - In: Journal of crystal growth, Bd. 531 (2020), 125346, S. 1-6
https://doi.org/10.1016/j.jcrysgro.2019.125346
Understanding the initial stages of Si electrodeposition under diffusion kinetic limitation in ionic liquid-based electrolytes. - In: Journal of crystal growth, Bd. 531 (2020), 125346, S. 1-6
https://doi.org/10.1016/j.jcrysgro.2019.125346
Petrich, Rebecca; Bartsch, Heike; Tonisch, Katja; Jaekel, Konrad; Barth, Stephan; Bartzsch, Hagen R.; Glöß, Daniel; Delan, Annekatrin; Krischok, Stefan; Strehle, Steffen; Hoffmann, Martin; Müller, Jens
Investigation of ScAlN for piezoelectric and ferroelectric applications. - In: 2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC), (2019), insges. 5 S.
https://doi.org/10.23919/EMPC44848.2019.8951824
Investigation of ScAlN for piezoelectric and ferroelectric applications. - In: 2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC), (2019), insges. 5 S.
https://doi.org/10.23919/EMPC44848.2019.8951824
Petrich, Rebecca; Bartsch, Heike; Tonisch, Katja; Jaekel, Konrad; Barth, Stephan; Bartzsch, Hagen R.; Glöß, Daniel; Delan, Annekatrin; Krischok, Stefan; Strehle, Steffen; Hoffmann, Martin; Müller, Jens
Untersuchung von ScAlN für piezoelektrische und ferroelektrische Anwendungen. - In: MikroSystemTechnik Kongress 2019, (2019), S. 412-416
Untersuchung von ScAlN für piezoelektrische und ferroelektrische Anwendungen. - In: MikroSystemTechnik Kongress 2019, (2019), S. 412-416
Lauer, Kevin;
Krischok, Stefan; Klein, Thomas; Bähr, Mario; Lawerenz, Alexander; Röder, Ralf; Ortlepp, Thomas; Gohs, Uwe
Light-induced degradation in annealed and electron irradiated silicon. - In: Physica status solidi, ISSN 1862-6319, Bd. 216 (2019), 17, S. 1900284, insges. 6 S.
https://doi.org/10.1002/pssa.201900284
Light-induced degradation in annealed and electron irradiated silicon. - In: Physica status solidi, ISSN 1862-6319, Bd. 216 (2019), 17, S. 1900284, insges. 6 S.
https://doi.org/10.1002/pssa.201900284
Michel, Jonas; Splith, Daniel; Rombach, Julius; Papadogianni, Alexandra; Berthold, Theresa; Krischok, Stefan; Grundmann, Marius; Bierwagen, Oliver; Wenckstern, Holger von; Himmerlich, Marcel
Processing strategies for high-performance Schottky contacts on n-type oxide semiconductors: insights from In2O3. - In: ACS applied materials & interfaces, ISSN 1944-8252, Bd. 11 (2019), 30, S. 27073-27087
Im Titel sind "2" und "3" tiefgestellt
https://doi.org/10.1021/acsami.9b06455
Processing strategies for high-performance Schottky contacts on n-type oxide semiconductors: insights from In2O3. - In: ACS applied materials & interfaces, ISSN 1944-8252, Bd. 11 (2019), 30, S. 27073-27087
Im Titel sind "2" und "3" tiefgestellt
https://doi.org/10.1021/acsami.9b06455
Baranov, Aleksandr; Ullmann, Fabian; Dimitrova, Anna; Krischok, Stefan
X-Ray photoelectron spectroscopic study of the near surface composition of [TfO] and [Tf2N] based Ionic Liquids at different electrode surfaces. - In: DPG-Frühjahrstagung 2019 (DPG Spring Meeting 2019) of the Condensed Matter Section (SKM) together with the Division Radiation and Medical Physics and the Working Groups Equal Opportunities, Industry and Business, Young DPG; Symposia, exhibition of scientific instruments and literature, (2019), O 67.6
X-Ray photoelectron spectroscopic study of the near surface composition of [TfO] and [Tf2N] based Ionic Liquids at different electrode surfaces. - In: DPG-Frühjahrstagung 2019 (DPG Spring Meeting 2019) of the Condensed Matter Section (SKM) together with the Division Radiation and Medical Physics and the Working Groups Equal Opportunities, Industry and Business, Young DPG; Symposia, exhibition of scientific instruments and literature, (2019), O 67.6
Hofmann, Tim; Tonisch, Katja; Hähnlein, Bernd; Kovic, Jaroslav; Pezoldt, Jörg; Krischok, Stefan
Spectroscopic characterization of sputtered ScAlN thinfilms. - In: DPG-Frühjahrstagung 2019 (DPG Spring Meeting 2019) of the Condensed Matter Section (SKM) together with the Division Radiation and Medical Physics and the Working Groups Equal Opportunities, Industry and Business, Young DPG; Symposia, exhibition of scientific instruments and literature, (2019), HL 35.6
Spectroscopic characterization of sputtered ScAlN thinfilms. - In: DPG-Frühjahrstagung 2019 (DPG Spring Meeting 2019) of the Condensed Matter Section (SKM) together with the Division Radiation and Medical Physics and the Working Groups Equal Opportunities, Industry and Business, Young DPG; Symposia, exhibition of scientific instruments and literature, (2019), HL 35.6
Reiß, Stephanie;
Krischok, Stefan; Rädlein, Edda
Comparative study of weather induced corrosion mechanisms of toughened and normal float glasses. - In: European journal of glass science and technology, ISSN 1753-3554, Bd. 60 (2019), 2, S. 33-44
https://doi.org/10.13036/17533546.60.2.020
Comparative study of weather induced corrosion mechanisms of toughened and normal float glasses. - In: European journal of glass science and technology, ISSN 1753-3554, Bd. 60 (2019), 2, S. 33-44
https://doi.org/10.13036/17533546.60.2.020
Link, Steffen;
Ivanov, Svetlozar; Dimitrova, Anna; Krischok, Stefan; Bund, Andreas
Electrochemical deposition of silicon from a sulfolane-based electrolyte: effect of applied potential. - In: Electrochemistry communications, ISSN 1873-1902, Bd. 103 (2019), S. 7-11
https://doi.org/10.1016/j.elecom.2019.04.008
Electrochemical deposition of silicon from a sulfolane-based electrolyte: effect of applied potential. - In: Electrochemistry communications, ISSN 1873-1902, Bd. 103 (2019), S. 7-11
https://doi.org/10.1016/j.elecom.2019.04.008