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Self-energy and damping of long-wavelength magnons in amorphous ferromagnets. - In: Physica status solidi, ISSN 1521-3951, Bd. 216 (1999), 2, S. 1073-1088
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Self-energy and damping of long-wavelength magnons in amorphous ferromagnets. - In: Physica status solidi, ISSN 1521-3951, Bd. 216 (1999), 2, S. 1073-1088
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Bechstedt, Friedhelm;
Grille, Hartmut
Lattice dynamics of ternary alloys. - In: Physica status solidi, ISSN 1521-3951, Bd. 216 (1999), 1, S. 761-768
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Lattice dynamics of ternary alloys. - In: Physica status solidi, ISSN 1521-3951, Bd. 216 (1999), 1, S. 761-768
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Scheiner, Jörg; Goldhahn, Rüdiger; Cimalla, Volker; Ecke, Gernot; Attenberger, Wilfried; Lindner, Jörg K. M.; Gobsch, Gerhard; Pezoldt, Jörg
Spectroscopic ellipsometry studies of heteroepitaxially grown cubic silicon carbide layers on silicon. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 61/62 (1999), S. 526-530
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Spectroscopic ellipsometry studies of heteroepitaxially grown cubic silicon carbide layers on silicon. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 61/62 (1999), S. 526-530
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Shokhovets, Sviatoslav; Goldhahn, Rüdiger; Gobsch, Gerhard; Cheng, T. S.; Foxon, C. Thomas
Optical characterisation of interface properties for hexagonal GaN grown by MBE on GaAs. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 59 (1999), 1/3, S. 69-72
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Optical characterisation of interface properties for hexagonal GaN grown by MBE on GaAs. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 59 (1999), 1/3, S. 69-72
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Köhler, U.; As, Donat J.; Schöttker, B.; Frey, T.; Lischka, Klaus; Scheiner, Jörg; Žochovec, Svjatoslav; Goldhahn, Rüdiger
Optical constants of cubic GaN in the energy range of 1.53.7 eV. - In: Journal of applied physics, ISSN 1089-7550, Bd. 85 (1999), 1, 404-407
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Optical constants of cubic GaN in the energy range of 1.53.7 eV. - In: Journal of applied physics, ISSN 1089-7550, Bd. 85 (1999), 1, 404-407
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Schenk, H. P. D.; Kipshidze, G. D.; Lebedev, Vadim B.; Shokhovets, Sviatoslav; Goldhahn, Rüdiger; Kräußlich, Jürgen; Fissel, A.; Richter, Wo.
Epitaxial growth of AlN and GaN on Si(1 1 1) by plasma-assisted molecular beam epitaxy. - In: Journal of crystal growth, Bd. 201/202 (1999), S. 359-364
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Epitaxial growth of AlN and GaN on Si(1 1 1) by plasma-assisted molecular beam epitaxy. - In: Journal of crystal growth, Bd. 201/202 (1999), S. 359-364
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Shokhovets, Sviatoslav; Goldhahn, Rüdiger; Cheng, T. S.; Foxon, C. Thomas
Optical study of the [alpha]-GaN/GaAs interface properties as a function of MBE growth conditions. - In: Semiconductor science and technology, ISSN 1361-6641, Bd. 14 (1999), 2, S. 181-186
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Optical study of the [alpha]-GaN/GaAs interface properties as a function of MBE growth conditions. - In: Semiconductor science and technology, ISSN 1361-6641, Bd. 14 (1999), 2, S. 181-186
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Goldhahn, Rüdiger; Scheiner, Jörg; Shokhovets, Sviatoslav; Frey, T.; Köhler, U.; As, Donat J.; Lischka, Klaus
Determination of optical constants for cubic In x Ga 1-x N layers. - In: Physica status solidi, ISSN 1521-3951, Bd. 216 (1999), 1, S. 265-268
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Determination of optical constants for cubic In x Ga 1-x N layers. - In: Physica status solidi, ISSN 1521-3951, Bd. 216 (1999), 1, S. 265-268
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Žochovec, Svjatoslav; Goldhahn, Rüdiger; Gobsch, Gerhard; Cheng, T. S.; Foxon, Tom; Kipshidze, G. D.; Richter, Wo.
Reflectivity investigations as a method for characterizing group III nitride films. - In: Journal of applied physics, ISSN 1089-7550, Bd. 86 (1999), 5, S. 2602-2610
https://doi.org/10.1063/1.371098
Reflectivity investigations as a method for characterizing group III nitride films. - In: Journal of applied physics, ISSN 1089-7550, Bd. 86 (1999), 5, S. 2602-2610
https://doi.org/10.1063/1.371098
Puta, Horst; Gobsch, Gerhard; Schellenberger, Ulrich; Feldmann, H.; Bürger, H.-D.; Schulze, Dirk
Solarthermische Systeme mit hohem Wirkungsgrad und hohem Speichervermögen durch umfassende Nutzung der Vakuumisolation (VakuSol). - In: [Vortragsreihen, (1999), S. 535-538
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