Scanning Probe Methods - Interaktive Studienpläne der TU Ilmenau

Die schriftliche Prüfung erstreckt sich über den Inhalt der Vorlesung.

Prof. Dr. Jörg Kröger

Experimentalphysik, Festkörperphysik, Quantenphysik

The students have obtained detailed insight into modern scanning tunneling and atomic force microscopy.  The lecture enables students to identify the challenges and to appreciate the rich physics of state-of-the-art experiments. The participants are prepared for research in surface and interface physics using scanning tunneling and atomic force microscopes.  The students are able to identify challenges in modern research fields such as atomic and molecular physics at surfaces. They have gained a thorough overview on previous and current research in scanning probe methods.

The lecture treats the working principle of scanning tunneling and atomic force microscopes. Experimental aspects, such as positioning of the probe by piezoceramic actuators, vibration damping, low-noise electronics, feedback control and lock-in technique are scrutinized. The physics of tunneling will be applied to the tip-surface junction resulting in Bardeen's tunneling matrix element, the one-dimensional model of Simmons and the important Tersoff-Hamann approximation to the tip density of states. Experimental examples of state-of-the-art instruments include imaging with atomic resolution and magnetic contrast, manipulation of matter at the atomic scale and the spectroscopy of the local density of states, single-molecule vibrational quanta, single-atom spin excitations, lattice vibrations as well as luminescence emitted from a single molecule.

Tafel, Computerpräsentation

R. Wiesendanger: Scanning Probe Microscopy and Spectroscopy (Cambridge University Press, 1998); J. A. Stroscio, W. J. Kaiser (Ed.): Scanning Tunneling Microscopy (Academic Press, 1993); C. J. Chen: Introduction to Scanning Tunneling Microscopy (Oxford University Press, 2008); D. Sarid: Scanning Force Microscopy (Oxford University Press, 1994); H. J. Güntherodt, R. Wiesendanger (Ed.): Scanning Tunneling Microscopy I, II, III (Springer, 1991); C. Bai: Scanning Tunneling Microscopy and its Application (Springer, 1992); E. L. Wolf: Principles of Electron Tunneling Spectroscopy (Oxford University Press, 1989); B. Voigtländer: Scanning Probe Microscopy (Springer, 2015); R. Reifenberger: Fundamentals of Atomic Force Microscopy (World Scientific, 2016)