Spectroscopic Diagnostic Methods - Interactive curriculae of TU Ilmenau
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| module properties Spectroscopic Diagnostic Methods in degree program Master Technische Physik 2023 | |
|---|---|
| module number | 201150 |
| examination number | 2400878 |
| department | Department of Mathematics and Natural Sciences |
| ID of group | 2422 (Technical Physics I) |
| module leader | Prof. Dr. Stefan Krischok |
| term | winter term only |
| language | Englisch |
| credit points | 3 |
| on-campus program (h) | 22 |
| self-study (h) | 68 |
| obligation | elective module |
| exam | oral pass-fail certificate, 30 minutes |
| details of the certificate | Die mündliche Prüfung erstreckt sich über den Inhalt der Vorlesung. |
| link to Moodle course | |
| teacher | Prof. Dr. Stefan Krischok |
| signup details for alternative examinations | |
| maximum number of participants | |
| previous knowledge and experience | Elektrodynamik, Festkörperphysik, Atomphysik |
| learning outcome | The students have learned basic methods to characterize and analyze surfaces and interfaces. Besides the knowledge of physical and experimental principles, the students are able to evaluate common aspects as well as differences of the methods. Opportunities and limitations of the individual techniques are clear to the students, which enables them to choose the most appropriate combination of methods in order to answer scientific questions in surface and interface analytics. |
| content | Electron spectroscopy for element and bonding analysis; Study of electronic properties by excitation with photons or metastable probe particles; Vibrational spectroscopy of surfaces and interfaces; Characterization of structure and stoichiometry by scattering and spectroscopy of ions and neutral atoms; Mass spectrometry for desorption experiments and ion abrasion; Optical spectroscopy of surfaces |
| media of instruction and technical requirements for education and examination in case of online participation | Tafel, Computerpräsentation |
| literature / references | K. Oura et al., Surface Science - an introduction, Springer; A. Zangwill, Physics at surfaces, Cambridge Univ. Press; H. Lüth, Surfaces and Interfaces of Solid Materials, Springer; M. Henzler und W. Göpel, Oberflächenphysik des Festkörpers, Teubner; W. Mönch, Semiconductor Surfaces and Interfaces, Springer; G. Ertl, J. Küppers, Low Energy Electrons and Surface Chemistry, VCH; G. Friedbacher,H. Bubert,H. Jenett, Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation and Applications, Wiley; D.P. Woodruff, Modern techniques of surface science, Cambridge Univ. Press; J.C. Vickerman, The surface analysis: the principal techniques, Wiley; S. Hüfner, Photoelectron spectroscopy : principles and applications, Springer; M. Cardona, L. Ley, Photoemission in solids, Springer; D. Briggs, J.T. Grant , Surface analysis by Auger and X-ray photoelectron spectroscopy, IM Publications; M. Grasserbauer, H.J. Dudek, M.F. Ebel, Angewandte Oberflächenanalyse mit SIMS, AES und XPS, Akademie-Verlag Berlin; H. Ibach, D. L. Mills, Electron Energy Loss Spectroscopy and Surface Vibrations, Academic Press, London; G. Ertl, J. Küppers, Low Energy Electrons and Surface Chemistry, VCH Publishers |
| evaluation of teaching | |