News
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18.03.2019
IEEE - International Conference of Mechatronics
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26.09.2018
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Researchdatabase and -projects
Research News
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04.09.2018 Precise calibration system for micro- and nano-force sensors
Over the past 15 years the Raster-Kraft-Mikroskopie (atomic force microscopy) has developed into a standard analytical method in micro- and nanosystems technology and contributes significantly to the rapid development in nanotechnology. It allows microscopic images in an enlargement of several million times and thus the visualization of yet undiscovered details. The centerpiece of the atomic force microscope is the cantilever, consisting of a measuring tip which is located with at a length of 100… 400 μm at the end of a flexible cantilever. When the spring stiffness of such a cantilever is calibrated, i.e. its force-deflection-characteristic, it can also be used for measuring the smallest forces on a microscopic scale.[more]
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30.07.2018 Cross-National Research on Online Sexuality
Sexuality is an important part of human life and is closely linked to health, life satisfaction and the quality of relationships. The sexual culture in Germany has undergone two crucial changes in the past fifty years: The so-called sexual revolution of the 1960s brought about a surge of liberalization, especially through the contraceptive pill and the reform of criminal law at the time. Since then, for example, the consumption of pornography and the cohabitation of unmarried couples have been legal. [more]
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08.06.2018 Research Project Flora Incognita – Interactive Plant Species Identification with Smartphones
Biodiversity is constantly changing. Globalization, climatic changes, as well as regional landscaping are continuously affecting our natural ecosystem. Declining population numbers of plant species native to the Federal Republic of Germany can thus be observed as well as the immigration and settlement of invasive plant species.[more]
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04.06.2018 Research Training Group tip- and laser- based 3D-Nanofabrication in extended macroscopic work areas (NanoFab)
For 40 years now the semiconductor industry has been following Moore’s Law with astonishing consistency. Despite far-reaching further developments in optical lithography, it is becoming evident that structure sizes of < 20 nm can only be achieved with great effort using known methods. Meanwhile, the fundamental challenge is in the development of alternative production technologies particularly for micro- and nanotechnologies which can measure and work on the atomic scale in steadily increasing work areas of several hundred millimeters in diameter. [more]
