Publikationen von Dr. Rüdiger Schmidt-Grund

Nano-structuring enables us to add additional degrees of freedom to the design of optical elements. Especially the possibility of controlling the polarization is of great interest in the field of nano-structured optics. For being able to exploit the whole range of form-birefringent phase shifts, the aspect ratios of the resulting element are typically much higher than the aspect ratios of conventional diffractive optical elements (DOEs), which does not only pose a challenge on fabrication but also on characterization. We evaluate several well-established approaches for the nondestructive characterization, including Müller-Matrix-Ellipsometry, measurement of the diffraction efficiencies, scattering measurements and calibration with rigorous coupled-wave modelling. The goal is to understand the challenges with all these techniques and combine them to a reliable method for structural reconnaisance of high aspect ratio nanostructures.

Herein, the complex pseudodielectric function of Ge and Si from femtosecond pump-probe spectroscopic ellipsometry with 267, 400, and 800 nm pump-pulse wavelengths is analyzed by fitting analytical lineshapes to the second derivatives of the pseudodielectric function with respect to energy. This yields the critical point parameters (threshold energy, lifetime broadening, amplitude, and excitonic phase angle) of E 1 and E 1 + Δ 1 in Ge and E 1 in Si as functions of delay time. Coherent longitudinal acoustic phonon oscillations with a period of about 11 ps are observed in the transient critical point parameters of Ge. From the amplitude of these oscillations, the laser-induced strain is found to be on the order of 0.03% for Ge measured with the 800 nm pump pulse, which is in reasonable agreement with the strain calculated from theory.

We present a setup for time-resolved spectroscopic ellipsometry in a pump-probe scheme using femtosecond laser pulses. As a probe, the system deploys supercontinuum white light pulses that are delayed with respect to single-wavelength pump pulses. A polarizer-sample-compensator-analyzer configuration allows ellipsometric measurements by scanning the compensator azimuthal angle. The transient ellipsometric parameters are obtained from a series of reflectance-difference spectra that are measured for various pump-probe delays and polarization (compensator) settings. The setup is capable of performing time-resolved spectroscopic ellipsometry from the near-infrared through the visible to the near-ultraviolet spectral range at 1.3 eV-3.6 eV. The temporal resolution is on the order of 100 fs within a delay range of more than 5 ns. We analyze and discuss critical aspects such as fluctuations of the probe pulses and imperfections of the polarization optics and present strategies deployed for circumventing related issues.

The recent developments in the study of magnetic properties in the spinel zinc ferrite system are explored. Engineering of ionic valence and site distribution allows tailoring of magnetic interactions. Recent literature is reviewed, and own investigations are presented for a conclusive understanding of the mechanisms responsible for the magnetic behavior in this material system. By varying the Zn-to-Fe ratio, the deposition, as well as thermal annealing conditions, ZnFe2O4 thin films with a wide range of crystalline quality are produced. In particular, the focus is on the magnetic structure in relation to spectroscopic properties of disordered ZnFe2O4 thin films. Comparing the cation distribution in film bulk (optical transitions in the dielectric function) and near-surface region (X-ray absorption), it is found that an inhomogeneous cation distribution leads to a weaker magnetic response in films of inverse configuration, whereas defects in the normal spinel are likely to be found at the film surface. The results show that it is possible to engineer the defect distribution in the magnetic spinel ferrite film structure and tailor their magnetic properties on demand. It is demonstrated that these properties can be read out optically, which allows controlled growth of the material and applications in future magneto-optical devices.