Stegner, Johannes;
Gropp, Sebastian; Podoskon, Dmitry; Stehr, Uwe; Hoffmann, Martin; Hein, Matthias
An analytical formulation of the radio-frequency response of piezoelectric contour-mode MEMS resonators verified by measurements. - In: IFCS 2018, (2018), insges. 5 S.
https://doi.org/10.1109/FCS.2018.8597517
An analytical formulation of the radio-frequency response of piezoelectric contour-mode MEMS resonators verified by measurements. - In: IFCS 2018, (2018), insges. 5 S.
https://doi.org/10.1109/FCS.2018.8597517
Jandura, Daniel; Schaaf, Peter; Pudis, Dusan; Gaso, Peter; Bonko, A.
3D waveguide device with Fabry-Perot resonator for sensing applications. - In: ASDAM 2018, ISBN 978-1-5386-7490-1, (2018), insges. 4 S.
https://doi.org/10.1109/ASDAM.2018.8544628
3D waveguide device with Fabry-Perot resonator for sensing applications. - In: ASDAM 2018, ISBN 978-1-5386-7490-1, (2018), insges. 4 S.
https://doi.org/10.1109/ASDAM.2018.8544628
Jotz, Matthias;
Schneider, Jens; Rädlein, Edda
lntroducing the "Cylinder Fit Test", a simplified edge strength measurement method for Ultra Thin Glass. - In: Glass in architecture and structural engineering, (2018), S. 65-73
lntroducing the "Cylinder Fit Test", a simplified edge strength measurement method for Ultra Thin Glass. - In: Glass in architecture and structural engineering, (2018), S. 65-73
Günther-Müller, Sarah;
Gropp, Sebastian; Hoffmann, Martin; D'heer, Herbert; Thourhout, Dries; Neft, Anna; Bartels, Frank; Gradkowski, Kamil; Carroll, Lee; O'Brien, Peter; Lerma-arce, Cristina; Watté, Jan
Electrowetting controlled non-volatile integrated optical switch. - In: 2018 European Conference on Optical Communication (ECOC), ISBN 978-1-5386-4862-9, (2018), insges. 3 S.
https://doi.org/10.1109/ECOC.2018.8535585
Electrowetting controlled non-volatile integrated optical switch. - In: 2018 European Conference on Optical Communication (ECOC), ISBN 978-1-5386-4862-9, (2018), insges. 3 S.
https://doi.org/10.1109/ECOC.2018.8535585
Supplie, Oliver;
Heinisch, Alexander; Sugiyama, Masakazu; Hannappel, Thomas
Optical in situ quantification of the Arsenic content in GaAsP graded buffer layers for III-V-on-Si tandem absorbers during MOVPE growth. - In: 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC), ISBN 978-1-5386-8529-7, (2018), S. 3923-3926
https://doi.org/10.1109/PVSC.2018.8547955
Optical in situ quantification of the Arsenic content in GaAsP graded buffer layers for III-V-on-Si tandem absorbers during MOVPE growth. - In: 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC), ISBN 978-1-5386-8529-7, (2018), S. 3923-3926
https://doi.org/10.1109/PVSC.2018.8547955
Paszuk, Agnieszka;
Supplie, Oliver; Nandy, Manali; Brückner, Sebastian; Dobrich, Anja; Kleinschmidt, Peter; Kim, Boram; Nakano, Yoshiaki; Sugiyama, Masakazu; Hannappel, Thomas
As-modified Si(100) surfaces for III-V-on-Si tandem solar cells. - In: 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC), ISBN 978-1-5386-8529-7, (2018), S. 0233-0236
https://doi.org/10.1109/PVSC.2018.8547817
As-modified Si(100) surfaces for III-V-on-Si tandem solar cells. - In: 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC), ISBN 978-1-5386-8529-7, (2018), S. 0233-0236
https://doi.org/10.1109/PVSC.2018.8547817
Hanitsch, Stefan; Plickett, Uwe; Hoffmann, Martin; Sinzinger, Stefan
MEMS needle electrode for impedance spectroscopy on cell spheroids. - In: Biomedical engineering, ISSN 1862-278X, Bd. 63 (2018), S1, Seite S333
Enthalten in: Poster Session
https://doi.org/10.1515/bmt-2018-6051
MEMS needle electrode for impedance spectroscopy on cell spheroids. - In: Biomedical engineering, ISSN 1862-278X, Bd. 63 (2018), S1, Seite S333
Enthalten in: Poster Session
https://doi.org/10.1515/bmt-2018-6051
Pezoldt, Jörg; Kalnin, Andrei Alexandrovich
Defects and polytype instabilities. - In: Silicon carbide and related materials 2017, (2018), S. 147-150
Defects and polytype instabilities. - In: Silicon carbide and related materials 2017, (2018), S. 147-150
Auge, Manuel; Hähnlein, Bernd; Pezoldt, Jörg
Infrared reflectance study of the graphene/semi-insulating 6H-SiC(0001) heterostructure. - In: Silicon carbide and related materials 2017, (2018), S. 314-317
Infrared reflectance study of the graphene/semi-insulating 6H-SiC(0001) heterostructure. - In: Silicon carbide and related materials 2017, (2018), S. 314-317
Eckstein, Marco; Koppka, Christian; Thiele, Sebastian; Mi, Yan; Xu, Rui; Lei, Yong; Hähnlein, Bernd; Schwierz, Frank; Pezoldt, Jörg
MOCVD compatible atomic layer deposition process of Al2O3 on SiC and graphene/SiC heterostructures. - In: Silicon carbide and related materials 2017, (2018), S. 506-510
Im Titel sind "2" und "3" tiefgestellt
MOCVD compatible atomic layer deposition process of Al2O3 on SiC and graphene/SiC heterostructures. - In: Silicon carbide and related materials 2017, (2018), S. 506-510
Im Titel sind "2" und "3" tiefgestellt