Cassel, Diego; Dittmann, R.; Kuhlmann, B.; Siegel, Michael; Ortlepp, Thomas; Töpfer, Hannes; Uhlmann, F. Hermann
HTS basic RSFQ cells for an optimal bit-error rate. - In: Superconductor science and technology, ISSN 1361-6668, Bd. 15 (2002), 4, S. 483-487
http://dx.doi.org/10.1088/0953-2048/15/4/301
HTS basic RSFQ cells for an optimal bit-error rate. - In: Superconductor science and technology, ISSN 1361-6668, Bd. 15 (2002), 4, S. 483-487
http://dx.doi.org/10.1088/0953-2048/15/4/301
Febvre, Pascal; Töpfer, Hannes; Ortlepp, Thomas; Kidiyarova-Shevchenko, A.; Gerritsma, G. J.
Comparative study of rapid-single-flux-quantum devices based on low-, medium- and high-Tc technologies. - In: Superconductor science and technology, ISSN 1361-6668, Bd. 15 (2002), 6, S. 952-955
http://dx.doi.org/10.1088/0953-2048/15/6/320
Comparative study of rapid-single-flux-quantum devices based on low-, medium- and high-Tc technologies. - In: Superconductor science and technology, ISSN 1361-6668, Bd. 15 (2002), 6, S. 952-955
http://dx.doi.org/10.1088/0953-2048/15/6/320
Cassel, Diego; Ortlepp, Thomas; Dittmann, R.; Kuhlmann, B.; Töpfer, Hannes; Siegel, Michael; Uhlmann, F. Hermann
HTS technology for implementing RSFQ cells with large noise immunity. - In: Physica, ISSN 0921-4534, Bd. 372/376 (2002), 1, S. 139-142
http://dx.doi.org/10.1016/S0921-4534(02)00638-X
HTS technology for implementing RSFQ cells with large noise immunity. - In: Physica, ISSN 0921-4534, Bd. 372/376 (2002), 1, S. 139-142
http://dx.doi.org/10.1016/S0921-4534(02)00638-X
Hein, Matthias; Oates, D. E.; Hirst, P. J.; Humphreys, R. G.; Velichko, A. V.
Nonlinear dielectric microwave losses in MgO substrates. - In: Applied physics letters, ISSN 1077-3118, Bd. 80 (2002), 6, S. 1007-1009
http://dx.doi.org/10.1063/1.1447000
Nonlinear dielectric microwave losses in MgO substrates. - In: Applied physics letters, ISSN 1077-3118, Bd. 80 (2002), 6, S. 1007-1009
http://dx.doi.org/10.1063/1.1447000
Ziolkowski, Marek; Haueisen, Jens; Leder, Uwe
Postprocessing of 3-D current density reconstruction results with equivalent ellipsoids. - In: IEEE transactions on biomedical engineering, ISSN 1558-2531, Bd. 49 (2002), 11, S. 1379-1384
http://dx.doi.org/10.1109/TBME.2002.804580
Postprocessing of 3-D current density reconstruction results with equivalent ellipsoids. - In: IEEE transactions on biomedical engineering, ISSN 1558-2531, Bd. 49 (2002), 11, S. 1379-1384
http://dx.doi.org/10.1109/TBME.2002.804580
Brauer, Hartmut; Ziolkowski, Marek; Haueisen, Jens; Tenner, Uwe; Nowak, Hannes
Verification of extended sources reconstruction techniques using a torso phantom. - In: Compel, ISSN 2054-5606, Bd. 20 (2001), 2, S. 595-606
http://dx.doi.org/10.1108/03321640110383933
Verification of extended sources reconstruction techniques using a torso phantom. - In: Compel, ISSN 2054-5606, Bd. 20 (2001), 2, S. 595-606
http://dx.doi.org/10.1108/03321640110383933
Brauer, Hartmut; Ziolkowski, Marek; Haueisen, Jens
Evaluation of inverse field solutions with biomedical applications. - In: Compel, ISSN 2054-5606, Bd. 20 (2001), 3, S. 665-675
http://dx.doi.org/10.1108/03321640110393635
Evaluation of inverse field solutions with biomedical applications. - In: Compel, ISSN 2054-5606, Bd. 20 (2001), 3, S. 665-675
http://dx.doi.org/10.1108/03321640110393635
Aretz, K.; Haardt, Martin; Konhäuser, W.; Mohr, W.
Die Zukunft mobiler Funknetze: jenseits von 3G. - In: NetworkWorld Germany, ISSN 1438-7891, Bd. 3 (2001), 12, S. 18-19
Die Zukunft mobiler Funknetze: jenseits von 3G. - In: NetworkWorld Germany, ISSN 1438-7891, Bd. 3 (2001), 12, S. 18-19
Ortlepp, Thomas; Töpfer, Hannes; Uhlmann, Hermann F.
Effects of a 20 K operation on the bit-error rates of a prospective MgB 2 based digital circuit. - In: Superconductor science and technology, ISSN 1361-6668, Bd. 14.2001, 8, S. L37-L39
http://dx.doi.org/10.1088/0953-2048/14/8/101
Effects of a 20 K operation on the bit-error rates of a prospective MgB 2 based digital circuit. - In: Superconductor science and technology, ISSN 1361-6668, Bd. 14.2001, 8, S. L37-L39
http://dx.doi.org/10.1088/0953-2048/14/8/101
Ortlepp, Thomas; Töpfer, Hannes; Uhlmann, Hermann F.
Minimization of noise-induced bit error rate in a high Tc superconducting dc/single flux quantum converter. - In: Applied physics letters, ISSN 1077-3118, Bd. 78 (2001), 9, S. 1279-1281
http://dx.doi.org/10.1063/1.1341228
Minimization of noise-induced bit error rate in a high Tc superconducting dc/single flux quantum converter. - In: Applied physics letters, ISSN 1077-3118, Bd. 78 (2001), 9, S. 1279-1281
http://dx.doi.org/10.1063/1.1341228