Niebelschütz, Merten; Ecke, Gernot; Cimalla, Volker; Tonisch, Katja; Ambacher, Oliver
Work function analysis of GaN-based lateral polarity structures by Auger electron energy measurements. - In: Journal of applied physics, ISSN 1089-7550, Bd. 100 (2006), 7, 074909, insges. 3 S.
https://doi.org/10.1063/1.2353785
Work function analysis of GaN-based lateral polarity structures by Auger electron energy measurements. - In: Journal of applied physics, ISSN 1089-7550, Bd. 100 (2006), 7, 074909, insges. 3 S.
https://doi.org/10.1063/1.2353785
Cimalla, Volker; Förster, Christian; Will, Florentina; Tonisch, Katja; Brückner, Klemens; Stephan, Ralf; Hein, Matthias; Ambacher, Oliver; Aperathitis, Elias
Pulsed mode operation of strained microelectromechanical resonators in air. - In: Applied physics letters, ISSN 1077-3118, Bd. 88 (2006), 25, S. 253501, insges. 3 S.
http://dx.doi.org/10.1063/1.2213950
Pulsed mode operation of strained microelectromechanical resonators in air. - In: Applied physics letters, ISSN 1077-3118, Bd. 88 (2006), 25, S. 253501, insges. 3 S.
http://dx.doi.org/10.1063/1.2213950
Cimalla, Volker; Förster, Christian; Cengher, Dorin; Tonisch, Katja; Ambacher, Oliver
Growth of AlN nanowires by metal organic chemical vapour deposition. - In: Physica status solidi, ISSN 1521-3951, Bd. 243 (2006), 7, S. 1476-1480
http://dx.doi.org/10.1002/pssb.200565205
Growth of AlN nanowires by metal organic chemical vapour deposition. - In: Physica status solidi, ISSN 1521-3951, Bd. 243 (2006), 7, S. 1476-1480
http://dx.doi.org/10.1002/pssb.200565205
Tonisch, Katja; Cimalla, Volker; Förster, Christian; Dontsov, Denys; Ambacher, Oliver
Piezoelectric properties of thin AlN layers for MEMS application determined by piezoresponse force microscopy. - In: Physica status solidi, ISSN 1610-1642, Bd. 3 (2006), 6, S. 2274-2277
http://dx.doi.org/10.1002/pssc.200565123
Piezoelectric properties of thin AlN layers for MEMS application determined by piezoresponse force microscopy. - In: Physica status solidi, ISSN 1610-1642, Bd. 3 (2006), 6, S. 2274-2277
http://dx.doi.org/10.1002/pssc.200565123
Will, Florentina; Tonisch, Katja; Cimalla, Volker; Förster, Christian; Brückner, Klemens; Stephan, Ralf; Hein, Matthias; Ambacher, Oliver
Nanoelectromechanical resonators and their application for viscosity measurements in smallest amounts of liquids. - In: Abstracts, (2006), insges. 1 S.
Nanoelectromechanical resonators and their application for viscosity measurements in smallest amounts of liquids. - In: Abstracts, (2006), insges. 1 S.
Brückner, Klemens; Förster, Christian; Tonisch, Katja; Cimalla, Volker; Ambacher, Oliver; Stephan, Ralf; Blau, Kurt; Hein, Matthias A.
Electromechanical resonances of SiC and AIN beams under ambient conditions. - In: Maschinenbau von Makro bis Nano, 2005, [04.P.01], insges. 2 S.
http://www.db-thueringen.de/servlets/DocumentServlet?id=17356
Electromechanical resonances of SiC and AIN beams under ambient conditions. - In: Maschinenbau von Makro bis Nano, 2005, [04.P.01], insges. 2 S.
http://www.db-thueringen.de/servlets/DocumentServlet?id=17356
Tonisch, Katja; Cimalla, Volker; Förster, Christian; Dontsov, Denis; Ambacher, Oliver
Estimation of the piezoelectric properties of thin AIN layers for MEMS applications. - In: Maschinenbau von Makro bis Nano, 2005, [04.07], insges. 4 S.
http://www.db-thueringen.de/servlets/DocumentServlet?id=17305
Estimation of the piezoelectric properties of thin AIN layers for MEMS applications. - In: Maschinenbau von Makro bis Nano, 2005, [04.07], insges. 4 S.
http://www.db-thueringen.de/servlets/DocumentServlet?id=17305
Tonisch, Katja; Will, Florentina; Förster, Christian; Cimalla, Volker; Brückner, Klemens; Hein, Matthias; Ambacher, Oliver
SiC and AlN-based micro- and nanomechanical resonators for sensing applications. - In: 7. Dresdner Sensor-Symposium - neue Herausforderungen und Anwendungen in der Sensortechnik, (2005), S. 239-242
SiC and AlN-based micro- and nanomechanical resonators for sensing applications. - In: 7. Dresdner Sensor-Symposium - neue Herausforderungen und Anwendungen in der Sensortechnik, (2005), S. 239-242
Brückner, Klemens; Förster, Christian; Tonisch, Katja; Cimalla, Volker; Ambacher, Oliver; Stephan, Ralf; Blau, Kurt; Hein, Matthias
Electromechanical resonances of SiC and AlN beams under ambient conditions. - In: Conference proceedings, (2005), S. 1531-1534
Electromechanical resonances of SiC and AlN beams under ambient conditions. - In: Conference proceedings, (2005), S. 1531-1534