Stange, Helena; Supplie, Oliver; May, Matthias M.; Höhn, Christian; Zabka, Wolf-Dietrich; Koppka, Christian; Tonisch, Katja; Döscher, Henning; Hannappel, Thomas
MOVPE-growth and characterisation of GaPN/Si(100) for photoelectrolysis. - In: DPG-Frühjahrstagung (DPG Spring Meeting) of the Condensed Matter Section [SKM], with its Divisions: Biological Physics, Chemical and Polymer Physics, Crystallography, Dielectric Solids, Dynamics and Statistical Physics, Low Temperature Physics, Magnetism, Metal and Material Physics, Physics of Socio-Economic Systems, Semiconductor Physics, Surface Science, Thin Fils, Vacuum Science and Technology, together with the Divisions: Microprobes, and Radiation and Medical Physics as well as the Working Groups: Industry and Business, and "Young DPG" ; March 10 - 15, 2013, University of Regensburg, 2013, HL 4.4
MOVPE-growth and characterisation of GaPN/Si(100) for photoelectrolysis. - In: DPG-Frühjahrstagung (DPG Spring Meeting) of the Condensed Matter Section [SKM], with its Divisions: Biological Physics, Chemical and Polymer Physics, Crystallography, Dielectric Solids, Dynamics and Statistical Physics, Low Temperature Physics, Magnetism, Metal and Material Physics, Physics of Socio-Economic Systems, Semiconductor Physics, Surface Science, Thin Fils, Vacuum Science and Technology, together with the Divisions: Microprobes, and Radiation and Medical Physics as well as the Working Groups: Industry and Business, and "Young DPG" ; March 10 - 15, 2013, University of Regensburg, 2013, HL 4.4
Supplie, Oliver; Stange, Helena; May, Matthias M.; Höhn, Christian; Koppka, Christian; Tonisch, Katja; Döscher, Henning; Hannappel, Thomas
In situ characterization of MOVPE grown GaPN/GaP/Si(100) for photoelectrolysis. - In: DPG-Frühjahrstagung (DPG Spring Meeting) of the Condensed Matter Section [SKM], with its Divisions: Biological Physics, Chemical and Polymer Physics, Crystallography, Dielectric Solids, Dynamics and Statistical Physics, Low Temperature Physics, Magnetism, Metal and Material Physics, Physics of Socio-Economic Systems, Semiconductor Physics, Surface Science, Thin Fils, Vacuum Science and Technology, together with the Divisions: Microprobes, and Radiation and Medical Physics as well as the Working Groups: Industry and Business, and "Young DPG" ; March 10 - 15, 2013, University of Regensburg, 2013, HL 68.15
In situ characterization of MOVPE grown GaPN/GaP/Si(100) for photoelectrolysis. - In: DPG-Frühjahrstagung (DPG Spring Meeting) of the Condensed Matter Section [SKM], with its Divisions: Biological Physics, Chemical and Polymer Physics, Crystallography, Dielectric Solids, Dynamics and Statistical Physics, Low Temperature Physics, Magnetism, Metal and Material Physics, Physics of Socio-Economic Systems, Semiconductor Physics, Surface Science, Thin Fils, Vacuum Science and Technology, together with the Divisions: Microprobes, and Radiation and Medical Physics as well as the Working Groups: Industry and Business, and "Young DPG" ; March 10 - 15, 2013, University of Regensburg, 2013, HL 68.15
Pezoldt, Jörg; Hähnlein, Bernd; Stubenrauch, Mike; Tonisch, Katja; Grieseler, Rolf; Vanco, Lubomir; Schaaf, Peter
Verspannungsanalyse mit Raman-Spektroskopie an MEMS aus Gruppe III-Nitriden. - In: Thüringer Werkstofftag 2013, (2013), S. 101-106
Parallel als Druckausg. erschienen
http://www.db-thueringen.de/servlets/DocumentServlet?id=22997
Verspannungsanalyse mit Raman-Spektroskopie an MEMS aus Gruppe III-Nitriden. - In: Thüringer Werkstofftag 2013, (2013), S. 101-106
Parallel als Druckausg. erschienen
http://www.db-thueringen.de/servlets/DocumentServlet?id=22997
Pezoldt, Jörg; Tonisch, Katja
FTIR-Ellipsometrie an Mischkristallen von Gruppe III-Nitriden. - In: Thüringer Werkstofftag 2013, (2013), S. 107-114
http://www.db-thueringen.de/servlets/DocumentServlet?id=22997
FTIR-Ellipsometrie an Mischkristallen von Gruppe III-Nitriden. - In: Thüringer Werkstofftag 2013, (2013), S. 107-114
http://www.db-thueringen.de/servlets/DocumentServlet?id=22997
Grieseler, Rolf; Stubenrauch, Mike; Michael, Steffen; Klaus, Jenny; Tonisch, Katja; Pezoldt, Jörg; Schaaf, Peter
Ermittlung mechanischer Eigenschaften neuer Materialien mittels freistehender Balkenstrukturen. - In: Thüringer Werkstofftag 2013, (2013), S. 209-210
http://www.db-thueringen.de/servlets/DocumentServlet?id=22997
Ermittlung mechanischer Eigenschaften neuer Materialien mittels freistehender Balkenstrukturen. - In: Thüringer Werkstofftag 2013, (2013), S. 209-210
http://www.db-thueringen.de/servlets/DocumentServlet?id=22997
Grieseler, Rolf; Stubenrauch, Mike; Michael, Steffen; Klaus, Jenny; Tonisch, Katja; Pezoldt, Jörg; Schaaf, Peter
Ermittlung mechanischer Eigenschaften neuer Materialien mittels freistehender Balkenstrukturen. - In: Thüringer Werkstofftag 2013, (2013), S. 209-210
Ermittlung mechanischer Eigenschaften neuer Materialien mittels freistehender Balkenstrukturen. - In: Thüringer Werkstofftag 2013, (2013), S. 209-210
Hiller, Lars; Tonisch, Katja; Tonisch, Katja *1980-*;
SiC/Si pseudosubstrates for AlGaN nanoelectronic devices. - In: Silicon carbide and related materials 2012, (2013), S. 1119-1122
SiC/Si pseudosubstrates for AlGaN nanoelectronic devices. - In: Silicon carbide and related materials 2012, (2013), S. 1119-1122
Jatal, Wael; Tonisch, Katja; Baumann, Uwe; Schwierz, Frank; Pezoldt, Jörg
AlGaN/GaN based HEMTs on SiC/Si-substrates: influences on high frequency performance. - In: Silicon carbide and related materials 2012, (2013), S. 1115-1118
AlGaN/GaN based HEMTs on SiC/Si-substrates: influences on high frequency performance. - In: Silicon carbide and related materials 2012, (2013), S. 1115-1118
Tonisch, Katja; Benzig, Robert; Ecke, Gernot; Pezoldt, Jörg
AlGaN solid solution grown on 3C-SiC(111)/Si(111) pseudosubstrates. - In: Silicon carbide and related materials 2012, (2013), S. 103-106
AlGaN solid solution grown on 3C-SiC(111)/Si(111) pseudosubstrates. - In: Silicon carbide and related materials 2012, (2013), S. 103-106