Zeitschriftenaufsätze und Buchbeiträge (Rezensionen)

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Hausotte, Tino; Percle, Brandon; Manske, Eberhard; Füßl, Roland; Jäger, Gerd
Measuring value correction and uncertainty analysis for homodyne interferometers. - In: Measurement science and technology, ISSN 1361-6501, Bd. 22 (2011), 9, S. 094028, insges. 6 S.

The Nanopositioning and Nanomeasuring Machine (NMM-1) developed at the Ilmenau University of Technology is equipped with three homodyne plane-mirror miniature interferometers for the measurement of the displacement of a movable corner mirror. The object being measured is placed on the corner mirror, which is positioned by a three-axis drive system. The uncertainty of interferometric length measurements is dependent on several factors. Starting with an improved equation for calculating length, this paper describes a part of the determination of the measurement uncertainty for a displacement measurement using two positions of the measuring mirror. The new approach separates the correlated influencing factors for three positions of the measuring mirror: for the position where the interferometer counter is reset to zero and the other two positions of two measured points. Additionally, the work takes into account the influence of the dead path length and its determination.



http://dx.doi.org/10.1088/0957-0233/22/9/094028
Vorbringer-Dorozhovets, Nataliya; Hausotte, Tino; Manske, Eberhard; Shen, Jing-Chung; Jäger, Gerd
Novel control scheme for a high-speed metrological scanning probe microscope. - In: Measurement science and technology, ISSN 1361-6501, Bd. 22 (2011), 9, S. 094012, insges. 7 S.

http://dx.doi.org/10.1088/0957-0233/22/9/094012
Kosinskiy, Mikhail; Ahmed, Syed Imad-Uddin; Liu, Yonghe; Gubisch, Maik; Mastylo, Rostyslav; Spieß, Lothar; Schäfer, Jürgen A.
Friction and wear properties of WC/C nano-scale multilayer coatings on technical surfaces. - In: Tribology letters, ISSN 1573-2711, Bd. 44 (2011), 1, S. 89-98

http://dx.doi.org/10.1007/s11249-011-9826-2
Jäger, Gerd; Manske, Eberhard; Hausotte, Tino
Performance and limitation of nanomeasuring technology. - In: International journal of nanomanufacturing, ISSN 1746-9392, Bd. 7 (2011), 1, S. 54-62

Jäger, Gerd;
Herausforderungen und Grenzen der interferometrischen Präzisionsmesstechnik. - In: Technisches Messen, ISSN 2196-7113, Bd. 78 (2011), 3, S. 114-117

Die Prinzipien, die Grundlagen und die Arbeitsweise von Zweifrequenz- und Einfrequenz-Interferometern werden beschrieben. Auf der Grundlage einer messtechnischen Analyse werden die Vorteile aber auch die Grenzen der laserinterferometrischen Messverfahren dargestellt. Die Ermittlung des kleinsten auflösbaren Weginkrements erlaubt die Berechnung der Auflösung von Interferometern. Neben den Abbé-Fehlern werden weitere Einflüsse aufgeführt, welche sich auf die Messunsicherheit interferometrischer Längenmessungen auswirken. Eine 3D-Abbéfehlerfreie Anordnung wird am Beispiel einer Nanopositionier- und Nanomessmaschine erläutert. Diese Maschine wurde in Zusammenarbeit zwischen dem Institut Prozessmess- und Sensortechnik und der SIOS Meßtechnik GmbH entwickelt.



http://dx.doi.org/10.1524/teme.2011.0122
Krapf, Gunter; Schalles, Marc; Schalles, Marc *1977-*; Fröhlich, Thomas;
Estimation of fixed-point temperatures - a practical approach. - In: Measurement, Bd. 44 (2011), 2, S. 385-390

Phase transition temperatures can be used for thermometer calibrations in accordance with the ITS-90. For this the thermometer is inserted into a fixed-point cell filled with a highly pure substance. While the substance is melting or freezing the temperature inside the cell remains almost constant and the thermometer measures a plateau in the temperature curve. From this plateau the phase transition temperature needs to be estimated for the calibration of the thermometer. This can be done using different mathematical methods, taking into account various systematic deviations as well as reproducibilities of the results depending on the chosen method, the fixed-point material's purity and above all the amount of fixed-point material. Hence this article presents results from measurements in miniature fixed-point cells filled with zinc of various purities. The plateau curves were measured at different heating rates and comparatively analysed using five different estimation methods.



http://dx.doi.org/10.1016/j.measurement.2010.10.015
Jäger, Gerd;
Three-dimensional nanopositioning and nanomeasuring machine with a resolution of 0.1 nm. - In: Optoelectronics, instrumentation and data processing, ISSN 1934-7944, Bd. 46 (2010), 4, S. 318-323

The paper describes traceable nanometrology based on a nanopositoning machine with integrated nanoprobes. The operation of a high-precision long-range three-dimensional nanopositioning and nanomeasuring machine (NMM-1) having a resolution of 0.1 nm over the positioning and measuring range of 25 x 25 x 5 mm is explained. Various developed probe systems have been integrated into the NMM-1 machine, including a focus sensor, a white light sensor, and tactile nanoprobes. Single-beam, double-beam and triple-beam interferometers are installed into the NMM-1 machine to measure and control the six degrees of freedom. Measured results are presented.



http://dx.doi.org/10.3103/S8756699010040035
Jäger, Gerd; Hausotte, Tino; Manske, Eberhard; Büchner, Hans-Joachim; Mastylo, Rostyslav; Dorozhovets, Nataliya; Hofmann, Norbert
Nanomeasuring and nanopositioning engineering. - In: Measurement, Bd. 43 (2010), 9, S. 1099-1105

The paper describes traceable nanometrology based on a nanopositioning machine with integrated nanoprobes. The operation of a high-precision long range three-dimensional nanopositioning and nanomeasuring machine (NPM-Machine) having a resolution of 0,1 nm over the positioning and measuring range of 25 mm x 25 mm x 5 mm is explained. An Abbe offset-free design of three miniature plan mirror interferometers and applying a new concept for compensating systematic errors resulting from mechanical guide systems provide very small uncertainties of measurement. The NPM-Machine has been developed by the Institute of Process Measurement and Sensor Technology of the Technische Universität Ilmenau and manufactured by the SIOS Messtechnik GmbH Ilmenau. The machines are operating successfully in several German and foreign research institutes including the Physikalisch-Technische Bundesanstalt (PTB), Germany. The integration of several, optical and tactile probe systems and nanotools makes the NPM-Machine suitable for various tasks, such as large-area scanning probe microscopy, mask and wafer inspection, nanostructuring, biotechnology and genetic engineering as well as measuring mechanical precision workpieces, precision treatment and for engineering new material. Various developed probe systems have been integrated into the NPM-Machine. The measurement results of a focus sensor, metrological AFM, white light sensor and tactile stylus probes are presented. Single beam-, double beam- and triple beam interferometers built in the NPM-Machine for six degrees of freedom measurements are described.



http://dx.doi.org/10.1016/j.measurement.2010.04.008
Jäger, Gerd;
Herausforderungen und Grenzen der interferometrischen Präzisionsmesstechnik. - In: Jahrbuch Optik und Feinmechanik, ISSN 0075-272X, Bd. 56 (2010), S. 1-8

Manske, Eberhard; Amthor, Arvid
Workbench for the nano world : developing nanopositioning machines with dSPACE tools. - In: dSpace magazine, (2009), 1, S. 20-23