Welcome to the research group of Nanofabrication and Nanomeasurement Technology

Head: Jun.-Prof. Dr. Thomas Kissinger

News

Studierende, die den Ehrenbergweg runter laufenTU Ilmenau/Michael Reichel

Voluntary year at TU Ilmenau: out of school and into science

From 1 September, school leavers can take part in a research project for a…

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World Interferometry Day 2024

On April 10 we celebrate the World Interferometry Day 2024 to commemorate the…

Taiwanese-German Exchange about Nanometrology in Taipei

As part of the long-standing cooperation and the current exchange projects,…

Research

The research unit aims to combine fundamental research into highly-accurate optical measurement technology with application-based research, often in collaboration with interdisciplinary partners. Furthermore, technology transfer all the way to the practical use is actively pursued.

Interferometric signal processing stands at the heart of the research profile and is applied to a number of key application fields. Nanometrology and sensor technology, in particular for use within nanofabrication, forms the core application area. Fibre-optic sensing and interferometric imaging are further key target areas and innovative research topics to advance the research profile are continuously being explored.

             
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Teaching

The lecture „Optoelectronic Measurement and Sensor Technology” at master level as well as parts of the lecture “Introduction to Measurement and Sensor Technology” at bachelor level are currently being offered.

Through working on research projects as part of Diploma, Bachelor and Master theses but also through scientific assistant positions, students are actively integrated into the research unit and scientific work skills are fostered.

Recent Publications

[J15]      Shmagun, V., Gerhardt, U., Fröhlich, T., Manske, E. and Kissinger, T., "Absolute distance measurements for in-situ interferometer characterisation using range-resolved interferometry", Meas. Sci. Technol. 33: 125024, 12pp, (2022). doi.org/10.1088/1361-6501/ac970a

[J14]      James, S.W., Kissinger, T., Weber, S., Mullaney, K., Chehura, E., Pekmezci, H.H., Barrington, J.H.,Staines, S.E., Charrett, T.O.H., Lawson, N.J:, Lone, M., Atack, R. and Tatam, R.P. ,“Fibre-optic measurement of strain and shape on a helicopter rotor blade during a ground run: 1. Measurement of strain”, Smart Materials and Structures, 31(7): 075014, 13pp, (2022). doi.org/10.1088/1361-665X/ac736d

[J13]      Kissinger, T., James, S.W., Weber, S., Mullaney, K., Chehura, E., Pekmezci, H.H., Barrington, J.H.,Staines, S.E., Charrett, T.O.H., Lawson, N.J:, Lone, M., Atack, R. and Tatam, R.P.,“Fibre-optic measurement of strain and shape on a helicopter rotor blade during a ground run: 2. Measurement of shape”, Smart Materials and Structures, 31(7): 075015, 13pp, (2022). doi.org/10.1088/1361-665X/ac736c

[J12]      Hallam, J.M., Kissinger, T., Charrett, T. O. and Tatam, R P. “In-process range-resolved interferometric (RRI) 3d layer height measurements for wire+ arc additive manufacturing (WAAM)”, Measurement Science and Technology, 33(4): 044002, 12pp, (2022).   DOI: 10.1088/1361-6501/ac440e
[J11]      Bridges, A., Yacoot, A., Kissinger, T. and Tatam, R.P. “Multiple intensity reference interferometry for the correction of sub-fringe displacement non-linearities”, Measurement Science and Technology, 33(2): 025201, 12pp, (2022).   DOI: 10.1088/1361-6501/ac3aad
[J10]      Bridges, A., Yacoot, A., Kissinger, T., Humphreys, D.A. and Tatam, R. P. “Correction of periodic displacement non-linearities by two-wavelength interferometry”, Measurement Science and Technology, 32: 125202, 12pp, (2021).   doi.org/10.1088/1361-6501/ac1dfa