Prof. Manske

• Nanometrology
• Nanopositioning and nanometrology
• Optical fiber-coupled interferometry
• Multi-coordinate measurement systems
• Optical and tactile nanoprobe systems
• Calibration technology and standards for nanomeasuring machines

1986
Ph.D. from the Faculty of Technical Sciences at Ilmenau
University of Technology (TH Ilmenau). Thesis topic: “A Contribution to the Development of High-Resolution Interferometric Optical Path Sensors”

2006
Habilitation at the Faculty of Mechanical Engineering, Ilmenau University of Technology (TU Ilmenau)
Topic: “Optical-fiber-coupled miniature interferometers for precision metrology”

2006–2008
Deputy Spokesperson for SFB 622 “Nanopositioning and Nanomeasuring Machines”

2008–2013 
Endowed Chair in “Precision Measurement Technology” at Sartorius AG

Spokesperson for the SFB 622 “Nanopositioning and Nanomeasuring Machines”

2013–2015
University Professor in the Research Group “Precision Measurement Technology” and “Measurement Technology in Mechanical Engineering and Manufacturing Metrology”

2013
Spokesperson for the Center of Excellence “Nanopositioning and Nanomeasuring Machines”

2015
University Professor in the combined Research Group “Manufacturing and Precision Measurement Technology”

2019
Director of the Institute for Process Measurement and Sensor Technology

• Competence Center Ultraprecise Surface Processing e.V. of the Nanotechnology Support Program of the Federal Ministry of Research and Education
• Working group "Optical Sensors for Geometry Measurement" of the Competence Network Optical Technologies and working group "Optical Metrology" of the DGaO
• Member of the cultural advisory board of the TU Ilmenau