Scherge, Matthias; Ahmed, S. I.; Mollenhauer, Olaf; Spiller, Frank
Mikrotribology : detection of forces in the micronewton range. - In: Sensoren und Meßsysteme 2000, (2000), S. 279-286
Mikrotribology : detection of forces in the micronewton range. - In: Sensoren und Meßsysteme 2000, (2000), S. 279-286
Schnittler, Christoph; Kirpal, Alfred
Die Macht des Geistes ... : Universitäten in der Wissensgesellschaft. - In: Ilmenauer Uni-Nachrichten, Bd. 43 (2000), 3, S. 22-23
Die Macht des Geistes ... : Universitäten in der Wissensgesellschaft. - In: Ilmenauer Uni-Nachrichten, Bd. 43 (2000), 3, S. 22-23
Grille, Harmut; Schnittler, Christoph; Schnittler, Christoph *1936-*; Bechstedt, Friedhelm;
Phonons in group-III nitride mixed crystals. - In: Compound semiconductors 1999, (2000), S. 499-502
Phonons in group-III nitride mixed crystals. - In: Compound semiconductors 1999, (2000), S. 499-502
Grille, Hartmut; Schnittler, Christoph; Schnittler, Christoph *1936-*; Bechstedt, Friedhelm;
Phonons in ternary group-III nitride alloys. - In: Physical review, ISSN 1550-235X, Bd. 61 (2000), 9, S. 6091-6105
http://dx.doi.org/10.1103/PhysRevB.61.6091
Phonons in ternary group-III nitride alloys. - In: Physical review, ISSN 1550-235X, Bd. 61 (2000), 9, S. 6091-6105
http://dx.doi.org/10.1103/PhysRevB.61.6091
Talalaev, V. G.; Novikov, B. V.; Verbin, S. Yu.; Novikov, A. B.; Thath, Dinh Son; Shchur, I. V.; Gobsch, Gerhard; Goldhahn, Rüdiger; Stein, Norbert; Golombek, A.
Recombination emission from InAs quantum dots grown on vicinal GaAs surfaces. - In: Semiconductors, ISSN 1090-6479, Bd. 34 (2000), 4, S. 453-461
http://dx.doi.org/10.1134/1.1188007
Recombination emission from InAs quantum dots grown on vicinal GaAs surfaces. - In: Semiconductors, ISSN 1090-6479, Bd. 34 (2000), 4, S. 453-461
http://dx.doi.org/10.1134/1.1188007
Goldhahn, Rüdiger; Shokhovets, Sviatoslav; Scheiner, Jörg; Gobsch, Gerhard; Cheng, T. S.; Foxon, C. Thomas; Kaiser, U.; Kipshidze, G. D.; Richter, W.
Determination of group III nitride film properties by reflectance and spectroscopic ellipsometry studies. - In: Physica status solidi, ISSN 1862-6319, Bd. 177 (2000), 1, S. 107-115
http://dx.doi.org/10.1002/(SICI)1521-396X(200001)177:1<107::AID-PSSA107>3.0.CO;2-8
Determination of group III nitride film properties by reflectance and spectroscopic ellipsometry studies. - In: Physica status solidi, ISSN 1862-6319, Bd. 177 (2000), 1, S. 107-115
http://dx.doi.org/10.1002/(SICI)1521-396X(200001)177:1<107::AID-PSSA107>3.0.CO;2-8
As, Donat J.; Frey, T.; Schikora, D.; Lischka, Klaus; Cimalla, Volker; Pezoldt, Jörg; Goldhahn, Rüdiger; Kaiser, S.; Gebhardt, W.
Cubic GaN epilayers grown by molecular beam epitaxy on thin beta-SiC/Si (001) substrates. - In: Applied physics letters, ISSN 1077-3118, Bd. 76 (2000), 13, S. 1686-1688
http://dx.doi.org/10.1063/1.126136
Cubic GaN epilayers grown by molecular beam epitaxy on thin beta-SiC/Si (001) substrates. - In: Applied physics letters, ISSN 1077-3118, Bd. 76 (2000), 13, S. 1686-1688
http://dx.doi.org/10.1063/1.126136
Goldhahn, Rüdiger; Scheiner, Jörg; Shokhovets, Sviatoslav; Frey, T.; Köhler, U.; As, Donat J.; Lischka, Klaus
Refractive index and gap energy of cubic InxGa1xN. - In: Applied physics letters, ISSN 1077-3118, Bd. 76 (2000), 3, S. 291-293
http://dx.doi.org/10.1063/1.125725
Refractive index and gap energy of cubic InxGa1xN. - In: Applied physics letters, ISSN 1077-3118, Bd. 76 (2000), 3, S. 291-293
http://dx.doi.org/10.1063/1.125725
Jiao, Yuekan; Gorb, Stanislav N.; Scherge, Matthias
Adhesive properties of attachment pads in Tettigonia viridissima. - In: Proceedings of: III. Biomechanic Workshop of the Studygroup Morphology (DZG), II. Workshop of Biological composed Materials and Systems (BKM&S), VI. Workshop of the Society of Technical Biology and Bionics, (2000), S. 168-170
Adhesive properties of attachment pads in Tettigonia viridissima. - In: Proceedings of: III. Biomechanic Workshop of the Studygroup Morphology (DZG), II. Workshop of Biological composed Materials and Systems (BKM&S), VI. Workshop of the Society of Technical Biology and Bionics, (2000), S. 168-170
Gorb, Stanislav N.; Scherge, Matthias
Frictional forces of orthopteran attachment pads measured by a novel microfriction tester. - In: Proceedings of: III. Biomechanic Workshop of the Studygroup Morphology (DZG), II. Workshop of Biological composed Materials and Systems (BKM&S), VI. Workshop of the Society of Technical Biology and Bionics, (2000), S. 28-30
Frictional forces of orthopteran attachment pads measured by a novel microfriction tester. - In: Proceedings of: III. Biomechanic Workshop of the Studygroup Morphology (DZG), II. Workshop of Biological composed Materials and Systems (BKM&S), VI. Workshop of the Society of Technical Biology and Bionics, (2000), S. 28-30