Jatal, Wael; Baumann, Uwe; Jacobs, Heiko O.; Schwierz, Frank; Pezoldt, Jörg
Tri-gate Al0.2Ga0.8N/AlN/GaN HEMTs on SiC/Si-substrates. - In: Materials science forum, ISSN 1662-9752, Bd. 858 (2016), S. 1174-1177
Im Titel sind "0.2" und "0.8" tiefgestellt
http://dx.doi.org/10.4028/www.scientific.net/MSF.858.1174
Tri-gate Al0.2Ga0.8N/AlN/GaN HEMTs on SiC/Si-substrates. - In: Materials science forum, ISSN 1662-9752, Bd. 858 (2016), S. 1174-1177
Im Titel sind "0.2" und "0.8" tiefgestellt
http://dx.doi.org/10.4028/www.scientific.net/MSF.858.1174
Pezoldt, Jörg;
Hähnlein, Bernd; Jacobs, Heiko O.; Schwierz, Frank
Amplification in graphene nanoribbon junctions. - In: Materials science forum, ISSN 1662-9752, Bd. 858 (2016), S. 1141-1144
http://dx.doi.org/10.4028/www.scientific.net/MSF.858.1141
Amplification in graphene nanoribbon junctions. - In: Materials science forum, ISSN 1662-9752, Bd. 858 (2016), S. 1141-1144
http://dx.doi.org/10.4028/www.scientific.net/MSF.858.1141
Zakharko, Yuriy;
Graf, Arko; Schießl, Stefan P.; Hähnlein, Bernd; Pezoldt, Jörg; Gather, Malte C.; Zaumseil, Jana
Broadband tunable, polarization-selective and directional emission of (6,5) carbon nanotubes coupled to plasmonic crystals. - In: Nano letters, ISSN 1530-6992, Bd. 16 (2016), 5, S. 3278-3284, insges. 7 S.
Gesehen am 01.10.2021
http://dx.doi.org/10.1021/acs.nanolett.6b00827
Broadband tunable, polarization-selective and directional emission of (6,5) carbon nanotubes coupled to plasmonic crystals. - In: Nano letters, ISSN 1530-6992, Bd. 16 (2016), 5, S. 3278-3284, insges. 7 S.
Gesehen am 01.10.2021
http://dx.doi.org/10.1021/acs.nanolett.6b00827
Nanmeni Bondja, Cedric; Geng, Zhansong; Granzner, Ralf; Pezoldt, Jörg; Schwierz, Frank
Simulation of 50-nm gate graphene nanoribbon transistors. - In: Electronics, ISSN 2079-9292, Bd. 5 (2016), 1, 3, insges. 17 S.
This article belongs to the Special Issue "Two-dimensional electronics - prospects and challenges", ISBN 978-3-03842-250-1
https://doi.org/10.3390/electronics5010003
Simulation of 50-nm gate graphene nanoribbon transistors. - In: Electronics, ISSN 2079-9292, Bd. 5 (2016), 1, 3, insges. 17 S.
This article belongs to the Special Issue "Two-dimensional electronics - prospects and challenges", ISBN 978-3-03842-250-1
https://doi.org/10.3390/electronics5010003
Biswas, Shantonu;
Kaltwasser, Mahsa; Stauden, Thomas; Jacobs, Heiko O.
Surface tension directed fluidic self-assembly of semiconductor chips across length scales and material boundaries. - In: Micromachines, ISSN 2072-666X, Bd. 7 (2016), 4, 54, insges. 13 S.
https://doi.org/10.3390/mi7040054
Surface tension directed fluidic self-assembly of semiconductor chips across length scales and material boundaries. - In: Micromachines, ISSN 2072-666X, Bd. 7 (2016), 4, 54, insges. 13 S.
https://doi.org/10.3390/mi7040054
Fang, Jun; Schlag, Leslie; Park, Se-Chul; Stauden, Thomas; Pezoldt, Jörg; Schaaf, Peter; Jacobs, Heiko O.
Approaching gas phase electrodeposition: process and optimization to enable the self-aligned growth of 3D nanobridge-based interconnects. - In: Advanced materials, ISSN 1521-4095, Bd. 28 (2016), 9, S. 1770-1779
https://doi.org/10.1002/adma.201503039
Approaching gas phase electrodeposition: process and optimization to enable the self-aligned growth of 3D nanobridge-based interconnects. - In: Advanced materials, ISSN 1521-4095, Bd. 28 (2016), 9, S. 1770-1779
https://doi.org/10.1002/adma.201503039
Grieseler, Rolf;
Theska, Felix; Stürzel, Thomas; Hähnlein, Bernd; Stubenrauch, Mike; Hopfeld, Marcus; Kups, Thomas; Pezoldt, Jörg; Schaaf, Peter
Elastic properties of nanolaminar Cr2AlC films and beams determined by in-situ scanning electron microscope bending tests. - In: Thin solid films, ISSN 1879-2731, Bd. 604 (2016), S. 85-89
Im Titel ist "2" tiefgestellt
http://dx.doi.org/10.1016/j.tsf.2016.03.026
Elastic properties of nanolaminar Cr2AlC films and beams determined by in-situ scanning electron microscope bending tests. - In: Thin solid films, ISSN 1879-2731, Bd. 604 (2016), S. 85-89
Im Titel ist "2" tiefgestellt
http://dx.doi.org/10.1016/j.tsf.2016.03.026
Müller, Jens;
Hannappel, Thomas; Hoffmann, Martin; Jacobs, Heiko O.; Lei, Yong; Rangelow, Ivo W.; Schaaf, Peter
Application of nanostructuring, nanomaterials and micro-nano-integration for improved components and system's performance. - In: 2016 Pan Pacific Microelectronics Symposium (Pan Pacific), ISBN 978-0-9888873-9-8, (2016), insges. 10 S.
http://dx.doi.org/10.1109/PanPacific.2016.7428387
Application of nanostructuring, nanomaterials and micro-nano-integration for improved components and system's performance. - In: 2016 Pan Pacific Microelectronics Symposium (Pan Pacific), ISBN 978-0-9888873-9-8, (2016), insges. 10 S.
http://dx.doi.org/10.1109/PanPacific.2016.7428387
Hähnlein, Bernd;
Alsioufy, Mohamad Adnan; Lootze, Michael; Jacobs, Heiko O.; Schwierz, Frank; Pezoldt, Jörg
Planar nanowire transistors from two-dimensional materials. - In: Materials science in semiconductor processing, ISSN 1873-4081, Volume 42 (2016), Part 2 (Feb.), Seite 183-187
https://doi.org/10.1016/j.mssp.2015.07.068
Planar nanowire transistors from two-dimensional materials. - In: Materials science in semiconductor processing, ISSN 1873-4081, Volume 42 (2016), Part 2 (Feb.), Seite 183-187
https://doi.org/10.1016/j.mssp.2015.07.068
Park, Se-Chul; Fang, Jun; Biswas, Shantonu; Kaltwasser, Mahsa; Stauden, Thomas; Jacobs, Heiko O.
Approaching roll-to-roll fluidic self-assembly: relevant parameters, machine design, and applications. - In: Journal of microelectromechanical systems, ISSN 1941-0158, Bd. 24 (2015), 6, S. 1928-1937
https://doi.org/10.1109/JMEMS.2015.2452772
Approaching roll-to-roll fluidic self-assembly: relevant parameters, machine design, and applications. - In: Journal of microelectromechanical systems, ISSN 1941-0158, Bd. 24 (2015), 6, S. 1928-1937
https://doi.org/10.1109/JMEMS.2015.2452772