Publication list FG Nanotechnology

Anzahl der Treffer: 722
Erstellt: Thu, 16 May 2024 23:02:13 +0200 in 0.0301 sec


Miskys, Claudio R.; Garrido, J. A.; Nebel, Christoph E.; Hermann, Martin; Ambacher, Oliver; Eickhoff, Martin; Stutzmann, Martin
AlN/diamond heterojunction diodes. - In: Applied physics letters, ISSN 0003-6951, Bd. 82 (2003), 2, S. 290-292

Park, M.; Cuomo, J. J.; Rodriguez, B. J.; Yang, W.-C.; Nemanich, R. J.; Ambacher, Oliver
Micro-Raman study of electronic properties of inversion domains in GaN-based lateral polarity heterostructures. - In: Journal of applied physics, ISSN 0021-8979, Bd. 93 (2003), 12, S. 9542-9547

Yang, W.-C.; Rodriguez, B. J.; Park, M.; Nemanich, R. J.; Ambacher, Oliver; Cimalla, Volker
Photoelectron emission microscopy observation of inversion domain boundaries of GaN-based lateral polarity heterostructures. - In: Journal of applied physics, ISSN 0021-8979, Bd. 94 (2003), 9, S. 5720-5725

Graf, T.; Gjukic, M.; Hermann, Martin; Brandt, M. S.; Stutzmann, Martin; Görgens, L.; Philipp, J. B.; Ambacher, Oliver
Growth and characterization of GaN:Mn epitaxial films. - In: Journal of applied physics, ISSN 0021-8979, Bd. 93 (2003), 12, S. 9697-9702

Scharmann, Friedhelm; Attenberger, Wilfried; Lindner, Jörg K. N.; Pezoldt, Jörg
Critical island size of the SiC formation on Si(1 0 0) and Si(1 1 1). - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 89 (2002), 1/3, S. 201-204

http://dx.doi.org/10.1016/S0921-5107(01)00852-2
Kosiba, Rastislav; Ecke, Gernot; Kharlamov, Vladimir; Trushin, Yuri; Pezoldt, Jörg
The estimation of sputtering yields for SiC and Si. - In: Nuclear instruments & methods in physics research. Beam interactions with materials and atoms. - Amsterdam [u.a.] : Elsevier, 1984- , ZDB-ID: 1466524-4, Bd. 196 (2002), 1/2, S. 39-50

http://dx.doi.org/10.1016/S0168-583X(02)01273-9
Kosiba, Rastislav; Ecke, Gernot
MC simulations of depth profiling by low energy ions. - In: Nuclear instruments & methods in physics research. Beam interactions with materials and atoms. - Amsterdam [u.a.] : Elsevier, 1984- , ZDB-ID: 1466524-4, Bd. 187 (2002), 1, S. 36-47

http://dx.doi.org/10.1016/S0168-583X(01)00848-5
Lebedev, Vadim; Pezoldt, Jörg; Cimalla, Volker; Jinschek, J.; Morales Sánchez, Francisco Miguel; Ambacher, Oliver
Preperation of epitaxial templates for molecular beam epitaxy of III-nitrides on silicon substrates. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2002), 1, S. 183-187

http://dx.doi.org/10.1002/pssc.200390018
Martinez-Criado, Gema; Cros, Ana; Cantarero, A.; Karrer, Uwe; Ambacher, Oliver; Miskys, Claudio Ronald; Stutzmann, Martin
Two-dimensional electron gas effects on the photoluminescence from a nonintentionally doped AlGaN/GaN heterojunction. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2002), 1, S. 392-396

http://dx.doi.org/10.1002/pssc.200390070
Gleize, Jerome; Di Carlo, A.; Lugli, P.; Jancu, J. M.; Scholz, R.; Ambacher, Oliver; Gerthsen, D.; Hahn, E.
Tight-binding simulation of an InGaN/GaN quantum well with indium concentration fluctuation. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2002), 1, S. 298-301

http://dx.doi.org/10.1002/pssc.200390047