The special issue about "Tip- and laser-based 3D nanofabrication in extended macroscopic working areas" in the journal Nanomanufacturing and Metrology is now online!
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Weigert F, Wolf M, Theska R (2022). „Model-based determination of the reproducibility of kinematic couplings”, Proceedings of the 22nd International Conference of the European Society for Precision Engineering and Nanotechnology / European Society for Precision Engineering and Nanotechnology International Conference & Exhibition 22. 2022 Genf. - Bedford, UK : euspen, 2022, S. 87-90
Mathew S, Narasimha S, Reiprich J, Scheler T, Hähnlein B, Thiele S, Stauffenberg J, Kurtash V, Abedin S, Manske E, Jacobs H O, Pezoldt J (2022). “Formation and Characterization of Three-Dimensional Tetrahedral MoS2 Thin Films by Chemical Vapor Deposition”,Crystal Growth & Design, https://doi.org/10.1021/acs.cgd.2c00333
StauffenbergJ, Ortlepp I, Belkner J, Dontsov D, Langlotz E, Hesse S, Rangelow I W, Manske E (2022). „Measurement Precision of a Planar Nanopositioning Machine with a Range of Motion of Ø100 mm”, Appl. Sci. 2022, 12, 7843, https://doi.org/10.3390/app12157843
Reuter C, Strehle S (2022). „Resistless Nanopatterning of 2D Materials by Field Electron Emission Scanning Probe Lithography“ Graphene 2022, Aachen, 04.07.-08.07.2022
Leineweber J, Meyer C, Füßl R, Theska R, Manske E (2022). “Ein neuartiges Konzept für 5D Nanopositionier-, Nanomess-,und Nanofabrikationsmaschinen”, tm – Technisches Messen 2022
Huaman A S, Gorges S, Katzschmann M, Hesse S, Fröhlich T, Manske E (2022). "Investigations on the tracking control and performance of a long stroke vertical nanopositioning drive", 22nd euspen International Conference, Geneva, CH, 30.05.-03.06.2022
Hebenstreit R, Wedrich K, Strehle S, Manske E, Theska R (2022). “First prototype of a positioning device with subatomic resolution”, euspen 22nd international conference and exhibition, Geneva, 30.05.-03.06.22, S.97-100. ISBN: 978-1-9989991-1-8
Wittke M, Wolf M, Darnieder M, Weigert F, Gerlach E, Zimmermann K, Theska R (2022).” Investigations on a torque-compensating adjustment drive for mechanically sensitive devices.”. Proceedings of the 22nd International Conference of the European Society for Precision Engineering and Nanotechnology (euspen), May 30th – June 3rd 2022. Genf, Schweiz, ISBN: 978-1-9989991-1-8
Wittke M, Torres Melgarejo M, Theska R (2022). „Concept of a monolithic stiffness-compensated mechanism for high-resolution force sensors”, 21. IGT/GMA Fachtagung Sensoren und Messsysteme, Nürnberg, 10.05.-11.05.22, S.461-464. ISBN: 978-3-8007-5835-7
Ortlepp I, Stauffenberg J, Krötschl A, Dontsov D, Zöllner J-P, Hesse S, Reuter C, Strehle S, Fröhlich T, Rangelow I W, Manske E (2022). "Nanofabrication and -metrology by using the nanofabrication machine (NFM-100)", Proc. SPIE 12054, Novel Patterning Technologies 2022, 120540A (25 May 2022); https://doi.org/10.1117/12.2615118
Belkner J, Stauffenberg J, Häcker A-V, Ortlepp I, Manske E (2022). „Amplituden- und Phasenmodulation in der Lock-In gefilterten differentiellen konfokalen Profilometrie“, ITG-Fb. 303: Sensoren und Messsysteme / VDE Verlag. - Neuerscheinung. - Berlin : VDE VERLAG, S. 235-244
Seminario R, Schmitt C, Weise C, Reger J (2022). "Control of an Overactuated Nanopositioning System with Hysteresis by Means of Control Allocation," 2022 IEEE 17th International Conference on Advanced Motion Control (AMC), 2022, pp. 280-287, doi: 10.1109/AMC51637.2022.9729294
Poroskun I, Rothleitner C, Heißelmann D (2022). „Structure of digital metrological twins as software for uncertainty estimation”, J. Sens. Sens. Syst., 11, 75–82, doi.org/10.5194/jsss-11-75-2022
- Stauffenberg J, Ortlepp I, Manske E (2021). „Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality Control”, Sensors 2021, 21, 5862, https://doi.org/10.3390/s21175862
- Stauffenberg J, Reibe M, Ortlepp I, Holz M, Dontsov D, Hesse S, Rangelow I W, Manske E (2021). “Combining nanometrology and nanomanufacturing using a Nanofabrication Machine (NFM-100)”, EuFN and Fit4Nano Joint Workshop/Meeting, 27th-29th September 2021 in Vienna
- Behrens A, Bosch M, Fesser P, Hentschel M, Sinzinger S (2021) „Diffractive optical coupling elements for microresonators“, OSA Advanced Photonics Congress, 26.07.- 30.07.2021, virtual
- Behrens A, Fesser P, Bosch M, Hentschel M, Sinzinger S (2021). “Whispering Gallery Resonators with diffractive coupling elements”, MikroSystemTechnik Kongress 2021 / VDE Verlag. - Berlin: VDE Verlag, 2021, S. 230-233
- Belkner J, Manske E (2021). "Verfahren und Vorrichtung zur Kompensation von instationären Aberrationen bei der konfokalen Vermessung einer Probenoberfläche", priority: 2020-03-26, published: 2021-07-15, DE102020108333B3, assignee: Technische Universität Ilmenau, 98693 Ilmenau
- Belkner J, Ortlepp I, Gerhardt U, Manske E (2021). "Compensating aberration induced error in differential confocal microscopy", Proc. SPIE 11782, Optical Measurement Systems for Industrial Inspection XII, 117820P (20 June 2021); https://doi.org/10.1117/12.2592392
- Stauffenberg J, Ortlepp I, Blumröder U, Dontsov D, Schäffel C, Holz M, Rangelow I W, Manske E:Investigations on the positioning accuracy of the Nano Fabrication Machine (NFM-100) / Untersuchungen zur Positioniergenauigkeit der NanoFabrikationsmaschine (NFM-100), Technisches Messen, 2021, https://doi.org/10.1515/teme-2021-0079
- Florian Fern, Roland Füßl, Eberhard Manske, Ralf Schienbein, René Theska, Ingo Ortlepp und Johannes Leineweber: Messunsicherheitsbetrachtungen an einem fünfachsigen Nano-Koordinatenmessgerät NMM-5D nach einem vektoriellen Ansatz. In tm - Technisches Messen, Band 88 Heft 2, De Gruyter Oldenbourg | 2021, https://doi.org/10.1515/teme-2020-0092
- Jaqueline Stauffenberg, Christoph Reuter, Ingo Ortlepp, Mathias Holz, Denis Dontsov, Christoph Schäffel, Jens-Peter Zöllner, Ivo W. Rangelow, Steffen Strehle and Eberhard Manske: Nanopositioning and -fabrication using the Nano Fabrication Machine with a positioning range up to Ø 100 mm. In: SPIE Advanced Lithography Proceedings, 11610-35 (2021), https://doi.org/10.1117/12.2583703
- Cherkasova, V, Dannberg O, Fröhlich T (2021): A Control Concept of a Compensation Load Cell in Terms of Calibration a Cantilever, SMSI Konferenz 03.05.-06.05.2021, Online Forum, Nürnberg
- Huaman A S, Katzschmann M, Hesse S, Schäffel C, Weise C, Dontsov D, Manske E, Reger J (2021): Picometer-Scale Positioning of a Linear Drive System via Feedforward-Feedback Control, IEEE ICM 2021, International Conference on Mechatronics, Kashiwa, Japan, 7-9 March 2021
- Weigert F (2021). „Investigations on low-friction kinematic couplings based on compliant mechanisms “, Euspen 21st International Conference & Exhibition: Virtual 07.-10.06.2021
- Belkner J, Hofmann M, Kirchner J, Manske E, 2020, "Demonstration of aberration-robust high-frequency modulated differential confocal microscopy with an oscillating pinhole", Proc. SPIE 11352, Optics and Photonics for Advanced Dimensional Metrology, 113520N (2020),
https://doi.org/10.1117/12.2555558 - Stauffenberg J, Durstewitz S, Hofmann M, Ivanov T, Holz M, Ehrhardt W, Riegel W-U, Zöllner J-P, Manske E, Rangelow I W (2020). “Determination of the mixing ratio of a flowing gas mixture with self-actuated microcantilevers”, Journal of sensors and sensor systems. -Göttingen: Copernicus Publ., ISSN: 2194-878X, ZDB-ID: 2733700-5, Bd. 9.2020, 1, Seite 71-78, https://doi.org/10.5194/jsss-9-71-2020
- Reuter C, Holz M, Reum A, Fahrbach M, Peiner E, Brand U, Hofmann M, Rangelow I W (2020). „Applications of tactile microprobes for surface metrology”, SMSI 2020, Nürnberg Wunstorf: AMA Service GmbH, S. 87-88, https://doi.org/10.5162/SMSI2020/A6.2
- Hebenstreit R, Theska R, Wedrich K, Strehle S (2020). „Conceptional design of a positioning device with subatomic resolution and reproducibility”, Proceedings of the 20th International Conference of the European Society for Precision Engineering and Nanotechnology. 2020, S. 305-306
- Germanow P, Mehring P, Neumann H, Augustin S, Fröhlich F, Krapf G (2020). „Vergleich verschiedener Methoden zur experimentellen Bestimmung der Inhomogenität von Thermoelementen“, GMA/ITG-Fachtagung Sensoren und Messsysteme; 20 (Nürnberg) : 2019.06.25-26, Technisches Messen, Bd. 87.2020, 3, Seite 146-152
- Behrens A, Bosch M, Fesser P, Hentschel M, Sinzinger S (2020). „ Fabrication and characterization of deformed microdisk cavities in silicon dioxide with high Q-factor”, Applied optics / Optical Society of America. - Washington, DC, Bd. 59.2020, 26, Seite 7893-7899, https://doi.org/10.1364/AO.398108
- Behzadirad M, Rishinaramangalam A K, Feezell D, Busani T, Reuter C, Reum A, Holz M, Gotszalk T, Mechold S, Hofmann M, Ahmad A, Ivanov T, Rangelow I W (2020). “Field emission scanning probe lithography with GaN nanowires on active cantilevers”, Journal of vacuum science and technology. Nanotechnology & microelectronics, ISSN: 2166-2746 , ZDB-ID: 797726-8, Bd. 38.2020, 3, Seite 032806-1-032806-6
- Weidenfeller, L., Hofmann, M., Supreeti, S., Mechold, S., Holz, M., Reuter, C., Manske, E. & Rangelow, I. W. (2020). "Cryogenic etching for pattern transfer into silicon of Mix-and-Match structured resist layers", Microelectronic Engineering, 111325. https://doi.org/10.1016/j.mee.2020.111325
- Dannberg O, Kühnel M, Fröhlich F, 2020, "Entwicklung einer Cantileverkalibriereinrichtung", tm-Technisches Messen, aop, https://doi.org/10.1515/teme-2020-0064
- Fern F, Füßl R, Eichfelder G, Manske E, Kuehnel M, 2020, "Coordinate transformation and its un-certainty under consideration of a non orthogonal coordinate base", Accepted Manuscript online 8 July 2020, Published by IOP Publishing Ltd in Measurement Science and Technology https://doi.org/10.1088/1361-6501/aba3f5
- Ortlepp I, Kühnel M, Hofmann M, Weidenfeller L, Kirchner J, Supreeti S, Mastylo R, Holz M, Michels T, Füßl R, Rangelow I.W, Fröhlich T, Dontsov D, Schäffel C, Manske E, 2020, "Tip- and laser-based nanofabrication up to 100 mm with sub-nanometre precision", Proc. SPIE 11324, Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS, 113240A (23 March 2020), https://doi.org/10.1117/12.2551044
Hofmann M, Weidenfeller L, Supreeti S, Mechold S, Holz M, Reuter C, Sinzinger S, Manske E, Rangelow I.W.; “Mix-and-match lithography and cryogenic etching for NIL template fabrication”, Microelectronic Engineering, Volume 224, 111234 (2020) https://doi.org/10.1016/j.mee.2020.111234
Ortlepp I, Kühnel M, Hofmann, M, Weidenfeller, L, Kirchner, J, Supreeti, S, Mastylo, R, Holz, M, Michels T, Füßl, R, Rangelow,I, Fröhlich, T, Donstov, D, Schäffel C, Manske, E, “Tip- and Laser based nanofabrication up to 100 mm with sub-nanometer precision” in SPIE Advanced Lithography 2020, San Jose, USA (24th-27th February 2020) https://doi.org/10.1117/12.2551044
Fern F; Füßl R; Eichfelder G; Manske E; Kühnel M: "Coordinate transformation and its uncertainty under consideration of a non orthogonal coordinate base" In: Measurement Science and Technology, 2020 https://doi.org/10.1088/1361-6501/aba3f5
Nilsen M, Dannberg O, Fröhlich T, Strehle S: "Direct polymer microcantilever fabrication from free-standing dry film photoresists" In: J. Micromech. Microeng.30 (2020) 095012 https://doi.org/10.1088/1361-6439/ab9e4c
Fischer D, Sinzinger S: "Evaluation of quadratic phase hologram calculation algorithms in the Fourier regime" Appl. Opt. 59, pp. 1501–1506 (2020). https://doi.org/10.1364/AO.381547
Kapp D, Weise C, Ruderman M, and Reger J: "Fractional-Order System Identification of Viscoelastic Behavior: A Frequency Domain Based Experimental Study", In Advanced Motion Control, 2020, DOI: 10.1109/AMC44022.2020.9244449
- Weise C, Tavares R, Wulff K, Ruderman M, and Reger J: "A Fractional-Order Control Approach to Ramp Tracking with Memory-Efficient Implementation", In Advanced Motion Control, 2020, DOI:10.1109/AMC44022.2020.9244309
- Weise C, Wulff K, and Reger J: "Extended Fractional-Order Memory Reset Control for Integer-Order LTI Systems and Experimental Demonstration", In IFAC World Congress, Berlin, 2020.
- J. Kirchner, R. Mastylo, U. Gerhardt, T. Sasiuk, L. Weidenfeller, M. Hofmann, M. Kühnel, S. Sinzinger, E. Manske: Fasergekoppelter konfokaler Sensor zur exakten Abstandsregelung für maskenlose Lithografieanwendungen, 20. GMA/ITG-Fachtagung Sensoren und Messsysteme, 2019
- Johannes Kirchner, Laura Weidenfeller, Uwe Gerhardt, Rostyslav Mastylo, Michael Kühnel, Stefan Sinzinger, Eberhard Manske, "A combined laser scanning and DLW tool for measuring and fabrication tasks with NPMM," Proc. SPIE 10930, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XII, 1093017, 2019
- Ralf Schienbein, Florian Fern, René Theska, Roland Füßl: On the development and qualification of multiaxial designs of nanofabrication machines with ultra precision tool rotations, euspen’s 19 th International Conference & Exhibition, Bilbao, ES, June 2019
- Shraddha Supreeti, Johannes Kirchner, Martin Hofmann, Rostyslav Mastylo, Ivo W. Rangelow, Eberhard Manske, Martin Hoffmann, Stefan Sinzinger, "Integrated soft UV-nanoimprint lithography in a Nanopositioning and Nanomeasuring Machine for accurate positioning of stamp to substrate", Proc. SPIE 10958, Novel patterning technologies for semiconductors, MEMS/NEMS, and MOEMS, 2019
- Laura Weidenfeller, Johannes Kirchner, Martin Hofmann, Michael Kühnel, Carsten Reinhardt, Ivo Rangelow, Eberhard Manske, "Laser-microfabrication with accurate positioning and metrological traceability," Proc. SPIE 10930, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XII, 2019
- Weidenfeller L, Manske E, et al, 2019, Micro- and nanofabrication technologies using the nanopo-sitioning and nanomeasuring machines, Proc. SPIE 11056, Optical Measurement Systems for In-dustrial Inspection XI, 1105637 (21 June 2019), doi: 10.1117/12.2528136
- X. Cao and S. Sinzinger, "Opto-Mechatronic System for Control and Characterization of the Coherence Properties of Light Sources," 2019 IEEE International Conference on Mechatronics (ICM), Ilmenau, Germany, 2019, pp. 141-145.
- Weidenfeller, L., Hofmann, M., Kirchner, J., Supreeti, S., Rangelow, I. W., Sinzinger, S., & Manske, E. (2019). Micro-and nanofabrication technologies using the nanopositioning and nanomeasuring machines. In Optical Measurement Systems for Industrial Inspection XI (Vol. 11056, p. 1105637). International Society for Optics and Photonics.
- Fern F, Schienbein R, Füßl R, 2019, Neues Konzept für eine fünfachsige Nanomessmaschine, Messunsicherheit - Prüfprozesse 2019, Düsseldorf, VDI Verlag GmbH, S. 131-138
- Fern F, Schienbein R, Füßl R, et al, 2019, In situ error measurement of serial rotational devices for the application in nano coordinate measuring machines, Technisches Messen 86, Supplement 1, pp. 77-81
- Sasiuk T, Fröhlich T, Theska R, Darnieder M, 2019, Generation of a static torque in the range of 1 mNm to 1 Nm according to the Jokey-weight principle, Messunsicherheit - Prüfprozesse 2019, Düsseldorf, VDI Verlag GmbH, S. 111-120
- Hofmann M, Mecholdt S, Mohr M, Holz M, Dallorto S, Manske E, Fecht H-J, and Rangelow I.W; "Nanoscale lift-off process using field emission scanning probe lithography”, JVSTB 37, 061803 (2019) https://doi.org/10.1116/1.5122272
- Florian Fern, Roland Füßl, Ralf Schienbein and René Theska: Influence of additional rotational movements on the measurement uncertainty of nanomeasuring, nanopositioning and nanofabrication machines, Sensoren und Messsysteme, 26. – 27. Juni, Nürnberg, 2018
- David Fischer, Stefan Sinzinger: Maskenlose Lithographie für die dreidimensionale Mikrostrukturierung, DGaO-Proceedings, 2018
- S. Gorges, S. Hesse: Design and Modeling Approach for a Lifting and Actuating Unit for the Applica-tion in Nano-Precision Machines. American Society for Preci-sion Engineering – Annual Meeting, 2018, Las Vegas – USA
- Martin Hofmann, Claudia Lenk, Tzvetan Ivanov, Ivo W. Rangelow, Alexander Reum, Ahmad Ahmad, Mathias Holz and Eberhard Manske: Field Emission from Diamond Nanotips for Scanning Probe Lithography, Journal of Vacuum Science & Technology B 36, 06JL02, 2018
- Martin Hofmann, Cemal Aydogan, Claudia Lenk, Yana Krivoshapkina, Steve Lenk, Burkhard Volland, Marcus Kaestner, Burhanettin Erdem Alaca, Eberhard Manske, Ivo Rangelow, Selective Pattern Transfer of Nano-Scale Features Generated by FE-SPL in 10 nm Thick Resist Layers, American Journal of Nano Research and Applications. Vol. 6, No. 1, 2018
- Ralf Schienbein, Florian Weigert, Florian Fern, René Theska, Roland Füßl: The implementation of ultra precision rotations to multiaxial nanofabrication machines: challenges and solution concepts, euspen’s 18 th International Conference &Exhibition, Venice, IT, June 2018
- Laura Weidenfeller, Ralf Schienbein, Johannes Kirchner, Carsten Reinhardt, Eberhard Manske, "Development of laser positioning system of high accuracy in the nanometer range," Proc. SPIE 10544, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XI, 2018
- X. Cao, P. Feßer, D. Fischer, M. Hofmann, Y. Bourgin, S. Sinzinger: Der Lau-Effekt in der lithographischen Mikro-Nanostrukturierung, DGaO-Proceedings 2018
- H. Speck, X. Cao, T. Meinecke, S. Sinzinger: Phase Retrieval mit Hilfe verstimmbarer Optiken für die Fourier Ptychographie, DGaO-Proceedings 2018
- S. Gorges, B. Leistritz, S. Hesse, I. Ortlepp, G. Slotta, C. Schaeffel: Development of an integrated guiding and actuation element for high dynamic nanopositioning systems. 59th Ilmenau Scientific Colloquium, 2017, Ilmenau – Germany
- Ralf Schienbein, René Theska: A contribution to the development of multiaxial nanopositioning machines, euspen’s 17 th International Conference &Exhibition, Hannover, DE, May 2017
- R. Schienbein, R. Theska, F. Weigert: A contribution to the implementation of ultraprecision rotations for multiaxial naopositioning machines, 59 th Ilmenau Scientific Colloquium, Technische Universität Ilmenau, 11 – 15 September 2017
- Cao, X., Sinzinger, S.: Effects of illumination on image reconstruction via Fourier ptychography, Advanced Optical Technologies, 2017 , 6 , 467-474
- Cao, Xinrui, Sinzinger, Stefan: Removal of optical aberrations caused by illumination system in Fourier ptychography. Ilmenau 2017
- X. Cao, M. Bichra, T. Meinecke, B. Mitschunas, S. Sinzinger: Einfluss der optischen Aberrationen und des Bildrauschens auf den Fourier-Ptychografie-Algorithmus, DGaO-Proceedings 2017