Konferenzbeiträge ab 2018

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Bischoff, Jörg; Mastylo, Rostyslav; Manske, Eberhard
Scanning wavefront detection coherent Fourier scatterometry (SCFS). - In: Optics and Photonics for Advanced Dimensional Metrology, (2020), S. 1135214-1-1135214-11

https://doi.org/10.1117/12.2554526
Stehr, Uwe; Centeno, Luis F.; Ni, Yuliana; Jacobs, Heiko O.; Hein, Matthias
RF properties of stretchable transmission line structures. - In: 2020 German Microwave Conference, (2020), S. 272-275

https://ieeexplore.ieee.org/document/9080242
Grundhöfer, Lars; Gewies, Stefan; Hehenkamp, Niklas; Del Galdo, Giovanni
Redesigned waveforms in the maritime medium frequency bands. - In: 2020 IEEE/ION Position, Location and Navigation Symposium (PLANS), (2020), S. 827-831

https://doi.org/10.1109/PLANS46316.2020.9110174
Geis, Julius; Bruchmüller, Matthias; Düngen, Matthias; Wächter, Julia
T11-372 : Influence of oscillating surfaces on the rheological behavior of thermoplastic melt. - In: SPE ANTEC 2018, (2020), S. 1168-1171

Ullrich, Johannes; Seul, Thomas; Bergmann, Jean Pierre; Hildebrand, Jörg; Ali, Yarop; Jahn, Simon; Dahms, Steffen; Eilenberger, Daniel
M07-256 : Additive manufacturing of large, temperature-controlled injection molding tools using arc welding and diffusion bonding. - In: SPE ANTEC 2018, (2020), S. 275-281

Pérez, Eduardo; Kirchhof, Jan; Semper, Sebastian; Krieg, Fabian; Römer, Florian
Cramér-Rao bounds for flaw localization in subsampled multistatic multichannel ultrasound NDT data. - In: 2020 IEEE International Conference on Acoustics, Speech, and Signal Processing, (2020), S. 4960-4964

https://doi.org/10.1109/ICASSP40776.2020.9053523
Häfner, Stephan; Thomä, Reiner
Extended Kalman filtering and maximum-likelihood estimation for point target localisation. - In: 2020 German Microwave Conference, (2020), S. 116-119

https://ieeexplore.ieee.org/document/9080235
Häfner, Stephan; Thomä, Reiner
MAP and MMSE based parameter estimation from noisy radar observations. - In: 2020 German Microwave Conference, (2020), S. 260-263

https://ieeexplore.ieee.org/document/9080169