Conference papers from 2018

Anzahl der Treffer: 692
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Wilke, Marcus; Teichert, Gerd;
Vergleichende Untersuchungen zur Charakterisierung der Verbindungsschicht beim Nitrocarburieren. - In: Fortschritte in der Metallographie, (2008), S. 209-304

Hotovy, Juraj; Kups, Thomas; Kovac, Jaroslav; Spieß, Lothar; Novotny, Ivan; Kovac, Jaroslav
Growth and characterization of ZnO thin films using XRD and AFM. - In: Prospects in mechanical engineering, (2008), insges. 10 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=18044
Hotovy, Ivan; Predanocy, Martin; Hotovy, Juraj; Kups, Thomas; Spieß, Lothar; Wang, Chunyu; Rehacek, Vlastimil
Growth and characterization of indium oxide films for ozone detection. - In: Prospects in mechanical engineering, (2008), insges. 11 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=18741
Kups, Thomas; Knote, Andreas; Spieß, Lothar
SEM and TEM investigations of electrophoretical deposited Si3N4 and SiC particles in siloxane of steel substrate. - In: Materials science, ISBN 978-3-540-85225-4, (2008), S. 695-696

Kups, Thomas; Kremin, Christoph; Hoffmann, Martin; Spieß, Lothar
Surface investigation of SU-8 by atomic force and scanning electron microscopy. - In: Materials science, ISBN 978-3-540-85225-4, (2008), S. 693-694

Wilden, Johannes; Jahn, Simon; Drescher, Viktor; Schaaf, Peter
High-temperature-functionalization of surfaces: drag reduction and self-cleaning. - In: Thermal spray crossing borders, ISBN 978-3-87155-979-2, (2008), insges. 6 S.

Kups, Thomas; Voelskow, Matthias; Skorupa, Wolfgang; Soueidan, M.; Ferro, G.; Pezoldt, Jörg
Lattice location determination of Ge in SiC by ALCHEMI. - In: Microscopy of semiconducting materials 2007, (2008), S. 353-358

Hauguth-Frank, Sindy; Lebedev, Vadim; Tonisch, Katja; Romanus, Henry; Kups, Thomas; Büchner, Hans-Joachim; Jäger, Gerd; Ambacher, Oliver; Schober, Andreas
Structural and photoconducting properties of MBE and MOCVD grown III-nitride double-heterostructures. - In: Materials and devices for laser remote sensing and optical communication, ISBN 978-1-60511-046-2, (2008), S. 155-161

Höche, Daniel; Schikora, Hendrik; Zutz, Hayo; Emmel, Andreas; Queitsch, Robert; Schaaf, Peter
TiN-coating formation by pulsed Nd:YAG laser irradiation of titanium in nitrogen. - In: Journal of coatings technology and research, ISSN 1935-3804, Bd. 5 (2008), 4, S. 505-512

Titanium was treated by pulsed Nd:YAG laser irradiation in nitrogen atmosphere, which led to nitrogen in-diffusion and TiN coating formation. The thickness of the TiN films was about 1.2 æm and the coatings had a universal hardness of about 11 GPa. The layers were investigated by X-ray diffraction at grazing incidence and resonant nuclear reaction analysis for nitrogen depth profiling. Fitting of the experimental depth profiles gave information about the physical processes (diffusion time and depth) with respect to the achieved hardness. The microscopic properties like lattice constants and the variation of the nitrogen content were evaluated. A relationship between laser scan parameters and coating properties could be revealed. Thus, it was possible to determine the physical limits such as film thickness, nitrogen content, and hardness of this direct laser synthesis. Keywords: Titanium, Hardness, Melting depth, Laser synthesis, Titanium nitride, Coatings



https://doi.org/10.1007/s11998-008-9093-9
Wang, Chunyu; Dai, Ye; Pezoldt, Jörg; Lu, Bo; Kups, Thomas; Cimalla, Volker; Ambacher, Oliver
Phase stabilization and phonon properties of single crystalline rhombohedral indium oxide. - In: Crystal growth & design, ISSN 1528-7505, Bd. 8 (2008), 4, S. 1257-1260

http://dx.doi.org/10.1021/cg700910n