Konferenzbeiträge ab 2018

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Belkner, Johannes; Stauffenberg, Jaqueline; Häcker, Annika-Verena; Ortlepp, Ingo; Manske, Eberhard
Amplituden- und Phasenmodulation in der Lock-In-gefilterten differentiellen konfokalen Profilometrie. - In: Sensoren und Messsysteme, (2022), S. 235-244

Birli, Oliver; Schwesinger, Folker; Manske, Eberhard
Nanopositionier- und Nanomessmaschinen - Herausforderungen bei der Visualisierung großer Messvolumina mit Übersichtsbildern im Gigapixel-Bereich. - In: Sensoren und Messsysteme, (2022), S. 224-234

Die Orientierung im Messvolumen von Nanopositionier- und Nanomessmaschinen mit großen Messbereichen (z.B. NPMM200 mit 200x200x25 mm Messbereich) ist speziell bei unbekannten Proben anspruchsvoll. Ein grobes Scannen mit AFM- oder Laserfokus-Sensoren (z.B. mit einem Pixelabstand von ca. 500 nm) ist extrem zeitaufwendig. Verwendet man zum Erstellen eines 3D-Übersichtsbildes Mikroskope und Kameras, kann in überschaubarer Zeit ein 3D-Abbild des Messobjektes erstellt werden. Durch eine Konvertierung in spezielle Datenformate ist eine nahezu verzögerungsfreie Navigation innerhalb der Grenzen des Messobjektes möglich. Die Herausforderungen und Probleme bei der Entwicklung derartiger Software bzgl. Rechnerarchitekturen, Datenspeicherung und Parallelisierung werden in dieser Abhandlung näher untersucht.



Gehrmann, Stephan; Bartz, Frederik; Skrotzki, David; Augustin, Silke; Dresler, Christian
Prüfstand für temperatursensitive Farben und grundlegende Untersuchung von Oberflächentemperaturen. - In: Sensoren und Messsysteme, (2022), S. 39-43

Ortlepp, Ingo; Stauffenberg, Jaqueline; Krötschl, Anja; Dontsov, Denis; Zöllner, Jens-Peter; Hesse, Steffen; Reuter, Christoph; Strehle, Steffen; Fröhlich, Thomas; Rangelow, Ivo W.; Manske, Eberhard
Nanofabrication and -metrology by using the nanofabrication machine (NFM-100). - In: Novel Patterning Technologies 2022, (2022), 120540A, S. 120540A-1-120540A-12

The feature dimensions of integrated circuits are becoming smaller and the fabrication, metrology and inspection is becoming harder to be fulfilled. Fast-writing of long respectively large nano-features with Scanning-ProbeLithography and their inspection with an Atomic Force Microscope (AFM) is a challenge, for the accomplishment of which the Nanofabrication Machine (NFM-100) can serve as a beneficial experimental platform for basic research in the field of scale-spanning nanomeasuring and nanofabrication. The NFM-100 has an integrated tipbased system, which can be used as an AFM as well as for Field-Emission Scanning Probe Lithography (FESPL). The combination of both systems offers the possibility to fabricate and analyze micro- and nanostructures with high resolution and precision down to a single nanometre over a large area of 100 mm in diameter in a single configuration without tool or sensor change. Thus, in contrast to conventional optical inspection and alignment systems, the NFM-100 offers the potential for full lithographic and metrological automation. For FESPL, the implemented active probes enable an in-situ inspection capability, a quantitative mapping at unprecedented resolution, as well as an integrated overlay alignment system. In this paper, the basic set-up of the NFM-100 as well as the capability of the system for long range AFM scans and FESPL is demonstrated.



https://doi.org/10.1117/12.2615118
Koch, Yanik; Husung, Stephan; Röhnert, Felix; Mahboob, Atif; Frank, M. G.; Kirchner, Eckhard
A method for the support of the design for Digital Twin solution and its application on a gearbox system. - In: Proceedings of the Design Society, ISSN 2732-527X, Bd. 2 (2022), S. 1609-1618

The information from Real Twins are increasingly used to construct Digital Twins. Acquisition of information from the Real Twin or in other words performing measurements on the Real Twin may lead to effects in the working of Real Twin. For instance, the introduction of sensors may impair certain functions of a Real Twin. Therefore, it is important to analyse the effect of any change that is performed on the Real Twin for achieving the Digital Twin. In this paper, a method for Digital Twin solution is presented that address these aspects as well as its use is demonstrated by a case example.



https://doi.org/10.1017/pds.2022.163
Mahboob, Atif; Husung, Stephan
A modelling method for describing and facilitating the reuse of SysML models during design process. - In: Proceedings of the Design Society, ISSN 2732-527X, Bd. 2 (2022), S. 1925-1934

MBSE and SysML are increasingly finding their applications in industry as well as in academia. The reuse of the information described in SysML models depends, among others, on the modelling methods, management of dependencies between elements and on the needed remodelling effort. In this paper, a modelling method is presented that address the reuse of SysML models and descriptions as well as reuse of model variants in SysML. A case example is presented to explain the modelling methods and the gained experience is summarised in the form of general recommendations for further use.



https://doi.org/10.1017/pds.2022.195
Husung, Stephan; Weber, Christian; Mahboob, Atif
Integrating model-based design of mechatronic systems with domain-specific design approaches. - In: Proceedings of the Design Society, ISSN 2732-527X, Bd. 2 (2022), S. 1895-1904

In addition to the known approaches for product development new or supplementary approaches have emerged. An important approach in this field is Systems Engineering (SE) and Model-Based Systems Engineering. Through these approaches, new procedures, level-focused description concepts and terms come into product development. However there are still some uncertainties as to how the known approaches of product development can be combined with the SE approaches. This paper aims to show how the known development approaches can be extended by and integrated with SE approaches.



https://doi.org/10.1017/pds.2022.192
Ahmad, Bilal; Khamidullina, Liana; Korobkov, Alexey A.; Manina, Alla; Haueisen, Jens; Haardt, Martin
Joint model order estimation for multiple tensors with a coupled mode and applications to the joint decomposition of EEG, MEG Magnetometer, and Gradiometer tensors. - In: 2022 IEEE International Conference on Acoustics, Speech, and Signal Processing, (2022), S. 1186-1190

The efficient estimation of an approximate model order is essential for applications with multidimensional data if the observed low-rank data is corrupted by additive noise. Certain signal processing applications such as biomedical studies, where the data are collected simultaneously through heterogeneous sensors, share some common features, i.e., coupled factors among multiple tensors. The exploitation of this coupling can lead to a better model order estimation, especially in case of low SNRs. In this paper, we extend the rank estimation techniques, designed for a single tensor, to noise-corrupted coupled low-rank tensors that share one of their factor matrices. To this end, we consider the joint effect of the global eigenvalues (calculated from the coupled HOSVD) and exploit the exponential behavior of the resulting coupled global eigenvalues. We show that the proposed method outperforms the classical criteria and can be successfully applied to EEG, MEG Magnetometer, and Gradiometer measurements. Our real data simulation results show that the estimated rank is highly reliable in terms of dominant components extraction.



https://doi.org/10.1109/ICASSP43922.2022.9747735
Engelhardt, Maximilian; Andrich, Carsten; Ihlow, Alexander; Del Galdo, Giovanni
RF performance of USRP TwinRX daughterboard under influence of strong interferers. - In: 16th European Conference on Antennas and Propagation, (2022), insges. 5 S.

In this paper, we investigate the sensitivity of the software-defined radio (SDR) universal software radio peripheral (USRP) X310 with a TwinRX daughterboard to strong interferers. In a conducted test setup, the signal-to-interference-plus-noise ratio (SINR) is measured under the influence of a mock-up Long-Term Evolution (LTE) base station. The frequency of the interferer is varied to analyze the effects over a wide frequency band, whereby a distinction is made between signals inside and outside the intermediate frequency (IF) band. The former can cause clipping at the analog-to-digital converter (ADC), while the latter are to be suppressed in the analog part of the software-defined radio. Here, leakage and higher-order mixing products make the receiver sensitive to spurious frequencies, whereby the performance degradation is particularly noticeable near the first intermediate frequency (IF1) of 1.25 GHz. At this point, even an interference signal with −28 dBm peak envelope power (PEP) causes an SINR loss of 3 dB.



https://doi.org/10.23919/EuCAP53622.2022.9769615