Zeitschriftenaufsätze ab 2018

Anzahl der Treffer: 1644
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Freitag, Stefanie; Hunold, Alexander; Klemm, Matthias; Klee, Sascha; Link, Dietmar; Nagel, Edgar; Haueisen, Jens
Pulsed electrical stimulation of the human eye enhances retinal vessel reaction to flickering light. - In: Frontiers in human neuroscience, ISSN 1662-5161, Bd. 13 (2019), 371, insges. 11 S.

https://doi.org/10.3389/fnhum.2019.00371
Kunicki, Piotr; Angelov, Tihomir; Ivanov, Tzvetan; Gotszalk, Teodor; Rangelow, Ivo W.
Sensitivity improvement to active piezoresistive AFM probes using focused ion beam processing. - In: Sensors, ISSN 1424-8220, Bd. 19 (2019), 20, 4429, insges. 9 S.

https://doi.org/10.3390/s19204429
Fronso, Selenia; diFiedler, Patrique; Tamburro, Gabriella; Haueisen, Jens; Bertollo, Maurizio; Comani, Silvia
Dry EEG in sports sciences: a fast and reliable tool to assess individual alpha peak frequency changes induced by physical effort. - In: Frontiers in neuroscience, ISSN 1662-453X, Bd. 13 (2019), 982, S. 1-12

https://doi.org/10.3389/fnins.2019.00982
Manske, Eberhard;
Nanopositioning and nanomeasuring machines. - In: Metrology, (2019), S. 1-23
Living reference work entry, first online: 04 January 2019

https://doi.org/10.1007/978-981-10-4912-5_2-1
Cadar, Calin; Cretu, Andrea; Moldovan, Marioara; Mattea, Carlos; Stapf, Siegfried; Ardelean, Ioan
NMR T1-T2 correlation analysis of molecular absorption inside a hardened cement paste containing silanised silica fume. - In: Molecular physics, ISSN 1362-3028, Bd. 117 (2019), 7/8, S. 1000-1005
Im Titel sind "1" und "2" tiefgestellt

https://doi.org/10.1080/00268976.2018.1513582
Machts, René; Hunold, Alexander; Drebenstedt, Christian; Rock, Michael; Leu, Carsten; Haueisen, Jens
Measurement and analysis of partial lightning currents in a head phantom. - In: PLOS ONE, ISSN 1932-6203, Bd. 14 (2019), 9, e0223133, insges. 22 S.

https://doi.org/10.1371/journal.pone.0223133
Dallorto, Stefano; Goodyear, Andy; Cooke, Mike; Szornel, Julia E.; Ward, Craig; Kastl, Christoph; Schwartzberg, Adam; Rangelow, Ivo W.; Cabrini, Stefano
Atomic layer etching of SiO2 with Ar and CHF 3 plasmas: a self-limiting process for aspect ratio independent etching. - In: Plasma processes and polymers, ISSN 1612-8869, Volume 16 (2019), issue 9, 1900051, Seite 1-9
Im Titel sind "2" und "3" tiefgestellt

https://doi.org/10.1002/ppap.201900051
Prylutska, Svitlana V.; Grebinyk, Anna; Lynchak, Oksana V.; Byelinska, Iryna V.; Cherepanov, Vsevolod; Täuscher, Eric; Matyshevska, Olga P.; Prylutskyy, Yuriy I.; Rybalchenko, Volodymyr K.; Ritter, Uwe; Frohme, Marcus
In vitro and in vivo toxicity of pristine C60 fullerene aqueous colloid solution. - In: Fullerenes, nanotubes & carbon nanostructures, ISSN 1536-4046, Bd. 27 (2019), 9, S. 715-728
Im Titel ist "60" tiefgestellt

https://doi.org/10.1080/1536383X.2019.1634055
Zhang, Da; Zhang, Keyu; Yao, Yaochun; Liang, Feng; Qu, Tao; Ma, Wenhui; Yang, Bing; Dai, Yongnian; Lei, Yong
Intercalation and exfoliation syntheses of high specific surface area graphene and FeC2O4/graphene composite for anode material of lithium ion battery. - In: Fullerenes, nanotubes & carbon nanostructures, ISSN 1536-4046, Bd. 27 (2019), 9, S. 746-754
Im Titel sind "2" und "4" tiefgestellt

https://doi.org/10.1080/1536383X.2019.1635586
Liang, Fei; Wang, Dong; Li, Xi; Luo, Xue-Mei; Schaaf, Peter; Zhang, Guang-Ping
A model revealing grain boundary arrangement-dominated fatigue cracking behavior in nanoscale metallic multilayers. - In: MRS communications, ISSN 2159-6867, Bd. 9 (2019), 3, S. 936-940

In order to reveal the quantitative relationship between fatigue crack deflection path and cross-sectional grain boundary (GB) arrangement of metallic nanolayered composites (NLCs), a stochastic model was established based on the interface-dominant fatigue damage for the ultrafine-scale NLCs. The model indicates that the crack deflection length decreases with decreasing GB arrangement deviation and grain size of constituent layers. The observation and quantitative analysis of fatigue cracking behavior of the Cu/W multilayers with a layer thickness of 5 and 20 nm was conducted to verify the model.



https://doi.org/10.1557/mrc.2019.75