Wang, Chunyu; Cimalla, Volker; Kups, Thomas; Röhlig, Claus-Christian; Romanus, Henry; Lebedev, Vadim; Pezoldt, Jörg; Stauden, Thomas; Ambacher, Oliver
Photoreduction and oxidation behavior of In2O3 nanoparticles by metal organic chemical vapor deposition. - In: Journal of applied physics, ISSN 1089-7550, Bd. 102 (2007), 4, 044310, insges. 6 S.
https://doi.org/10.1063/1.2770831
Photoreduction and oxidation behavior of In2O3 nanoparticles by metal organic chemical vapor deposition. - In: Journal of applied physics, ISSN 1089-7550, Bd. 102 (2007), 4, 044310, insges. 6 S.
https://doi.org/10.1063/1.2770831
Machleidt, Torsten; Franke, Karl-Heinz; Romanus, Henry; Cimalla, Volker; Niebelschütz, Merten; Spieß, Lothar; Ambacher, Oliver
Using defined structures on very thin foils for characterizing AFM tips. - In: Ultramicroscopy, ISSN 1879-2723, Bd. 107 (2007), 10/11, S. 1086-1090
http://dx.doi.org/10.1016/j.ultramic.2007.05.004
Using defined structures on very thin foils for characterizing AFM tips. - In: Ultramicroscopy, ISSN 1879-2723, Bd. 107 (2007), 10/11, S. 1086-1090
http://dx.doi.org/10.1016/j.ultramic.2007.05.004
Cimalla, Volker; Machleidt, Torsten; Spieß, Lothar; Gubisch, Maik; Hotovy, Ivan; Romanus, Henry; Ambacher, Oliver
Analysis of nanocrystalline films on rough substrates. - In: Ultramicroscopy, ISSN 1879-2723, Bd. 107 (2007), 10/11, S. 989-994
http://dx.doi.org/10.1016/j.ultramic.2007.02.046
Analysis of nanocrystalline films on rough substrates. - In: Ultramicroscopy, ISSN 1879-2723, Bd. 107 (2007), 10/11, S. 989-994
http://dx.doi.org/10.1016/j.ultramic.2007.02.046
Lebedev, Vadim; Wang, Chunyu; Cimalla, Volker; Hauguth, Sindy; Kups, Thomas; Ali, Majdeddin; Ecke, Gernot; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Ambacher, Oliver; Polyakov, Vladimir M.; Schwierz, Frank
Effect of surface oxidation on electron transport in InN thin films. - In: Journal of applied physics, ISSN 1089-7550, Bd. 101 (2007), 12, 123705, insges. 6 S.
https://doi.org/10.1063/1.2747592
Effect of surface oxidation on electron transport in InN thin films. - In: Journal of applied physics, ISSN 1089-7550, Bd. 101 (2007), 12, 123705, insges. 6 S.
https://doi.org/10.1063/1.2747592
Wang, Chunyu; Cimalla, Volker; Romanus, Henry; Kups, Thomas; Niebelschütz, Merten; Ambacher, Oliver
Tuning of electrical and structural properties of indium oxide films grown by metal organic chemical vapor deposition. - In: Thin solid films, ISSN 1879-2731, Bd. 515 (2007), 16, S. 6611-6614
http://dx.doi.org/10.1016/j.tsf.2006.11.079
Tuning of electrical and structural properties of indium oxide films grown by metal organic chemical vapor deposition. - In: Thin solid films, ISSN 1879-2731, Bd. 515 (2007), 16, S. 6611-6614
http://dx.doi.org/10.1016/j.tsf.2006.11.079
Wang, Chunyu; Lebedev, Vadim; Cimalla, Volker; Kups, Thomas; Tonisch, Katja; Ambacher, Oliver
Structural studies of single crystalline In2O3 films epitaxially grown on InN(0001). - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 22, S. 221902, insges. 3 S.
http://dx.doi.org/10.1063/1.2743907
Structural studies of single crystalline In2O3 films epitaxially grown on InN(0001). - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 22, S. 221902, insges. 3 S.
http://dx.doi.org/10.1063/1.2743907
Romanus, Henry; Schadewald, Jens; Cimalla, Volker; Niebelschütz, Merten; Machleidt, Torsten; Franke, Karl-Heinz; Spieß, Lothar; Ambacher, Oliver
Preparation of defined structures on very thin foils for characterization of AFM probes. - In: Microelectronic engineering, Bd. 84 (2007), 3, S. 528-531
http://dx.doi.org/10.1016/j.mee.2006.10.077
Preparation of defined structures on very thin foils for characterization of AFM probes. - In: Microelectronic engineering, Bd. 84 (2007), 3, S. 528-531
http://dx.doi.org/10.1016/j.mee.2006.10.077
Romanus, Henry; Schadewald, Jens; Cimalla, Volker; Niebelschütz, Merten; Machleidt, Torsten; Franke, Karl-Heinz; Spieß, Lothar; Ambacher, Oliver
Markers prepared by focus ion beam technique for nanopositioning procedures. - In: Microelectronic engineering, Bd. 84 (2007), 3, S. 524-527
http://dx.doi.org/10.1016/j.mee.2006.10.076
Markers prepared by focus ion beam technique for nanopositioning procedures. - In: Microelectronic engineering, Bd. 84 (2007), 3, S. 524-527
http://dx.doi.org/10.1016/j.mee.2006.10.076
Reháková, Andrea; Tengeri, David; Hotový, Ivan; Lalinský, Tibor; Reháček, Vlastimil; Spieß, Lothar; Romanus, Henry; Ha&bovko;s&bovko;cík, Stefan
Preparation and characterization of microhotplate for gas sensors. - In: International Conference on Advanced Semiconductor Devices and Microsystems, 2006, (2006), insges. 4 S.
https://doi.org/10.1109/ASDAM.2006.331208
Preparation and characterization of microhotplate for gas sensors. - In: International Conference on Advanced Semiconductor Devices and Microsystems, 2006, (2006), insges. 4 S.
https://doi.org/10.1109/ASDAM.2006.331208
Hotovy, Ivan; Lalinsky, Tibor; Rehacek, Vlastimil; Spieß, Lothar; Gubisch, Maik; Hascik, Stefan; Rehakova, Andrea
Fabrication and characterization of a microheater on GaAs for gas sensors. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 9 S.
http://www.db-thueringen.de/servlets/DocumentServlet?id=13379
Fabrication and characterization of a microheater on GaAs for gas sensors. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 9 S.
http://www.db-thueringen.de/servlets/DocumentServlet?id=13379